JPWO2016063858A1 - Electrical measuring device - Google Patents

Electrical measuring device Download PDF

Info

Publication number
JPWO2016063858A1
JPWO2016063858A1 JP2016555224A JP2016555224A JPWO2016063858A1 JP WO2016063858 A1 JPWO2016063858 A1 JP WO2016063858A1 JP 2016555224 A JP2016555224 A JP 2016555224A JP 2016555224 A JP2016555224 A JP 2016555224A JP WO2016063858 A1 JPWO2016063858 A1 JP WO2016063858A1
Authority
JP
Japan
Prior art keywords
measurement
sample
channel
flow path
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016555224A
Other languages
Japanese (ja)
Other versions
JP6647631B2 (en
Inventor
馬場 嘉信
嘉信 馬場
範匡 加地
範匡 加地
隆雄 安井
隆雄 安井
啓寿 矢崎
啓寿 矢崎
麻美子 佐野
麻美子 佐野
川合 知二
知二 川合
剛 柳田
剛 柳田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nagoya University NUC
Osaka University NUC
Tokai National Higher Education and Research System NUC
Original Assignee
Nagoya University NUC
Osaka University NUC
Tokai National Higher Education and Research System NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nagoya University NUC, Osaka University NUC, Tokai National Higher Education and Research System NUC filed Critical Nagoya University NUC
Publication of JPWO2016063858A1 publication Critical patent/JPWO2016063858A1/en
Application granted granted Critical
Publication of JP6647631B2 publication Critical patent/JP6647631B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/1031Investigating individual particles by measuring electrical or magnetic effects thereof, e.g. conductivity or capacity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N2015/1006Investigating individual particles for cytology

Abstract

定常電流の変化のみではなく過渡電流の発生も読み取ることで、高感度検出ができるように設計した電気測定用チップ、及び該電気測定用チップを含む電気測定装置を提供する。基板、該基板上に形成したサンプル移動流路及びサンプル測定流路を含み、前記サンプル測定流路は、前記サンプル移動流路に接続する第1測定流路、及び前記第1測定流路とは反対側から前記サンプル移動流路に接続する第2測定流路を含む、電気測定用チップ。Provided are an electrical measurement chip designed to detect not only a change in steady-state current but also a transient current, so that highly sensitive detection is possible, and an electrical measurement device including the electrical measurement chip. A substrate, a sample moving channel formed on the substrate, and a sample measuring channel, wherein the sample measuring channel is a first measuring channel connected to the sample moving channel and the first measuring channel An electric measurement chip including a second measurement channel connected to the sample movement channel from the opposite side.

Description

本発明は、電気測定用チップ、及び電気測定装置に関し、特に、細胞、菌、ウィルス、DNA等のサンプルがマイクロ流路を流れる際に、定常電流の変化のみではなく過渡電流の発生も読み取ることで、高感度検出ができるように設計した電気測定用チップ、及び該電気測定用チップを含む電気測定装置に関する。   The present invention relates to an electric measurement chip and an electric measurement device, and particularly, when a sample such as a cell, a bacterium, a virus, or a DNA flows through a microchannel, reads not only the change in steady current but also the generation of a transient current. Thus, the present invention relates to an electrical measurement chip designed to perform highly sensitive detection, and an electrical measurement device including the electrical measurement chip.

溶液中に含まれる細胞、菌、花粉、PM2.5等のサンプルの大きさ、個数等を正確に測定することは、健康な生活を送る上で大切な情報であり、近年、ますます測定精度の向上が望まれている。また、生物化学の分野では、DNA断片をそのまま分析する分析チップの開発が望まれている。   Accurate measurement of the size, number, etc. of samples such as cells, fungi, pollen, and PM2.5 contained in a solution is important information for living a healthy life. Improvement is desired. In the field of biochemistry, it is desired to develop an analysis chip that analyzes a DNA fragment as it is.

図1は、サンプルの大きさや個数等の測定方法の従来技術を示しており、シリコン等の基板上に形成した細孔(マイクロポア)にサンプルを通過させ、細孔に印加した電圧によって細孔の内部を流れる定常電流が変化する様子から細胞の大きさ、硬さを解析している(非特許文献1参照)。図1に示す従来の測定方法は、細孔の体積が小さい程感度が向上すことが知られている。細孔の体積を減らすためには直径を小さくするとともに基板を薄くする必要があり、そのため、測定の際には図1に示すように基板は縦置きにして使用されている。   FIG. 1 shows a conventional technique for measuring the size and number of samples. The sample is passed through pores (micropores) formed on a substrate such as silicon, and the pores are applied by voltage applied to the pores. The size and hardness of the cell are analyzed from the state in which the steady-state current flowing inside the cell changes (see Non-Patent Document 1). The conventional measurement method shown in FIG. 1 is known to improve the sensitivity as the volume of the pores decreases. In order to reduce the volume of the pores, it is necessary to reduce the diameter and reduce the thickness of the substrate. For this reason, the substrate is used in a vertical orientation as shown in FIG.

また、細孔を通過するサンプルの状態をより詳しく測定するため、マイクロ流路を形成した基板を横置きにすることで細孔部分を蛍光顕微鏡で観察できるようにし、定常電流の測定に加え細孔の周りの事象を直接観察する方法も知られている(非特許文献2参照)。図2は、非特許文献2のFig.1を示している。   In addition, in order to measure the state of the sample passing through the pores in more detail, the substrate on which the microchannels are formed can be placed sideways so that the pores can be observed with a fluorescence microscope. A method of directly observing an event around a hole is also known (see Non-Patent Document 2). 2 is shown in FIG. 1 is shown.

Waseem A.et al.,Lab on a Chip, Vol.12, pp.2345−2352 (2012)Wasem A. et al. Lab on a Chip, Vol. 12, pp. 2345-2352 (2012) Naoya.Y et al.,“Tracking single−particle dynamics via combined optical and electrical sensing”, SCIENTIFIC REPORTS, Vol.3, pp.1−7(2013)Naoya. Y et al. , "Tracking single-particle dynamics via combined optical and electrical sensing", SCIENTIFIC REPORTS, Vol. 3, pp. 1-7 (2013)

しかしながら、図1に示す方法では、得られる情報が定常電流の変化の信号のみであり、細孔を通過したサンプルの判別は電流値の強弱などから推察するに留まる。そのため、複数のサンプルが細孔に流れ込む場合や、測定するサンプルが生体分子等の形状が球体以外又は変化し易い場合などは、詳細な解析が難しいという問題がある(問題1)。   However, in the method shown in FIG. 1, the information obtained is only a signal indicating a change in the steady current, and the discrimination of the sample that has passed through the pores can only be inferred from the strength of the current value. Therefore, there is a problem that detailed analysis is difficult (problem 1) when a plurality of samples flow into the pores, or when the shape of the sample to be measured is other than a sphere or is easily changed.

また、非特許文献1に記載されている方法は、サンプルを駆動させるための駆動回路と、細孔をサンプルが通過する際の電流変化を測定する測定回路が同じになっている。一般的に、印加電圧を大きくすることで測定感度を上げることができるが、駆動回路と測定回路が同じ場合、印加電圧を大きくすると測定回路の電流計に負荷がかかり過ぎ、高感度検出ができないという問題がある(問題2)。   In the method described in Non-Patent Document 1, the drive circuit for driving the sample and the measurement circuit for measuring the current change when the sample passes through the pore are the same. In general, the measurement sensitivity can be increased by increasing the applied voltage. However, if the drive circuit and the measurement circuit are the same, increasing the applied voltage will overload the ammeter of the measurement circuit and prevent high sensitivity detection. (Problem 2).

更に、サンプルが細孔を通過する時間は、サンプルの表面電荷、変形能等に影響されるため、特に生体分子解析においては非常に重要な情報である。しかしながら、従来法の感度では、細孔内の定常電流の緩やかな変化を読みとることしか出来ず、印加電圧によって加速されたサンプルが短い細孔を通過する時間を読み取るには誤差が大きかった。加えて、核酸等の細長い形状の生体分子を測定する場合、生体分子を伸長状態で細孔に導入する必要があるが、そのためには、生体分子を伸長状態にするためのガイド流路が必要となる。しかしながら、ガイド流路を設けることは細孔部分の体積を増加することになり、感度の低下が避けられないという問題がある(問題3)。   Furthermore, since the time for which the sample passes through the pores is influenced by the surface charge, deformability, etc. of the sample, it is very important information particularly in biomolecule analysis. However, with the sensitivity of the conventional method, only a gradual change in the steady current in the pore can be read, and there is a large error in reading the time for the sample accelerated by the applied voltage to pass through the short pore. In addition, when measuring elongated biomolecules such as nucleic acids, it is necessary to introduce the biomolecules into the pores in an elongated state. To this end, a guide channel for bringing the biomolecules into an elongated state is required. It becomes. However, the provision of the guide channel increases the volume of the pore portion, and there is a problem that a decrease in sensitivity is inevitable (Problem 3).

一方、図2に示すように、基板を横置きにして蛍光顕微鏡で観察することで、上記(問題1)を解決することができる。しかしながら、非特許文献2に記載されている方法は、ポンプの圧力により液体中に分散したサンプルが基板上に形成された細孔を通過するように設計されている。ポンプの圧力で液体中に分散したサンプルを流す場合、測定感度を上げる為に細孔のサイズを小さくすればするほど、液体が細孔を流れにくくなる。勿論、ポンプの圧力を大きくすることで液体を流すこともできるが、圧力を大きくし過ぎると、細孔部分が破損する恐れがある。また、非特許文献2に記載されているポンプの圧力でサンプルを流す方法では、核酸やタンパク質を流すことはできないという問題がある。更に、非特許文献2に記載されている方法も、非特許文献1に記載されている方法と同様に、感度を上げる為には細孔の体積を小さくする必要があり、上記(問題3)を解決することができないという問題がある。   On the other hand, as shown in FIG. 2, the above (Problem 1) can be solved by placing the substrate horizontally and observing with a fluorescence microscope. However, the method described in Non-Patent Document 2 is designed such that the sample dispersed in the liquid by the pressure of the pump passes through the pores formed on the substrate. When a sample dispersed in a liquid is flowed by the pressure of the pump, the liquid is less likely to flow through the pores as the pore size is reduced in order to increase measurement sensitivity. Of course, the liquid can be flowed by increasing the pressure of the pump, but if the pressure is increased too much, the pores may be damaged. Further, the method of flowing a sample with the pressure of a pump described in Non-Patent Document 2 has a problem that nucleic acid or protein cannot be flowed. Further, the method described in Non-Patent Document 2 also needs to reduce the volume of the pores in order to increase the sensitivity, similarly to the method described in Non-Patent Document 1, and the above (Problem 3) There is a problem that cannot be solved.

本発明は、上記従来の問題を解決するためになされた発明であり、鋭意研究を行ったところ、
(1)サンプルを流すことができるサンプル移動流路を形成し、該サンプル移動流路に接続する第1測定流路及び前記第1測定流路とは反対側から前記サンプル移動流路に接続する第2測定流路を形成することで、サンプルの駆動回路と測定回路を別回路として設計できること、
(2)サンプルの駆動回路と測定回路を別回路とすることで、駆動回路の電圧を高く設定することで検出感度を高めることができ、従来はノイズに埋もれていた過渡電流を測定できること、
(3)測定回路に可変抵抗を組み込むと、より高感度検出が可能となり過渡電流をより精度良く測定できること、
(4)過渡電流を読み取ることで、サンプル移動流路へのサンプルの入出タイミングを正確に測定することができ、その結果、サンプルの通過速度を計算することでサンプルの表面電荷及び変形能を測定できること、
(5)過渡電流とは別に、第1測定流路及第2測定流路間の定常電流の変化を測定できることから、従来の細孔と異なりサンプル移動流路を長く設計することができ、サンプル移動流路内でサンプルの伸長状態を作り出して核酸やタンパク質等の生体分子を測定できること、を新たに見出した。
The present invention is an invention made in order to solve the above-mentioned conventional problems.
(1) A sample moving channel capable of flowing a sample is formed, and the first measuring channel connected to the sample moving channel and the sample moving channel are connected from the side opposite to the first measuring channel. By forming the second measurement channel, the sample drive circuit and the measurement circuit can be designed as separate circuits,
(2) By making the sample drive circuit and measurement circuit separate, the detection sensitivity can be increased by setting the voltage of the drive circuit high, and it is possible to measure transient currents that were previously buried in noise,
(3) If a variable resistor is incorporated in the measurement circuit, higher sensitivity can be detected and the transient current can be measured more accurately.
(4) By reading the transient current, it is possible to accurately measure the sample entry / exit timing to the sample movement flow path, and as a result, the surface charge and deformability of the sample are measured by calculating the passage speed of the sample. What you can do,
(5) Since the change in the steady current between the first measurement channel and the second measurement channel can be measured separately from the transient current, the sample moving channel can be designed longer than the conventional pore, It was newly discovered that biomolecules such as nucleic acids and proteins can be measured by creating an extended state of the sample in the movement channel.

すなわち、本発明の目的は、定常電流の変化のみではなく過渡電流の発生も読み取ることで、高感度検出ができるように設計した電気測定用チップ、及び該電気測定用チップを含む電気測定装置を提供することである。   That is, an object of the present invention is to provide an electrical measurement chip designed to detect highly sensitively by reading not only a change in steady current but also a transient current, and an electrical measurement device including the electrical measurement chip. Is to provide.

本発明は、以下に示す、電気測定用チップ、及び該電気測定用チップを含む電気測定装置に関する。   The present invention relates to an electrical measurement chip and an electrical measurement apparatus including the electrical measurement chip, which will be described below.

(1)基板、該基板上に形成したサンプル移動流路及びサンプル測定流路を含み、
前記サンプル測定流路は、前記サンプル移動流路に接続する第1測定流路、及び前記第1測定流路とは反対側から前記サンプル移動流路に接続する第2測定流路を含む、
電気測定用チップ。
(2)前記第1測定流路及び前記第2測定流路の幅が、前記サンプル移動流路と接続している部分の長さより、前記サンプル移動流路から離れるにしたがって長くなる上記(1)に記載の電気測定用チップ。
(3)前記第1測定流路及び前記第2測定流路が、前記サンプル移動流路を挟んで非対称の位置に形成されている上記(1)又は(2)に記載の電気測定用チップ。
(4)前記サンプル移動流路に狭窄部が少なくとも1以上形成されている上記(1)〜(3)の何れか一に記載の電気測定用チップ。
(5)前記サンプル移動流路の一端に形成されたサンプル投入流路、前記サンプル移動流路の他端に形成されたサンプル回収流路を含む、上記(1)〜(4)の何れか一に記載の電気測定用チップ。
(6)前記第1測定流路及び前記第2測定流路に換え、第1測定電極及び第2測定電極が形成されている上記(1)〜(5)の何れか一に記載の電気測定用チップ。
(7)上記(1)〜(5)の何れか一に記載の電気測定用チップ、
サンプルがサンプル移動流路を移動できるようにするための駆動回路、
第1測定流路及び第2測定流路に電圧を印加し、サンプルがサンプル移動回路を移動する際の電流の変化を測定する測定回路、
を含む電気測定装置。
(8)上記(6)に記載の電気測定用チップ、
サンプルがサンプル移動流路を移動できるようにするための駆動回路、
第1測定電極及び第2測定電極に電圧を印加し、サンプルがサンプル移動回路を移動する際の電流の変化を測定する測定回路、
を含む電気測定装置。
(9)前記測定回路が、前記駆動回路と前記測定回路の抵抗を釣り合った状態にするための可変抵抗を含み、
前記測定回路が、釣り合った状態からの電流の差分を測定する上記(7)又は(8)に記載の電気測定装置。
(10)前記測定回路が、過渡電流及び定常電流の変化を測定する上記(7)〜(9)の何れか一に記載の電気測定装置。
(11)蛍光顕微鏡を更に含む上記(7)〜(10)の何れか一に記載の電気測定装置。
(1) including a substrate, a sample moving channel formed on the substrate, and a sample measuring channel,
The sample measurement flow path includes a first measurement flow path connected to the sample movement flow path and a second measurement flow path connected to the sample movement flow path from the side opposite to the first measurement flow path.
Chip for electrical measurement.
(2) The width of the first measurement channel and the second measurement channel is longer as the distance from the sample movement channel is longer than the length of the portion connected to the sample movement channel (1) The electrical measurement chip according to 1.
(3) The electrical measurement chip according to (1) or (2), wherein the first measurement channel and the second measurement channel are formed at asymmetric positions with the sample movement channel interposed therebetween.
(4) The electrical measurement chip according to any one of (1) to (3), wherein at least one narrow portion is formed in the sample moving flow path.
(5) Any one of the above (1) to (4), including a sample input channel formed at one end of the sample moving channel and a sample recovery channel formed at the other end of the sample moving channel. The electrical measurement chip according to 1.
(6) The electrical measurement according to any one of (1) to (5) above, wherein a first measurement electrode and a second measurement electrode are formed instead of the first measurement channel and the second measurement channel. For chips.
(7) The electrical measurement chip according to any one of (1) to (5) above,
A drive circuit for allowing the sample to move through the sample transfer channel,
A measurement circuit that applies a voltage to the first measurement channel and the second measurement channel and measures a change in current when the sample moves through the sample moving circuit;
Including electrical measuring device.
(8) The electrical measurement chip according to (6) above,
A drive circuit for allowing the sample to move through the sample transfer channel,
A measurement circuit for applying a voltage to the first measurement electrode and the second measurement electrode and measuring a change in current when the sample moves through the sample moving circuit;
Including electrical measuring device.
(9) The measurement circuit includes a variable resistor for making the resistance of the drive circuit and the measurement circuit balanced.
The electrical measurement device according to (7) or (8), wherein the measurement circuit measures a difference in current from a balanced state.
(10) The electrical measurement device according to any one of (7) to (9), wherein the measurement circuit measures changes in transient current and steady current.
(11) The electrical measurement apparatus according to any one of (7) to (10), further including a fluorescence microscope.

本発明の電気測定用チップは、サンプルを流すことができるサンプル移動流路を形成し、該サンプル移動流路に接続する第1測定流路及び前記第1測定流路とは反対側から前記サンプル移動流路に接続する第2測定流路を形成している。
そのため、本発明の電気測定用チップを用いた電気測定装置は、サンプルの駆動回路と測定回路を別回路として設計できるので、駆動回路の電圧を高く設定し、検出感度を高めることができるので過渡電流も正確に読み取ることができる。更に、測定回路に可変抵抗を組み込むと、駆動回路と測定回路が釣り合った状態からの差分を読み取ることができるので、検出感度をより高めることができる。
そして、本発明の電気測定装置は、過渡電流を読み取ることでサンプル移動流路へのサンプルの入出タイミングを正確に測定でき、通過速度からサンプルの表面電荷及び変形能を測定することが可能となる。また、過渡電流とは別に、第1測定流路及び第2測定流路間の定常電流の変化を測定できることから、従来の細孔と異なりサンプル移動流路を長く設計することができ、サンプル移動流路内で核酸やタンパク質等の生体分子の伸長状態を作り出して測定することが可能となる。
更に、本発明の電気測定チップは横置きで使用できることから、蛍光顕微鏡観察と組み合わせて使用することで、より正確な分析をすることができる。
また、サンプル移動流路に狭窄部を設けることで、同種の細胞であっても変形能が異なる細胞を測定することができる。
The electrical measurement chip of the present invention forms a sample movement channel through which a sample can flow, and the first measurement channel connected to the sample movement channel and the sample from the side opposite to the first measurement channel A second measurement channel connected to the moving channel is formed.
For this reason, the electrical measuring device using the electrical measuring chip of the present invention can design the sample driving circuit and the measuring circuit as separate circuits, so that the voltage of the driving circuit can be set high and the detection sensitivity can be increased. The current can also be read accurately. Furthermore, when a variable resistor is incorporated in the measurement circuit, the difference from the state in which the drive circuit and the measurement circuit are balanced can be read, so that the detection sensitivity can be further increased.
The electrical measurement apparatus of the present invention can accurately measure the sample entry / exit timing to the sample movement channel by reading the transient current, and can measure the surface charge and deformability of the sample from the passing speed. . In addition to the transient current, the change in the steady current between the first measurement channel and the second measurement channel can be measured. Therefore, unlike the conventional pore, the sample movement channel can be designed longer and the sample movement It is possible to create and measure the elongation state of biomolecules such as nucleic acids and proteins in the channel.
Furthermore, since the electrical measuring chip of the present invention can be used in a horizontal orientation, it can be used for a more accurate analysis by using it in combination with fluorescence microscope observation.
In addition, by providing a stenosis portion in the sample movement channel, cells having different deformability can be measured even for the same type of cells.

図1は、サンプルの大きさや個数等の測定方法の従来技術を示している。FIG. 1 shows a conventional technique for measuring the size and number of samples. 図2は、非特許文献2のFig.1を示している。2 is shown in FIG. 1 is shown. 図3は、本発明の電気測定用チップ1の概略を説明する図である。FIG. 3 is a diagram for explaining the outline of the electrical measurement chip 1 of the present invention. 図4は、本発明の電気測定用チップ1の他の実施形態を示している。FIG. 4 shows another embodiment of the electric measurement chip 1 of the present invention. 図5は、第1測定流路6及び第2測定流路7に代え、第1電極及び第2電極で形成した電気測定用チップ1の概略を説明する図である。FIG. 5 is a diagram for explaining an outline of the electrical measurement chip 1 formed with the first electrode and the second electrode in place of the first measurement channel 6 and the second measurement channel 7. 図6は、本発明の電気測定用チップ1の他の実施形態を示している。FIG. 6 shows another embodiment of the electric measurement chip 1 of the present invention. 図7は、図4のA−A’断面図で、電気測定用チップ1の製造工程の一例を示している。FIG. 7 is a cross-sectional view taken along the line A-A ′ of FIG. 4 and shows an example of the manufacturing process of the electrical measuring chip 1. 図8は、本発明の電気測定用チップ1の他の製造工程を示す図である。FIG. 8 is a diagram showing another manufacturing process of the electrical measurement chip 1 of the present invention. 図9は、本発明の電気測定用チップ1を用いた電気測定装置10の概略を示す図である。FIG. 9 is a diagram showing an outline of an electricity measuring device 10 using the electricity measuring chip 1 of the present invention. 図10は、本発明の電気測定装置10を用いてサンプルを測定する際の、電気測定チップ1上のサンプルの位置と測定できる電流値の関係を説明する図である。FIG. 10 is a diagram for explaining the relationship between the position of the sample on the electrical measurement chip 1 and the current value that can be measured when measuring the sample using the electrical measurement apparatus 10 of the present invention. 図11は、電気測定用チップ1の他の実施形態を示す図である。FIG. 11 is a view showing another embodiment of the electricity measuring chip 1. 図12は、図面代用写真で、図12(1)は、実施例1で作製した電気測定用チップ1の写真、図12(2)は、第1測定流路6及び第2測定流路7付近の拡大写真である。FIG. 12 is a drawing-substituting photograph, FIG. 12 (1) is a photograph of the electrical measurement chip 1 produced in Example 1, and FIG. 12 (2) is the first measurement channel 6 and the second measurement channel 7. This is an enlarged photo of the neighborhood. 図13は、図面代用写真で、図13(1)は、実施例2で作製した電気測定用チップ1の第1測定流路6及び第2測定流路7付近の拡大写真、図13(2)は、実施例3で作製した電気測定用チップ1の第1測定流路6及び第2測定流路7付近の拡大写真である。FIG. 13 is a drawing-substituting photograph, and FIG. 13 (1) is an enlarged photograph of the vicinity of the first measurement channel 6 and the second measurement channel 7 of the electrical measurement chip 1 manufactured in Example 2, and FIG. ) Is an enlarged photograph of the vicinity of the first measurement channel 6 and the second measurement channel 7 of the electrical measurement chip 1 manufactured in Example 3. FIG. 図14(1)は、実施例4における測定時間と測定された定常電流値の関係を示すグラフ、図14(2)は、実施例5における測定時間と測定された定常電流値の関係を示すグラフ、図14(3)は、実施例6における測定時間と測定された定常電流値の関係を示すグラフである。FIG. 14 (1) is a graph showing the relationship between the measurement time and the measured steady current value in Example 4, and FIG. 14 (2) shows the relationship between the measurement time and the measured steady current value in Example 5. FIG. 14 (3) is a graph showing the relationship between the measurement time and the measured steady current value in Example 6. 図15は、実施例3の電気測定用チップ1を用いた場合、ピークを2つ測定した理由を説明する図である。FIG. 15 is a diagram for explaining the reason why two peaks were measured when the electrical measurement chip 1 of Example 3 was used. 図16は、サンプル移動流路3を流れるサンプルの位置の連続写真、及びサンプルが流れる際の定常電流値の変化(シグナル強度)と蛍光強度の変化を示す写真及びグラフである。FIG. 16 is a continuous photograph of the position of the sample flowing through the sample moving flow path 3, and a photograph and a graph showing a change in steady-state current value (signal intensity) and a change in fluorescence intensity when the sample flows. 図17は、実施例8で測定した定常電流値の変化(シグナル強度)を示すグラフである。FIG. 17 is a graph showing changes (signal intensity) in steady-state current values measured in Example 8. 図18は、実施例8で測定した結果に基づき作製したサンプルの体積と定常電流値の変化(シグナル強度)を示すグラフである。FIG. 18 is a graph showing changes in volume (steady current value) (signal intensity) of a sample prepared based on the results measured in Example 8. 図19は、駆動回路の電圧とサンプルがサンプル移動流路を通過する時間の関係を示す図である。FIG. 19 is a diagram showing the relationship between the voltage of the drive circuit and the time for the sample to pass through the sample movement channel. 図20(1)は、図面代用写真で、実施例12で作製した電気測定用チップ1のサンプル移動流路付近の拡大写真、図20(2)は実施例12で作製した電気測定用チップ1のサンプル移動流路付近の寸法を説明するための図である。図20(3)は、定常電流値のヒストグラムで、各定常電流値においてカウントされた細胞数の分布を示すグラフである。FIG. 20 (1) is a drawing-substituting photograph, an enlarged photograph of the vicinity of the sample movement channel of the electrical measurement chip 1 produced in Example 12, and FIG. 20 (2) is an electrical measurement chip 1 produced in Example 12. It is a figure for demonstrating the dimension of the sample moving flow path vicinity. FIG. 20 (3) is a histogram of steady current values, and is a graph showing the distribution of the number of cells counted at each steady current value. 図21(1)は、図面代用写真で、サンプル移動流路3の狭窄部34付近の拡大写真である。図21(2)は、サンプル移動流路3と狭窄部34の長さ及び幅を説明するための図である。FIG. 21 (1) is a drawing-substituting photograph, which is an enlarged photograph of the vicinity of the narrowed portion 34 of the sample moving channel 3. FIG. 21 (2) is a diagram for explaining the length and width of the sample moving flow path 3 and the narrowed portion 34. 図22(1)は、図21に示すチップの左から右側にHeLa細胞を流した時の各幅の流路に入った時間(in)と出た時間(out)、及び定常電流値の変化を示すグラフである。図22(2)は、HeLa細胞を逆方向に流した時の各幅の流路に入った時間(in)と出た時間(out)、及び定常電流値を示すグラフである。FIG. 22 (1) shows the time (in) and time (out) when the HeLa cells flowed from the left to the right of the chip shown in FIG. It is a graph which shows. FIG. 22 (2) is a graph showing the time (in) and time (out) of entering the flow path of each width when the HeLa cells are flowed in the reverse direction, and the steady current value. 図23(1)は、図面代用写真で、実施例14で作製した電気測定用チップ1のサンプル移動流路3の狭窄部34付近の拡大写真である。図23(2)は、実施例14の定常電流値と通過時間の関係を示すグラフである。FIG. 23 (1) is a drawing-substituting photograph, which is an enlarged photograph of the vicinity of the constricted portion 34 of the sample moving channel 3 of the electrical measurement chip 1 produced in Example 14. FIG. 23 (2) is a graph showing the relationship between the steady current value and the passage time in Example 14.

以下に、本発明の電気測定用チップ、及び電気測定装置について詳しく説明する。先ず、本発明において、「定常電流」とは測定回路に定常的に流れているイオン電流を意味する。また、「過渡電流」とは、測定回路に瞬間的に流れるイオン電流を意味する。   Hereinafter, the electrical measurement chip and electrical measurement apparatus of the present invention will be described in detail. First, in the present invention, the “steady current” means an ionic current constantly flowing in the measurement circuit. The “transient current” means an ionic current that flows instantaneously in the measurement circuit.

図3は、本発明の電気測定用チップ1の概略を説明する図である。図3に示す電気測定用チップ1は、基板2、基板2上に形成されたサンプル移動流路3、サンプル移動流路3の一端に接続するサンプル投入流路4、サンプル移動流路3の他端に接続するサンプル回収流路5、サンプル移動流路3に接続する第1測定流路6、及び第1測定流路6とは反対側からサンプル移動流路3に接続する第2測定流路7を含んでいる(以下、基板上に形成した流路を纏める場合は、単に「流路」と記載することがある。)。第1測定流路6及び第2測定流路7でサンプル測定流路を形成する。   FIG. 3 is a diagram for explaining the outline of the electrical measurement chip 1 of the present invention. 3 includes a substrate 2, a sample moving channel 3 formed on the substrate 2, a sample input channel 4 connected to one end of the sample moving channel 3, and the sample moving channel 3 A sample recovery channel 5 connected to the end, a first measurement channel 6 connected to the sample transfer channel 3, and a second measurement channel connected to the sample transfer channel 3 from the side opposite to the first measurement channel 6 7 (hereinafter, when the flow paths formed on the substrate are collected, they may be simply referred to as “flow paths”). A sample measurement channel is formed by the first measurement channel 6 and the second measurement channel 7.

サンプル移動流路3の幅及び深さは、サンプルのサイズより大きければ特に制限は無いが、測定感度を上げる為には、サンプルのサイズより大き過ぎないように適宜調整することが好ましい。例えば、空気中のPM2.5の直径は約2.5μmであるので、サンプル移動流路3の幅及び深さは、3μm程度の大きさであればよい。また、スギ花粉の直径は約20〜40μm、ヒノキ花粉の直径は28μm〜45μm程度と言われているので、幅及び深さは約50μm程度であればよい。勿論、上記の数値は目安であって、サンプルがさらに大きな場合は、幅及び深さを100μ、150μm、200μm等、サンプルのサイズに応じて大きくしてもよい。幅及び深さの下限値は、現在の微細加工技術では約4nmが限界であるが、技術の進歩により、更に小さくしてもよい。   The width and depth of the sample moving flow path 3 are not particularly limited as long as they are larger than the size of the sample. However, in order to increase the measurement sensitivity, it is preferable to appropriately adjust the width and depth so as not to be too large. For example, since the diameter of PM2.5 in the air is about 2.5 μm, the width and depth of the sample moving flow path 3 may be about 3 μm. Moreover, since the diameter of a cedar pollen is said to be about 20-40 micrometers and the diameter of a hinoki pollen is said to be about 28 micrometers-45 micrometers, the width | variety and depth should just be about 50 micrometers. Of course, the above numerical values are only a guide, and when the sample is larger, the width and depth may be increased according to the size of the sample, such as 100 μm, 150 μm, and 200 μm. The lower limit values of the width and depth are about 4 nm in the current microfabrication technology, but may be further reduced as the technology advances.

サンプル投入流路4及びサンプル回収流路5は、サンプル駆動回路の電極を投入できる大きさであって、サンプルを含む液体(以下、サンプルを含む液体を「サンプル液」と記載することがある。)を投入及び回収できれば大きさ及び形状に特に制限は無いが、深さはサンプル移動流路3と同じにすることが望ましい。なお、サンプル移動回路3にサンプルが効率よく流入できるようにするため、サンプル投入流路4及びサンプル回収流路5は、サンプル移動回路3に向かって幅が狭くなるテーパー状にしてもよい。   The sample input channel 4 and the sample recovery channel 5 are large enough to input the electrodes of the sample drive circuit, and may include a liquid containing a sample (hereinafter, a liquid containing a sample is referred to as a “sample liquid”). ) Is not particularly limited in size and shape, but the depth is preferably the same as that of the sample moving flow path 3. In order to allow the sample to efficiently flow into the sample moving circuit 3, the sample input channel 4 and the sample recovery channel 5 may be tapered so that the width becomes narrower toward the sample moving circuit 3.

第1測定流路6及び第2測定流路7は、後述するサンプル測定回路の電極を夫々に投入して測定回路を構成し、定常電流の変化及び過渡電流を測定(以下、定常電流の変化及び過渡電流を測定することを「電流の変化を測定」と記載することがある。)するために用いられる。第1測定流路6及び第2測定流路7の大きさ及び形状は、サンプル測定回路の電極を投入できる大きさであれば特に制限は無いが、測定感度を高くするためには、抵抗を少なくすることが好ましい。サンプル液で満たされた流路の抵抗値は、サンプル液の抵抗率と流路の長さの積を、流路の断面積で割った値となる。したがって、流路の幅を大きくするほど面積が大きくなり、抵抗を少なくすることができる。そのため、第1測定流路6及び前記第2測定流路7の幅は、サンプル移動流路3と接続している部分の長さLより、サンプル移動流路3から離れるにしたがって長くなることが好ましい。第1測定流路6及び第2測定流路7の形状は同じであっても異なっていてもよいが、第1測定流路6及び第2測定流路7の形状が異なると、測定して得られるシグナルも非対称となる。そのため、測定したシグナルから物の形状等、より精度の高い測定をする場合は、第1測定流路6及び第2測定流路7を同じ形状にすることが好ましい。   The first measurement channel 6 and the second measurement channel 7 constitute a measurement circuit by inserting electrodes of a sample measurement circuit, which will be described later, and measure changes in steady-state current and transient current (hereinafter, changes in steady-state current). And measuring transient current is sometimes referred to as “measuring current change”). The size and shape of the first measurement channel 6 and the second measurement channel 7 are not particularly limited as long as the electrodes of the sample measurement circuit can be inserted, but in order to increase the measurement sensitivity, resistance is required. It is preferable to reduce it. The resistance value of the flow path filled with the sample liquid is a value obtained by dividing the product of the resistivity of the sample liquid and the length of the flow path by the cross-sectional area of the flow path. Therefore, as the width of the flow path is increased, the area is increased and the resistance can be reduced. Therefore, the widths of the first measurement channel 6 and the second measurement channel 7 may become longer as the distance from the sample movement channel 3 is longer than the length L of the portion connected to the sample movement channel 3. preferable. The shapes of the first measurement channel 6 and the second measurement channel 7 may be the same or different, but if the shapes of the first measurement channel 6 and the second measurement channel 7 are different, the measurement is performed. The resulting signal is also asymmetric. For this reason, it is preferable that the first measurement flow channel 6 and the second measurement flow channel 7 have the same shape when measuring a signal with higher accuracy such as the shape of an object from the measured signal.

なお、図3では、第1測定流路6及び第2測定流路7を略台形状にすることで、第1測定流路6及び第2測定流路7の幅をLより長くしているが、第1測定流路6及び第2測定流路7の幅がサンプル移動流路3から離れるにしたがって長くなれば形状に特に限定は無い。例えば、図4は、本発明の電気測定用チップ1の他の実施形態を示しており、図4に示すように、半円形状とすることで、サンプル移動流路3から離れるにしたがって長くするようにしてもよい。   In FIG. 3, the widths of the first measurement channel 6 and the second measurement channel 7 are longer than L by making the first measurement channel 6 and the second measurement channel 7 substantially trapezoidal. However, the shape is not particularly limited as long as the widths of the first measurement channel 6 and the second measurement channel 7 become longer as they move away from the sample moving channel 3. For example, FIG. 4 shows another embodiment of the electrical measurement chip 1 of the present invention. As shown in FIG. 4, the semi-circular shape makes it longer as it moves away from the sample moving channel 3. You may do it.

第1測定流路6及び第2測定流路7の深さは、サンプル移動流路3の深さと同じにすればよい。また、長さLは、短い程感度が良くなることから、微細加工技術で作製可能な程度まで短くすればよい。一方、長さLが長すぎると、サンプルがサンプル移動流路3から第1測定流路6又は第2測定流路7に流れ込む恐れがあるので、長さLはサンプル移動流路3の幅より短い方が好ましく、測定対象サンプルのサイズより短くすることがより好ましい。   The depths of the first measurement channel 6 and the second measurement channel 7 may be the same as the depth of the sample moving channel 3. Further, since the sensitivity is improved as the length L is shorter, it may be shortened to such an extent that it can be manufactured by a microfabrication technique. On the other hand, if the length L is too long, the sample may flow into the first measurement channel 6 or the second measurement channel 7 from the sample movement channel 3, so the length L is larger than the width of the sample movement channel 3. The shorter one is preferable, and it is more preferable to make it shorter than the size of the sample to be measured.

図5は、第1測定流路6及び第2測定流路7に代え、第1測定電極61及び第2測定電極71を形成した電気測定用チップ1の概略を説明する図である。第1測定電極61及び第2測定電極71を形成する場合は、第1測定流路6及び第2測定流路7を形成する必要は無く、サンプル移動流路3が形成された基板2上に、導電性の材料をサンプル移動流路3に接する位置まで塗布すればよい。電気測定用チップ1の使用時にはガラス板等で蓋をすることから、サンプル移動流路3の中はサンプル液で満たされる。そのため、基板2上に第1測定電極61及び第2測定電極71を形成してもサンプル液に導通できる。   FIG. 5 is a diagram for explaining the outline of the electrical measurement chip 1 in which the first measurement electrode 61 and the second measurement electrode 71 are formed instead of the first measurement channel 6 and the second measurement channel 7. In the case of forming the first measurement electrode 61 and the second measurement electrode 71, it is not necessary to form the first measurement channel 6 and the second measurement channel 7, and on the substrate 2 on which the sample moving channel 3 is formed. The conductive material may be applied up to a position in contact with the sample moving flow path 3. When the electrical measuring chip 1 is used, the sample moving flow path 3 is filled with the sample liquid because it is covered with a glass plate or the like. Therefore, even if the first measurement electrode 61 and the second measurement electrode 71 are formed on the substrate 2, the sample liquid can be conducted.

第1測定電極61及び第2測定電極71の材料としては、アルミニウム、銅、白金、金、銀、チタン等の公知の導電性金属を用いればよい。また、第1測定電極61及び第2測定電極71は基板2上をマスクして前記材料を蒸着することで作製すればよい。第1測定流路6及び第2測定流路7を形成して電極を挿入する形態と比較して、第1測定電極61及び第2測定電極71を形成する場合は抵抗を少なくできる。そのため、サンプル移動流路3に印加する電圧を低くすることができる。サンプル移動流路3と電極との接続部分の長さは第1測定流路6及び第2測定流路7と同様にすればよい。また、相対する第1測定電極61及び第2測定電極71の形状は同じにすることが望ましい。上記のとおり第1測定電極61及び第2測定電極71の場合は抵抗を少なくできることから、図3及び図4に示すようにサンプル移動流路3から離れるにしたがって第1測定電極61及び第2測定電極71の幅を長くしてもよいが、長方形等、同じ幅であってもよい。   As a material for the first measurement electrode 61 and the second measurement electrode 71, a known conductive metal such as aluminum, copper, platinum, gold, silver, or titanium may be used. The first measurement electrode 61 and the second measurement electrode 71 may be manufactured by masking the substrate 2 and vapor-depositing the material. The resistance can be reduced when the first measurement electrode 61 and the second measurement electrode 71 are formed, as compared with the configuration in which the first measurement channel 6 and the second measurement channel 7 are formed and the electrodes are inserted. Therefore, the voltage applied to the sample moving flow path 3 can be lowered. The length of the connection portion between the sample moving flow path 3 and the electrode may be the same as that of the first measurement flow path 6 and the second measurement flow path 7. In addition, it is desirable that the opposing first measurement electrode 61 and second measurement electrode 71 have the same shape. As described above, in the case of the first measurement electrode 61 and the second measurement electrode 71, the resistance can be reduced. Therefore, as shown in FIGS. 3 and 4, the first measurement electrode 61 and the second measurement electrode are moved away from the sample moving channel 3. The width of the electrode 71 may be increased, but it may be the same width such as a rectangle.

ところで、がん細胞の転移は、細胞の変形能が重要な役割を果たしていることが知られている。また、寿命や血中のコレステロールにより赤血球の変形能が低下すること、分化前の幹細胞は変形しやすいことが知られている。図6は、本発明の電気測定用チップ1の他の実施形態を示しており、サンプル移動流路3に狭窄部34を形成している。サンプルが狭窄部34を通過する際に、サンプルの変形能が異なると、狭窄部34を通過する際の細胞の変形具合が異なる。そのため、同種のサンプルであっても、通過時間や波形を調べることで、サンプルの変形能を測定することができる。図3〜5に示す電気測定用チップ1においても、サンプルの変形能が高ければ、サンプル移動流路3を変形しながら流れる為、サンプルの通過時間や波形を調べることで変形能を測定することはできるが、図6に示す電気測定用チップ1の方が、サンプルの変形能をより詳しく測定できる。狭窄部34の幅は、測定対象サンプルの変形能を測定することから、少なくとも測定対象サンプルより小さくすることが好ましく、測定対象サンプルの大きさの50%〜90%とすることが好ましく、60%〜80%程度とすることがより好ましい。また、狭窄部34の深さは特に制限はなく、サンプル移動流路3と同様とすればよい。なお、狭窄部34は、幅及び/又は深さをサンプルより小さくすればよいので、例えば、幅はサンプル移動流路3と同じにして、深さを測定対象サンプルの大きさの50%〜90%、より好ましくは60%〜80%程度としてもよい。或いは、幅及び深さの両方を、測定対象サンプルの大きさの50%〜90%、より好ましくは60%〜80%程度としてもよい。   By the way, it is known that the deformability of cells plays an important role in metastasis of cancer cells. In addition, it is known that the deformability of erythrocytes decreases due to life span and cholesterol in blood, and stem cells before differentiation are easily deformed. FIG. 6 shows another embodiment of the electric measurement chip 1 of the present invention, in which a narrowed portion 34 is formed in the sample moving flow path 3. When the sample passes through the stenosis part 34, if the deformability of the sample is different, the deformation state of the cells when passing through the stenosis part 34 is different. Therefore, even for the same type of sample, the deformability of the sample can be measured by examining the passage time and waveform. 3-5, if the deformability of the sample is high, it flows while deforming the sample moving flow path 3. Therefore, the deformability is measured by examining the passage time and waveform of the sample. However, the electric measuring chip 1 shown in FIG. 6 can measure the deformability of the sample in more detail. The width of the constricted portion 34 is preferably at least smaller than the measurement target sample because it measures the deformability of the measurement target sample, and is preferably 50% to 90% of the size of the measurement target sample, 60% More preferably, it is set to about ˜80%. Further, the depth of the narrowed portion 34 is not particularly limited and may be the same as that of the sample moving flow path 3. In addition, since the narrow part 34 should just make width and / or depth smaller than a sample, for example, the width is made the same as the sample movement flow path 3, and depth is 50%-90% of the magnitude | size of a measurement object sample. %, More preferably about 60% to 80%. Alternatively, both the width and depth may be about 50% to 90%, more preferably about 60% to 80% of the size of the sample to be measured.

なお、図6に示す電気測定用チップ1は狭窄部34を一か所形成した例を示しているが、狭窄部34は2カ所以上形成してもよい。また、狭窄部34を2か所以上形成する場合は、各々の狭窄部34の幅は同じであっても異なっていてもよい。また、図6に示す電気測定用チップ1は第1測定流路6及び第2測定流路7を設けているが、図5に示す第1測定電極61及び第2測定電極71としてもよい。   6 shows an example in which one narrow portion 34 is formed, but two or more narrow portions 34 may be formed. When two or more narrow portions 34 are formed, the width of each narrow portion 34 may be the same or different. 6 has the first measurement flow path 6 and the second measurement flow path 7, the first measurement electrode 61 and the second measurement electrode 71 shown in FIG. 5 may be used.

電気測定用チップ1は、微細加工技術を用いて製造することができる。図7は、図4のA−A’断面図で、電気測定チップ1の製造工程の一例を示している。
(1)基板2の上に、エッチング可能な材料8を化学蒸着で塗布する。
(2)ポジ型フォトレジスト9をスピンコータで塗布する。
(3)流路を形成する個所に光が照射するように、フォトマスクを用いて露光・現像処理し、流路を形成する部分のポジ型フォトレジスト9を除去する。なお、図3、図5及び図6に示す電気測定用チップ1を作製する際には、フォトマスクの形状を変えればよい。
(4)流路を形成する個所の材料8をエッチングし、流路を形成する。
(5)ポジ型フォトレジスト9を除去する。
The electrical measuring chip 1 can be manufactured by using a fine processing technique. FIG. 7 is a cross-sectional view taken along the line AA ′ in FIG. 4 and shows an example of the manufacturing process of the electrical measuring chip 1.
(1) An etchable material 8 is applied on the substrate 2 by chemical vapor deposition.
(2) A positive photoresist 9 is applied with a spin coater.
(3) Exposure / development processing is performed using a photomask so that light is irradiated to the portion where the flow path is formed, and the positive photoresist 9 in the portion where the flow path is formed is removed. Note that the shape of the photomask may be changed when the electrical measurement chip 1 shown in FIGS. 3, 5, and 6 is manufactured.
(4) The material 8 at the place where the flow path is formed is etched to form the flow path.
(5) The positive photoresist 9 is removed.

基板2は、半導体製造技術の分野で一般的に用いられている材料であれば特に制限は無い。基板2の材料としては、例えば、Si、Ge、Se、Te、GaAs、GaP、GaN、InSb、InP等が挙げられる。   The substrate 2 is not particularly limited as long as it is a material generally used in the field of semiconductor manufacturing technology. Examples of the material of the substrate 2 include Si, Ge, Se, Te, GaAs, GaP, GaN, InSb, and InP.

ポジ型フォトレジスト9としては、TSMR V50、PMER等、半導体製造分野で一般的に使用されているものであれば特に制限はない。また、ポジ型に代え、ネガティブ型フォトレジストを用いてもよく、SU−8、KMPR等、半導体製造分野で一般的に使用されているものであれば特に制限はない。フォトレジストの除去液は、ジメチルホルムアミドとアセトン等、半導体分野で一般的な除去液であれば特に制限はない。   The positive photoresist 9 is not particularly limited as long as it is generally used in the semiconductor manufacturing field, such as TSMR V50 and PMER. Further, a negative type photoresist may be used instead of the positive type, and there is no particular limitation as long as it is generally used in the semiconductor manufacturing field, such as SU-8, KMPR. The photoresist removal solution is not particularly limited as long as it is a common removal solution in the semiconductor field, such as dimethylformamide and acetone.

基板2の上に堆積し、流路及び流路以外を形成する材料8としては、絶縁性の材料であれば特に制限は無く、例えば、SiO2、Si34、BPSG、SiON等が挙げられる。なお、図7に示す製造工程は、エッチング可能な材料8を用いて流路を形成しているが、材料8として、上記のポジ型フォトレジストやネガティブ型フォトレジスト等の感光性樹脂を用いてもよい。感光性樹脂を用いる場合は、基板2上に感光性樹脂を塗布し、流路を形成できる形状のフォトマスクを用い、露光・現像により、感光性樹脂で流路を形成すればよい。The material 8 deposited on the substrate 2 and forming the flow path and other than the flow path is not particularly limited as long as it is an insulating material, and examples thereof include SiO 2 , Si 3 N 4 , BPSG, and SiON. It is done. In the manufacturing process shown in FIG. 7, the flow path is formed using the etchable material 8, but the material 8 is formed using the photosensitive resin such as the positive photoresist or the negative photoresist described above. Also good. When using a photosensitive resin, the photosensitive resin is applied on the substrate 2, a photomask having a shape capable of forming a flow path is used, and the flow path may be formed of the photosensitive resin by exposure and development.

図8は、本発明の電気測定用チップ1の他の製造工程を示す図である。図7に示す製造工程は、エッチングにより流路を形成しているが、図8に示す製造工程では、鋳型を転写することで電気測定用チップ1を作製できる。
(1)フォトマスクの形状を変えることで、転写後に流路を形成する凸部8を基板2上に形成し、鋳型を作製する。
(2)鋳型を、転写用の材料21に転写する。
(3)鋳型を剥離することで、流路が形成された電気測定用チップ1を作製する。
FIG. 8 is a diagram showing another manufacturing process of the electrical measurement chip 1 of the present invention. In the manufacturing process shown in FIG. 7, the flow path is formed by etching, but in the manufacturing process shown in FIG. 8, the chip 1 for electrical measurement can be manufactured by transferring the mold.
(1) By changing the shape of the photomask, convex portions 8 that form flow paths after transfer are formed on the substrate 2 to produce a mold.
(2) The template is transferred to the transfer material 21.
(3) The mold 1 is peeled to produce the electrical measurement chip 1 in which the flow path is formed.

鋳型を転写する材料21としては、ポリジメチルシロキサン(PDMS)、ポリメチルメタクリレート(PMMA)、ポリカーボネート(PC)、硬質ポリエチレン製等のプラスチック等の絶縁性材料が挙げられる。なお、転写して作製した電気測定用チップ1は、取扱いの利便性を向上するため、ガラス、プラスチック等の補助基板に貼り付けてもよい。   Examples of the material 21 for transferring the template include insulating materials such as polydimethylsiloxane (PDMS), polymethyl methacrylate (PMMA), polycarbonate (PC), and hard polyethylene. The electrical measurement chip 1 produced by transfer may be attached to an auxiliary substrate such as glass or plastic in order to improve the convenience of handling.

図7及び図8に示す製造工程で作製した電気測定用チップ1を用いて測定する際に、蛍光顕微鏡で観察する場合には、基板2、材料8、鋳型を転写する材料21、補助基板は、光透過性材料で形成することが望ましい。   When measuring using the electrical measurement chip 1 produced in the manufacturing process shown in FIGS. 7 and 8, when observing with a fluorescence microscope, the substrate 2, the material 8, the material 21 for transferring the mold, and the auxiliary substrate are: It is desirable to form the light transmissive material.

また、電気測定用チップ1は、サンプル液が流れやすくするために親水化処理をしてもよい。親水化処理方法としては、プラズマ処理、界面活性剤処理、PVP(ポリビニルピロリドン)処理、光触媒等が挙げられ、例えば、電気測定用チップ1の流路が形成されている面を10〜30秒間プラズマ処理することで、表面に水酸基を導入することができる。   Further, the electrical measuring chip 1 may be subjected to a hydrophilic treatment so that the sample liquid can easily flow. Examples of the hydrophilization treatment method include plasma treatment, surfactant treatment, PVP (polyvinylpyrrolidone) treatment, photocatalyst and the like. For example, the surface on which the flow path of the electric measurement chip 1 is formed is plasma for 10 to 30 seconds. By treatment, a hydroxyl group can be introduced on the surface.

図9は、本発明の電気測定用チップ1を用いた電気測定装置10の概略を示す図である。電気測定装置10は、電気測定用チップ1に加え、駆動回路30、及び測定回路40を含んでいる。   FIG. 9 is a diagram showing an outline of an electricity measuring device 10 using the electricity measuring chip 1 of the present invention. The electricity measuring device 10 includes a drive circuit 30 and a measuring circuit 40 in addition to the electricity measuring chip 1.

駆動回路30は、サンプル投入流路4に挿入する第1電極31及びサンプル回収流路5に挿入する第2電極32、電圧印加手段33を含んでいる。第1電極31及び第2電極32は、電気を通す材料であれば特に制限は無く、例えば、アルミニウム、銅、白金、金、銀、チタン等の公知の導電性金属を用いればよい。なお、図9に示す例では、第1電極31をサンプル投入流路4に、第2電極をサンプル回収流路5に挿入しているが、第1電極31及び第2電極32は、サンプル投入流路4及びサンプル回収流路5に形成し、電線で繋いでもよい。電圧印加手段33は、駆動回路30に電圧を印加してサンプルを移動できれば特に制限は無いが、電池ボックス等、ノイズを出しにくいものが好ましい。   The drive circuit 30 includes a first electrode 31 inserted into the sample input channel 4, a second electrode 32 inserted into the sample recovery channel 5, and a voltage applying unit 33. The first electrode 31 and the second electrode 32 are not particularly limited as long as they are materials that conduct electricity. For example, a known conductive metal such as aluminum, copper, platinum, gold, silver, or titanium may be used. In the example shown in FIG. 9, the first electrode 31 is inserted into the sample input channel 4 and the second electrode is inserted into the sample recovery channel 5, but the first electrode 31 and the second electrode 32 are input into the sample. It may be formed in the flow path 4 and the sample recovery flow path 5 and connected by electric wires. The voltage application means 33 is not particularly limited as long as the sample can be moved by applying a voltage to the drive circuit 30. However, it is preferable that the voltage application means 33 does not easily generate noise, such as a battery box.

なお、図9に示す実施形態では、電気測定用チップ1のサンプル投入流路4及びサンプル回収流路5に電極31及び32を投入してサンプルを移動させているが、サンプルが移動できれば他の実施形態であってもよい。例えば、サンプル回収流路5の一部に孔をあけ、シリコンチューブの一端をサンプル回収流路5に接続し他端をシリンジポンプ等の吸引器に接続することで、駆動回路30に加え、吸引力によりサンプルを移動させてもよい。細胞等の大きなサンプルを用いる場合に有用である。また、サンプル投入流路4及びサンプル回収流路5を設けなくてもよい。その場合、サンプル移動流路3の両端に孔を形成し、駆動回路30の第1電極31及び第2電極32もサンプル移動回路3に挿入すればよい。更に、必要に応じて、サンプル移動流路3の一端の孔には上記と同様の吸引器を設け、他端の孔にはシリコンチューブの一端を接続し、当該シリコンチューブの他端をサンプル液容器に接続することで、駆動回路30に加え、吸引力によりサンプルを移動してもよい。   In the embodiment shown in FIG. 9, the electrodes 31 and 32 are loaded into the sample loading channel 4 and the sample collection channel 5 of the electricity measuring chip 1 to move the sample. It may be an embodiment. For example, a hole is formed in a part of the sample recovery flow path 5, one end of the silicon tube is connected to the sample recovery flow path 5, and the other end is connected to an aspirator such as a syringe pump. The sample may be moved by force. This is useful when using large samples such as cells. Further, the sample input channel 4 and the sample recovery channel 5 need not be provided. In that case, holes may be formed at both ends of the sample moving flow path 3, and the first electrode 31 and the second electrode 32 of the drive circuit 30 may be inserted into the sample moving circuit 3. Furthermore, if necessary, a suction device similar to the above is provided in the hole at one end of the sample moving flow path 3, one end of the silicon tube is connected to the hole at the other end, and the other end of the silicon tube is connected to the sample liquid. By connecting to the container, the sample may be moved by suction force in addition to the drive circuit 30.

測定回路40は、第1測定流路6に挿入する第3電極41及び第2測定流路7に挿入する第4電極42、電流計43を少なくとも含んでおり、第3電極41及び第4電極42からの電流を電流計43で測定すればよい。また、駆動回路30と測定回路40の電圧を釣り合わせた状態にし、釣り合った状態からの電流の差分を検出することでより高感度検出を行う場合は、測定回路40に電圧印加手段44、可変抵抗45、抵抗46、更に、必要に応じて増幅手段を含ませることで、電流の差分のみを測定できるようにしてもよい。   The measurement circuit 40 includes at least a third electrode 41 inserted into the first measurement channel 6, a fourth electrode 42 inserted into the second measurement channel 7, and an ammeter 43, and the third electrode 41 and the fourth electrode What is necessary is just to measure the electric current from 42 with the ammeter 43. In the case where the voltages of the drive circuit 30 and the measurement circuit 40 are balanced, and the detection of the difference in current from the balanced state is performed for higher sensitivity detection, the voltage application means 44, the variable voltage is applied to the measurement circuit 40. Only the difference between the currents may be measured by including a resistor 45, a resistor 46, and, if necessary, an amplifying means.

第3電極41及び第4電極42は、第1電極31及び第2電極32と同様の材料で作製すればよく、また、第1測定流路6及び第2測定流路7に形成して電線で繋いでもよい。電圧印加手段44は、電圧印加手段33と同様に、電池ボックス等を用いればよい。電流計43も一般的に使用されている電流計を用いればよい。増幅手段も、一般的に使用されているアンプを用いればよい。第1測定電極61及び第2測定電極71を形成する場合は第3電極41及び第4電極42は不要で、第1測定電極61及び第2測定電極71と電流計43を電線で接続すればよい。   The third electrode 41 and the fourth electrode 42 may be made of the same material as that of the first electrode 31 and the second electrode 32, and are formed in the first measurement channel 6 and the second measurement channel 7 to form an electric wire. It may be connected with. The voltage application unit 44 may be a battery box or the like, similar to the voltage application unit 33. The ammeter 43 may be a generally used ammeter. Amplifying means may be a commonly used amplifier. When the first measurement electrode 61 and the second measurement electrode 71 are formed, the third electrode 41 and the fourth electrode 42 are not necessary, and the first measurement electrode 61 and the second measurement electrode 71 and the ammeter 43 are connected by an electric wire. Good.

本発明では、可変抵抗45及び抵抗46を用いることで、サンプル移動流路3中の第1測定流路6及び第2測定流路7に挟まれている部分の電位差と、抵抗46の電位差を釣り合った状態にし、サンプルがサンプル移動流路3に入った際の過渡電流の発生及び定常電流の変化を、釣り合った状態からのズレとして測定することができるので、検出感度を高めることができる。本発明に使用できる可変抵抗45及び抵抗46は、市販されているものを用いればよい。   In the present invention, by using the variable resistor 45 and the resistor 46, the potential difference of the portion sandwiched between the first measurement channel 6 and the second measurement channel 7 in the sample moving channel 3 and the potential difference of the resistor 46 are obtained. Since it is possible to measure the generation of transient current and the change in steady current when the sample enters the sample movement flow path 3 in a balanced state, the deviation from the balanced state can be measured, so that the detection sensitivity can be increased. Commercially available variable resistors 45 and resistors 46 may be used in the present invention.

図10は、本発明の電気測定装置10を用いてサンプルを測定する際の、電気測定チップ1上のサンプルの位置と測定できる電流値の関係を説明する図である。先ず、測定の前に、PBS、リン酸バッファー、TBEバッファー等の緩衝液を毛管現象で流路に導入し、次いで、サンプル液をサンプル投入流路4に投入する。次に、駆動回路30に電圧を印加すると、サンプルが、サンプル回収流路5に向けて移動する。サンプル投入流路4とサンプル移動流路3の境界付近(図10中のaの位置)にサンプルが移動すると、測定回路40は先ず過渡電流を測定する。次に、サンプルが、aの位置からサンプル移動流路3と第1測定流路6の接続部分(図10中のbの位置)の付近に移動するまで、定常電流の変化を読み取る。そして、サンプルが、bの位置からサンプル移動流路3と第2測定流路7の接続部分(図10中のcの位置)から出るまでの間は、より大きな定常電流の変化を測定する。そして、サンプルが、cの位置からサンプル移動流路3とサンプル回収流路5の境界付近(図10中のdの位置)に移動するまで、定常電流の変化を読み取り、そして、サンプルがサンプル回収回路5に出る際に、測定回路40は過渡電流を測定する。   FIG. 10 is a diagram for explaining the relationship between the position of the sample on the electrical measurement chip 1 and the current value that can be measured when measuring the sample using the electrical measurement apparatus 10 of the present invention. First, before the measurement, a buffer solution such as PBS, phosphate buffer, TBE buffer or the like is introduced into the channel by capillary action, and then the sample solution is introduced into the sample introduction channel 4. Next, when a voltage is applied to the drive circuit 30, the sample moves toward the sample recovery channel 5. When the sample moves to the vicinity of the boundary between the sample input channel 4 and the sample moving channel 3 (position a in FIG. 10), the measurement circuit 40 first measures the transient current. Next, the change in the steady current is read until the sample moves from the position a to the vicinity of the connection portion of the sample moving flow path 3 and the first measurement flow path 6 (position b in FIG. 10). Then, a larger change in steady current is measured from the position b until the sample exits from the connection portion (position c in FIG. 10) between the sample moving flow path 3 and the second measurement flow path 7. The change in steady current is read until the sample moves from the position c to the vicinity of the boundary between the sample moving flow path 3 and the sample collection flow path 5 (position d in FIG. 10). Upon exiting circuit 5, measurement circuit 40 measures the transient current.

図10に示すように、本発明の電気測定チップ1を用いてサンプルを測定すると、サンプルがサンプル移動流路3に入る時と出る時の過渡電流を測定することで、サンプルがサンプル移動流路3を移動(図10中のa〜d)する時間を正確に測定することができる。したがって、サンプルの表面電荷や変形能を測定することができる。なお、サンプル移動流路3に狭窄部34を設けた場合の波形は、後述する実施例において説明する。   As shown in FIG. 10, when a sample is measured using the electrical measurement chip 1 of the present invention, the sample is moved by measuring the transient current when the sample enters and leaves the sample moving channel 3. The time for moving 3 (ad in FIG. 10) can be measured accurately. Therefore, the surface charge and deformability of the sample can be measured. In addition, the waveform at the time of providing the constriction part 34 in the sample movement flow path 3 is demonstrated in the Example mentioned later.

また、サンプルの粒径、形状は、サンプルが、第1測定流路6とサンプル移動流路3の接続部分から第2測定流路7とサンプル移動流路3の接続部分までの間(図10中のb〜c)の定常電流の変化の大きさで測定することができる。したがって、サンプル移動流路3の長さに比較して、サンプルの定常電流の変化を測定する長さが短いことから、測定感度を維持することができる。更に、第1測定流路6と第2測定流路7の間以外のサンプル移動流路3はガイド流路として利用することができることから、測定感度を維持したまま、DNA等の細長い分子を伸長状態で測定することが可能となる。   In addition, the particle size and shape of the sample are such that the sample is between the connection portion between the first measurement channel 6 and the sample movement channel 3 and the connection portion between the second measurement channel 7 and the sample movement channel 3 (FIG. 10). It can be measured by the magnitude of the change in the steady current b to c). Therefore, compared with the length of the sample moving flow path 3, since the length which measures the change of the steady current of a sample is short, measurement sensitivity can be maintained. Furthermore, since the sample movement flow path 3 other than between the first measurement flow path 6 and the second measurement flow path 7 can be used as a guide flow path, elongated molecules such as DNA are elongated while maintaining measurement sensitivity. It becomes possible to measure in a state.

上記のとおり、本発明の電気測定装置10は、サンプルがサンプル移動流路3を通過する間の定常電流の変化を測定し、特に、サンプルが第1測定流路6及び第2測定流路7の間を移動している時の定常電流のより大きな変化を測定している。したがって、第1測定流路6及び第2測定流路7は、サンプル移動流路3の両端部に近い非対称となる位置に形成してもよいが、その場合、後述する実施例で示すとおりピーク時の波形は線状となることから第1測定流路6及び第2測定流路7を形成する位置のズレを小さくすることが好ましい。なお、本発明において、位置の「ズレ」とは、第1測定流路6とサンプル移動流路3の接続部分の中間点と第2測定流路7とサンプル移動流路3の接続部分の中間点(図10中の⇔)を意味する。一方、後述する実施例で示すとおり、サンプル移動流路3を挟んだ対称となる位置に第1測定流路6及び第2測定流路7を形成しても定常電流を測定することはできるが、定常電流の波形が割れることから、上記のとおり、非対称となる位置に形成することが好ましく、位置のズレを、第1測定流路6とサンプル移動流路3の接続部分の長さの半分+第2測定流路7とサンプル移動流路3の接続部分の長さの半分+サンプルの大きさ、とすることがより好ましい   As described above, the electrical measurement device 10 of the present invention measures a change in steady current while the sample passes through the sample moving flow path 3. In particular, the sample measures the first measurement flow path 6 and the second measurement flow path 7. The larger change in steady-state current is measured when moving between. Therefore, the first measurement channel 6 and the second measurement channel 7 may be formed at positions that are asymmetric near both ends of the sample moving channel 3, but in that case, as shown in the examples described later, Since the waveform at the time is linear, it is preferable to reduce the displacement of the positions where the first measurement channel 6 and the second measurement channel 7 are formed. In the present invention, the “displacement” of the position means an intermediate point between the connection portions of the first measurement channel 6 and the sample movement channel 3 and an intermediate point between the connection points of the second measurement channel 7 and the sample movement channel 3. It means a point (⇔ in FIG. 10). On the other hand, as shown in the examples described later, the steady current can be measured even if the first measurement channel 6 and the second measurement channel 7 are formed at symmetrical positions with the sample moving channel 3 interposed therebetween. As described above, since the waveform of the steady current is broken, it is preferably formed at an asymmetric position as described above, and the positional deviation is half the length of the connection portion of the first measurement channel 6 and the sample moving channel 3. It is more preferable that + half the length of the connecting portion between the second measurement channel 7 and the sample moving channel 3 + the sample size.

図11は、電気測定用チップ1の他の実施形態を示す図である。図3〜図6に示す電気測定用チップ1のサンプル投入流路4及びサンプル回収流路5は単一の流路となっているが、図11に示すよう、サンプル投入流路4及びサンプル回収流路5を、複数の流路として形成してもよい。サンプル投入流路4を複数の流路とすることで、例えば、異なるサンプルを夫々の流路に入れ、駆動回路の第1電極31及び第2電極32も夫々の流路に入れ、電圧を印加する電極を切り替えることで、異なるサンプルを連続分析して、サンプル回収流路に回収することができる。   FIG. 11 is a view showing another embodiment of the electricity measuring chip 1. The sample input channel 4 and the sample recovery channel 5 of the electrical measurement chip 1 shown in FIGS. 3 to 6 are a single channel, but as shown in FIG. 11, the sample input channel 4 and the sample recovery channel The channel 5 may be formed as a plurality of channels. By making the sample input flow path 4 into a plurality of flow paths, for example, different samples are put in the respective flow paths, and the first electrode 31 and the second electrode 32 of the drive circuit are also put in the respective flow paths, and voltage is applied. By switching the electrodes to be used, different samples can be continuously analyzed and collected in the sample collection channel.

なお、複数の流路は、サンプル投入流路4又はサンプル回収流路5の一方のみに形成してもよい。サンプル投入流路4のみを複数の流路とした場合は、異なるサンプル液を連続的に分析することができる。   Note that the plurality of channels may be formed only in one of the sample input channel 4 and the sample recovery channel 5. When only the sample input channel 4 is a plurality of channels, different sample solutions can be continuously analyzed.

また、サンプル液中に表面電荷が異なるサンプルが含まれる場合、サンプル移動流路3を流れるサンプルの移動速度が異なる。したがって、サンプル回収流路5のみを複数の流路を形成し、夫々の流路に挿入する電極を切り替えることで、サンプル液中の異なるサンプルを分離・回収することができ、更に別の分析に用いることができる。   Further, when samples having different surface charges are included in the sample liquid, the moving speed of the sample flowing through the sample moving flow path 3 is different. Therefore, by forming a plurality of flow paths only for the sample recovery flow path 5 and switching the electrodes inserted into the respective flow paths, different samples in the sample liquid can be separated and recovered for further analysis. Can be used.

以下に実施例を掲げ、本発明を具体的に説明するが、この実施例は単に本発明の説明のため、その具体的な態様の参考のために提供されているものである。これらの例示は本発明の特定の具体的な態様を説明するためのものであるが、本願で開示する発明の範囲を限定したり、あるいは制限することを表すものではない。   The present invention will be described in detail with reference to the following examples, which are provided merely for the purpose of illustrating the present invention and for reference to specific embodiments thereof. These exemplifications are for explaining specific specific embodiments of the present invention, but are not intended to limit or limit the scope of the invention disclosed in the present application.

〔電気測定用チップ1の作製〕
<実施例1>
以下の手順により、電気測定用チップ1を作製した。
(1)厚さ600μmのシリコン基板2(フェローテックシリコン社製 直径76mm)を準備した。
(2)ネガ型フォトレジストSU−8 3005(MICRO CHEM社製)をスピンコータにより塗布した。
(3)フォトリソグラフィにより、流路を形成する個所に光が照射するように、フォトマスクを用いて露光した。露光後は、SU−8 developer(MICRO CHEM社製)を用いてレジストを現像した。現像後は、超純水を用いてリンスし、スピンドライヤーで水分を飛ばし乾燥させ、鋳型を作製した。
(4)作製した鋳型に、ポリジメチルシロキサン(東レ社製、SILPOT184)を流し込み、硬化させた。
(5)硬化したPDMSを鋳型から取り外し、次いで、市販のカバーガラス(厚み:0.17mm)をPDMSに密着させて電気測定用チップ1を作製した。
[Preparation of chip 1 for electrical measurement]
<Example 1>
The electrical measurement chip 1 was produced by the following procedure.
(1) A silicon substrate 2 (diameter 76 mm, manufactured by Ferrotec Silicon) with a thickness of 600 μm was prepared.
(2) A negative photoresist SU-8 3005 (manufactured by MICRO CHEM) was applied by a spin coater.
(3) It exposed using the photomask so that light might irradiate the part which forms a flow path by photolithography. After exposure, the resist was developed using SU-8 developer (manufactured by MICRO CHEM). After the development, rinsing was performed using ultrapure water, and moisture was removed by a spin dryer and dried to prepare a mold.
(4) Polydimethylsiloxane (SILPOT184, manufactured by Toray Industries, Inc.) was poured into the produced mold and cured.
(5) The cured PDMS was removed from the mold, and then a commercially available cover glass (thickness: 0.17 mm) was brought into close contact with the PDMS to produce a chip 1 for electrical measurement.

図12(1)は、実施例1で作製した電気測定用チップ1の写真で、図12(2)は、第1測定流路6及び第2測定流路7付近の拡大写真である。サンプル移動流路3の長さは150μm、幅は4μm、深さは7.5μmであった。第1測定流路6及び第2測定流路7の深さは7.5μm、サンプル移動流路3との接続部分の長さは10.5μmで、サンプル移動流路と第1測定流路の角度は約45°であった。また、サンプル移動流路3を挟んだ第1測定流路6と第2測定流路7の位置のズレは、40μmであった。サンプル投入流路4及びサンプル回収流路5の深さは7.5μmであった。   12A is a photograph of the electrical measurement chip 1 produced in Example 1, and FIG. 12B is an enlarged photograph of the vicinity of the first measurement channel 6 and the second measurement channel 7. The sample moving flow path 3 had a length of 150 μm, a width of 4 μm, and a depth of 7.5 μm. The depth of the first measurement channel 6 and the second measurement channel 7 is 7.5 μm, and the length of the connecting portion with the sample movement channel 3 is 10.5 μm. The angle was about 45 °. Further, the positional deviation between the first measurement channel 6 and the second measurement channel 7 across the sample moving channel 3 was 40 μm. The depth of the sample input channel 4 and the sample recovery channel 5 was 7.5 μm.

<実施例2>
実施例1のフォトマスクの形状を換え、第1測定流路6と第2測定流路7の位置のズレを5μmとした以外は、実施例1と同様の手順で電気測定用チップ1を作製した。図13(1)は、実施例2で作製した電気測定用チップ1の第1測定流路6及び第2測定流路7付近の拡大写真である。
<Example 2>
The electrical measurement chip 1 is manufactured in the same procedure as in Example 1 except that the shape of the photomask of Example 1 is changed and the positional deviation between the first measurement channel 6 and the second measurement channel 7 is set to 5 μm. did. FIG. 13 (1) is an enlarged photograph of the vicinity of the first measurement channel 6 and the second measurement channel 7 of the electrical measurement chip 1 produced in Example 2.

<実施例3>
実施例1のフォトマスクの形状を換え、サンプル移動流路3を挟んで対称の位置に第1測定流路6と第2測定流路7を形成した以外は、実施例1と同様の手順で電気測定用チップ1を作製した。図13(2)は、実施例3で作製した電気測定用チップ1の第1測定流路6及び第2測定流路7付近の拡大写真である。
<Example 3>
The procedure of Example 1 is the same as that of Example 1 except that the shape of the photomask of Example 1 is changed and the first measurement channel 6 and the second measurement channel 7 are formed at symmetrical positions across the sample moving channel 3. An electrical measurement chip 1 was produced. FIG. 13 (2) is an enlarged photograph of the vicinity of the first measurement channel 6 and the second measurement channel 7 of the electrical measurement chip 1 produced in Example 3.

〔電気測定装置10の作製〕
<実施例4>
(1)駆動回路30の作製
第1電極31及び第2電極32は、電線(オヤイデ電気社製FTVS−408)の皮を剥いで金属部分を露出させて作製した。電圧印加手段33は、電池ボックス(誠南工業社製)を用いた。
(2)測定回路40の作製
第3電極41及び第4電極42は、電線(オヤイデ電気社製FTVS−408)の皮を剥いで金属部分を露出させて作製した。増幅手段は、FEMTO社製Variable Gain Low Noise Current Amplifierを用いた。電圧印加手段44は、電池ボックス(誠南工業社製)を用いた。可変抵抗45は、BI Technologies社製精密ポテンションメーターを用いた。電流計43は、増幅手段で増幅したシグナルをUSB−DAQ(National Instruments社製)を用いてPC用の電気信号に変換し、Lab View(National Instruments社製)を用いて作成したソフトウェアで読み取った。抵抗46は、金属皮膜抵抗(1kΩ パナソニック製)を用いた。
(3)実施例1で作製した電気測定用チップ1の、サンプル投入流路4に第1電極31、サンプル回収流路5に第2電極32、第1測定流路6に第3電極41、第2測定流路7に第4電極42を挿入することで、本発明の電気測定装置10を作製した。
[Fabrication of electrical measuring device 10]
<Example 4>
(1) Production of Drive Circuit 30 The first electrode 31 and the second electrode 32 were produced by peeling a wire (FTAS-408 manufactured by Oyaide Electric Co., Ltd.) and exposing a metal part. As the voltage application means 33, a battery box (manufactured by Seinan Industry Co., Ltd.) was used.
(2) Production of measurement circuit 40 The third electrode 41 and the fourth electrode 42 were produced by peeling the skin of an electric wire (FTVS-408 manufactured by Oyaide Electric Co., Ltd.) to expose the metal part. As the amplification means, Variable Gain Low Noise Current Amplifier manufactured by FEMTO was used. As the voltage applying means 44, a battery box (manufactured by Seinan Industry Co., Ltd.) was used. As the variable resistor 45, a precision potentiometer manufactured by BI Technologies was used. The ammeter 43 converts the signal amplified by the amplifying means into an electrical signal for PC using USB-DAQ (manufactured by National Instruments) and read it with software created using Lab View (manufactured by National Instruments). . The resistor 46 was a metal film resistor (1 kΩ made by Panasonic).
(3) The electrical measurement chip 1 manufactured in Example 1 has the first electrode 31 in the sample input channel 4, the second electrode 32 in the sample recovery channel 5, the third electrode 41 in the first measurement channel 6, By inserting the fourth electrode 42 into the second measurement channel 7, the electrical measurement device 10 of the present invention was produced.

〔電気測定装置10を用いた測定〕
<実施例5>
超純水にサンプルとして蛍光マイクロビーズ(Polyscience社製Fluoresbrite)を分散することで、サンプル液を作製した。次に、5×TBEバッファーを毛管現象により流路に導入し、作製したサンプル液30μlをサンプル投入流路4に投入し、駆動回路30に53Vの電圧を印加した。また、測定回路40には、18Vの電圧を印加した。可変抵抗45を操作し、駆動回路30及び測定回路40の見かけ上の抵抗を釣り合った状態にした。サンプルがサンプル移動流路3を流れた際の定常電流の変化と過渡電流の発生を計測した。図14(1)は、実施例5における測定時間と測定された定常電流値の関係を示すグラフである。
[Measurement using the electrical measuring device 10]
<Example 5>
A sample solution was prepared by dispersing fluorescent microbeads (Fluoresbrite manufactured by Polyscience) as a sample in ultrapure water. Next, 5 × TBE buffer was introduced into the channel by capillary action, 30 μl of the prepared sample solution was introduced into the sample introduction channel 4, and a voltage of 53 V was applied to the drive circuit 30. A voltage of 18 V was applied to the measurement circuit 40. The variable resistor 45 was operated so that the apparent resistances of the drive circuit 30 and the measurement circuit 40 were balanced. Changes in steady-state current and generation of transient current when the sample flowed through the sample moving flow path 3 were measured. FIG. 14A is a graph showing the relationship between the measurement time and the measured steady current value in Example 5.

<実施例6>
実施例2で作製した電気測定用チップ1を用いた以外は、実施例5と同様の手順で測定を行った。図14(2)は、実施例6における測定時間と測定された定常電流値の関係を示すグラフである。
<Example 6>
Measurement was carried out in the same procedure as in Example 5 except that the electrical measurement chip 1 produced in Example 2 was used. FIG. 14B is a graph showing the relationship between the measurement time and the measured steady current value in Example 6.

<実施例7>
実施例3で作製した電気測定用チップ1を用いた以外は、実施例5と同様の手順で測定を行った。図14(3)は、実施例7における測定時間と測定された定常電流値の関係を示すグラフである。
<Example 7>
Measurement was performed in the same procedure as in Example 5 except that the electrical measurement chip 1 produced in Example 3 was used. FIG. 14 (3) is a graph showing the relationship between the measurement time and the measured steady current value in Example 7.

図14(1)〜(3)に示すように、実施例1〜3の何れの電気測定用チップ1を用いた場合でも、過渡電流の2つのピークが確認され、ピークの間隔はほぼ同じであった。実施例1〜3は同じサンプルを使用していることから、表面電荷は同じである。したがって、第1測定流路6及び第2測定流路7の位置関係によらず、サンプルの表面電荷に応じて、サンプルがサンプル移動流路3を移動する時間を正確に測定することができる。   As shown in FIGS. 14 (1) to (3), when any of the electrical measurement chips 1 of Examples 1 to 3 is used, two peaks of transient current are confirmed, and the peak intervals are almost the same. there were. Since Examples 1 to 3 use the same sample, the surface charges are the same. Therefore, regardless of the positional relationship between the first measurement channel 6 and the second measurement channel 7, the time for the sample to move through the sample movement channel 3 can be accurately measured according to the surface charge of the sample.

また、実施例1の電気測定用チップ1を用いた場合、図14(1)に示すように、定常電流値の変化量は一番大きかったが、ピーク時の波形は線状となった。これは、第1測定流路6及び第2測定流路7のズレが大きいことから、第1測定流路6及び第2測定流路7の間でサンプルが移動しても、体積変化が起こらず定常状態が続いたためと考えられる。   Further, when the electrical measurement chip 1 of Example 1 was used, as shown in FIG. 14A, the amount of change in the steady current value was the largest, but the peak waveform was linear. This is because the displacement between the first measurement channel 6 and the second measurement channel 7 is large, so that even if the sample moves between the first measurement channel 6 and the second measurement channel 7, the volume change does not occur. This is probably because the steady state continued.

一方、図14(2)に示すように、実施例2の電気測定用チップ1を用いた場合、実施例1の電気測定用チップ1と比較して、定常電流値の変化は少なくなるものの、定常電流値の波形は明確なピークを示した。   On the other hand, as shown in FIG. 14 (2), when the electrical measurement chip 1 of Example 2 is used, the change in steady-state current value is smaller than that of the electrical measurement chip 1 of Example 1, The steady-state current waveform showed a clear peak.

更に、実施例3の電気測定用チップ1を用いた場合、図14(3)に示すようにピークを2つ測定した。これは、図15に示すように、
(1)第1測定流路6及び第2測定流路7が対称となる位置関係に配置されているため、実施例1及び実施例2の配置のチップより測定回路40の電流が流れやすい、
(2)第1測定流路6及び第2測定流路7の端にサンプルが流れて来た時に定常電流の変化を測定するが、上記のとおり、実施例3の電気測定用チップ1は電気が流れやすいため、サンプルがサンプル移動流路3との接続部分の中間に来た時に定常電流値がベース値に近い値に戻り、
(3)そして、接続部分からサンプルが流れ出る際に、定常電流値の変化を測定した、
為と考えられる。
Further, when the electricity measuring chip 1 of Example 3 was used, two peaks were measured as shown in FIG. As shown in FIG.
(1) Since the first measurement flow path 6 and the second measurement flow path 7 are arranged in a symmetrical positional relationship, the current of the measurement circuit 40 is more likely to flow than the chips arranged in the first and second embodiments.
(2) When the sample flows to the ends of the first measurement channel 6 and the second measurement channel 7, the change in the steady current is measured. As described above, the electrical measurement chip 1 of Example 3 is the electrical Therefore, when the sample comes in the middle of the connection part with the sample moving flow path 3, the steady current value returns to a value close to the base value,
(3) Then, when the sample flowed out from the connection part, the change in the steady current value was measured.
It is thought to be for the purpose.

以上の結果より、第1測定流路6及び第2測定流路7は、サンプル移動流路3を挟んで非対称の位置に形成することが好ましく、サンプルの大きさに応じてピーク値の値が線状にならない程度にズラして配置(第1測定流路6の端部と第2測定流路7の端部がサンプル移動流路3を挟んで重ならず、且つ離れすぎない位置)することが好ましい。   From the above results, the first measurement channel 6 and the second measurement channel 7 are preferably formed at asymmetric positions with the sample moving channel 3 in between, and the peak value varies depending on the sample size. Arranged so as not to be linear (the position where the end of the first measurement channel 6 and the end of the second measurement channel 7 do not overlap with the sample moving channel 3 and are not too far apart). It is preferable.

〔電気測定装置10及び蛍光顕微鏡を用いた測定〕
<実施例8>
サンプルとして蛍光マイクロビーズ(Polyscience社製Fluoresbrite)を用い、電気測定用チップ1の第1測定流路6と第2測定流路7の間が観察できるように蛍光顕微鏡(Nikon社製TE300)を配置して蛍光強度を測定した以外は、実施例5と同様の手順で測定を行った。図16は、電気測定用チップ1の写真及び第1測定流路6〜第2測定流路7の間を流れる蛍光マイクロビーズの写真、並びに、蛍光マイクロビーズが流れる際の定常電流値の変化(シグナル強度)と蛍光強度の変化を示すグラフ(グラフ中の線で囲った部分が、蛍光マイクロビーズが第1測定流路6〜第2測定流路7の間を流れた際の測定結果)である。図16に示すように、本発明の電気測定装置10を用いることで、過渡電流及び定常電流値の変化を測定しつつ、蛍光顕微鏡で電気測定用チップ1のサンプル移動流路3を流れるサンプルを観察することができるので、電気測定用チップ1の測定部位で起こっている事象を正確に観察することができる。
[Measurement using the electrical measuring device 10 and a fluorescence microscope]
<Example 8>
Using fluorescent microbeads (Fluoresbrite manufactured by Polyscience) as a sample, a fluorescent microscope (TE300 manufactured by Nikon) is arranged so that the space between the first measurement channel 6 and the second measurement channel 7 of the electrical measurement chip 1 can be observed. Then, the measurement was performed in the same procedure as in Example 5 except that the fluorescence intensity was measured. FIG. 16 shows a photograph of the electrical measurement chip 1, a photograph of fluorescent microbeads flowing between the first measurement channel 6 and the second measurement channel 7, and a change in steady-state current value when the fluorescent microbeads flow ( Signal intensity) and a graph showing changes in fluorescence intensity (the portion surrounded by the line in the graph is the measurement result when the fluorescent microbead flows between the first measurement channel 6 and the second measurement channel 7) is there. As shown in FIG. 16, by using the electrical measuring device 10 of the present invention, a sample flowing through the sample moving channel 3 of the electrical measuring chip 1 is measured with a fluorescence microscope while measuring changes in the transient current and the steady current value. Since it can be observed, the event occurring at the measurement site of the electrical measurement chip 1 can be accurately observed.

<実施例9>
サンプルとして、粒径が約3.1μm、2.08μm、1μmの蛍光マイクロビーズ(Polyscience社製Fluoresbrite)を用いた以外は、実施例8と同様の手順で測定を行った。図17は実施例9で測定した定常電流値の変化(シグナル強度)を示すグラフである。従来の定常電流値の変化の測定のみでは、同じ大きさの物質が重なったものであるのか、又は、大きさの異なる物質であるのか判別が困難であったが、蛍光顕微鏡と併せて観察することで、サンプルを正確に判別できた。なお、蛍光顕微鏡は異なる色を判別できることから、例えば、グラム陰性菌と陽性菌を染色して蛍光顕微鏡で観察しつつ、過渡電流及び定常電流値の変化を測定することで、大凡の種類の判別も可能となる。
<Example 9>
Measurement was performed in the same manner as in Example 8, except that fluorescent microbeads (Fluoresbrite manufactured by Polyscience) having a particle size of about 3.1 μm, 2.08 μm, and 1 μm were used. FIG. 17 is a graph showing changes (signal intensity) in steady-state current values measured in Example 9. Although it was difficult to determine whether substances of the same size overlap each other or substances of different sizes only by measuring changes in the steady-state current value in the past, observe in conjunction with a fluorescence microscope. As a result, the sample could be accurately identified. In addition, since the fluorescence microscope can distinguish different colors, for example, by staining the gram-negative bacteria and the positive bacteria and observing them with a fluorescence microscope, measuring changes in transient currents and steady-state current values, it is possible to distinguish roughly types. Is also possible.

〔粒径と定常電流値の大きさの関係〕
<実施例10>
サンプルとして、粒径が約3.1μm、2.08μm、1.75μm、1.1μm、1μm、0.75μmの蛍光マイクロビーズ(Polyscience社製Fluoresbrite)を用いて実施例8と同様の手順で測定を行った。図18はサンプルの体積と定常電流値の変化(シグナル強度)を示すグラフである。図18に示すように、シグナル強度とサンプルの体積は相関関係があることが確認できた。
[Relationship between particle size and steady current value]
<Example 10>
Measurement was performed in the same manner as in Example 8 using fluorescent microbeads (Fluoresbrite manufactured by Polyscience) having particle diameters of about 3.1 μm, 2.08 μm, 1.75 μm, 1.1 μm, 1 μm, and 0.75 μm. Went. FIG. 18 is a graph showing the change in the volume of the sample and the steady current value (signal intensity). As shown in FIG. 18, it was confirmed that there was a correlation between the signal intensity and the sample volume.

〔印加電圧と、シグナル強度及び通過時間の関係〕
<実施例11>
実施例5において、駆動回路30の電圧を、53V、32V、12Vの3種類に代えて測定した以外は実施例5と同様の手順で測定を行った。図19は、駆動回路の電圧とサンプルがサンプル移動流路を通過する時間の関係を示す図である。図19に示すように、駆動電圧30の電圧を大きくすることで、測定感度を上げることができる一方で、サンプルの表面電荷により、通過時間が短くなることが明らかとなった。また、12Vの場合は、シグナル強度のバラツキは少なかったものの、通過時間のバラツキが大きかった。一方、駆動電圧を32V以上にした場合、通過時間のバラツキはほとんどなかったが、シグナル強度のバラツキが見られた。これは、低電圧下では、電荷を持つサンプルへの駆動力が小さくなり、壁面から受ける摩擦力によってサンプルの移動速度に影響を与えたためと考えられる。
本発明においては、サンプル移動流路3の長さ、及び第1測定流路6及び第2測定流路7の間隔を任意に設定できる。したがって、駆動回路30の電圧を高くしても、定常電流の変化を読み取るのに必要で且つ最短となる時間となるようにサンプル移動流路3の長さ、及び第1測定流路6及び第2測定流路7を設定できることから、短時間で高感度検出を行うことができる。
[Relationship between applied voltage, signal intensity and transit time]
<Example 11>
In Example 5, the measurement was performed in the same procedure as in Example 5 except that the voltage of the drive circuit 30 was measured in place of the three types of 53V, 32V, and 12V. FIG. 19 is a diagram showing the relationship between the voltage of the drive circuit and the time for the sample to pass through the sample movement channel. As shown in FIG. 19, it is clear that the measurement sensitivity can be increased by increasing the voltage of the drive voltage 30, while the passage time is shortened due to the surface charge of the sample. In addition, in the case of 12V, although there was little variation in signal intensity, variation in passage time was large. On the other hand, when the drive voltage was set to 32 V or more, there was almost no variation in the passage time, but there was a variation in the signal intensity. This is presumably because the driving force to the charged sample was reduced under a low voltage, and the moving speed of the sample was affected by the frictional force received from the wall surface.
In the present invention, the length of the sample movement channel 3 and the interval between the first measurement channel 6 and the second measurement channel 7 can be arbitrarily set. Therefore, even if the voltage of the drive circuit 30 is increased, the length of the sample moving flow path 3 and the first measurement flow path 6 and the first measurement flow path 6 are adjusted so that the time required for reading the change in the steady current is the shortest. 2 Since the measurement channel 7 can be set, highly sensitive detection can be performed in a short time.

〔細胞を用いた際の粒径と定常電流値の大きさの関係〕
<実施例12>
上記実施例10では、形状が一定の蛍光マイクロビーズを用いたが、形状が変化する細胞を用いた場合のシグナル強度とサンプル体積の相関関係を調べた。
先ず、実施例1のフォトマスクの形状を変えることで、サンプル移動流路3の幅が20μm、第1測定流路6の端部と第2測定流路7の端部の距離が20μmの電気測定用チップ1を作製した。図20(1)は、実施例12で作製した電気測定用チップ1のサンプル移動流路付近の拡大写真、図20(2)は実施例12で作製した電気測定用チップ1のサンプル移動流路付近の寸法を説明するための図である。その他のサイズは、実施例1と同様である。
そして、駆動回路30に加え、作製した電気測定用チップ1のPDMSのサンプル投入流路4及びサンプル回収流路5の一部に孔をあけ、シリコンチューブの一端をサンプル回収流路5の形成した孔に接続し他端をシリンジポンプ(kd Scientific,KDS210)に接続した以外は、実施例4と同様の手順で電気測定装置10を作製した。
次に、サンプルとして、
・HeLa細胞(ヒト子宮頸がん由来細胞):約15μm(ATCC,CCL−2)
・Jurkat細胞(ヒトT細胞)浮遊系 :約10μm(ATCC,TIB−152)、
を用いた。なお、HeLa細胞は、HeLa用細胞培地であるMEM(Sigma aldrich,M4655)を用いて培養した。また、Jurkatは、Jurkat用細胞培地であるRPMI1640(gibco,11875−093)を用いて培養した。
そして、蛍光マイクロビーズに変え上記の細胞を用い、駆動回路30に印加する電圧を3V、シリンジポンプでサンプル溶液を5〜10μL/minで吸引した以外は、実施例10と同様の手順で実験を行った。
図20(3)は、定常電流値のヒストグラムで、各定常電流値においてカウントされた細胞数の分布を示すグラフである。図20(2)に示すように、細胞等の形状が変化し易いサンプルを用いた場合でも、定常電流値の強度とサンプルの体積には相関関係があることが確認できた。
[Relationship between particle size and steady current when using cells]
<Example 12>
In Example 10 above, fluorescent microbeads having a constant shape were used, but the correlation between the signal intensity and the sample volume in the case of using cells whose shape changed was examined.
First, by changing the shape of the photomask of the first embodiment, the width of the sample movement channel 3 is 20 μm, and the distance between the end of the first measurement channel 6 and the end of the second measurement channel 7 is 20 μm. A measuring chip 1 was produced. 20 (1) is an enlarged photograph of the vicinity of the sample movement channel of the electrical measurement chip 1 produced in Example 12, and FIG. 20 (2) is the sample migration channel of the electrical measurement chip 1 produced in Example 12. It is a figure for demonstrating the dimension of vicinity. Other sizes are the same as those in the first embodiment.
Then, in addition to the drive circuit 30, holes were made in a part of the PDMS sample input channel 4 and sample recovery channel 5 of the manufactured electrical measurement chip 1, and one end of the silicon tube was formed as the sample recovery channel 5. The electrical measuring device 10 was produced in the same procedure as in Example 4 except that the other end was connected to a hole and the other end was connected to a syringe pump (kd Scientific, KDS210).
Next, as a sample
HeLa cell (human cervical cancer-derived cell): about 15 μm (ATCC, CCL-2)
Jurkat cell (human T cell) suspension system: about 10 μm (ATCC, TIB-152),
Was used. HeLa cells were cultured using MEM (Sigma aldrich, M4655) which is a cell culture medium for HeLa. Jurkat was cultured using RPMI1640 (gibco, 11875-093), which is a cell medium for Jurkat.
Then, using the above cells instead of the fluorescent microbeads, the voltage applied to the drive circuit 30 was 3 V, and the experiment was performed in the same procedure as in Example 10 except that the sample solution was sucked at 5 to 10 μL / min with a syringe pump. went.
FIG. 20 (3) is a histogram of steady current values, and is a graph showing the distribution of the number of cells counted at each steady current value. As shown in FIG. 20 (2), it was confirmed that there was a correlation between the intensity of the steady-state current value and the volume of the sample even when using a sample whose shape such as cells easily changed.

〔狭窄部34を有する電気測定用チップ1の作製〕
<実施例13>
実施例1のフォトマスクの形状を変えることで、狭窄部34を有する電気測定用チップ1を作製した。図21(1)は、実施例13で作製した電気測定用チップ1のサンプル移動流路3の狭窄部34付近の拡大写真である。また、図21(2)は、実施例13で作製した電気測定用チップ1のサンプル移動流路3と狭窄部34の長さ及び幅を示す図である。サンプル移動流路3の幅は25μmで、幅15μmの狭窄部及び幅10μmの狭窄部を、間隔を設けて形成した。幅15μmの狭窄部及び幅10μmの狭窄部、並びに両狭窄部の間のサンプル移動流路3の長さは30μmであった。また、幅15μmの狭窄部及びサンプル移動流路3は約45°の角度で接続し、接続部分の長さは約5μmであった。幅10μmの狭窄部及びサンプル移動流路3は約45°の角度で接続し、接続部分の長さは約7.5μmであった。
次に、作製した電気測定用チップ1を用い、実施例12と同様の手順で電気測定装置10を作製した。
次に、サンプルとして実施例12に記載のHeLa細胞を用い、シリンジポンプで5μl/minの量で吸引した。
図22(1)は、図21に示すチップの左から右側(流路幅は、15μm→25μm→10μm)にHeLa細胞を流した時の各幅の流路に入った時間(in)と出た時間(out)、及び定常電流値の変化を示すグラフである。図22(2)は、HeLa細胞を逆方向(流路幅は、10μm→25μm→15μm)に流した時の各幅の流路に入った時間(in)と出た時間(out)、及び定常電流値を示すグラフである。上記のとおりHeLa細胞の大きさは約15μmである。図22(1)及び(2)から明らかなように、同じ長さの流路であっても、流路幅が狭くなるに従ってHeLa細胞が通過する時間が長くなった。特に、HeLa細胞が変形しないと通過できない幅である10μmの狭窄部を通過する時には、15μm及び25μmの幅の時より非常に長い時間を要した。以上の結果より、サンプル移動流路3に狭窄部34を形成することで、サンプルの変形能を測定することができた。
[Fabrication of electricity measuring chip 1 having narrowed portion 34]
<Example 13>
By changing the shape of the photomask of Example 1, the electrical measurement chip 1 having the narrowed portion 34 was produced. FIG. 21 (1) is an enlarged photograph of the vicinity of the narrowed portion 34 of the sample moving flow path 3 of the electrical measurement chip 1 manufactured in Example 13. FIG. 21B is a diagram showing the length and width of the sample moving flow path 3 and the narrowed portion 34 of the electrical measurement chip 1 manufactured in Example 13. The sample moving flow path 3 had a width of 25 μm, and a narrowed portion having a width of 15 μm and a narrowed portion having a width of 10 μm were formed at intervals. The stenosis part with a width of 15 μm, the stenosis part with a width of 10 μm, and the length of the sample moving flow path 3 between both the stenosis parts were 30 μm. Further, the narrow portion having a width of 15 μm and the sample moving flow path 3 were connected at an angle of about 45 °, and the length of the connection portion was about 5 μm. The narrow portion having a width of 10 μm and the sample moving flow path 3 were connected at an angle of about 45 °, and the length of the connection portion was about 7.5 μm.
Next, an electrical measuring device 10 was manufactured in the same procedure as in Example 12 using the manufactured electrical measuring chip 1.
Next, HeLa cells described in Example 12 were used as samples, and aspirated at a rate of 5 μl / min with a syringe pump.
FIG. 22 (1) shows the time (in) and the time (in) when the HeLa cells flowed from the left to the right of the chip shown in FIG. 21 (flow path width is 15 μm → 25 μm → 10 μm). It is the graph which shows the change of the last time (out) and the steady-state current value. FIG. 22 (2) shows the time when the HeLa cells flowed in the opposite direction (flow path width is 10 μm → 25 μm → 15 μm) and entered the flow path of each width (in), and the time of exit (out), and It is a graph which shows a steady-state electric current value. As described above, the size of the HeLa cell is about 15 μm. As is clear from FIGS. 22 (1) and (2), even when the flow paths have the same length, the time for the HeLa cells to pass increases as the flow path width decreases. In particular, when a HeLa cell passes through a 10 μm narrow portion that cannot pass through without deformation, it takes a much longer time than when it has a width of 15 μm and 25 μm. From the above results, it was possible to measure the deformability of the sample by forming the narrowed portion 34 in the sample moving flow path 3.

<実施例14>
上記実施例13において、狭窄部34を設けることでサンプルの変形能を測定できたことから、本実施例では、変形能が異なる同種の細胞を準備し測定を行った。
先ず、フォトマスクの形状を変えることで、幅が10μm、長さが40μmの狭窄部34を1つ有する電気測定用チップ1を作製した。図23(1)は、実施例14で作製した電気測定用チップ1のサンプル移動流路3の狭窄部34付近の拡大写真である。次に、作製した電気測定用チップ1を用いて、実施例13と同様の手順で電気測定装置を作製した。
次に、アクチンの重合を阻害することで細胞骨格を作ることを阻害する物質であるラトランクリンA(wako,125−04363)を、上記実施例12のHeLa細胞に0.5μMの濃度で作用させた。なお、ラトランクリンAをHeLa細胞に作用させると細胞骨格の形成が阻害されることから、ラトランクリンAを作用しないHeLa細胞と比較して、細胞は変形能が異なる。
そして、作製した電気測定装置を用い、ラトランクリンAを作用したHeLa細胞(LatA)及びラトランクリンAを作用していないHeLa細胞(Without LatA)を、シリンジポンプを用いて10μl/minの量で吸引した以外は、実施例12と同様の手順で実験を行った。
図23(2)は、定常電流値と通過時間の関係を示すグラフである。図23(2)から明らかなように、同じ定常電流値、つまり、細胞の大きさが同じ場合、ラトランクリンAを作用していないHeLa細胞(Without LatA)の方が明らかに狭窄部を通過する時間が長かった。
以上の結果から、同種の細胞であっても、狭窄部を通過する時間を測定することで細胞の変形能の違いを測定することができた。がん化した細胞は正常細胞と比較して変形能が高くなることから、例えば、狭窄部を設けた電気測定用チップに同じ細胞集団の溶液を流すことで、細胞集団の中から、がん化した細胞を区別・選別する装置(セルソーター)を作製することができる。
<Example 14>
In Example 13, since the deformability of the sample could be measured by providing the constricted portion 34, in this example, the same type of cells having different deformability were prepared and measured.
First, by changing the shape of the photomask, the electrical measurement chip 1 having one narrow portion 34 having a width of 10 μm and a length of 40 μm was produced. FIG. 23 (1) is an enlarged photograph of the vicinity of the narrowed portion 34 of the sample moving flow path 3 of the electrical measurement chip 1 manufactured in Example 14. Next, an electrical measurement device was produced in the same procedure as in Example 13 using the produced electrical measurement chip 1.
Next, rat trunkrin A (wako, 125-04363), a substance that inhibits the formation of the cytoskeleton by inhibiting actin polymerization, acts on the HeLa cells of Example 12 at a concentration of 0.5 μM. I let you. In addition, since the formation of cytoskeleton is inhibited when latrunculin A is allowed to act on HeLa cells, the cells have different deformability than HeLa cells that do not act on latrunculin A.
Then, using the electrometric apparatus thus prepared, HeLa cells (LatA) that acted on rattrunkin A and HeLa cells that did not act on rattrunkin A (Without LatA) were added in an amount of 10 μl / min using a syringe pump. The experiment was performed in the same procedure as in Example 12 except that the suction was performed.
FIG. 23 (2) is a graph showing the relationship between the steady current value and the passage time. As is clear from FIG. 23 (2), when the same steady-state current value, that is, the cell size is the same, the HeLa cell (Without LatA) not acting on rattrunkin A clearly passes through the stenosis. The time to do was long.
From the above results, it was possible to measure the difference in cell deformability by measuring the time for passing through the stenosis even for the same type of cells. Because cancerous cells have higher deformability than normal cells, for example, by flowing the same cell population solution through an electrical measurement chip with a stenosis, cancer cells can be extracted from the cell population. A device (cell sorter) for discriminating / sorting the transformed cells can be produced.

本発明の電気測定用チップ1を用いることで、駆動回路と測定回路を別回路として設計できるので、駆動回路の電圧を高く設定し、検出感度を高めることができる。更に、過渡電流も正確に読み取ることができることから、サンプルの表面電荷を読み取ることができ、また、サンプル移動流路内でサンプルの伸長状態を作り出して核酸やタンパク質等の生体分子の測定が可能となる。
したがって、企業、研究機関等において、サンプルを正確に分析するための測定機器の開発に有用である。
By using the electrical measurement chip 1 of the present invention, the drive circuit and the measurement circuit can be designed as separate circuits, so that the voltage of the drive circuit can be set high and the detection sensitivity can be increased. Furthermore, since transient currents can be accurately read, the surface charge of the sample can be read, and it is possible to measure the biomolecules such as nucleic acids and proteins by creating an extended state of the sample in the sample movement channel. Become.
Therefore, it is useful for the development of measuring instruments for accurately analyzing samples in companies, research institutions, and the like.

【0001】
技術分野
[0001]
本発明は、電気測定用チップ、及び電気測定装置に関し、特に、細胞、菌、ウィルス、DNA等のサンプルがマイクロ流路を流れる際に、定常電流の変化のみではなく過渡電流の発生も読み取ることで、高感度検出ができるように設計した電気測定用チップ、及び該電気測定用チップを含む電気測定装置に関する。
背景技術
[0002]
溶液中に含まれる細胞、菌、花粉、PM2.5等のサンプルの大きさ、個数等を正確に測定することは、健康な生活を送る上で大切な情報であり、近年、ますます測定精度の向上が望まれている。また、生物化学の分野では、DNA断片をそのまま分析する分析チップの開発が望まれている。
[0003]
図1は、サンプルの大きさや個数等の測定方法の従来技術を示しており、シリコン等の基板上に形成した細孔(マイクロポア)にサンプルを通過させ、細孔に印加した電圧によって細孔の内部を流れる定常電流が変化する様子から細胞の大きさ、硬さを解析している(非特許文献1参照)。図1に示す従来の測定方法は、細孔の体積が小さい程感度が向上すことが知られている。細孔の体積を減らすためには直径を小さくするとともに基板を薄くする必要があり、そのため、測定の際には図1に示すように基板は縦置きにして使用されている。
[0004]
また、細孔を通過するサンプルの状態をより詳しく測定するため、マイクロ流路を形成した基板を横置きにすることで細孔部分を蛍光顕微鏡で観察できるようにし、定常電流の測定に加え細孔の周りの事象を直接観察する方法も知られている(非特許文献2参照)。図2は、非特許文献2のFig.1を示している。
先行技術文献
[0001]
Technical field [0001]
The present invention relates to an electric measurement chip and an electric measurement device, and particularly, when a sample such as a cell, a bacterium, a virus, or a DNA flows through a microchannel, reads not only the change in steady current but also the generation of a transient current. Thus, the present invention relates to an electrical measurement chip designed to perform highly sensitive detection, and an electrical measurement device including the electrical measurement chip.
Background art [0002]
Accurate measurement of the size, number, etc. of samples such as cells, fungi, pollen, and PM2.5 contained in a solution is important information for living a healthy life. Improvement is desired. In the field of biochemistry, it is desired to develop an analysis chip that analyzes a DNA fragment as it is.
[0003]
FIG. 1 shows a conventional technique for measuring the size and number of samples. The sample is passed through pores (micropores) formed on a substrate such as silicon, and the pores are applied by voltage applied to the pores. The size and hardness of the cell are analyzed from the state in which the steady-state current flowing inside the cell changes (see Non-Patent Document 1). The conventional measurement method shown in FIG. 1 is known to improve the sensitivity as the volume of the pores decreases. In order to reduce the volume of the pores, it is necessary to reduce the diameter and reduce the thickness of the substrate. For this reason, the substrate is used in a vertical orientation as shown in FIG.
[0004]
In addition, in order to measure the state of the sample passing through the pores in more detail, the substrate on which the microchannels are formed can be placed sideways so that the pores can be observed with a fluorescence microscope. A method of directly observing an event around a hole is also known (see Non-Patent Document 2). 2 is shown in FIG. 1 is shown.
Prior art documents

Claims (11)

基板、該基板上に形成したサンプル移動流路及びサンプル測定流路を含み、
前記サンプル測定流路は、前記サンプル移動流路に接続する第1測定流路、及び前記第1測定流路とは反対側から前記サンプル移動流路に接続する第2測定流路を含む、
電気測定用チップ。
Including a substrate, a sample movement channel formed on the substrate, and a sample measurement channel,
The sample measurement flow path includes a first measurement flow path connected to the sample movement flow path and a second measurement flow path connected to the sample movement flow path from the side opposite to the first measurement flow path.
Chip for electrical measurement.
前記第1測定流路及び前記第2測定流路の幅が、前記サンプル移動流路と接続している部分の長さより、前記サンプル移動流路から離れるにしたがって長くなる請求項1に記載の電気測定用チップ。   2. The electricity according to claim 1, wherein the width of the first measurement channel and the second measurement channel is longer as the distance from the sample movement channel is longer than the length of the portion connected to the sample movement channel. Measuring chip. 前記第1測定流路及び前記第2測定流路が、前記サンプル移動流路を挟んで非対称の位置に形成されている請求項1又は2に記載の電気測定用チップ。   3. The electrical measurement chip according to claim 1, wherein the first measurement channel and the second measurement channel are formed at asymmetric positions with the sample movement channel interposed therebetween. 前記サンプル移動流路に狭窄部が少なくとも1以上形成されている請求項1〜3の何れか一項に記載の電気測定用チップ。   The electrical measurement chip according to claim 1, wherein at least one narrow portion is formed in the sample moving flow path. 前記サンプル移動流路の一端に形成されたサンプル投入流路、前記サンプル移動流路の他端に形成されたサンプル回収流路を含む、請求項1〜4の何れか一項に記載の電気測定用チップ。   The electrical measurement according to any one of claims 1 to 4, further comprising a sample input channel formed at one end of the sample moving channel and a sample recovery channel formed at the other end of the sample moving channel. For chips. 前記第1測定流路及び前記第2測定流路に換え、第1測定電極及び第2測定電極が形成されている請求項1〜5の何れか一項に記載の電気測定用チップ。   The electrical measurement chip according to any one of claims 1 to 5, wherein a first measurement electrode and a second measurement electrode are formed instead of the first measurement channel and the second measurement channel. 請求項1〜5の何れか一項に記載の電気測定用チップ、
サンプルがサンプル移動流路を移動できるようにするための駆動回路、
第1測定流路及び第2測定流路に電圧を印加し、サンプルがサンプル移動回路を移動する際の電流の変化を測定する測定回路、
を含む電気測定装置。
The chip for electrical measurement according to any one of claims 1 to 5,
A drive circuit for allowing the sample to move through the sample transfer channel,
A measurement circuit that applies a voltage to the first measurement channel and the second measurement channel and measures a change in current when the sample moves through the sample moving circuit;
Including electrical measuring device.
請求項6に記載の電気測定用チップ、
サンプルがサンプル移動流路を移動できるようにするための駆動回路、
第1測定電極及び第2測定電極に電圧を印加し、サンプルがサンプル移動回路を移動する際の電流の変化を測定する測定回路、
を含む電気測定装置。
The electrical measurement chip according to claim 6,
A drive circuit for allowing the sample to move through the sample transfer channel,
A measurement circuit for applying a voltage to the first measurement electrode and the second measurement electrode and measuring a change in current when the sample moves through the sample moving circuit;
Including electrical measuring device.
前記測定回路が、前記駆動回路と前記測定回路の抵抗を釣り合った状態にするための可変抵抗を含み、
前記測定回路が、釣り合った状態からの電流の差分を測定する請求項7又は8に記載の電気測定装置。
The measuring circuit includes a variable resistor for balancing the resistance of the driving circuit and the measuring circuit;
The electrical measurement device according to claim 7 or 8, wherein the measurement circuit measures a difference in current from a balanced state.
前記測定回路が、過渡電流及び定常電流の変化を測定する請求項7〜9の何れか一項に記載の電気測定装置。   The electrical measurement apparatus according to claim 7, wherein the measurement circuit measures changes in transient current and steady current. 蛍光顕微鏡を更に含む請求項7〜10の何れか一項に記載の電気測定装置。   The electrical measurement apparatus according to any one of claims 7 to 10, further comprising a fluorescence microscope.
JP2016555224A 2014-10-20 2015-10-20 Electric measuring device Expired - Fee Related JP6647631B2 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2014214090 2014-10-20
JP2014214090 2014-10-20
JP2015078223 2015-04-07
JP2015078223 2015-04-07
PCT/JP2015/079532 WO2016063858A1 (en) 2014-10-20 2015-10-20 Chip for electrical measurement, and electrical measuring device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2019235981A Division JP2020098211A (en) 2014-10-20 2019-12-26 Chip for electrical measurement, and sample measurement method

Publications (2)

Publication Number Publication Date
JPWO2016063858A1 true JPWO2016063858A1 (en) 2017-08-10
JP6647631B2 JP6647631B2 (en) 2020-02-14

Family

ID=55760891

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2016555224A Expired - Fee Related JP6647631B2 (en) 2014-10-20 2015-10-20 Electric measuring device
JP2019235981A Pending JP2020098211A (en) 2014-10-20 2019-12-26 Chip for electrical measurement, and sample measurement method

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2019235981A Pending JP2020098211A (en) 2014-10-20 2019-12-26 Chip for electrical measurement, and sample measurement method

Country Status (2)

Country Link
JP (2) JP6647631B2 (en)
WO (1) WO2016063858A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018066597A1 (en) * 2016-10-07 2018-04-12 国立大学法人名古屋大学 Sample analysis method, and sample analysis device

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5046179A (en) * 1973-08-13 1975-04-24
JPH01235833A (en) * 1988-03-16 1989-09-20 Hitachi Ltd Flow cell and fine particle measuring instrument using said cell
JP2009128057A (en) * 2007-11-20 2009-06-11 Sekisui Chem Co Ltd Minute particle counter and minute particle counter chip
JP2010181399A (en) * 2009-01-09 2010-08-19 Sony Corp Flow path device, complex dielectric constant measuring device, and dielectric cytometry device
US20110089328A1 (en) * 2009-10-20 2011-04-21 Diagnostic Chips, LLC Electrokinetic microfluidic flow cytometer apparatuses with differential resistive particle counting and optical sorting
JP2012501627A (en) * 2008-09-03 2012-01-26 ナブシス, インコーポレイテッド Use of longitudinally displaced nanoscale electrodes for voltage sensing of biomolecules and other analytes in fluid channels
JP2013090576A (en) * 2011-10-24 2013-05-16 Hitachi Ltd Nucleic acid analyzing device and nucleic acid analyzer using the same
WO2014122489A1 (en) * 2013-02-05 2014-08-14 Norma Instruments Zrt. Testing unit for determining the physical characteristics of samples containing liquid components
US20140273193A1 (en) * 2012-11-27 2014-09-18 Diagnostic Chips, LLC Electrokinetic Microfluidic Flow Cytometer Apparatuses with Differential Resistive Particle Counting and Optical Sorting
JP2014173935A (en) * 2013-03-07 2014-09-22 Toshiba Corp Semiconductor micro-analysis chip and manufacturing method thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001018246A1 (en) * 1999-08-26 2001-03-15 The Trustees Of Princeton University Microfluidic and nanofluidic electronic devices for detecting changes in capacitance of fluids and methods of using
JP2007147602A (en) * 2005-10-27 2007-06-14 Kyocera Corp Chip for fluid inspection and method of manufacturing same, optical system for fluid inspection, electrical system for fluid inspection, and sensing method
EP2887058B1 (en) * 2012-08-17 2017-11-29 Quantum Biosystems Inc. Sample analysis method

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5046179A (en) * 1973-08-13 1975-04-24
JPH01235833A (en) * 1988-03-16 1989-09-20 Hitachi Ltd Flow cell and fine particle measuring instrument using said cell
JP2009128057A (en) * 2007-11-20 2009-06-11 Sekisui Chem Co Ltd Minute particle counter and minute particle counter chip
JP2012501627A (en) * 2008-09-03 2012-01-26 ナブシス, インコーポレイテッド Use of longitudinally displaced nanoscale electrodes for voltage sensing of biomolecules and other analytes in fluid channels
JP2010181399A (en) * 2009-01-09 2010-08-19 Sony Corp Flow path device, complex dielectric constant measuring device, and dielectric cytometry device
US20110089328A1 (en) * 2009-10-20 2011-04-21 Diagnostic Chips, LLC Electrokinetic microfluidic flow cytometer apparatuses with differential resistive particle counting and optical sorting
JP2013090576A (en) * 2011-10-24 2013-05-16 Hitachi Ltd Nucleic acid analyzing device and nucleic acid analyzer using the same
US20140273193A1 (en) * 2012-11-27 2014-09-18 Diagnostic Chips, LLC Electrokinetic Microfluidic Flow Cytometer Apparatuses with Differential Resistive Particle Counting and Optical Sorting
WO2014122489A1 (en) * 2013-02-05 2014-08-14 Norma Instruments Zrt. Testing unit for determining the physical characteristics of samples containing liquid components
JP2014173935A (en) * 2013-03-07 2014-09-22 Toshiba Corp Semiconductor micro-analysis chip and manufacturing method thereof

Also Published As

Publication number Publication date
JP6647631B2 (en) 2020-02-14
JP2020098211A (en) 2020-06-25
WO2016063858A1 (en) 2016-04-28

Similar Documents

Publication Publication Date Title
JP4932066B2 (en) Flow path device and sample processing apparatus including the same
JP5922361B2 (en) Active microsieve and methods for biological applications
Errico et al. Mitigating positional dependence in coplanar electrode Coulter-type microfluidic devices
Vaclavek et al. Resistive pulse sensing as particle counting and sizing method in microfluidic systems: Designs and applications review
Bilican et al. Focusing-free impedimetric differentiation of red blood cells and leukemia cells: A system optimization
Guo et al. Design of a fluidic circuit-based microcytometer for circulating tumor cell detection and enumeration
Guo et al. Precise enumeration of circulating tumor cells using support vector machine algorithm on a microfluidic sensor
Frankowski et al. Simultaneous optical and impedance analysis of single cells: A comparison of two microfluidic sensors with sheath flow focusing
Chen et al. Portable Coulter counter with vertical through-holes for high-throughput applications
Tang et al. Cost-effective portable microfluidic impedance cytometer for broadband impedance cell analysis based on viscoelastic focusing
Khodaparastasgarabad et al. A novel microfluidic high-throughput resistive pulse sensing device for cells analysis
WO2016163387A1 (en) Device for electrical measurement and electrical measurement apparatus
Do Quang et al. Biological living cell in-flow detection based on microfluidic chip and compact signal processing circuit
JP2020098211A (en) Chip for electrical measurement, and sample measurement method
US11383241B2 (en) Mechano-node pore sensing
Kim et al. Potentiometric multichannel cytometer microchip for high-throughput microdispersion analysis
Civelekoglu et al. Wrap-around sensors for electrical detection of particles in microfluidic channels
Wang et al. Cell density detection based on a microfluidic chip with two electrode pairs
JP6846719B2 (en) Sample analysis method and sample analysis device
Doi et al. Micro-to-nano bimodal single-particle sensing using optical tweezers
CN218811788U (en) Microfluidic chip and system
Gawad et al. Impedance spectroscopy and optical analysis of single biological cells and organisms in microsystems
Liu et al. Analysis and Characterization of Soft-Lithography-Compatible Parallel-Electrode-Sensors in Microfluidic Devices
Prakash et al. Conjugated Barcoded Particles for Multiplexed Biomarker Quantification with a Microfluidic Biochip
Roelen Transducing Signals and Pre-Concentrating Molecules for Enhanced Solid-State Nanopore Biosensing

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170502

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20180926

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20180926

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20190805

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20190805

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20190904

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20190909

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20191004

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20191028

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20191119

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20191226

R150 Certificate of patent or registration of utility model

Ref document number: 6647631

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313117

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees