JPS6453953U - - Google Patents

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Publication number
JPS6453953U
JPS6453953U JP14804587U JP14804587U JPS6453953U JP S6453953 U JPS6453953 U JP S6453953U JP 14804587 U JP14804587 U JP 14804587U JP 14804587 U JP14804587 U JP 14804587U JP S6453953 U JPS6453953 U JP S6453953U
Authority
JP
Japan
Prior art keywords
gas
analyzer
light emitting
emitting source
different wavelengths
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14804587U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14804587U priority Critical patent/JPS6453953U/ja
Publication of JPS6453953U publication Critical patent/JPS6453953U/ja
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す図、第2図は
本考案の他の実施例を示す要部の概略図、第3図
は第2図に示す実施例の場合の具体例を示す図で
ある。 1…発光源、2a,2b,2c…レーザ発振部
、4…シヤツタ、20,21,22…ビームスプ
リツタ、23a,23b,23c…ガス分析器、
34…受光点。
Fig. 1 is a diagram showing one embodiment of the present invention, Fig. 2 is a schematic diagram of main parts showing another embodiment of the invention, and Fig. 3 is a specific example of the embodiment shown in Fig. 2. FIG. DESCRIPTION OF SYMBOLS 1... Light emitting source, 2a, 2b, 2c... Laser oscillation part, 4... Shutter, 20, 21, 22... Beam splitter, 23a, 23b, 23c... Gas analyzer,
34...Light receiving point.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 発光源からのレーザをガス分析器に導き、該ガ
ス分析器に導入した測定用ガスを分析させるよう
にしたガス濃度分析計において、上記発光源を1
つにして異なる波長の複数のレージを発振させる
ようにし、且つ上記発光源の複数個の異なる波長
に対応させて上記ガス分析器を複数並設し、測定
対象ガスに応じて波長の異なるレーザを通過させ
るように切り換えるシヤツタと、測定対象ガスに
対して使用するガス分析器を切り換える手段とを
備えてなることを特徴とするガス濃度分析計。
In a gas concentration analyzer in which a laser beam from a light emitting source is guided to a gas analyzer and the gas for measurement introduced into the gas analyzer is analyzed, the light emitting source is
A plurality of lasers having different wavelengths are oscillated by each gas analyzer, and a plurality of the gas analyzers are arranged in parallel to correspond to the plurality of different wavelengths of the light emitting source, and the lasers having different wavelengths are oscillated according to the gas to be measured. A gas concentration analyzer comprising: a shutter for switching the gas to pass; and means for switching the gas analyzer used for the gas to be measured.
JP14804587U 1987-09-30 1987-09-30 Pending JPS6453953U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14804587U JPS6453953U (en) 1987-09-30 1987-09-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14804587U JPS6453953U (en) 1987-09-30 1987-09-30

Publications (1)

Publication Number Publication Date
JPS6453953U true JPS6453953U (en) 1989-04-03

Family

ID=31419002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14804587U Pending JPS6453953U (en) 1987-09-30 1987-09-30

Country Status (1)

Country Link
JP (1) JPS6453953U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0843288A (en) * 1994-05-05 1996-02-16 Santa Barbara Res Center Nitrogeb oxide sensor of infrared ray base with steam compensation

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0843288A (en) * 1994-05-05 1996-02-16 Santa Barbara Res Center Nitrogeb oxide sensor of infrared ray base with steam compensation

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