JPWO2020184474A1 - - Google Patents

Info

Publication number
JPWO2020184474A1
JPWO2020184474A1 JP2021505046A JP2021505046A JPWO2020184474A1 JP WO2020184474 A1 JPWO2020184474 A1 JP WO2020184474A1 JP 2021505046 A JP2021505046 A JP 2021505046A JP 2021505046 A JP2021505046 A JP 2021505046A JP WO2020184474 A1 JPWO2020184474 A1 JP WO2020184474A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021505046A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2020184474A1 publication Critical patent/JPWO2020184474A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13Stabilisation of laser output parameters, e.g. frequency or amplitude

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2021505046A 2019-03-08 2020-03-06 Pending JPWO2020184474A1 (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201962815474P 2019-03-08 2019-03-08
JP2019151601 2019-08-21
PCT/JP2020/009829 WO2020184474A1 (ja) 2019-03-08 2020-03-06 分析装置

Publications (1)

Publication Number Publication Date
JPWO2020184474A1 true JPWO2020184474A1 (zh) 2020-09-17

Family

ID=72426361

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021505046A Pending JPWO2020184474A1 (zh) 2019-03-08 2020-03-06

Country Status (2)

Country Link
JP (1) JPWO2020184474A1 (zh)
WO (1) WO2020184474A1 (zh)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003168841A (ja) * 2001-11-29 2003-06-13 Japan Science & Technology Corp 共振器及びレーザの安定化装置
US8736845B2 (en) * 2011-05-24 2014-05-27 Honeywell International Inc. Frequency stabilized laser system
WO2013148757A1 (en) * 2012-03-29 2013-10-03 Imra America, Inc. Methods for precision optical frequency synthesis and molecular detection
KR102243474B1 (ko) * 2014-01-24 2021-04-21 캘리포니아 인스티튜트 오브 테크놀로지 듀얼-주파수 광학 소스
GB2536187B (en) * 2014-12-02 2017-08-30 Qrometric Ltd Spectroscopic apparatus for measuring an amount of an analyte in a mixture using a frequency-modulated laser beam
CN105067565B (zh) * 2015-08-28 2017-12-19 清华大学 一种基于飞秒光频梳的激光腔衰荡气体光谱测量系统
US20200033256A1 (en) * 2017-01-20 2020-01-30 Sekisui Medical Co., Ltd. Carbon isotope analysis device and carbon isotope analysis method

Also Published As

Publication number Publication date
WO2020184474A1 (ja) 2020-09-17

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