JPWO2012176289A1 - Spiral probe and manufacturing method thereof - Google Patents

Abstract

A tapered tip (2) that directly contacts the object to be inspected, a substantially hollow cylindrical tip-side body (3) extending in one direction from the root of the tip (2), and the tip-side body ( 3) a substantially hollow cylindrical bent portion (4) extending integrally in the one direction continuously with 3) and having an outer peripheral surface formed in a spiral shape, and continuously with the bent portion (4). A substantially hollow cylindrical base end portion (5) extending in one direction, and the outer peripheral surfaces of the front end side main body portion (3), the flexible portion (4) and the base end portion (5) are in the one direction. It is aligned along.

Description

  The present invention relates to a spiral probe and a manufacturing method thereof.

  In order to realize various electronic devices in a small size, light weight, thin shape, and multi-functional performance, electronic components have been miniaturized and the density of component mounting has been increased by increasing the number of semiconductor packages (BGA). In order to cope with the increase in functionality and speed associated with such downsizing of electronic equipment, there is a need for a resistance value between lines that is a resistance value generated between conductor patterns even when the conductor pattern is narrowed. It has become tough.

  Accordingly, in order to accurately inspect various parameters in a high-density mounted electronic component, a resistance value between lines between high-density conductor patterns, and the like, probes as these inspection devices are also being miniaturized. .

  Such a probe is disclosed in Patent Document 1. The probe described in Patent Document 1 has a pair of plungers connected by a spring. However, such a structure in which the plunger is separated and the spring is interposed is difficult to manufacture and is not easy to work. In particular, the conventional probes are only compatible with a pitch of 0.2 mm or more, and can be used only at 0.3 mm or more when arranged in a grid.

Japanese translation of PCT publication No. 2004-503783

  The present invention provides a spiral probe that is easy to manufacture, can reduce the interval between the probes when used as a probe unit, and can cope with further downsizing of electronic components and the like, and a manufacturing method thereof.

  In the present invention, a tapered tip that directly contacts the object to be inspected, a substantially hollow cylindrical tip-side main body extending in one direction from the root of the tip, and the tip-side main body are continuously integrated. A substantially hollow cylindrical flexible portion extending in the one direction and having an outer peripheral surface formed in a spiral shape, and a substantially hollow cylindrical base end portion extending continuously in the one direction continuously with the flexible portion. The spiral probe is characterized in that the distal end side main body portion, the flexible portion, and the outer peripheral surface of the base end portion are aligned along the one direction.

  Preferably, the distal end portion, the distal end side main body portion, the flexible portion, and the proximal end portion are all made of the same material, and the material is made of nickel, a gold alloy containing nickel or cobalt, or gold on a nickel film. It is a two-layer material or a nickel-tin alloy with laminated films.

  In the present invention, the outer peripheral surface has a substantially cylindrical shape in which the end on the tip side is closed by immersing the plating solution by immersing a portion other than one end of the thin wire member made of a thin metal wire in the plating solution. By forming a uniform plating layer, forming the tip portion at the end portion on the tip side where the plating layer is closed by machining, and removing the part of the plating layer to form the flexure portion. A distal end side main body portion and the proximal end portion are formed, and the thin wire member is immersed in an etching solution in a state having the distal end side main body, the flexure portion, and the proximal end portion, and all the thin wire members are melted. A method for manufacturing a spiral probe is provided.

Preferably, the other end of the thin wire member has a tapered shape.
Preferably, the removal of the plating layer is performed by laser processing.

  According to the present invention, since the outer peripheral surfaces of the distal end side main body portion, the flexure portion, and the base end portion are aligned along one direction, it is possible to provide an extra fine type probe. Therefore, when this probe is used as a probe unit, the interval between the probes can be narrowed, and it is possible to cope with further downsizing of electronic components and the like.

  Further, according to the present invention, since the spiral probe is formed as an integral type using only the plating layer, the probe can be efficiently manufactured in a series of flows.

It is the schematic of the spiral probe which concerns on this invention. It is the schematic explaining in order the manufacturing method of the spiral probe which concerns on this invention. It is the schematic explaining in order the manufacturing method of the spiral probe which concerns on this invention. It is the schematic explaining in order the manufacturing method of the spiral probe which concerns on this invention. It is the schematic explaining in order the manufacturing method of the spiral probe which concerns on this invention. It is the schematic of another spiral probe which concerns on this invention. It is the schematic of the probe unit using the spiral probe which concerns on this invention.

  As shown in FIG. 1, a spiral probe 1 according to the present invention includes a tapered tip portion 2 that is in direct contact with an object to be inspected at the tip thereof. The probe 1 also includes a tip-side main body 3 that extends in one direction from the root of the tip 2 and has a substantially hollow cylindrical shape. The probe 1 also includes a flexible portion 4 that extends continuously in one direction continuously with the distal end side main body portion 3. The flexible portion 4 has an outer peripheral surface formed in a spiral shape and has a substantially hollow cylindrical shape. The probe 1 further includes a base portion 5 having a substantially hollow cylindrical shape that extends continuously in one direction continuously with the flexible portion 4.

The spiral probe 1 having such a structure is manufactured as follows.
First, as shown in FIG. 2, a thin wire member 7 made of a thin metal wire is immersed in a plating solution 6. The thin wire member 7 is, for example, copper and has a diameter of 50 μm. The plating solution 6 is immersed while leaving one end of the thin wire member 7 having a predetermined length. The electrode 8 is also immersed in the plating solution, and the electrode 8 and the thin wire member 7 are electrically connected via a power source 9. Nickel ions are present in the plating solution. Therefore, by applying a voltage, an electrolytic plating process is performed, and a plating layer 10 is formed on the outside of the thin wire member 7 as shown in FIG. The plating layer 10 has a substantially cylindrical shape in which the end portion on the front end side (lower side in FIG. 3) is closed, and the position of the outer peripheral surface is aligned along the longitudinal axis. The plating thickness can be controlled by the processing time and voltage (current).

  And as shown in FIG. 4, the front-end | tip part 2 is formed. The tip 2 is formed at the tip of the plated layer 10 by machining using a known machine. Specifically, the end portion on the front end side of the plating layer 10 is processed into a tapered shape. At this time, if the end of the thin wire member 7 on the tip side is a tapered shape, it is preferable because it is easy to process. Then, as shown in FIG. 5, a part of the plating layer 10 is removed to form the bent portion 4. The bending portion 4 is formed by removing the outer peripheral surface of the plating layer 10 in a spiral shape with a laser using a known laser processing machine (laser trimming). The wavelength of the laser beam is preferably 532 nm, but may be changed according to the material of the plating layer 10. Simultaneously with the formation of the flexible portion 4, the distal end side main body portion 3 and the proximal end portion 5 are formed.

  Then, the thin wire member 7 having such a distal end side main body 3, a bent portion 4, and a proximal end portion 5 is immersed in a selective etching solution (not shown). This selective etching solution dissolves only the material of the thin wire member 7 (copper in this example). Thereby, since the thin wire member 7 is melted, only the spiral probe 1 having the distal end portion 2, the distal end side main body 3, the deflection portion 4 and the proximal end portion 5 formed by the plating layer 10 remains (the state of FIG. 1). Thus, when the spiral probe 1 is manufactured, only the plating layer 10 is used. Thus, since the probe 1 is formed as an integral type using the plating layer 10, the probe 1 can be efficiently manufactured in a series of flows.

  In the probe 1 manufactured as described above, the outer peripheral surfaces of the distal end side main body portion 3, the flexure portion 4, and the base end portion 5 are aligned along one direction. More specifically, the positions of the outer peripheral surfaces in all these portions are aligned along the longitudinal axis. That is, all the outer peripheral surfaces except the tip of the probe 1 are along a virtual line K parallel to the axis of the probe 1 (see FIG. 1). Therefore, the ultrafine probe 1 can be obtained. For example, when the plating thickness is 8 μm and the fine wire diameter is Φ50 μm, the probe 1 having an outer diameter of Φ66 μm can be obtained. Therefore, it becomes possible to cope with a pitch of 100 μm, and the pitch interval can be dramatically reduced as compared with the conventional case. That is, when this probe 1 is used as a probe unit, the interval between the probes 1 can be narrowed, and it is possible to cope with further downsizing of electronic components and the like. Such a pitch interval cannot be realized by a conventional spring probe or wire probe.

  The probes 1 are all formed from the same material. As the material, nickel, a gold alloy containing nickel or cobalt, a material having a two-layer structure in which a gold film is laminated on a nickel film, or a nickel tin alloy can be used. In any material, since the small probe 1 has a certain degree of elasticity, it can bend in the longitudinal direction.

  In addition, as shown in FIG. 6, the large diameter part 5a can be formed in the outermost edge side of the base end part 5 by making one end part side of the thin wire | line member 7 large diameter. Thus, it can apply to a various probe unit by making the base end part 5 into a different diameter.

  A probe unit 11 using such a probe 1 is formed on a support 16 having a four-layer structure in which a distal end guide member 12, a deflection portion guide member 13, a proximal end guide member 14, and an input / output extraction guide member 15 are stacked. It is formed by penetrating the probe 1. Note that the distal end guide member 12, the flexure part guide member 13, the proximal end guide member 14, and the input / output extraction guide member 15 may be made of the same material. In this case, the support 16 has a three-layer structure or a two-layer structure.

DESCRIPTION OF SYMBOLS 1 Spiral probe 2 Front-end | tip part 3 Front end side main-body part 4 Deflection part 5 Base end part 6 Plating solution 7 Fine wire member 8 Electrode 9 Power supply 10 Plating layer 11 Probe unit 12 Front-end | tip part guide member 13 Bending part guide member 14 Base-end part guide member 15 Input / output extraction guide member 16 Support

Claims (5)

A tapered tip that is in direct contact with the object to be inspected;
A substantially hollow cylindrical tip-side body portion extending in one direction from the root of the tip portion;
A substantially hollow cylindrical flexible part extending in the one direction continuously with the distal end side main body part and having an outer peripheral surface formed in a spiral shape;
A substantially hollow cylindrical base end portion extending continuously in the one direction continuously with the flexible portion,
The spiral probe according to claim 1, wherein outer peripheral surfaces of the distal end side main body portion, the flexible portion, and the proximal end portion are aligned along the one direction. The distal end portion, the distal end side main body portion, the flexible portion, and the proximal end portion are all made of the same material,
2. The spiral probe according to claim 1, wherein the material is nickel, a gold alloy containing nickel or cobalt, a two-layer material in which a gold film is laminated on a nickel film, or a nickel tin alloy. Forming a plating layer with a substantially cylindrical shape with a uniform outer peripheral surface with the end on the tip side closed by immersing the plating solution except for one end of a thin wire member made of metal thin wire. And
Forming the tip at the end of the plated layer closed by the machining,
By forming a part of the plating layer and forming the flexible portion, the distal end side main body portion and the proximal end portion are formed,
2. The spiral probe according to claim 1, wherein the thin wire member is completely dissolved by immersing the thin wire member in an etching solution in a state having the distal end side main body, the flexure portion, and the base end portion. Manufacturing method for.   The manufacturing method according to claim 3, wherein the other end of the thin wire member has a tapered shape.   The method according to claim 3, wherein the plating layer is removed by laser processing.

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