JPS6472730A - High resolving power x ray tomographic imaging apparatus - Google Patents

High resolving power x ray tomographic imaging apparatus

Info

Publication number
JPS6472730A
JPS6472730A JP62228416A JP22841687A JPS6472730A JP S6472730 A JPS6472730 A JP S6472730A JP 62228416 A JP62228416 A JP 62228416A JP 22841687 A JP22841687 A JP 22841687A JP S6472730 A JPS6472730 A JP S6472730A
Authority
JP
Japan
Prior art keywords
examined
rays
dimensional projection
projection image
resolving power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62228416A
Other languages
Japanese (ja)
Other versions
JPH0619457B2 (en
Inventor
Tatsumi Hirano
Katsuhisa Usami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62228416A priority Critical patent/JPH0619457B2/en
Publication of JPS6472730A publication Critical patent/JPS6472730A/en
Publication of JPH0619457B2 publication Critical patent/JPH0619457B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To measure a plurality of tomographic images with the optimum resolving power at every size of an object to be examined, by mounting an X-ray detector having function capable of changing position resolving power to the size of the object to be examined. CONSTITUTION:The X-rays emitted from a synchrotron emitting light source 16 pass through a slit 17 to be brought to monochromatic X-rays having an arbitrary wavelength and high parallelization by a spectroscope 18. X-rays (two-dimensional projection image) after transmitted through an object to be examined are detected by an X-ray imaging tube 3 to be taken in a computer 10 through an X-ray imaging tube control apparatus 8 and a sequencer 9 and subsequently passed through a mechanism 7 for supporting and rotating the object to be examined from the computer 10 to rotate the object to be examined at an equal angle interval to again detect the two-dimensional projection image of the object to be examined. This operation is repeated until the angle of rotation of the object to be examined becomes 180 deg. or 360 deg.. From the obtained two-dimensional projection image group, image reconstituting operational processing is performed at every XY plane and a plurality of tomographic images are displayed on an image display apparatus 11. As mentioned above, since two-dimensional projection image measurement can be performed within one exposure time by the X-ray imaging tube, a plurality of tomographic images due to X-rays can be obtained within a short time.
JP62228416A 1987-09-14 1987-09-14 High resolution X-ray tomography system Expired - Lifetime JPH0619457B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62228416A JPH0619457B2 (en) 1987-09-14 1987-09-14 High resolution X-ray tomography system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62228416A JPH0619457B2 (en) 1987-09-14 1987-09-14 High resolution X-ray tomography system

Publications (2)

Publication Number Publication Date
JPS6472730A true JPS6472730A (en) 1989-03-17
JPH0619457B2 JPH0619457B2 (en) 1994-03-16

Family

ID=16876134

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62228416A Expired - Lifetime JPH0619457B2 (en) 1987-09-14 1987-09-14 High resolution X-ray tomography system

Country Status (1)

Country Link
JP (1) JPH0619457B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06258259A (en) * 1993-03-04 1994-09-16 Hitachi Ltd In-plane distribution measuring method and device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4665019B2 (en) * 2008-08-18 2011-04-06 株式会社東芝 X-ray computed tomography system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06258259A (en) * 1993-03-04 1994-09-16 Hitachi Ltd In-plane distribution measuring method and device

Also Published As

Publication number Publication date
JPH0619457B2 (en) 1994-03-16

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