JPS6450044A - Resin composition having sensibility for radiant rays - Google Patents
Resin composition having sensibility for radiant raysInfo
- Publication number
- JPS6450044A JPS6450044A JP20755087A JP20755087A JPS6450044A JP S6450044 A JPS6450044 A JP S6450044A JP 20755087 A JP20755087 A JP 20755087A JP 20755087 A JP20755087 A JP 20755087A JP S6450044 A JPS6450044 A JP S6450044A
- Authority
- JP
- Japan
- Prior art keywords
- sensibility
- radiant rays
- novolak resin
- resin
- resin composition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Abstract
PURPOSE:To obtain a resin compsn. having sensibility for radiant rays, having also high developability, high resolution, and high resistance to dry etching by using a specified alkali-soluble novolak resin. CONSTITUTION:The alkali-soluble novolak resin is a novolak resin obtd. by the polycondensation of at least one phenolic compd. expressed by formula I with an aldehydic compd., and the weight average mol.wt. of said novolak resin expressed in terms of polystyrene is 2,000-30,000, and the m.p. is 100-180 deg.C. In formula I, R is -CH3, -C2H5, -C3H7, -C4H9, -OCH3, -OCH2CH3, -CO2CH3, or -CO2CH2CH3; n is 2 or 3. Thus, a resin compsn. having sensibility for radiant rays, having also high developability, high resolution, and high resistance to dry etching is obtd.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20755087A JP2555620B2 (en) | 1987-08-21 | 1987-08-21 | Radiation-sensitive resin composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20755087A JP2555620B2 (en) | 1987-08-21 | 1987-08-21 | Radiation-sensitive resin composition |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6450044A true JPS6450044A (en) | 1989-02-27 |
JP2555620B2 JP2555620B2 (en) | 1996-11-20 |
Family
ID=16541590
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20755087A Expired - Fee Related JP2555620B2 (en) | 1987-08-21 | 1987-08-21 | Radiation-sensitive resin composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2555620B2 (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0293651A (en) * | 1988-09-30 | 1990-04-04 | Fuji Photo Film Co Ltd | Positive type photoresist composition |
JPH02108054A (en) * | 1988-10-18 | 1990-04-19 | Japan Synthetic Rubber Co Ltd | Radiation sensitive resin composition |
US5346799A (en) * | 1991-12-23 | 1994-09-13 | Ocg Microelectronic Materials, Inc. | Novolak resins and their use in radiation-sensitive compositions wherein the novolak resins are made by condensing 2,6-dimethylphenol, 2,3-dimethylphenol, a para-substituted phenol and an aldehyde |
US5407780A (en) * | 1989-12-27 | 1995-04-18 | Sumitomo Chemical Company, Limited | Radiation-sensitive positive resist composition comprising an alkali-soluble resin made from m-cresol, 2-tert-butl-5-methyl phenol and formaldehyde |
EP0786699A1 (en) | 1996-01-22 | 1997-07-30 | Fuji Photo Film Co., Ltd. | Positive photoresist composition |
JP2023098763A (en) * | 2021-12-29 | 2023-07-11 | 互応化学工業株式会社 | Resin composition for resist, method for manufacturing resist film, and patterned resist film |
-
1987
- 1987-08-21 JP JP20755087A patent/JP2555620B2/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0293651A (en) * | 1988-09-30 | 1990-04-04 | Fuji Photo Film Co Ltd | Positive type photoresist composition |
JPH02108054A (en) * | 1988-10-18 | 1990-04-19 | Japan Synthetic Rubber Co Ltd | Radiation sensitive resin composition |
US5407780A (en) * | 1989-12-27 | 1995-04-18 | Sumitomo Chemical Company, Limited | Radiation-sensitive positive resist composition comprising an alkali-soluble resin made from m-cresol, 2-tert-butl-5-methyl phenol and formaldehyde |
US5346799A (en) * | 1991-12-23 | 1994-09-13 | Ocg Microelectronic Materials, Inc. | Novolak resins and their use in radiation-sensitive compositions wherein the novolak resins are made by condensing 2,6-dimethylphenol, 2,3-dimethylphenol, a para-substituted phenol and an aldehyde |
EP0786699A1 (en) | 1996-01-22 | 1997-07-30 | Fuji Photo Film Co., Ltd. | Positive photoresist composition |
JP2023098763A (en) * | 2021-12-29 | 2023-07-11 | 互応化学工業株式会社 | Resin composition for resist, method for manufacturing resist film, and patterned resist film |
Also Published As
Publication number | Publication date |
---|---|
JP2555620B2 (en) | 1996-11-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |