JPWO2021014697A1 - - Google Patents

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Publication number
JPWO2021014697A1
JPWO2021014697A1 JP2021534540A JP2021534540A JPWO2021014697A1 JP WO2021014697 A1 JPWO2021014697 A1 JP WO2021014697A1 JP 2021534540 A JP2021534540 A JP 2021534540A JP 2021534540 A JP2021534540 A JP 2021534540A JP WO2021014697 A1 JPWO2021014697 A1 JP WO2021014697A1
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JP
Japan
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JP2021534540A
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Japanese (ja)
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JP7242859B2 (en
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
JP2021534540A 2019-07-23 2020-04-10 Sample testing device, method of operating sample testing device, operating program for sample testing device Active JP7242859B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019135272 2019-07-23
JP2019135272 2019-07-23
PCT/JP2020/016058 WO2021014697A1 (en) 2019-07-23 2020-04-10 Specimen inspection device, operation method of specimen inspection apparatus, and operation program of specimen inspection apparatus

Publications (2)

Publication Number Publication Date
JPWO2021014697A1 true JPWO2021014697A1 (en) 2021-01-28
JP7242859B2 JP7242859B2 (en) 2023-03-20

Family

ID=74194089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021534540A Active JP7242859B2 (en) 2019-07-23 2020-04-10 Sample testing device, method of operating sample testing device, operating program for sample testing device

Country Status (2)

Country Link
JP (1) JP7242859B2 (en)
WO (1) WO2021014697A1 (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007303884A (en) * 2006-05-09 2007-11-22 Olympus Corp Autoanalyzer
JP2010151672A (en) * 2008-12-25 2010-07-08 Beckman Coulter Inc Automatic analyzer
JP2013076624A (en) * 2011-09-30 2013-04-25 Sysmex Corp Specimen processing apparatus
JP2013076619A (en) * 2011-09-30 2013-04-25 Sysmex Corp Specimen analyzer and computer program
JP2014089129A (en) * 2012-10-30 2014-05-15 Sysmex Corp Specimen analyzer
JP2019045446A (en) * 2017-09-07 2019-03-22 株式会社日立ハイテクノロジーズ Automatic analyzer

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007303884A (en) * 2006-05-09 2007-11-22 Olympus Corp Autoanalyzer
JP2010151672A (en) * 2008-12-25 2010-07-08 Beckman Coulter Inc Automatic analyzer
JP2013076624A (en) * 2011-09-30 2013-04-25 Sysmex Corp Specimen processing apparatus
JP2013076619A (en) * 2011-09-30 2013-04-25 Sysmex Corp Specimen analyzer and computer program
JP2014089129A (en) * 2012-10-30 2014-05-15 Sysmex Corp Specimen analyzer
JP2019045446A (en) * 2017-09-07 2019-03-22 株式会社日立ハイテクノロジーズ Automatic analyzer

Also Published As

Publication number Publication date
WO2021014697A1 (en) 2021-01-28
JP7242859B2 (en) 2023-03-20

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