JPWO2020205952A5 - - Google Patents
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- JPWO2020205952A5 JPWO2020205952A5 JP2021559237A JP2021559237A JPWO2020205952A5 JP WO2020205952 A5 JPWO2020205952 A5 JP WO2020205952A5 JP 2021559237 A JP2021559237 A JP 2021559237A JP 2021559237 A JP2021559237 A JP 2021559237A JP WO2020205952 A5 JPWO2020205952 A5 JP WO2020205952A5
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顕微鏡の対物レンズを通って出射された光ビームの干渉によって、複数の点の各々において生成された第1の収束フリンジパターンで、前記試料の前記複数の点を照明することを含み、
前記第1の収束フリンジパターンに対して、前記顕微鏡の対物レンズの第1の別個の照明領域は第1の回転軸を有し、前記光ビームの位相は、第1の位相だけお互いに対してシフトされ、
前記方法が、前記複数の点を少なくとも1つの異なる収束フリンジパターンで照明することをさらに含み、前記光ビームは、前記第1の位相に対して、異なる位相だけ互いに対して位相がシフトされ、(i)前記顕微鏡の対物レンズの同一の別個の照明領域は、前記第1の回転軸に対して角度付けられていない同一の回転軸を有するか、または、(ii)前記顕微鏡の対物レンズの異なる別個の照明領域は、前記第1の回転軸に対して角度付けられている異なる回転軸を有し、
前記別個の照明領域の一方または双方が、非円形である、方法。 A method of imaging a sample, comprising:
illuminating the plurality of points of the sample with a first converging fringe pattern produced at each of the plurality of points by interference of light beams emitted through a microscope objective;
For said first converging fringe pattern, a first discrete illumination area of said microscope objective lens has a first axis of rotation and said light beams are phased with respect to each other by a first phase. shifted and
The method further comprises illuminating the plurality of points with at least one different converging fringe pattern, wherein the light beams are phase shifted with respect to each other by different phases relative to the first phase, and ( i) the same separate illumination areas of the microscope objective have the same axis of rotation that is not angled with respect to the first axis of rotation; or (ii) different illumination areas of the microscope objective. separate illumination areas having different axes of rotation angled with respect to the first axis of rotation;
The method, wherein one or both of the discrete illumination areas are non-circular.
前記第1の収束フリンジパターンおよび前記少なくとも1つの異なる収束フリンジパターンの各々に対して、
iは、回転軸角度に対応する指数であり、
jは、前記光ビームのお互いに対しての位相シフトに対応する指数であり、
Irawi、jは、前記回転軸角度に対応する指数iおよび前記位相シフトに対応する指数jを有する、前記複数の生画像の各々に対する前記照明データであり、
Aは、収束フリンジパターンのコントラストを表す係数であり、
phaseは、前記位相シフトである、請求項2に記載の方法。 further comprising reconstructing a super-resolution composite image from the illumination data for each of the plurality of raw images according to the formula:
for each of the first converging fringe pattern and the at least one different converging fringe pattern;
i is an index corresponding to the rotation axis angle,
j is an index corresponding to the phase shift of the light beams with respect to each other;
Irawi,j is the illumination data for each of the plurality of raw images, with index i corresponding to the axis of rotation angle and index j corresponding to the phase shift;
A is a coefficient representing the contrast of the converging fringe pattern,
3. The method of claim 2, wherein phase is the phase shift.
前記光ビームが前記第1の位相と実質的に同一である第3の位相だけシフトされており、かつ、第3の別個の照明領域が前記第1の回転軸および前記第2の回転軸に対して角度付けられている第3の回転軸を有する、第3の収束フリンジパターンをさらに含む、請求項11に記載の方法。 The at least one different converging fringe pattern is
wherein the light beam is shifted by a third phase that is substantially the same as the first phase, and a third separate illumination area is aligned with the first axis of rotation and the second axis of rotation; 12. The method of claim 11, further comprising a third converging fringe pattern having a third axis of rotation that is angled relative to.
前記光ビームが前記第2の位相と実質的に同一である第4の位相だけシフトされており、かつ、第4の別個の照明領域が前記第3の回転軸に対して角度付けられていない第4の回転軸をさらに含む、請求項12に記載の方法。 The at least one different converging fringe pattern is
the light beam is shifted by a fourth phase that is substantially the same as the second phase, and a fourth discrete illumination area is not angled with respect to the third axis of rotation 13. The method of claim 12, further comprising a fourth axis of rotation.
前記光ビームが前記第1の位相および前記第3の位相と実質的に同一である第5の位相だけシフトし、かつ、第5の別個の照明領域が前記第1、第2、第3、および第4の回転軸に対して角度を有する第5の回転軸を有する、第5の収束フリンジパターンと、
前記光ビームが前記第2の位相および前記第4の位相と実質的に同一である第6の位相だけシフトされ、かつ、第6の別個の照明領域が前記第5に対して角度を有さない第6の回転軸を有する、第6の収束フリンジパターンと、を含む、請求項13に記載の方法。 The at least one different converging fringe pattern is
wherein the light beam is shifted by a fifth phase substantially identical to the first phase and the third phase, and a fifth separate illumination area is shifted from the first, second, third, and a fifth converging fringe pattern having a fifth axis of rotation angled with respect to the fourth axis of rotation;
the light beam is shifted by a sixth phase substantially identical to the second phase and the fourth phase, and a sixth separate illumination area is angled with respect to the fifth; 14. The method of claim 13, comprising a sixth converging fringe pattern having a non-zero sixth axis of rotation.
複数の生画像の各々の照明データを取得することを含み、前記生画像の各々は、1組の収束フリンジパターンの所与の1つに対応し、前記収束フリンジパターンの各々は、顕微鏡の対物レンズを通って出射される一対の光ビームの干渉によって生成され、前記試料の複数の点を照明し、
前記収束フリンジパターンの組は、(i)前記光ビームがシフトされたX位相と、(ii)前記光ビームの回転軸が向けられたY角度と、の組み合わせであるXおよびY構成要素を含み、前記組は、Xの2つの異なる値以下であり、
前記一対の光ビームの光ビームは、前記収束フリンジパターンの少なくとも1つに対して、前記顕微鏡の対物レンズの非円形な照明領域を照明する、方法。 A method of imaging a sample, comprising:
acquiring illumination data for each of a plurality of raw images, each of said raw images corresponding to a given one of a set of converging fringe patterns, each of said converging fringe patterns corresponding to a microscope objective; produced by the interference of a pair of light beams emitted through a lens to illuminate a plurality of points on the sample;
The set of converging fringe patterns includes an X and Y component that is a combination of (i) the X phase at which the light beam is shifted and (ii) the Y angle at which the axis of rotation of the light beam is oriented. , the set is less than or equal to two different values of X;
The method of claim 1, wherein the light beams of the pair of light beams illuminate a non-circular illumination area of the microscope objective lens for at least one of the converging fringe patterns.
Applications Claiming Priority (3)
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US201962827921P | 2019-04-02 | 2019-04-02 | |
US62/827,921 | 2019-04-02 | ||
PCT/US2020/026143 WO2020205952A1 (en) | 2019-04-02 | 2020-04-01 | Enhanced sample imaging using structured illumination microscopy |
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JP2022527827A JP2022527827A (en) | 2022-06-06 |
JPWO2020205952A5 true JPWO2020205952A5 (en) | 2023-03-03 |
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US (1) | US11604341B2 (en) |
EP (1) | EP3948237B1 (en) |
JP (1) | JP2022527827A (en) |
CN (1) | CN113711014A (en) |
WO (1) | WO2020205952A1 (en) |
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CN115297765A (en) | 2020-02-19 | 2022-11-04 | 热电科学仪器有限公司 | Structured illuminated phase mask |
DE102020123668A1 (en) * | 2020-09-10 | 2022-03-10 | Carl Zeiss Microscopy Gmbh | Methods for image evaluation for SIM microscopy and SIM microscopy methods |
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- 2020-04-01 JP JP2021559237A patent/JP2022527827A/en active Pending
- 2020-04-01 WO PCT/US2020/026143 patent/WO2020205952A1/en unknown
- 2020-04-01 CN CN202080027237.2A patent/CN113711014A/en active Pending
- 2020-04-01 US US16/837,512 patent/US11604341B2/en active Active
- 2020-04-01 EP EP20783460.7A patent/EP3948237B1/en active Active
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