JPS6454305U - - Google Patents
Info
- Publication number
- JPS6454305U JPS6454305U JP14940587U JP14940587U JPS6454305U JP S6454305 U JPS6454305 U JP S6454305U JP 14940587 U JP14940587 U JP 14940587U JP 14940587 U JP14940587 U JP 14940587U JP S6454305 U JPS6454305 U JP S6454305U
- Authority
- JP
- Japan
- Prior art keywords
- release
- button
- movable
- output lever
- spring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 125000006850 spacer group Chemical group 0.000 claims description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims 3
Landscapes
- Breakers (AREA)
- Switch Cases, Indication, And Locking (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14940587U JPS6454305U (OSRAM) | 1987-09-29 | 1987-09-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14940587U JPS6454305U (OSRAM) | 1987-09-29 | 1987-09-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6454305U true JPS6454305U (OSRAM) | 1989-04-04 |
Family
ID=31421605
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14940587U Pending JPS6454305U (OSRAM) | 1987-09-29 | 1987-09-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6454305U (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7235782B2 (en) | 2001-04-27 | 2007-06-26 | Hitachi, Ltd. | Semiconductor inspection system |
-
1987
- 1987-09-29 JP JP14940587U patent/JPS6454305U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7235782B2 (en) | 2001-04-27 | 2007-06-26 | Hitachi, Ltd. | Semiconductor inspection system |