JPS6484134A - Method for mounting sample for measurement of total reflection of infrared ray - Google Patents
Method for mounting sample for measurement of total reflection of infrared rayInfo
- Publication number
- JPS6484134A JPS6484134A JP24088187A JP24088187A JPS6484134A JP S6484134 A JPS6484134 A JP S6484134A JP 24088187 A JP24088187 A JP 24088187A JP 24088187 A JP24088187 A JP 24088187A JP S6484134 A JPS6484134 A JP S6484134A
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- prism
- screw
- sample
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE:To improve the accuracy of measurement and reproducibility by using both faces of prism even for samples having a poor contact area with the prism. CONSTITUTION:Au auxiliary base is set to the rear face of a base plate 1 and a thumb screw 8' is tightened via keep plate 6' to fix said base to the extent of preventing deviating. The prism 2 is then superposed on the auxiliary base and the sample 3 for measurement thereon so as to come into contact with the prism 2. The prism and the sample are then fixed by a column screw 7 and a thumb screw 8 via a gasket 5 and a keep plate 6. The front and rear faces are then turned over and the auxiliary base is removed by loosening the screw 8'. The sample 4 for measurement is superposed on the prism 2 in such a manner that the measuring surface comes into contact with the prism 2 and further, the sample is fixed by the screw 7' and the screw 8' via the gasket 5' and the plate 6'. The samples 3, 4 are set by such procedures and are subjected to measurement. The accuracy of the measurement is thus improved.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24088187A JPS6484134A (en) | 1987-09-28 | 1987-09-28 | Method for mounting sample for measurement of total reflection of infrared ray |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24088187A JPS6484134A (en) | 1987-09-28 | 1987-09-28 | Method for mounting sample for measurement of total reflection of infrared ray |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6484134A true JPS6484134A (en) | 1989-03-29 |
Family
ID=17066087
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24088187A Pending JPS6484134A (en) | 1987-09-28 | 1987-09-28 | Method for mounting sample for measurement of total reflection of infrared ray |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6484134A (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5729839B2 (en) * | 1979-03-28 | 1982-06-24 | ||
| JPS6098403A (en) * | 1983-10-25 | 1985-06-01 | ブラデイミル ミハイロビチ ゾロタレフ | Optical element for attenuation-oriented total reflection, spectoral analysis and mold for making optical element |
-
1987
- 1987-09-28 JP JP24088187A patent/JPS6484134A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5729839B2 (en) * | 1979-03-28 | 1982-06-24 | ||
| JPS6098403A (en) * | 1983-10-25 | 1985-06-01 | ブラデイミル ミハイロビチ ゾロタレフ | Optical element for attenuation-oriented total reflection, spectoral analysis and mold for making optical element |
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