JPS6432155U - - Google Patents
Info
- Publication number
- JPS6432155U JPS6432155U JP12758387U JP12758387U JPS6432155U JP S6432155 U JPS6432155 U JP S6432155U JP 12758387 U JP12758387 U JP 12758387U JP 12758387 U JP12758387 U JP 12758387U JP S6432155 U JPS6432155 U JP S6432155U
- Authority
- JP
- Japan
- Prior art keywords
- seal
- elastic body
- utility
- opening
- model registration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12758387U JPS6432155U (it) | 1987-08-22 | 1987-08-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12758387U JPS6432155U (it) | 1987-08-22 | 1987-08-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6432155U true JPS6432155U (it) | 1989-02-28 |
Family
ID=31380144
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12758387U Pending JPS6432155U (it) | 1987-08-22 | 1987-08-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6432155U (it) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0576761U (ja) * | 1992-03-21 | 1993-10-19 | 株式会社コンサイス | 印 鑑 |
US7295307B2 (en) * | 2004-09-03 | 2007-11-13 | Horiba, Ltd. | Method of and apparatus for measuring stress of semiconductor material |
JP2012126115A (ja) * | 2010-12-10 | 2012-07-05 | Masataka Kawasaki | サイフのカード入れに入る携帯薄型印鑑 |
-
1987
- 1987-08-22 JP JP12758387U patent/JPS6432155U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0576761U (ja) * | 1992-03-21 | 1993-10-19 | 株式会社コンサイス | 印 鑑 |
US7295307B2 (en) * | 2004-09-03 | 2007-11-13 | Horiba, Ltd. | Method of and apparatus for measuring stress of semiconductor material |
JP2012126115A (ja) * | 2010-12-10 | 2012-07-05 | Masataka Kawasaki | サイフのカード入れに入る携帯薄型印鑑 |
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