JPWO2021124423A1 - - Google Patents

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Publication number
JPWO2021124423A1
JPWO2021124423A1 JP2021565184A JP2021565184A JPWO2021124423A1 JP WO2021124423 A1 JPWO2021124423 A1 JP WO2021124423A1 JP 2021565184 A JP2021565184 A JP 2021565184A JP 2021565184 A JP2021565184 A JP 2021565184A JP WO2021124423 A1 JPWO2021124423 A1 JP WO2021124423A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2021565184A
Other languages
Japanese (ja)
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JP7329881B2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Publication of JPWO2021124423A1 publication Critical patent/JPWO2021124423A1/ja
Application granted granted Critical
Publication of JP7329881B2 publication Critical patent/JP7329881B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
JP2021565184A 2019-12-16 2019-12-16 Conveyor type X-ray inspection device Active JP7329881B2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/049256 WO2021124423A1 (en) 2019-12-16 2019-12-16 Portable conveyor-type x-ray inspection device

Publications (2)

Publication Number Publication Date
JPWO2021124423A1 true JPWO2021124423A1 (en) 2021-06-24
JP7329881B2 JP7329881B2 (en) 2023-08-21

Family

ID=76477334

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021565184A Active JP7329881B2 (en) 2019-12-16 2019-12-16 Conveyor type X-ray inspection device

Country Status (3)

Country Link
JP (1) JP7329881B2 (en)
CN (1) CN115087859A (en)
WO (1) WO2021124423A1 (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4983176A (en) * 1972-12-15 1974-08-09
JPS4984198A (en) * 1972-12-16 1974-08-13
JPS50152515U (en) * 1974-06-05 1975-12-18
JPH11230918A (en) * 1998-02-12 1999-08-27 Hitachi Medical Corp X-ray inspection device
JP2005003480A (en) * 2003-06-11 2005-01-06 Ishida Co Ltd X-ray examination apparatus
JP2015512033A (en) * 2012-02-08 2015-04-23 ラピスカン システムズ、インコーポレイテッド High-speed security inspection system
JP2018017663A (en) * 2016-07-29 2018-02-01 株式会社Naaエレテック Baggage restriction curtain for x-ray check
JP2018124084A (en) * 2017-01-30 2018-08-09 日本信号株式会社 X-ray inspection device and baggage inspection device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5725384B2 (en) * 1974-05-27 1982-05-29

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4983176A (en) * 1972-12-15 1974-08-09
JPS4984198A (en) * 1972-12-16 1974-08-13
JPS50152515U (en) * 1974-06-05 1975-12-18
JPH11230918A (en) * 1998-02-12 1999-08-27 Hitachi Medical Corp X-ray inspection device
JP2005003480A (en) * 2003-06-11 2005-01-06 Ishida Co Ltd X-ray examination apparatus
JP2015512033A (en) * 2012-02-08 2015-04-23 ラピスカン システムズ、インコーポレイテッド High-speed security inspection system
JP2018017663A (en) * 2016-07-29 2018-02-01 株式会社Naaエレテック Baggage restriction curtain for x-ray check
JP2018124084A (en) * 2017-01-30 2018-08-09 日本信号株式会社 X-ray inspection device and baggage inspection device

Also Published As

Publication number Publication date
WO2021124423A1 (en) 2021-06-24
CN115087859A (en) 2022-09-20
JP7329881B2 (en) 2023-08-21

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