JPS645173U - - Google Patents
Info
- Publication number
- JPS645173U JPS645173U JP9873587U JP9873587U JPS645173U JP S645173 U JPS645173 U JP S645173U JP 9873587 U JP9873587 U JP 9873587U JP 9873587 U JP9873587 U JP 9873587U JP S645173 U JPS645173 U JP S645173U
- Authority
- JP
- Japan
- Prior art keywords
- main body
- semiconductor device
- leads
- presses
- electrode terminals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 4
Landscapes
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9873587U JPS645173U (bg) | 1987-06-26 | 1987-06-26 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9873587U JPS645173U (bg) | 1987-06-26 | 1987-06-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS645173U true JPS645173U (bg) | 1989-01-12 |
Family
ID=31325260
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9873587U Pending JPS645173U (bg) | 1987-06-26 | 1987-06-26 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS645173U (bg) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100503996B1 (ko) * | 1997-07-09 | 2005-10-06 | 텍사스 인스트루먼츠 인코포레이티드 | 번인테스트용소켓장치 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5827874B2 (ja) * | 1978-07-05 | 1983-06-11 | 防衛庁技術研究本部長 | ソ−ナ−装置の測的処理方法 |
-
1987
- 1987-06-26 JP JP9873587U patent/JPS645173U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5827874B2 (ja) * | 1978-07-05 | 1983-06-11 | 防衛庁技術研究本部長 | ソ−ナ−装置の測的処理方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100503996B1 (ko) * | 1997-07-09 | 2005-10-06 | 텍사스 인스트루먼츠 인코포레이티드 | 번인테스트용소켓장치 |