JPWO2019195196A5 - - Google Patents

Claims (20)

A device for capturing analytes
a) Electrodes configured to generate an electrokinetic field region, and
b) A layer in contact with at least a portion of the electrode, containing a dielectric material and having a thickness of less than 100 angstroms.
Including devices. The device according to claim 1, wherein the electrokinetic field includes a dielectric field, an electric heating field, an electroosmotic field, or a combination thereof. The device of claim 1 or 2, wherein the layer is about 5 angstroms-about 25 angstroms thick. The device of claim 1 or 2, wherein the layer is 50 angstroms or less in thickness. The device according to any one of claims 1-4, wherein the dielectric material comprises a metalloid oxide, a metalloid nitride, a metalloid carbide, a metalloid silicide, or a combination thereof. The device of claim 5, wherein the metalloid is selected from the group consisting of boron, silicon, germanium, arsenic, antimony, telluride, and combinations thereof. The device according to any one of claims 1-6, wherein the dielectric material further comprises a metal. The metals are platinum, ruthenium, rhodium, iridium, manganese, magnesium, tungsten, zirconium, chromium, gold, iron, aluminum, thallium, gallium, copper, silver, brass, zinc, tin, nickel, palladium, titanium, cobalt, The device according to claim 7, wherein the device is selected from the group consisting of indium, bismuth, lead, lanthanum, hafnium, ittrium, calcium, strontium, barium, cadmium, mercury, thallium, antimony, germanium, and combinations thereof. The device according to any one of claims 1-8, wherein the dielectric material comprises an organic polymer or an inorganic polymer. The device according to any one of claims 1-8, wherein the dielectric material comprises ceramic. The device according to any one of claims 1-8, wherein the dielectric material has a dielectric constant of about 2-about 10. The layers are silicon, silicon oxide, silicon nitride, silicon carbide, titanium oxide, germanium, polytetrafluoroethylene, neoprene, polyvinylidene fluoride, silicon dioxide, titanium dioxide, fluorosilicate glass, polyimide, fluorinated polyimide, methylsilsesqui. The device according to any one of claims 1-8, comprising a material selected from the group consisting of oxane, polyarylene ether, polyethylene, polystyrene, calcium carbonate, and combinations thereof. The device according to any one of claims 1-12, wherein the electrodes include a conductive material. 13. The device of claim 13, wherein the dielectric material to conductive material ratio is about 0.01: 2-about 99: 1 . 13. The device of claim 13, wherein the dielectric material to conductive material ratio is about 0.3: 2. The conductive material is at least in the group consisting of platinum, gold, aluminum, tantalum, gallium arsenide, copper, silver, brass, zinc, tin, nickel, silicon, palladium, titanium, graphite, carbon, and combinations thereof. The device according to any one of claims 13-15, comprising one. A method for isolating an analyte in a sample, wherein the method is:
(A) A step of applying a sample to the device according to any one of claims 1-16.
(B) A step of generating at least one AC dielectric field region and / or an AC electrokinetic field region, and
(C) A step of isolating the analyte in the AC dielectric field region and / or the AC electrokinetic field region.
Including, how. 17. The method of claim 17, wherein the presence of the layer results in at least a 5-fold increase in capture of the analyte on the surface when compared to a device without the layer. The method for manufacturing any one of claims 1-16, comprising precipitating a layer onto an electrode using at least one precipitation technique. A method of diagnosing or monitoring a patient's disease or condition comprising applying a sample to the device according to any one of claims 1-16.