JPWO2020250280A1 - - Google Patents

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Publication number
JPWO2020250280A1
JPWO2020250280A1 JP2021525421A JP2021525421A JPWO2020250280A1 JP WO2020250280 A1 JPWO2020250280 A1 JP WO2020250280A1 JP 2021525421 A JP2021525421 A JP 2021525421A JP 2021525421 A JP2021525421 A JP 2021525421A JP WO2020250280 A1 JPWO2020250280 A1 JP WO2020250280A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021525421A
Other versions
JPWO2020250280A5 (ja
JP7180772B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Publication of JPWO2020250280A1 publication Critical patent/JPWO2020250280A1/ja
Publication of JPWO2020250280A5 publication Critical patent/JPWO2020250280A5/ja
Application granted granted Critical
Publication of JP7180772B2 publication Critical patent/JP7180772B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267—Fault communication, e.g. human machine interface [HMI]
    • G05B23/0272—Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Human Computer Interaction (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2021525421A 2019-06-10 2019-06-10 監視方法、監視装置、記録媒体 Active JP7180772B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/022956 WO2020250280A1 (ja) 2019-06-10 2019-06-10 監視方法、監視装置、記録媒体

Publications (3)

Publication Number Publication Date
JPWO2020250280A1 true JPWO2020250280A1 (ja) 2020-12-17
JPWO2020250280A5 JPWO2020250280A5 (ja) 2022-02-28
JP7180772B2 JP7180772B2 (ja) 2022-11-30

Family

ID=73781009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021525421A Active JP7180772B2 (ja) 2019-06-10 2019-06-10 監視方法、監視装置、記録媒体

Country Status (3)

Country Link
US (1) US20220334576A1 (ja)
JP (1) JP7180772B2 (ja)
WO (1) WO2020250280A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7506960B2 (ja) 2021-06-02 2024-06-27 株式会社Tmeic データ管理装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003132088A (ja) * 2001-10-22 2003-05-09 Toshiba Corp 時系列データ検索システム
JP2015225637A (ja) * 2014-05-30 2015-12-14 アズビル株式会社 相関分析装置、相関分析方法、および相関分析用プログラム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6613175B2 (ja) * 2016-03-03 2019-11-27 株式会社日立製作所 異常検出装置、系統安定度監視装置、及びそのシステム

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003132088A (ja) * 2001-10-22 2003-05-09 Toshiba Corp 時系列データ検索システム
JP2015225637A (ja) * 2014-05-30 2015-12-14 アズビル株式会社 相関分析装置、相関分析方法、および相関分析用プログラム

Also Published As

Publication number Publication date
US20220334576A1 (en) 2022-10-20
JP7180772B2 (ja) 2022-11-30
WO2020250280A1 (ja) 2020-12-17

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