JPWO2020255399A1 - - Google Patents

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Publication number
JPWO2020255399A1
JPWO2020255399A1 JP2021528617A JP2021528617A JPWO2020255399A1 JP WO2020255399 A1 JPWO2020255399 A1 JP WO2020255399A1 JP 2021528617 A JP2021528617 A JP 2021528617A JP 2021528617 A JP2021528617 A JP 2021528617A JP WO2020255399 A1 JPWO2020255399 A1 JP WO2020255399A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021528617A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2020255399A1 publication Critical patent/JPWO2020255399A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/043—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H01L27/14627—Microlenses
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H04N13/207—Image signal generators using stereoscopic image cameras using a single 2D image sensor
    • H04N13/232—Image signal generators using stereoscopic image cameras using a single 2D image sensor using fly-eye lenses, e.g. arrangements of circular lenses
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/95—Computational photography systems, e.g. light-field imaging systems
    • H04N23/957—Light-field or plenoptic cameras or camera modules
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/47—Image sensors with pixel address output; Event-driven image sensors; Selection of pixels to be read out based on image data
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2200/00—Indexing scheme for image data processing or generation, in general
    • G06T2200/04—Indexing scheme for image data processing or generation, in general involving 3D image data
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G06T2207/10012—Stereo images
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N2013/0074—Stereoscopic image analysis
    • H04N2013/0081—Depth or disparity estimation from stereoscopic image signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Power Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computing Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2021528617A 2019-06-21 2019-06-21 Pending JPWO2020255399A1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/024797 WO2020255399A1 (ja) 2019-06-21 2019-06-21 位置検出システム、画像処理装置、位置検出方法および位置検出プログラム

Publications (1)

Publication Number Publication Date
JPWO2020255399A1 true JPWO2020255399A1 (ja) 2020-12-24

Family

ID=74040444

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021528617A Pending JPWO2020255399A1 (ja) 2019-06-21 2019-06-21

Country Status (6)

Country Link
US (1) US20220222845A1 (ja)
EP (1) EP3988893A4 (ja)
JP (1) JPWO2020255399A1 (ja)
KR (1) KR20220023979A (ja)
CN (1) CN113994168A (ja)
WO (1) WO2020255399A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023188183A1 (ja) * 2022-03-30 2023-10-05 株式会社ソニー・インタラクティブエンタテインメント 情報処理装置、システム、情報処理方法、情報処理プログラム、およびコンピュータシステム
US20240040274A1 (en) * 2022-07-28 2024-02-01 Summer Robotics, Inc. Folded single sensor 3-d capture system

Citations (9)

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JP2011099779A (ja) * 2009-11-06 2011-05-19 Ricoh Co Ltd 距離画像取得装置及び距離画像取得処理方法
JP2017519440A (ja) * 2014-06-11 2017-07-13 オリンパス株式会社 深度推定のための画像センサ
JP2017520134A (ja) * 2014-04-07 2017-07-20 サムスン エレクトロニクス カンパニー リミテッド 光学的イベントを感知する方法とそのための光学的イベントセンサ、及び距離測定モバイル装置
US20170223332A1 (en) * 2016-01-29 2017-08-03 Samsung Electronics Co., Ltd. Method and apparatus for acquiring image disparity
JP2017533497A (ja) * 2014-09-16 2017-11-09 クゥアルコム・インコーポレイテッドＱｕａｌｃｏｍｍ Ｉｎｃｏｒｐｏｒａｔｅｄ イベントベースダウンサンプリング
JP2018509030A (ja) * 2015-01-16 2018-03-29 クゥアルコム・インコーポレイテッドＱｕａｌｃｏｍｍ Ｉｎｃｏｒｐｏｒａｔｅｄ 撮像デバイスの視野における物体の奥行きによってトリガされるイベント
WO2018141414A1 (en) * 2017-02-06 2018-08-09 Photonic Sensors & Algorithms, S.L. Device and method for obtaining depth information from a scene
WO2019012660A1 (ja) * 2017-07-13 2019-01-17 オリンパス株式会社 画像処理装置およびライトフィールド撮像装置
JP2019092145A (ja) * 2017-11-16 2019-06-13 采▲ぎょく▼科技股▲ふん▼有限公司ＶｉｓＥｒａ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｃｏｍｐａｎｙ Ｌｉｍｉｔｅｄ シフトされたマイクロレンズアレイを有するイメージセンサ

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JPH08280864A (ja) * 1995-04-12 1996-10-29 Fuji Heavy Ind Ltd 球技練習機
KR101880998B1 (ko) 2011-10-14 2018-07-24 삼성전자주식회사 이벤트 기반 비전 센서를 이용한 동작 인식 장치 및 방법
US10057498B1 (en) * 2013-03-15 2018-08-21 Cognex Corporation Light field vision system camera and methods for using the same
US10863098B2 (en) * 2013-06-20 2020-12-08 Microsoft Technology Licensing. LLC Multimodal image sensing for region of interest capture
JP2015084089A (ja) * 2013-09-19 2015-04-30 株式会社東芝 固体撮像素子用のマイクロレンズアレイ、固体撮像素子、撮像装置およびレンズユニット
CN104864849B (zh) * 2014-02-24 2017-12-26 电信科学技术研究院 视觉导航方法和装置以及机器人
JP6648411B2 (ja) * 2014-05-19 2020-02-14 株式会社リコー 処理装置、処理システム、処理プログラム及び処理方法
JP2016001464A (ja) * 2014-05-19 2016-01-07 株式会社リコー 処理装置、処理システム、処理プログラム、及び、処理方法
EP3213053B1 (en) * 2014-12-23 2019-08-28 Apple Inc. Optical inspection system and method including accounting for variations of optical path length within a sample
EP3104595A1 (en) * 2015-06-08 2016-12-14 Thomson Licensing Light field imaging device
CN105807550B (zh) * 2016-03-02 2019-04-23 深圳大学 反演超高速成像方法
US20180146149A1 (en) 2016-11-21 2018-05-24 Samsung Electronics Co., Ltd. Event-based sensor, user device including the same, and operation method of the same
CN107302695A (zh) * 2017-05-31 2017-10-27 天津大学 一种基于仿生视觉机理的电子复眼系统
AU2018278515A1 (en) * 2017-05-31 2019-12-19 Monash University An imaging method and apparatus
US10706564B2 (en) * 2018-04-11 2020-07-07 Wisconsin Alumni Research Foundation Systems, methods, and media for determining object motion in three dimensions from light field image data
US11143879B2 (en) * 2018-05-25 2021-10-12 Samsung Electronics Co., Ltd. Semi-dense depth estimation from a dynamic vision sensor (DVS) stereo pair and a pulsed speckle pattern projector

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011099779A (ja) * 2009-11-06 2011-05-19 Ricoh Co Ltd 距離画像取得装置及び距離画像取得処理方法
JP2017520134A (ja) * 2014-04-07 2017-07-20 サムスン エレクトロニクス カンパニー リミテッド 光学的イベントを感知する方法とそのための光学的イベントセンサ、及び距離測定モバイル装置
JP2017519440A (ja) * 2014-06-11 2017-07-13 オリンパス株式会社 深度推定のための画像センサ
JP2017533497A (ja) * 2014-09-16 2017-11-09 クゥアルコム・インコーポレイテッドＱｕａｌｃｏｍｍ Ｉｎｃｏｒｐｏｒａｔｅｄ イベントベースダウンサンプリング
JP2018509030A (ja) * 2015-01-16 2018-03-29 クゥアルコム・インコーポレイテッドＱｕａｌｃｏｍｍ Ｉｎｃｏｒｐｏｒａｔｅｄ 撮像デバイスの視野における物体の奥行きによってトリガされるイベント
US20170223332A1 (en) * 2016-01-29 2017-08-03 Samsung Electronics Co., Ltd. Method and apparatus for acquiring image disparity
WO2018141414A1 (en) * 2017-02-06 2018-08-09 Photonic Sensors & Algorithms, S.L. Device and method for obtaining depth information from a scene
WO2019012660A1 (ja) * 2017-07-13 2019-01-17 オリンパス株式会社 画像処理装置およびライトフィールド撮像装置
JP2019092145A (ja) * 2017-11-16 2019-06-13 采▲ぎょく▼科技股▲ふん▼有限公司ＶｉｓＥｒａ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｃｏｍｐａｎｙ Ｌｉｍｉｔｅｄ シフトされたマイクロレンズアレイを有するイメージセンサ

Also Published As

Publication number Publication date
EP3988893A1 (en) 2022-04-27
EP3988893A4 (en) 2023-01-11
KR20220023979A (ko) 2022-03-03
CN113994168A (zh) 2022-01-28
US20220222845A1 (en) 2022-07-14
WO2020255399A1 (ja) 2020-12-24

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