JPWO2020054381A1 - Data output device for surface characteristic measurement and surface characteristic measurement device - Google Patents

Abstract

When a single illumination display device (1) capable of displaying at least one or more illumination patterns and the measurement target portion (100a) of the measurement object (100) are irradiated with illumination light from the illumination pattern. It is a two-dimensional photoelectric conversion element (3) that receives the reflected light from the measured part for each pixel, converts it into image data, and outputs it. The image data has the reflection angle characteristic of each pixel of the measured part. The photoelectric conversion element (3) used for measuring the dependent parameters is provided, and the illumination display device (1) and the photoelectric conversion element (3) are such that the photoelectric conversion element (3) is the part to be measured (3). They are arranged in a positional relationship in which the reflected light in the substantially normal reflection direction from 100a) can be received.

Description

The present invention uses, for example, a coated portion containing flaky aluminum pieces or mica pieces called a bright material as a measurement portion, and outputs data for measuring surface characteristics used for measuring parameters depending on the reflection angle characteristics thereof. The present invention relates to an apparatus and a surface characteristic measuring apparatus.

Since the colors of paints containing bright materials as described above appear to differ depending on the observation angle, they are widely used as metallic paints or pearl paints for various industrial products such as automobiles that require design. Has been done.

Conventionally, in order to capture the evaluation of the characteristics of such metallic coating or pearl coating as a texture other than color, Patent Document 1 illuminates the object to be measured from a specific direction or diffuses it from all directions, and reflects light. Is received by a two-dimensional sensor and the reflected image is analyzed to quantify the brilliance and particle sensation of the object to be measured, which is expressed by the brilliant material contained in the automobile paint.

Further, Patent Document 2 proposes a method of inspecting defects such as scratches and bumps on the surface by projecting a two-dimensional light-dark fringe pattern onto an object to be measured and analyzing the reflected image two-dimensionally. ing.

Japanese Unexamined Patent Publication No. 2006-208327 Japanese Unexamined Patent Publication No. 2008-224341

However, in the technique described in Patent Document 1, since the area to be measured is irradiated with a plurality of independent illuminations in specific directions or diffused illumination, there is a concern that the apparatus may be complicated.

Moreover, since the measurement is not performed in the specular reflection direction, the optical characteristics are sufficient when physical properties such as high brightness and high saturation are exhibited only in the vicinity of specular reflection, such as pigments with high design these days. It cannot be captured and no correlation with the visual impression can be obtained, or the orientation distribution of the bright material is concentrated in the horizontal direction of the coating film, and the reflected light reaches the vicinity of specular reflection, but the reflected light is captured. There are problems such as being unable to perform high-precision measurement.

Explaining this point in more detail, as shown in FIG. 21, a typical layer structure of a painted automobile surface containing a bright material is a base layer 200 which is a base material, and a bright material-containing layer 201 is laminated. The clear coat layer 202 is further laminated on the clear coat layer 202. Consider an optical model that measures the reflection characteristics of this layered structure. Here, a general resin such as acrylic or urethane is assumed as the clear coat layer 202, and the refractive index is defined as n≈1.4 together with the glitter material-containing layer 201.

When a light beam is incident on the normal line of the coating film at 45 degrees, a part of the incident light L11 is specularly reflected on the surface of the clear coat layer 202, and a part is refracted on the boundary surface of the surface of the clear coat layer 202 to be inside. Enter. A part of the light entering the coating film is specularly reflected by the bright material 203 inside the coating film, and the rest is diffusely reflected inside the coating film.

The bright material 203 in the coating film exists in a state of having a constant inclination (orientation). The orientation distribution generally has a peak in the horizontal direction (0 degree direction) of the coating film surface, and is represented by, for example, a Gaussian distribution having a finite half width. The specularly reflected light L12 corresponding to the orientation of the bright material 203 is rerefracted at the interface between the surface of the clear coat layer 202 and the air and emitted.

At this time, the orientation angle θ1 of the bright material 203 and the angle θ2 of the reflected light of the bright material in air (denoted as AS angle in FIG. 21) are in the relationship shown in the graph of FIG. In the technique described in Patent Document 1, since the sensor exists only at | θ2 | ≧ 15 degrees, when converted from the graph of FIG. 22 to the orientation angle of the bright material 203, it becomes | θ1 | ≧ 5 degrees, and the orientation distribution of the bright material 203. Is concentrated in the direction of 0 degrees, but there is a problem that information in the vicinity of specular reflection cannot be captured.

The technique described in Patent Document 2 is a technique for inspecting defects such as scratches and bumps on the surface of the object to be measured, and is not a technique for evaluating the brilliance and graininess of the object to be measured. The problem of Document 1 cannot be solved.

The present invention has been made in view of such a technical background, and the bright material in which the orientation distribution is concentrated in the horizontal direction of the coating film is dispersed without causing the complexity of the apparatus. Provided is a surface characteristic measurement data output device and a surface characteristic measurement device that can output data for enabling highly accurate measurement of parameters depending on reflection angle characteristics for a part to be measured such as a painted surface. The purpose is to do.

The above object is achieved by the following means.
(1) A single illumination display device capable of displaying at least one or more illumination patterns and the illumination pattern displayed on the illumination display device irradiate the measured portion of the object to be measured with illumination light. It is a two-dimensional photoelectric conversion element that receives the reflected light from the measured portion at that time for each pixel, converts it into image data, and outputs the image data. The image data is the reflection angle of each pixel of the measured portion. A photoelectric conversion element used for measuring a parameter depending on a characteristic is provided, and the illumination display device and the photoelectric conversion element are such that the photoelectric conversion element is in a substantially normal reflection direction from the measured portion. A data output device for measuring surface characteristics that is arranged in a positional relationship that can receive reflected light.
(2) The illumination pattern that can be displayed on the illumination display device is a pattern in which a specific illumination display moves in one direction or a plurality of directions, and the photoelectric conversion element moves the specific illumination display. The data output device for surface characteristic measurement according to item 1 above, which receives reflected light each time, converts it into image data, and outputs it.
(3) The data output device for surface characteristic measurement according to item 2 above, wherein the specific lighting display has a cross-sectional intensity distribution represented by a square wave.
(4) The data output device for measuring surface characteristics according to item 2 above, wherein the specific lighting display has a cross-sectional intensity distribution represented by a triangular wave.
(5) The data output device for surface characteristic measurement according to item 2 above, wherein the specific lighting display has a sine wave, a cosine wave, or a cross-sectional intensity distribution indicated by a part thereof.
(6) The data output device for surface characteristic measurement according to any one of items 2 to 5 above, wherein the movement of the specific lighting display is a movement in which a dark line does not occur between the displays before and after the movement.
(7) The data output device for surface characteristic measurement according to item 1 above, wherein the illumination pattern is a structured pattern having a cross-sectional intensity distribution shown by a waveform that changes at regular intervals.
(8) The data output device for measuring surface characteristics according to item 7 above, wherein the waveform that changes at a fixed cycle is a sine wave or a cosine wave.
(9) The illumination display device displays the cross-sectional intensity distribution in the structured pattern in different phases a plurality of times, and the photoelectric conversion element receives reflected light for each display in different phases and converts it into image data. The data output device for surface characteristic measurement according to item 7 or 8 above, which is converted and output.
(10) The illumination display device displays the cross-sectional intensity distribution in the structured pattern at different frequencies a plurality of times, and the photoelectric conversion element receives reflected light for each display at different frequencies and converts it into image data. The data output device for surface characteristic measurement according to any one of items 7 to 9 above, which is converted and output.
(11) The data output device for measuring surface characteristics according to any one of items 1 to 10 above, wherein the photoelectric conversion element has a spatial resolution of 10 to 100 μm.
(12) The surface characteristic measurement according to any one of the above items 1 to 11, wherein the portion to be measured of the object to be measured is a painted portion containing a bright material, and the reflection angle characteristic is the reflection angle characteristic of the bright material. Data output device.
(13) The data for measuring surface characteristics according to item 12 above, wherein the parameter depending on the reflection angle characteristic includes at least one of information on the brightness, chromaticity, light distribution characteristic, particle size, and dispersion aggregation of the bright material. Output device.
(14) The data output device for measuring surface characteristics according to item 13 above, wherein the light distribution characteristics are measured based on reflection angle characteristics in two orthogonal directions.
(15) The illumination display device individually displays the illumination pattern in different colors, and the photoelectric conversion element receives reflected light for each color, converts it into image data and outputs it, and outputs each output color. The data output device for surface characteristic measurement according to any one of the above items 1 to 14, wherein the color information or the spectral information of the part to be measured is measured based on the image data of the above item.
(16) A plurality of filters having different spectral transmission rates are provided, and the photoelectric conversion element receives the reflected light through each filter, converts the reflected light into image data for each filter, outputs the data, and outputs the data. The data output device for measuring surface characteristics according to any one of items 1 to 14 above, wherein the color information or spectral information of the part to be measured is measured based on the image data of each filter.
(17) The data output device for surface characteristic measurement according to item 16 above, wherein the plurality of filters have spectral transmittances corresponding to the color matching functions x (λ), y (λ), and z (λ). ..
(18) Based on the surface characteristic measurement data output device according to any one of the preceding items 1 to 17 and the image data output from the output device, it depends on the reflection angle characteristic of each pixel of the measurement site. A surface characteristic measuring device including a calculation unit for calculating parameters.
(19) The data output device for measuring surface characteristics is provided in one housing, and the housing is irradiated with illumination light to a portion to be measured of the object to be measured and reflected light from the portion to be measured. The surface characteristic measuring apparatus according to item 18 above, which is provided with an opening for taking in and a result display unit for displaying a calculation result by the calculation unit.
(20) The surface characteristic measuring device according to item 18 or 19 above, wherein the calculation unit is composed of a personal computer.
(21) The surface characteristic measuring apparatus according to any one of items 18 to 20 above, wherein the image data output from the photoelectric conversion element is sent to the calculation unit via a network.

According to the invention described in the preceding paragraph (1), a single illumination display device capable of displaying at least one or more illumination patterns, and illumination light is irradiated from the illumination pattern to the measurement target portion of the measurement object. It is provided with a two-dimensional photoelectric conversion element that receives the reflected light from the part to be measured at that time for each pixel, converts it into image data, and outputs it. The illumination display device and the photoelectric conversion element are the photoelectric conversion elements. Is arranged in a positional relationship in which the reflected light in the substantially normal reflection direction from the measured portion can be received, so that the image data output from the photoelectric conversion element includes the image data in the vicinity of the normal reflection. Become. Therefore, using the image data output from the photoelectric conversion element, it is possible to measure parameters depending on the reflection angle characteristic for the entire portion to be measured including the reflection angle characteristic in the vicinity of specular reflection. As a result, for example, the measurement with high accuracy of the parameter depending on the reflection angle characteristic for each pixel can be performed on the measured portion such as the coated surface in which the bright material whose orientation distribution is concentrated in the horizontal direction of the coating film is dispersed. This makes it possible to obtain measurement results with high visual correlation. Moreover, since a single lighting display device is used, it is possible to suppress the complexity of the configuration of the entire device.

According to the invention described in the preceding paragraph (2), the illumination pattern that can be displayed on the illumination display device is a pattern in which a specific illumination display moves in one direction or a plurality of directions, and the photoelectric conversion element is a specific illumination. By receiving the reflected light each time the display moves, converting it into image data and outputting it, it is possible to output image data for accurately measuring parameters depending on the reflection angle characteristic.

According to the inventions described in the preceding paragraphs (3) to (5), reflection is performed by setting the cross-sectional intensity distribution of the illumination display to a square wave, a triangular wave, a sine wave, a cosine wave, or a part thereof. Image data can be output to accurately measure parameters that depend on angular characteristics.

According to the invention described in the previous section (6), since the movement of the specific illumination display is a movement in which a dark line does not occur between the displays before and after the movement, continuous image data can be obtained, and the area to be measured can be measured. The continuous reflection angle characteristic peculiar to each pixel can be uniquely determined, and image data for more accurately measuring parameters depending on the reflection angle characteristic can be output.

According to the invention described in the previous section (7), since the illumination pattern is a structured pattern having a cross-sectional intensity distribution shown by a waveform that changes at a constant cycle, parameters that depend on the reflection angle characteristics can be measured with high accuracy. Image data can be output.

According to the invention described in the previous section (8), since the waveform that changes at a constant cycle is a sine wave or a cosine wave, it is possible to output image data for accurately measuring parameters depending on the reflection angle characteristic.

According to the invention described in the previous section (9), the illumination display device displays the cross-sectional intensity distribution in the structured pattern in different phases a plurality of times, and the photoelectric conversion element displays the reflected light for each display in different phases. Is received, converted into image data, and output. Therefore, the reflection angle characteristics peculiar to each pixel of the part to be measured can be uniquely determined, and the image data for measuring the parameters depending on the reflection angle characteristics in more detail and with high accuracy can be obtained. Can be output.

According to the invention described in the previous section (10), the illumination display device displays the cross-sectional intensity distribution in the structured pattern at different frequencies a plurality of times, and the photoelectric conversion element displays the reflected light for each display at different frequencies. Is received, converted into image data, and output, so the reflection angle characteristics unique to each pixel of the part to be measured can be uniquely determined, and image data for more accurately measuring parameters that depend on the reflection angle characteristics can be output. ..

According to the invention described in the previous section (11), since the spatial resolution of the photoelectric conversion element is 10 to 100 μm, it is possible to measure realistic reflection angle characteristics suitable for the human eye.

According to the invention described in the previous section (12), it is possible to output image data for measuring a parameter depending on the reflection angle characteristic of the bright material contained in the painted portion.

According to the invention described in the previous section (13), it is possible to output image data for measuring at least one of information on the brightness, chromaticity, light distribution characteristics, particle size, and dispersion aggregation of the bright material.

According to the invention described in the previous section (14), the light distribution characteristic can be measured based on the reflection angle characteristic in two orthogonal directions.

According to the invention described in the preceding paragraph (15), the illumination display device individually displays illumination patterns in different colors and irradiates the area to be measured with color information or spectral information of the area to be measured for each color. Can be measured.

According to the invention described in the previous section (16), the photoelectric conversion element receives the reflected light through the filters having different spectral transmittances, so that the color information or the spectral information of the part to be measured is measured for each filter. can do.

According to the invention described in the previous section (17), information close to the sensitivity of the human eye can be obtained by using a spectral transmittance filter corresponding to the color matching functions x (λ), y (λ), and z (λ). Can be calculated.

According to the invention described in the previous section (18), the calculation unit calculates a parameter depending on the reflection angle characteristic of each pixel of the measured portion by using the image data output from the photoelectric conversion element of the output device. Therefore, for example, on a surface to be measured such as a coated surface in which a bright material whose orientation distribution is concentrated in the horizontal direction of the coating film is dispersed, parameters depending on the reflection angle characteristic can be measured with high accuracy. It becomes a characteristic measuring device.

According to the invention described in the previous section (19), by carrying the housing, parameters depending on the reflection angle characteristic can be measured regardless of the location.

According to the invention described in the previous section (20), a parameter depending on the reflection angle characteristic can be calculated by a personal computer.

According to the invention described in the previous section (21), since the image data output from the photoelectric conversion element is sent to the calculation unit via the network, a parameter depending on the reflection angle characteristic even if the calculation unit is away from the measurement location. Can be measured.

It is a block diagram which shows the structure of the surface characteristic measuring apparatus provided with the surface characteristic measuring data output apparatus which concerns on one Embodiment of this invention. (A) and (B) are diagrams showing how the illumination display having a rectangular wave-shaped cross-sectional intensity distribution displayed on the illumination display device moves. (A) is a diagram schematically showing a state in which the orientations of the bright materials are aligned in the horizontal direction of the coating film surface, and (B) is a diagram schematically showing a state in which the orientations of the bright materials are separated from 0 degrees. (A) to (D) are diagrams schematically showing the state of reflection from the bright material when the illumination display is moved (scanned) in one direction. (A) is a diagram schematically showing a state in which a large number of bright materials having a small particle size are present, and (B) is a diagram schematically showing a state in which a bright material having a large particle size is present. (A) is a diagram schematically showing a state in which the bright materials are dispersed, and (B) is a diagram schematically showing a state in which the bright materials are agglomerated. (A) is a diagram showing how the lighting display having a cross-sectional intensity distribution indicated by a square wave, which is displayed on the lighting display device, moves, and (B) is a direction orthogonal to the moving direction of (A). , It is a figure which shows the state that the display for lighting moves. (A) means that the orientation angle of the bright material in the plane parallel to the scanning direction A can be measured, and (B) means that the bright material in the plane parallel to the scanning direction B orthogonal to the scanning direction A can be measured. It is a figure for demonstrating that the orientation angle can be measured, respectively. (A) to (D) are diagrams schematically showing the state of reflection from the surface of the measurement object when the illumination display is moved (scanned) in one direction. It is a figure which shows another example of the cross-sectional intensity distribution of a display for illumination. It is a figure which shows still another example of the cross-sectional intensity distribution of a display for illumination. It is a figure which shows still another example of the cross-sectional intensity distribution of a display for illumination. (A) shows a basic illumination pattern, and (B) to (D) are diagrams showing a state in which the phase of the cross-sectional intensity distribution of the illumination pattern of (A) is shifted by π / 2. It is a figure for demonstrating the imaging state by a photoelectric conversion element when the object to be measured is a perfect smooth surface which does not contain a bright material. It is a figure for demonstrating the imaging state by a photoelectric conversion element when the object to be measured contains a bright material which has a light distribution distribution. (A) to (C) are explanatory views in the case of illuminating the object to be measured by changing the frequency of the cross-sectional intensity distribution of the basic illumination pattern of FIG. 13 (A). It is a figure which shows the structure of the optical characteristic measuring apparatus which added the filter part for measuring the color information and the spectral information on the light receiving side. It is a figure which shows an example of a filter part schematically. (A) and (B) are diagrams schematically showing other examples of the filter unit. It is a perspective view of the optical characteristic measuring apparatus which concerns on other embodiment of this invention. It is a figure for demonstrating the problem of the prior art. Similarly, it is a figure for demonstrating the problem of the prior art.

Hereinafter, embodiments of the present invention will be described with reference to the drawings.

FIG. 1 is a block diagram showing a configuration of a surface characteristic measuring device provided with a surface characteristic measuring data output device according to an embodiment of the present invention.

The surface characteristic measuring device shown in FIG. 1 includes a single lighting display device 1, an objective lens 2, a two-dimensional photoelectric conversion element 3 including a CCD sensor, a calculation unit 4, a liquid crystal display device, and the like. The measurement result display unit 5 is provided, and the illumination display device 1, the objective lens 2, and the photoelectric conversion element 3 constitute an output device for measuring surface characteristics.

The illumination display device 1 displays at least one illumination pattern, and irradiates the measurement target portion 100a of the measurement object (simply referred to as a sample) 100 with the illumination light L1 from the displayed illumination pattern.

The photoelectric conversion element 3 includes a large number of pixels, receives the reflected light L2 from the sample 100 for each pixel via the objective lens 2, converts it into image data, and outputs the light.

In this embodiment, the illumination display device 1 and the photoelectric conversion element 3 are arranged in a positional relationship in which the photoelectric conversion element 3 can receive the reflected light in the substantially specular reflection direction from the measurement target portion 100a. The substantially specular reflection direction means that not only the reflected light in the specular reflection direction but also the reflected light slightly deviating from the specular reflection direction is allowed. The reason for adopting such an arrangement relationship is that even when physical properties such as high brightness and high saturation are exhibited only in the vicinity of specular reflection because a large number of components in the horizontal direction (0 degree) are present in the measured portion 100a. This is to respond accurately and obtain measurement results with high visual correlation.

For example, when the sample 100 is coated with a bright material, the orientation distribution of the bright material in the coating film generally has a peak in the horizontal direction (0 degree direction) of the coating film surface. This is to accurately capture the information in the vicinity of the specular reflection of such a bright material.

Further, it is desirable that the surface (sample surface) of the portion 100a to be measured in the sample 100 and the photoelectric conversion element 3 have a conjugated relationship.

The image data, which is an electric signal output from the photoelectric conversion element 3, is converted into a digital signal through an IV conversion circuit and an AD conversion circuit (not shown), if necessary, and sent to the calculation unit 4. The calculation unit 4 performs a parameter calculation process depending on the reflection angle characteristic by the CPU or the like using the sent image data, and the measurement result display unit 5 displays the calculation result by the calculation unit 4, that is, the measurement result. The image data output from the photoelectric conversion element 3 may be converted into a digital signal by the calculation unit 4.

The arithmetic unit 4 may be a dedicated device or may be configured by a personal computer. Further, the image data output from the photoelectric conversion element 3 and processed into a digital signal may be sent to the calculation unit 4 via the network. In this case, even if the calculation unit 4 exists at a place distant from the measurement place, the parameter can be measured depending on the reflection angle characteristic.

Next, the spatial resolution of the photoelectric conversion element 3 will be described. In order for the photoelectric conversion element 3 to detect a phenomenon that is visually observed, the photoelectric conversion element 3 needs to have a spatial resolution equivalent to that of the human eye. According to one study, the minimum width that can be distinguished by the human eye is about 0.6 minutes. Assuming that the distance from the pupil to the observed object is 20 to 30 cm, the distance between the two distinguishable points is calculated to be 30 to 50 μm.

Further, assuming that the measurement target is a painted surface containing a bright material for an automobile exterior material, the particle size of the bright material contained in the coating film is about 10 to 20 μm for a small one and about 100 μm for a large one. It is more desirable that the photoelectric conversion element 3 can spatially distinguish each bright material.

From the above, it is desirable that the spatial resolution of the photoelectric conversion element 3 is about 10 to 100 μm.
(Embodiment 1)
Next, the measurement of the parameter depending on the specific reflection angle characteristic will be described.

The reflection angle characteristic is a characteristic at which reflection angle the illumination light L1 is reflected by the measured portion 100a, and is evaluated for each pixel corresponding to the pixels of the photoelectric conversion element 3. In this embodiment, a case where the parameter depending on the reflection angle characteristic is information regarding the light distribution of the bright material (for example, the light distribution angle) will be described.

The illumination display device 1 displays one or more illumination patterns. As an example of the illumination pattern, a pattern in which a specific illumination display moves in one direction or a plurality of directions can be mentioned. In the first embodiment, the specific illumination display has a cross-sectional intensity distribution represented by a rectangular wave with respect to the brightness, and the illumination display is moved to irradiate the measurement target portion 100a of the sample 100 with the illumination light L1. The photoelectric conversion element 3 shows a case where the reflected light L2 from the measurement target portion 100a is received and converted into image data each time the illumination display moves.

FIG. 2 shows a state in which the illumination display 11 having a cross-sectional intensity distribution indicated by a square wave, which is displayed on the illumination display device 1, moves, and FIG. 2 (A) on the upper side shows the display surface of the illumination display device 1. It is the brightness distribution, and the lower figure (B) is the cross-sectional intensity distribution. In the figure (A), the white portion is the illumination display 11 and consists of rectangular bright lines, the black portion is the dark line which is the non-emission region, and the illumination display 11 which is the bright line is A1 → A2 → A3 →. ... → Moves (scans) in order from the width direction of the display surface of the lighting display device 1 (the left-right direction in the figure (A)) to An. The movement is performed so that no dark line is generated between the illumination displays 11 before and after the movement, so that appropriate image data can be obtained over the entire measurement portion 100a, and by extension, for each pixel of the photoelectric conversion element 3. It is desirable because the continuous reflection angle characteristics can be uniquely determined and the parameters depending on the reflection angle characteristics can be measured with high accuracy. Also in this embodiment, the illumination display 11 is moved so that a dark line does not occur between the illumination displays 11 before and after the movement. The front end side of the illumination display 11 before movement and the rear end side of the illumination display 11 after movement may overlap.

Each time the illumination display 11 is moved, the photoelectric conversion element 3 receives the reflected light L2 from the measured portion 100a. The objective lens 2 is designed so that the sample surface and the photoelectric conversion element 3 are conjugate to each other, and the two-dimensional luminance distribution and chromaticity distribution of the sample surface are measured.

A sufficiently high resolution is selected on the sample surface, and each texture structure can be captured in the sample 100 in which each brightening material is contained in the surface coating film such as an automobile exterior material, or in the sample 100 having fine irregularities. It is assumed that there is a sufficient spatial resolution.

In this embodiment, a sample 100 having a surface coated with a brightening material will be described as an example. The bright material in the coating film exists in a state of having a certain inclination (orientation). The orientation distribution generally has a peak in the horizontal direction (0 degree) of the coating film surface, and the number of bright materials decreases as the angle increases, and is expressed by, for example, a Gaussian distribution.

It is said that the orientation state depends on design factors such as the type of bright material and paint, and also on coating conditions such as paint spraying speed, pressure, and film thickness. Generally, as shown in FIG. 3 (A), when the orientation of the bright material 110 is aligned in the horizontal direction (0 degree) of the coating film surface, it is said that the orientation is good, and conversely, it is shown in FIG. 3 (B). As described above, when the orientation of the bright material 110 is different from 0 degrees, it is said that the orientation is bad. As a method for quantifying the quality of this orientation, the method according to the present embodiment can be utilized.

Specifically, in the first embodiment, in the illumination display device 1, the illumination display 11 composed of rectangular bright lines is sequentially moved (scanned) in the width direction of the display surface to sequentially move (scan) the measurement target portion 100a of the sample 100. The illumination angle of the illumination light L1 with respect to the light L1 changes sequentially, but the angle of the photoelectric conversion element 3 on the light receiving side is fixed. When the illumination angle and the light receiving angle are equal to the surface normal of the bright material 110, the photoelectric conversion element 3 receives the specularly reflected light, and the obtained brightness becomes maximum.

On the other hand, since the reflection brightness decreases as the reflection deviates from the specular reflection relationship, when the illumination pattern is scanned, the distribution has a peak in a specific pattern (= specific illumination angle).

This situation is shown in FIGS. 4 (A) to 4 (D). These figures schematically show the state of reflection from the glitter material 110 when the illumination display is moved (scanned) in the width direction of the display surface. Further, each lower figure shows a state in which the attention-grabbing material 111 is sandwiched between the + mark and the + mark.

In FIG. 3A, the illumination display 11 has not moved, and in this state, the brightness of the shining material having a downwardly downward slope becomes maximum as shown in the shining material 111 of interest. In FIG. 3B, the illumination display is moved to the right, and in this state, the brightness of the bright material arranged substantially horizontally is maximized as shown in the attention bright material 111. In FIG. 3C, the illumination display 11 is further moved to the right, and in this state, the brightness of the bright material having a downwardly downward slope becomes maximum as shown in the attention bright material 111. In FIG. 3D, the illumination display 11 is further moved to the right, and in this state, the brightness of the bright material having a downward downward inclination becomes maximum as shown in the attention bright material 111.

As described above, the angle at which the brightness is maximized differs for each pixel and depends on the reflection angle of the glitter material 110 and thus the orientation angle. In other words, it is possible to estimate the orientation angle of each bright material from the peak position of the brightness.

In this way, by sequentially moving (scanning) the illumination display 11 in one direction, the orientation angle of the bright material 110 in the plane including the scanning direction can be calculated, and the light distribution angle can be measured.

The parameter depending on the reflection angle characteristic that can be calculated (measured) in the present embodiment is not limited to the orientation angle. By analyzing the two-dimensional spatial brightness distribution, it is possible to quantify the size of the particle size of the bright material 110 contained therein. It is also possible to calculate the particle size distribution, average particle size, etc. of the bright material 110 from the analysis result.

FIG. 5A shows a case where a large number of bright materials 110 having a small particle size are present, and FIG. 5B shows a case where a large number of bright materials 110 having a large particle size are present. The particle size of the bright material 110 can be calculated because the light distribution angle and the length in the horizontal direction of the bright material 110 can be known by analyzing the two-dimensional spatial brightness distribution.

In addition, by analyzing the two-dimensional spatial brightness distribution in the same way, it is possible to quantify the presence or absence of unevenness of the bright material (whether it is uniformly dispersed or agglomerated) at each location. .. FIG. 6A shows a state in which the bright material 110 is dispersed, and FIG. 6B shows a state in which the bright material 110 is aggregated.

By analyzing and evaluating the reflection angle characteristics in this way, the parameters depending on the reflection angle characteristics are represented by at least one of the brightness / chromaticity, orientation, particle size, dispersion aggregation, and the like of the bright material 110. , A lot of information about paint physical properties can be measured.

Further, in this embodiment, since a single lighting display device 1 is used, it is possible to suppress the complexity of the configuration of the entire surface characteristic measuring device as compared with the case where a plurality of lighting display devices are used.
(Embodiment 2)
In this embodiment, as shown in FIG. 7A, the illumination display is shown in the width direction of the display surface of the illumination display device 1 (the left-right direction in the figure is the scanning direction A) and FIG. As shown in the above, scanning is performed in two directions, which are orthogonal to the width direction (the vertical direction in the figure is defined as the scanning direction B). This makes it possible to evaluate the reflection angle characteristics of the bright material 110 in the two orthogonal directions, and to measure the orientation angle of the bright material 110 in the two orthogonal directions. Specifically, it is as follows.

That is, after the illumination display 11 is scanned and displayed on the illumination display device 1 as A1 → A2 → A3 → ... → An as shown in FIG. → B2 → B3 →… → Bn is scanned and displayed.

In the scanning of A1 → A2 → A3 → ... → An, as shown in FIG. 8A, the orientation angle of the bright material 110 in the plane parallel to the scanning direction (direction A) can be measured. On the other hand, in the scanning of B1 → B2 → B3 → ... → Bn, as shown in FIG. 8B, the orientation angle of the bright material 110 in the plane parallel to the scanning direction (direction B, orthogonal to direction A) is measured. It is possible.

Therefore, by scanning in the order of A1 → A2 → A3 →… → An, B1 → B2 → B3 →… → Bn, the orientation angles in two directions orthogonal to each bright material 110 can be obtained. It is possible to estimate and calculate the orientation angle (or surface normal vector) in any direction in two dimensions, that is, to measure the orientation angle.
(Embodiment 3)
In the first and second embodiments, the sample 100 whose surface is coated with the glitter material 110 is illustrated. However, when a treatment such as an alumite treatment is applied, minute irregularities and gradients are present on the surface in a micro region on the order of several μm to several tens of μm. Due to its microstructure, a part of the surface looks shining when illuminated and observed from a specific direction, and another part shines when illuminated and observed from another direction, which is a driving force for expressing high design. ing.

Therefore, even if the bright material does not exist, it depends on the reflection angle characteristic even for the sample 100 having minute irregularities and gradients on the surface, such as the one treated with alumite, as in Examples 1 and 2. It is possible to measure parameters such as the gradient angle.

This situation is shown in FIGS. 9A to 9D. These figures schematically show the state of reflection from the surface of the sample 100 when the illumination display 11 is moved (scanned) in the width direction of the display surface of the illumination display device 1. Further, each lower figure shows a state in which the attention portion 101 on the surface is sandwiched between the + mark and the + mark.

In FIG. 3A, the illumination display 11 is not moved, and in this state, the brightness of the surface portion inclined to the left is maximized as shown in the region of interest 101. In FIG. 3B, the illumination display 11 is moved to the right, and in this state, the brightness of the surface portion of the substantially horizontal arrangement is maximized as shown in the attention portion 101. In FIG. 3C, the illumination display 11 is further moved to the right, and in this state, the brightness of the surface portion inclined downward to the right is maximized as shown in the region of interest 101. In FIG. 3D, the illumination display 11 is further moved to the right, and in this state, the brightness of the surface portion inclined downward to the right is maximized as shown in the region of interest 101.

As described above, the angle at which the brightness is maximized differs for each pixel, and depends on the reflection angle of the surface of the measured portion 100a in the sample 100 and thus the gradient angle. In other words, it is possible to estimate and calculate the gradient angle of each surface portion from the peak position of the brightness, that is, to measure the gradient angle.
(Embodiment 4)
In the first to third embodiments, the illumination display 11 has a cross-sectional intensity distribution represented by a square wave, but the cross-sectional intensity distribution is not limited to the one represented by the square wave. For example, the illumination display having the cross-sectional intensity distribution shown by the triangular wave as shown in FIG. 10 may be moved in order, or the illumination display having the cross-sectional intensity distribution shown by the trapezoid as shown in FIG. 11 may be moved in order. Alternatively, the illumination display having the cross-sectional intensity distribution shown by the Gaussian distribution as shown in FIG. 12 may be moved in order. Alternatively, the illumination display having a cross-sectional intensity distribution indicated by a sine wave, a cosine wave, or a part thereof may be moved in order.

In either case, it is preferable to move the lighting display 11 before and after the movement so that a dark line does not occur.

Further, by moving the illumination display 11 having a plurality of patterns in which the cross-sectional intensity distribution is changed, each image data is acquired from the photoelectric conversion element 3, and these image data are used, parameters with abundant applicability can be measured. It is also possible to get results.
(Embodiment 5)
In this embodiment, as an illumination pattern, a structured pattern having a cross-sectional intensity distribution shown by a waveform that changes at a constant cycle is displayed to illuminate the measurement target portion 100a of the measurement object 100.

Generally, when illuminating from a plurality of points on the display surface of the illumination display device 1 which are separated from each other, the reflection angle characteristic of each pixel cannot be uniquely determined. However, in a structured pattern having a cross-sectional strength distribution shown by a waveform that changes at a fixed period, such as a sine wave or a cosine wave, the photoelectric conversion element 3 is displayed in a plurality of patterns in which the phase of the cross-sectional strength distribution is changed. The inventors have found that it is possible to measure a parameter depending on the reflection angle characteristic of each pixel by adding a specific arithmetic process to the image data output from the above. The sample 100 may have a bright material on its surface or may not have a bright material, but may have minute irregularities or gradients on its surface such as an alumite film.
1) Measurement procedure As shown in FIG. 13 (A), the basic illumination pattern (hereinafter referred to as the basic pattern) has a cross-sectional intensity distribution represented by a cosine wave for one cycle. An illumination pattern having a cross-sectional intensity distribution represented by a sine wave for one cycle may be used. FIGS. (B) to (D) show a state in which the phases of the cross-sectional strength distribution of the basic pattern of the figure (A) are shifted by π / 2.

The upper view of FIGS. 13 (A) to 13 (D) shows the brightness distribution of the display surface of the lighting display device 1 (white part has higher brightness, black part has lower brightness), and the lower figure shows the cross-sectional intensity distribution thereof. Is.

When the basic pattern is displayed on the illumination display device 1 and the measurement target portion 101a of the sample 100 is illuminated, the surface of the sample 100 can also be regarded as a spatial intensity distribution substantially according to the basic pattern (cosine wave). That is, the spatial intensity distribution at the coordinates (x, y) of the sample surface is expressed by the following equation.

The spatial intensity distribution with the phase shifted by (n / N) * 2π (n = 0,1,2, ..., N-1) with respect to the basic pattern is expressed by the following equation.

The sample 100 is sequentially illuminated by the illumination display device 1 so that the spatial intensity distribution on the surface of the sample 100 at the measurement site 100a is the distribution (n = 0,1,2, ..., N-1), and the positiveness thereof is positive. The reflected image is measured by the photoelectric conversion element 3.
2) Calculation of phase distribution from intensity distribution
Give N a concrete number and think about it.
Example 1) In the case of N = 3 (n = 0,1,2) The measurement target portion 100a of the sample 100 is sequentially illuminated with a pattern having the following spatial intensity distribution. This corresponds to three cosine waves that are out of phase by 2π / 3.

The reflection intensity distribution on the photoelectric conversion element 3 side (same as the spatial intensity distribution on the sample surface) I (x, y, 0), I (x, y, 1), and I (x, y, 2) are measured.

Since there are three unknowns, a (x, y), b (x, y), and θ (x, y), and there are also three equations, the exact solution is uniquely determined.

The phase distribution θ (x, y) can be calculated by the following formula.

Example 2) In the case of N = 4 (n = 0,1,2,3) The samples are sequentially illuminated with a pattern having the following spatial intensity distribution. This corresponds to four cosine waves that are out of phase by π / 2 as shown in FIGS. 13 (A) to 13 (D).

The respective reflection intensity distributions I (x, y, 0), I (x, y, 1), I (x, y, 2), and I (x, y, 3) are measured.

As an advantage when N = 4, the phase distribution θ (x, y) can be calculated by the following simple formula.

3) Calculation of orientation distribution from phase distribution When sample 100 is a completely smooth surface that does not contain bright materials, as shown in FIG. 14, on the photoelectric conversion element 3, the reflection of the reference projected by the illumination display device 1 is reflected. The intensity distribution is imaged.

On the other hand, when the sample 100 contains the bright material 110 having an orientation distribution, or when the sample surface has a minute gradient / unevenness, the specular reflection direction of the reflected light L2 changes from a dotted line to a solid line as shown in FIG. , The coordinates corresponding to the same brightness of the reference distribution shift compared to the smooth surface. That is, it means that the phase shifts.

The shift amount depends on the reflection angle characteristics of the glitter material 110 and the surface, and thus the orientation angle of the glitter material 110 or the gradient angle of the surface. That is, it is possible to uniquely obtain, that is, measure, the orientation angle of the bright material 110 or the gradient angle of the surface from the phase shift amount.

When the amplitude a (x, y) and the background brightness b (x, y) are known, the phase distribution θ (x, y) can be specified from a single irradiation of only the basic pattern, and the brilliance The orientation angle of the material 110 or the slope angle of the surface can be obtained.
(Embodiment 6)
In the present embodiment, the case where the illumination pattern whose frequency is shifted is illuminated will be described. The basic pattern has a cross-sectional intensity distribution represented by a sine wave for one cycle, as in the fifth embodiment described above.

By calculating the phase distribution from the luminance distribution (cross-sectional intensity distribution) using the same method as in the sixth embodiment, the orientation angle (light distribution) of the bright material 110 and the surface gradient angle (light distribution) depending on the reflection angle characteristic ( Gradient distribution) can be obtained.

However, as shown in FIG. 16 (A), the change in the vertical axis is small especially near the peaks and valleys of the cosine wave in one cycle, and in some cases, the signal component of the phase distribution is buried in noise. Is a concern.

Therefore, by sequentially illuminating the structural pattern of the cross-sectional intensity distribution shown by the cosine wave of N period (N ≧ 2) such as 2 cycles as shown in FIG. 16 (B) or 3 cycles in FIG. 16 (C). Compared with the case of N = 1, the change in brightness especially in the vicinity of peaks and valleys can be increased, and as a result, the resolution on the vertical axis can be increased. Therefore, it is possible to obtain the phase distribution (orientation distribution and gradient distribution) with higher accuracy.
(Embodiment 7)
In particular, with pearl pigments, the color changes according to the observation angle, so it is very significant to perform wavelength decomposition measurement such as color measurement and spectroscopic measurement. Therefore, as a parameter depending on the reflection angle characteristic, a mechanism for measuring the color information or the spectroscopic information of the measured portion 100a may be added.

Therefore, in this embodiment, a case where a mechanism for measuring color information / spectral information is added to the illumination side will be described.

By using a liquid crystal display, an OLED (Organic Light Emitting Diode) display, or the like for the lighting display device 1, it is possible to display red, green, and blue (hereinafter, these are referred to as RGB) in a single color.

When illuminating with the same illumination pattern, RGB is displayed individually in time division, and the photoelectric conversion element 3 receives the reflected light for each color in synchronization with the display timing and outputs the image data to obtain the color. Information / spectral information can be calculated / measured.
(Embodiment 8)
In the seventh embodiment, a case where a mechanism for measuring color information / spectral information is added to the illumination side has been described, but in the present embodiment, a case where a color measurement mechanism is added to the light receiving side will be described.

That is, as shown in FIG. 17, a two-dimensional color filter unit 6 is provided on the front surface of the photoelectric conversion element 3. In FIG. 17, the configuration other than the two-dimensional filter unit 6 is the same as the configuration of the apparatus shown in FIG. As an example of the two-dimensional color filter unit 6, as shown in FIG. 18, those having a plurality of filters 61 to 63 having different spectral transmittances corresponding to the pixels 31 of the photoelectric conversion element 3 can be mentioned. By using such a filter unit 6, the photoelectric conversion element 3 receives the reflected light of the color corresponding to the spectral transmittance of each of the filters 61 to 63 and outputs the image data. Therefore, the output image data It is possible to calculate and measure color information and spectral information using.

The filter array may be a Bayer array. In order to prevent a decrease in spatial resolution, the output of pixels in between may be interpolated from the outputs of adjacent filters of the same type.

The plurality of filters 61 to 63 may be RGB filters or filters having sensitivities corresponding to the color matching functions x (λ), y (λ), and z (λ), which are the sensitivities of the human eye. ..

As another example of the two-dimensional color filter unit 6, the configuration shown in FIG. 19 is also possible. That is, a plurality of filters 64 to 66 having different spectral transmittances (three in the case of FIG. 19) are arranged on the circumference of the disk 67, and the rotation shaft 71 of the motor 7 is installed at the center of the disk 67. The disk 67 is configured to rotate in the circumferential direction by the drive of 7. The reflected light L2 from the measured portion 100a of the sample 100 is arranged so as to be received by the photoelectric conversion element 3 after passing through the filters 64 to 67. The photoelectric conversion element 3 sequentially receives light in the order of transmission of the first filter 64 ⇒ rotation of the disk 67 ⇒ transmission of the second filter 65 ⇒ rotation of the disk 67 ⇒ transmission of the third filter 66, and outputs the corresponding image data. Therefore, it is possible to calculate and measure color information and spectral information in a time-division manner.

The plurality of filters 64 to 66 may be RGB filters, or filters having sensitivities corresponding to the color matching functions x (λ), y (λ), and z (λ), which are the sensitivities of the human eye. But it's okay. In addition, the full width at half maximum is about 10 to 20 nm, the wavelength of the center of gravity is about 10 nm pitch, and a plurality of different band path filters are arranged on the circumference, and the motor is rotated to transmit them in order, so that the spectral reflection in each two-dimensional pixel is reflected. It is also possible to measure the rate.
(Embodiment 9)
FIG. 20 is a perspective view showing the appearance of the optical characteristic measuring device according to another embodiment of the present invention. In this embodiment, the optical characteristic measuring device is configured to be a portable handy type.

Specifically, the lighting display device 1, the objective lens 2, the photoelectric conversion element 3, the calculation unit 4, or the two-dimensional color filter unit 6 are housed in the housing 8. Further, the upper surface of the housing 8 is provided with a grip portion 82 for carrying, and a measurement result display unit 5 for displaying the measurement result is provided, and further, the lower surface of the housing 8 is covered with the sample 100. An opening 81 for irradiating the measurement portion 100a with illumination light and taking in the reflected light from the measurement portion is formed.

When used, the optical characteristic measuring device shown in FIG. 20 grips the grip portion 82 and positions the opening 81 on the lower surface at the measurement target portion 100a of the sample 100. Then, in this state, the sample 100 is irradiated with the illumination light from the illumination display device 1 housed inside the housing 8, the reflected light is received by the photoelectric conversion element 3, and is output from the photoelectric conversion element 3. By calculating with the calculation unit 5 using the image data, the parameter depending on the reflection angle characteristic is measured, and the measurement result is displayed on the measurement result display unit 5.

According to such an optical characteristic measuring device, it is possible to measure a parameter depending on the reflection angle characteristic regardless of the place by carrying the housing.

This application is accompanied by the priority claim of Japanese Patent Application No. 2018-172327 filed on September 14, 2018, and the disclosure content thereof constitutes a part of the present application as it is. ..

The terms and expressions used herein are for illustration purposes only, not for limited interpretation, and for any equality of the features shown and stated herein. It must be recognized that it does not exclude objects, but also allows various modifications within the claimed scope of the present invention.

Although illustrated embodiments of the present invention have been described herein, the invention is not limited to the embodiments described herein, and equal elements, modifications, which can be recognized by those skilled in the art based on this disclosure. It also includes all embodiments having deletions, combinations (eg, combinations of features across various embodiments), improvements and / or changes.

INDUSTRIAL APPLICABILITY The present invention can be used for measuring parameters depending on the reflection angle characteristic, for example, by using a painted portion containing flaky aluminum pieces or mica pieces called a bright material as a measurement portion.

1 Lighting display device 2 Objective lens 3 Photoelectric conversion element 4 Calculation unit 5 Measurement result display unit 6 Filter unit 8 Housing 81 Opening 11 Lighting display 61-66 filter 100 Measurement target (sample)
100a Area to be measured 101 Area of interest 110 Bright material 111 Bright material of interest

Claims (21)

A single lighting display device capable of displaying at least one lighting pattern,
When the measurement target portion of the measurement object is irradiated with the illumination light from the illumination pattern displayed on the illumination display device, the reflected light from the measurement target portion is received for each pixel and converted into image data. A two-dimensional photoelectric conversion element that outputs light, and the image data includes a photoelectric conversion element used for measuring a parameter that depends on the reflection angle characteristic of each pixel of the measured portion.
With
The illumination display device and the photoelectric conversion element are arranged in a positional relationship in which the photoelectric conversion element can receive the reflected light in the substantially specular reflection direction from the measurement target portion, and output data for surface characteristic measurement. Device. The illumination pattern that can be displayed on the illumination display device is a pattern in which a specific illumination display moves in one direction or a plurality of directions, and the photoelectric conversion element reflects each time the specific illumination display moves. The data output device for surface characteristic measurement according to claim 1, which receives light, converts it into image data, and outputs it. The data output device for measuring surface characteristics according to claim 2, wherein the specific lighting display has a cross-sectional intensity distribution represented by a square wave. The data output device for measuring surface characteristics according to claim 2, wherein the specific lighting display has a cross-sectional intensity distribution represented by a triangular wave. The data output device for surface characteristic measurement according to claim 2, wherein the specific illumination display has a sine wave or a cosine wave, or a cross-sectional intensity distribution represented by a part thereof. The data output device for measuring surface characteristics according to any one of claims 2 to 5, wherein the movement of the specific lighting display is a movement in which a dark line does not occur between the displays before and after the movement. The data output device for measuring surface characteristics according to claim 1, wherein the illumination pattern is a structured pattern having a cross-sectional intensity distribution shown by a waveform that changes at a constant cycle. The data output device for measuring surface characteristics according to claim 7, wherein the waveform that changes at a constant cycle is a sine wave or a cosine wave. The illumination display device displays the cross-sectional intensity distribution in the structured pattern in different phases a plurality of times, and the photoelectric conversion element receives reflected light for each display in different phases, converts it into image data, and outputs it. The data output device for measuring surface characteristics according to claim 7 or 8. The illumination display device displays the cross-sectional intensity distribution in the structured pattern at different frequencies a plurality of times, and the photoelectric conversion element receives reflected light for each display at different frequencies, converts it into image data, and outputs it. The data output device for measuring surface characteristics according to any one of claims 7 to 9. The data output device for measuring surface characteristics according to any one of claims 1 to 10, wherein the spatial resolution of the photoelectric conversion element is 10 to 100 μm. The data for measuring surface characteristics according to any one of claims 1 to 11, wherein the portion to be measured of the object to be measured is a coated portion containing a bright material, and the reflection angle characteristic is a reflection angle characteristic of the bright material. Output device. The output of the surface characteristic measurement data according to claim 12, wherein the parameter depending on the reflection angle characteristic includes at least one of information on the brightness, chromaticity, light distribution characteristic, particle size, and dispersion aggregation of the bright material. Device. The data output device for measuring surface characteristics according to claim 13, wherein the light distribution characteristics are measured based on reflection angle characteristics in two orthogonal directions. The illumination display device individually displays the illumination pattern in different colors, and the photoelectric conversion element receives reflected light for each color, converts it into image data and outputs it, and outputs the output image data for each color. The data output device for measuring surface characteristics according to any one of claims 1 to 14, wherein the color information or the spectral information of the part to be measured is measured based on the above. The photoelectric conversion element is provided with a plurality of filters having different spectral transmittances, and by receiving the reflected light through each filter, it is converted into image data for each filter and output, and for each output filter. The data output device for surface characteristic measurement according to any one of claims 1 to 14, wherein the color information or the spectral information of the part to be measured is measured based on the image data of the above. The data output device for measuring surface characteristics according to claim 16, wherein the plurality of filters have spectral transmittances corresponding to the color matching functions x (λ), y (λ), and z (λ). The data output device for measuring surface characteristics according to any one of claims 1 to 17,
Based on the image data output from the output device, a calculation unit that calculates parameters that depend on the reflection angle characteristics of each pixel of the part to be measured, and
Surface characteristic measuring device equipped with. The data output device for measuring surface characteristics is provided in one housing.
The housing has an opening for irradiating the measurement target portion of the measurement object with illumination light and taking in the reflected light from the measurement target portion, and a result display unit for displaying the calculation result by the calculation unit. The surface property measuring apparatus according to claim 18. The surface characteristic measuring device according to claim 18 or 19, wherein the calculation unit is composed of a personal computer. The surface characteristic measuring apparatus according to any one of claims 18 to 20, wherein the image data output from the photoelectric conversion element is sent to the calculation unit via a network.

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