JPS645173U - - Google Patents

Info

Publication number
JPS645173U
JPS645173U JP9873587U JP9873587U JPS645173U JP S645173 U JPS645173 U JP S645173U JP 9873587 U JP9873587 U JP 9873587U JP 9873587 U JP9873587 U JP 9873587U JP S645173 U JPS645173 U JP S645173U
Authority
JP
Japan
Prior art keywords
main body
semiconductor device
leads
presses
electrode terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9873587U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9873587U priority Critical patent/JPS645173U/ja
Publication of JPS645173U publication Critical patent/JPS645173U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
JP9873587U 1987-06-26 1987-06-26 Pending JPS645173U (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9873587U JPS645173U (zh) 1987-06-26 1987-06-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9873587U JPS645173U (zh) 1987-06-26 1987-06-26

Publications (1)

Publication Number Publication Date
JPS645173U true JPS645173U (zh) 1989-01-12

Family

ID=31325260

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9873587U Pending JPS645173U (zh) 1987-06-26 1987-06-26

Country Status (1)

Country Link
JP (1) JPS645173U (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100503996B1 (ko) * 1997-07-09 2005-10-06 텍사스 인스트루먼츠 인코포레이티드 번인테스트용소켓장치

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5827874B2 (ja) * 1978-07-05 1983-06-11 防衛庁技術研究本部長 ソ−ナ−装置の測的処理方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5827874B2 (ja) * 1978-07-05 1983-06-11 防衛庁技術研究本部長 ソ−ナ−装置の測的処理方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100503996B1 (ko) * 1997-07-09 2005-10-06 텍사스 인스트루먼츠 인코포레이티드 번인테스트용소켓장치

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