JPS643220U - - Google Patents
Info
- Publication number
- JPS643220U JPS643220U JP9553487U JP9553487U JPS643220U JP S643220 U JPS643220 U JP S643220U JP 9553487 U JP9553487 U JP 9553487U JP 9553487 U JP9553487 U JP 9553487U JP S643220 U JPS643220 U JP S643220U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor integrated
- output
- control gate
- logic
- output control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Electronic Switches (AREA)
- Logic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9553487U JPS643220U ( ) | 1987-06-22 | 1987-06-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9553487U JPS643220U ( ) | 1987-06-22 | 1987-06-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS643220U true JPS643220U ( ) | 1989-01-10 |
Family
ID=31320205
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9553487U Pending JPS643220U ( ) | 1987-06-22 | 1987-06-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS643220U ( ) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001091305A1 (fr) * | 2000-05-24 | 2001-11-29 | Thine Electronics, Inc. | Circuit integre a semi-conducteurs |
US7363804B2 (en) | 1996-12-17 | 2008-04-29 | Denso Corporation | Method for detecting malfunction of a cooling system based on detected coolant temperature |
-
1987
- 1987-06-22 JP JP9553487U patent/JPS643220U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7363804B2 (en) | 1996-12-17 | 2008-04-29 | Denso Corporation | Method for detecting malfunction of a cooling system based on detected coolant temperature |
US7743651B2 (en) | 1996-12-17 | 2010-06-29 | Denso Corporation | Method for detecting malfunction of a cooling system based on detected coolant temperature |
WO2001091305A1 (fr) * | 2000-05-24 | 2001-11-29 | Thine Electronics, Inc. | Circuit integre a semi-conducteurs |