JPS6437676U - - Google Patents
Info
- Publication number
- JPS6437676U JPS6437676U JP13055687U JP13055687U JPS6437676U JP S6437676 U JPS6437676 U JP S6437676U JP 13055687 U JP13055687 U JP 13055687U JP 13055687 U JP13055687 U JP 13055687U JP S6437676 U JPS6437676 U JP S6437676U
- Authority
- JP
- Japan
- Prior art keywords
- electrical contact
- amplifier circuit
- voltage
- checker
- connector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13055687U JPS6437676U (OSRAM) | 1987-08-27 | 1987-08-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13055687U JPS6437676U (OSRAM) | 1987-08-27 | 1987-08-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6437676U true JPS6437676U (OSRAM) | 1989-03-07 |
Family
ID=31385830
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13055687U Pending JPS6437676U (OSRAM) | 1987-08-27 | 1987-08-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6437676U (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020003293A (ja) * | 2018-06-27 | 2020-01-09 | 矢崎総業株式会社 | 電気的接続部の劣化度合診断装置、及び、劣化度合診断方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6156745B2 (OSRAM) * | 1980-10-02 | 1986-12-03 | Okabe Kk |
-
1987
- 1987-08-27 JP JP13055687U patent/JPS6437676U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6156745B2 (OSRAM) * | 1980-10-02 | 1986-12-03 | Okabe Kk |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020003293A (ja) * | 2018-06-27 | 2020-01-09 | 矢崎総業株式会社 | 電気的接続部の劣化度合診断装置、及び、劣化度合診断方法 |
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