JPWO2021124300A5 - - Google Patents
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- JPWO2021124300A5 JPWO2021124300A5 JP2022538194A JP2022538194A JPWO2021124300A5 JP WO2021124300 A5 JPWO2021124300 A5 JP WO2021124300A5 JP 2022538194 A JP2022538194 A JP 2022538194A JP 2022538194 A JP2022538194 A JP 2022538194A JP WO2021124300 A5 JPWO2021124300 A5 JP WO2021124300A5
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- JP
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- Prior art keywords
- probe
- marker detection
- 170abcd
- marker
- detection areas
- Prior art date
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- 239000003550 marker Substances 0.000 claims 38
- 239000000523 sample Substances 0.000 claims 36
- 238000001514 detection method Methods 0.000 claims 28
- 239000013598 vector Substances 0.000 claims 6
- 238000000034 method Methods 0.000 claims 3
- 238000013459 approach Methods 0.000 claims 1
- 238000003491 array Methods 0.000 claims 1
Claims (14)
遠位端(160)と、
前記プローブ(100、101)の前記遠位端(160)の第1の磁気センサ(110)と、
前記第1の磁気センサ(110)と前記プローブ(100、101)の近位端(165)との間に配設された第2の磁気センサ(120)とを備え、前記第1及び第2の磁気センサが、使用時に、前記磁気双極子の1つ又は複数の磁場ベクトルを決定するように構成及び配置され、
前記プローブ(100、101)が、
プローブ長手方向軸(150)に沿って前記遠位端(160)から延びる2つ以上のマーカ検出区域(170abcd、171cd、172cd、173cd、174cd)を定義し、
前記1つ又は複数の磁場ベクトルを使用して、前記磁気双極子に対する前記角度配設(180、190)を決定し、
前記角度配設(180、190)が前記2つ以上のマーカ検出区域(170abcd、171cd、172cd、173cd、174cd)のうちの1つと実質的に一致する場合には、前記埋め込み型マーカ(200)が前記2つ以上のマーカ検出区域のうちの1つの中にあることを決定し、
前記磁気双極子に対する前記角度配設(180、190)が前記2つ以上のマーカ検出区域(170abcd、171cd、172cd、173cd、174cd)のうちの前記1つと一致しない場合には、1つ又は複数の磁場ベクトルの決定を抑制する
ようにさらに構成される、磁場プローブ(100、101)。 a magnetic field probe (100, 101) for determining the angular placement (180, 190) of an implantable marker (200), the marker being configured to generate a magnetic field when in use; The probe (100, 101) includes a dipole ,
a distal end (160);
a first magnetic sensor (110) at the distal end (160) of the probe (100, 101) ;
a second magnetic sensor (120) disposed between the first magnetic sensor (110) and the proximal end (165) of the probe (100, 101); a magnetic sensor configured and arranged to, in use, determine one or more magnetic field vectors of the magnetic dipole ;
The probes (100, 101) are
defining two or more marker detection zones (170abcd, 171cd, 172cd, 173cd, 174cd) extending from said distal end (160) along a probe longitudinal axis (150);
determining the angular alignment (180, 190) for the magnetic dipole using the one or more magnetic field vectors;
said embedded marker (200) when said angular arrangement (180, 190) substantially coincides with one of said two or more marker detection areas (170abcd, 171cd, 172cd, 173cd, 174cd); is within one of the two or more marker detection areas;
one or more of the two or more marker detection areas (170abcd, 171cd, 172cd, 173cd, 174cd) if the angular arrangement (180, 190) with respect to the magnetic dipole suppress the determination of the magnetic field vector of
A magnetic field probe (100, 101) further configured to.
範囲、形状、向き、配設、スケーリング、分解能、角度境界、長手方向範囲、横方向範囲、又はそれらの任意の組合せ
からなる群から選択されるパラメータに関して異なる、請求項1~4のいずれか一項に記載のプローブ。 The two or more marker detection areas (171cd, 172cd, 173cd, 174cd) are
Any one of claims 1 to 4 , differing with respect to a parameter selected from the group consisting of extent, shape, orientation, arrangement, scaling, resolution, angular boundaries, longitudinal extent, lateral extent, or any combination thereof. Probes described in Section.
前記角度配設(180、190)が3つ以上のマーカ検出区域(170abcd、171cd、172cd、173cd、174cd)のうちの1つと実質的に一致するかを判断し、それによって、前記マーカ(200)が、前記3つ以上のマーカ検出区域(170abcd、171cd、172cd、173cd、174cd)のうちの前記1つの中にあることを決定する
ようにさらに構成される、請求項1~5のいずれか一項に記載のプローブ。 defining additional marker detection zones (170abcd, 171cd, 172cd, 173cd, 174cd) extending from said distal end (160) along a probe longitudinal axis (150);
determining whether said angular arrangement (180, 190) substantially coincides with one of three or more marker detection areas (170abcd, 171cd, 172cd, 173cd, 174cd), thereby determining whether said marker (200 ) is within the one of the three or more marker detection areas (170abcd, 171cd, 172cd, 173cd, 174cd ). The probe according to paragraph 1.
前記角度配設(180、190)が、
前記さらなるマーカ検出区域(170abcd、1710cdb、1720cd、1730cd、174cd)と実質的に一致するか、
前記第1のマーカ検出区域及びさらなるマーカ検出区域(170abcd、1710cdb、1720cd、1730cd、174cd)の両方と実質的に一致するか、
前記第2のマーカ検出区域及びさらなるマーカ検出区域(170abcd、1710cdb、1720cd、1730cd、174cd)の両方と実質的に一致するか、
前記第1のマーカ検出区域又はさらなるマーカ検出区域(170abcd、1710cdb、1720cd、1730cd、174cd)のいずれとも一致しないか、
前記第2のマーカ検出区域又はさらなるマーカ検出区域(170abcd、1710cdb、1720cd、1730cd、174cd)のいずれとも一致しないか、又は
それらの任意の組合せを判断する
ようにさらに構成される、請求項1~6のいずれか一項に記載のプローブ。 defining additional marker detection zones (170abcd, 171cd, 172cd, 173cd, 174cd) extending from said distal end (160) along a probe longitudinal axis (150);
The angular arrangement (180, 190) is
substantially coincident with the further marker detection area (170abcd, 1710cdb, 1720cd, 1730cd, 174cd) ;
substantially coincident with both the first marker detection area and the further marker detection area (170abcd, 1710cdb, 1720cd, 1730cd, 174cd) ;
substantially coincident with both the second marker detection area and the further marker detection area (170abcd, 1710cdb, 1720cd, 1730cd, 174cd) ;
does not match any of the first marker detection area or the further marker detection areas (170abcd, 1710cdb, 1720cd, 1730cd, 174cd) ,
Further configured to determine whether there is no match with any of the second marker detection area or further marker detection areas (170abcd, 1710cdb, 1720cd, 1730cd, 174cd), or any combination thereof. 6. The probe according to any one of 6.
遠位端(160)を備えるプローブ(100、101)を提供し、前記プローブが、前記遠位端(160)の第1の磁気センサ(110)と、前記第1の磁気センサ(110)と前記プローブ(100、101)の近位端(165)との間に配設された第2の磁気センサ(120)とをさらに備え、前記第1及び第2の磁気センサが、使用時に、前記磁気双極子の1つ又は複数の磁場ベクトルを決定するように構成及び配置されること、
プローブ長手方向軸(150)に沿って前記遠位端(160)から延びる2つ以上のマーカ検出区域(170abcd、171cd、172cd、173cd、174cd)を定義するように前記プローブ(100、101)を構成及び配置すること、
前記1つ又は複数の磁場ベクトルを使用して、前記磁気双極子に対する前記角度配設(180、190)を決定すること、
前記角度配設(180、190)が前記2つ以上のマーカ検出区域(170abcd、171cd、172cd、173cd、174cd)のうちの1つと実質的に一致する場合には、前記埋め込み型マーカ(200)が前記2つ以上のマーカ検出区域のうちの1つの中にあることを決定すること、並びに
前記磁気双極子に対する前記角度配設(180、190)が前記2つ以上のマーカ検出区域(170abcd、171cd、172cd、173cd、174cd)のうちの前記1つと一致しない場合には、1つ又は複数の磁場ベクトルの決定を抑制すること、
を含む方法。 A method for determining angular placement (180, 190) of an implantable marker (200), the marker (200) comprising a magnetic dipole configured to generate a magnetic field in use. , the method is
A probe (100, 101) comprising a distal end (160) is provided, said probe comprising a first magnetic sensor (110) of said distal end (160) and said first magnetic sensor (110). a second magnetic sensor (120) disposed between the proximal end (165 ) of the probe (100, 101 ), wherein the first and second magnetic sensors, in use, configured and arranged to determine one or more magnetic field vectors of the magnetic dipole ;
said probe (100, 101) to define two or more marker detection zones (170abcd, 171cd, 172cd, 173cd, 174cd) extending from said distal end (160) along a probe longitudinal axis ( 150); configuring and arranging;
determining the angular alignment (180, 190) for the magnetic dipole using the one or more magnetic field vectors;
said embedded marker (200) when said angular arrangement (180, 190) substantially coincides with one of said two or more marker detection areas (170abcd, 171cd, 172cd, 173cd, 174cd); is within one of the two or more marker detection areas , and
one or more of the two or more marker detection areas (170abcd, 171cd, 172cd, 173cd, 174cd) if the angular arrangement (180, 190) with respect to the magnetic dipole suppressing the determination of the magnetic field vector of
method including.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL2024545 | 2019-12-20 | ||
NL2024545A NL2024545B1 (en) | 2019-12-20 | 2019-12-20 | Magnetic field probe for determining an angular disposition of an implantable marker |
PCT/IB2020/062259 WO2021124300A1 (en) | 2019-12-20 | 2020-12-20 | Magnetic field probe for determining a disposition of an implantable marker using two or more detection zones |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2023507658A JP2023507658A (en) | 2023-02-24 |
JPWO2021124300A5 true JPWO2021124300A5 (en) | 2023-12-21 |
Family
ID=69156479
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022538194A Pending JP2023507658A (en) | 2019-12-20 | 2020-12-20 | Magnetic field probe for determining placement of implantable markers using two or more detection zones |
Country Status (7)
Country | Link |
---|---|
US (1) | US11672615B2 (en) |
EP (1) | EP4090280A1 (en) |
JP (1) | JP2023507658A (en) |
CN (1) | CN115038403A (en) |
CA (1) | CA3162504A1 (en) |
NL (1) | NL2024545B1 (en) |
WO (1) | WO2021124300A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114403925A (en) * | 2022-01-21 | 2022-04-29 | 山东黄金职业病防治院 | Breast cancer ultrasonic detection system |
WO2024042365A1 (en) * | 2022-08-23 | 2024-02-29 | Molli Surgical Inc. | Sensor optimization to identify location and orientation of anisotropic magnet field from a permanent magnet |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6129668A (en) * | 1997-05-08 | 2000-10-10 | Lucent Medical Systems, Inc. | System and method to determine the location and orientation of an indwelling medical device |
US7561051B1 (en) * | 2005-04-20 | 2009-07-14 | Creare Inc. | Magnet locating apparatus and method of locating a magnet using such apparatus |
WO2016032910A1 (en) * | 2014-08-24 | 2016-03-03 | Health Beacons, Inc. | Probe for determining magnetic marker locations |
JP2019535339A (en) * | 2016-09-09 | 2019-12-12 | サニーブルック リサーチ インスティテュート | System and method for localization and imaging of magnetic potential lesions |
GB2582123B (en) * | 2018-01-25 | 2021-04-28 | Endomagnetics Ltd | Systems and methods for detecting magnetic markers for surgical guidance |
NL2022093B1 (en) | 2018-11-29 | 2020-06-26 | Sirius Medical Systems B V | The present disclosure relates to a magnetic field probe for determining a disposition of an implantable magnetic marker, a detection unit comprising the probe and a method of detecting the disposition of an implantable magnetic marker. |
-
2019
- 2019-12-20 NL NL2024545A patent/NL2024545B1/en active
-
2020
- 2020-12-20 EP EP20845618.6A patent/EP4090280A1/en active Pending
- 2020-12-20 JP JP2022538194A patent/JP2023507658A/en active Pending
- 2020-12-20 WO PCT/IB2020/062259 patent/WO2021124300A1/en unknown
- 2020-12-20 CN CN202080095128.4A patent/CN115038403A/en active Pending
- 2020-12-20 CA CA3162504A patent/CA3162504A1/en active Pending
-
2022
- 2022-06-15 US US17/841,212 patent/US11672615B2/en active Active
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