JPS6447866A - Sputtering device - Google Patents
Sputtering deviceInfo
- Publication number
- JPS6447866A JPS6447866A JP20453087A JP20453087A JPS6447866A JP S6447866 A JPS6447866 A JP S6447866A JP 20453087 A JP20453087 A JP 20453087A JP 20453087 A JP20453087 A JP 20453087A JP S6447866 A JPS6447866 A JP S6447866A
- Authority
- JP
- Japan
- Prior art keywords
- target
- camera
- illuminated
- sputtering
- sputtering device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
PURPOSE:To easily detect the abnormal state on the surface of a target while keeping a high vacuum by using a camera to photograph the target surface illuminated by an illuminating jig in a sputtering chamber. CONSTITUTION:The light source 6 as the illuminating jig and a mini-camera 3 as the camera device fixed to a variable stage 4 are provided in the sputtering chamber 1. In the sputtering device, the surface of the target 2 is illuminated by the light source 6 while keeping the inside of the chamber 1 at a high vacuum. The illuminated surface of the target 2 is photographed by the mini-camera 3. The photographed image is enlarged and observed, and the abnormal state on the surface is detected. Any trouble in the sputtering device can be easily found at an early stage by this method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20453087A JPS6447866A (en) | 1987-08-18 | 1987-08-18 | Sputtering device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20453087A JPS6447866A (en) | 1987-08-18 | 1987-08-18 | Sputtering device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6447866A true JPS6447866A (en) | 1989-02-22 |
Family
ID=16492065
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20453087A Pending JPS6447866A (en) | 1987-08-18 | 1987-08-18 | Sputtering device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6447866A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6535628B2 (en) * | 1998-10-15 | 2003-03-18 | Applied Materials, Inc. | Detection of wafer fragments in a wafer processing apparatus |
-
1987
- 1987-08-18 JP JP20453087A patent/JPS6447866A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6535628B2 (en) * | 1998-10-15 | 2003-03-18 | Applied Materials, Inc. | Detection of wafer fragments in a wafer processing apparatus |
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