JPS642438Y2 - - Google Patents

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Publication number
JPS642438Y2
JPS642438Y2 JP10879081U JP10879081U JPS642438Y2 JP S642438 Y2 JPS642438 Y2 JP S642438Y2 JP 10879081 U JP10879081 U JP 10879081U JP 10879081 U JP10879081 U JP 10879081U JP S642438 Y2 JPS642438 Y2 JP S642438Y2
Authority
JP
Japan
Prior art keywords
cup
air
inner tank
wafer
discharge port
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10879081U
Other languages
Japanese (ja)
Other versions
JPS5815347U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10879081U priority Critical patent/JPS5815347U/en
Publication of JPS5815347U publication Critical patent/JPS5815347U/en
Application granted granted Critical
Publication of JPS642438Y2 publication Critical patent/JPS642438Y2/ja
Granted legal-status Critical Current

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Description

【考案の詳細な説明】 本考案はウエハ処理装置にかかり、とくに半導
体集積回路製造工程においてウエハの表面を逆さ
にし下方よりメツキ液、化成液等を噴出させ、ウ
エハ表面を処理する機構を有するウエハ処理装置
に関するものである。
[Detailed Description of the Invention] The present invention relates to a wafer processing apparatus, particularly in the semiconductor integrated circuit manufacturing process. It relates to a processing device.

一般にこれらの装置は第1図の様な構造をして
いる。つまり、1個の外槽1の中に、もう1個の
密閉された内槽2がある。その内槽2の上板に、
噴水を出す噴水ヘツド3が取り付けてあり、内槽
2に一杯になつた循環液6がその噴水ヘツド3よ
り噴き出して来るものである。内槽2には循環液
6を循環させるポンプ4の吐出口7が接続されて
いる。噴水ヘツド3より噴水した循環液6はウエ
ハ12と接触した後外槽1の排液口より循環液6
の留めタンク5に回収される。回収された循環液
6はポンプ4を通つて再び内槽2に供給される。
これらの機構において、下記の様な不都合な点が
あつた。
Generally, these devices have a structure as shown in FIG. That is, inside one outer tank 1, there is another sealed inner tank 2. On the upper plate of the inner tank 2,
A fountain head 3 that emits water is attached, and the circulating fluid 6 that fills up the inner tank 2 is spouted out from the fountain head 3. A discharge port 7 of a pump 4 that circulates a circulating fluid 6 is connected to the inner tank 2 . After the circulating fluid 6 sprayed from the fountain head 3 comes into contact with the wafer 12, the circulating fluid 6 is discharged from the drain port of the outer tank 1.
The water is collected in a holding tank 5. The recovered circulating fluid 6 is supplied to the inner tank 2 again through the pump 4.
These mechanisms had the following disadvantages.

ポンプの吸引側配管のゆるみ又は循環液6を交
換した後、ポンプ4の内部や配管に残つている空
気がこの内槽2に入り、最終的には噴水ヘツド3
から気泡となつて噴き出して来る。これらの気泡
がウエハ表面に付着し、その箇所にはメツキ液、
化成液等が入らないため、メツキ又は化成されず
にウエハ処理に大きな影響を及ぼす。このような
気泡は、これらの循環液6より完全に取り除くこ
とは難しく、循環液6の交換頻度が多ければ多い
ほど配管、ポンプ等に空気の留まりやすく悪影響
を及ぼす。
If the suction side piping of the pump becomes loose or the circulating fluid 6 is replaced, the air remaining inside the pump 4 or in the piping enters this inner tank 2 and eventually flows into the fountain head 3.
It gushes out in the form of bubbles. These bubbles adhere to the wafer surface, and the plating liquid,
Since chemical liquid etc. do not enter, plating or chemical conversion does not occur, which has a large effect on wafer processing. It is difficult to completely remove such air bubbles from the circulating fluid 6, and the more frequently the circulating fluid 6 is replaced, the more air tends to remain in the pipes, pumps, etc., and has an adverse effect.

本考案は上記の欠点を解消するためのものであ
る。
The present invention is intended to eliminate the above drawbacks.

循環系に空気又は気泡が入るのを完全に防ぐこ
とはかなり困難であるため、混入した気泡を噴水
ヘツド3を通過しないようにしたのが本考案であ
る。
Since it is quite difficult to completely prevent air or bubbles from entering the circulation system, the present invention prevents the air bubbles from passing through the fountain head 3.

構造は下記の通りである。内槽2の下部に取り
つけてあるポンプ4からの吐出口7の真上に漏斗
を逆さにした形状のカツプ8を取り付ける。
The structure is as follows. A cup 8 in the shape of an inverted funnel is attached directly above the discharge port 7 from the pump 4 attached to the lower part of the inner tank 2.

そのカツプ8の最上部を内槽2の上板内側に取
り付け空気の抜き孔10をあける。この抜き孔1
0はポンプからの吐出口7よりすこし位置をずら
して取り付ける。抜き孔10の孔径は循環液6の
量、ポンプ4の吐出量等によつて異なる。空気又
は気泡を含んだ循環液6はポンプ4の吐出口より
内槽2に入るが、一担カツプ内にあたり、浮力の
ある空気、気泡は浮上し循環液6はカツプの下部
より内槽2に広がる。カツプ8の先端の方にはテ
ーパがついているため気泡は、それに沿つて浮い
てゆき最後には抜き孔10より放出する。この
際、循環液6も気泡に混つて噴き出て来るが抜き
孔10の孔径が小さいためそこからの吐出量は問
題とならない。抜き孔10とポンプ4からの吐出
口7の位置をずらすのは気泡を効率よく除去する
ためであり、直接吐出口7の真上では循環液6が
抜き孔10より多量に噴き出すのを防止するため
のものである。
The top of the cup 8 is attached to the inside of the upper plate of the inner tank 2, and an air vent hole 10 is made therein. This hole 1
0 is installed at a position slightly shifted from the discharge port 7 from the pump. The hole diameter of the extraction hole 10 varies depending on the amount of the circulating fluid 6, the discharge amount of the pump 4, and the like. The circulating fluid 6 containing air or bubbles enters the inner tank 2 from the discharge port of the pump 4, but once it hits the cup, the buoyant air and bubbles float to the surface, and the circulating fluid 6 enters the inner tank 2 from the bottom of the cup. spread. Since the tip of the cup 8 is tapered, the air bubbles float along the tip and are finally released from the punch hole 10. At this time, the circulating fluid 6 also comes out mixed with air bubbles, but since the diameter of the vent hole 10 is small, the amount of fluid discharged therefrom does not matter. The purpose of shifting the positions of the vent hole 10 and the discharge port 7 from the pump 4 is to efficiently remove air bubbles, and to prevent the circulating fluid 6 from spouting out in a larger amount than the vent hole 10 directly above the discharge port 7. It is for.

次に実施例として、化成装置を例に具体的に説
明する。
Next, as an example, a chemical conversion apparatus will be specifically explained.

化成装置は第2図のごとく構造をしている。化
成液9を循環させるポンプ4があり、吐出口7は
内槽2の下部に取り付けてある。その吐出口7の
上に、カツプ8が約10mm位はなれて取り付けられ
ている。そのカツプ8は第3図のような形状をし
ており、吐出口7をカバー出来る大きさで上部に
テーパがあり気泡をカツプ上方に浮上させる。そ
れらの気泡は下方から吐出される化成液9により
押し出されると同時に自らの浮力により抜き孔1
0より噴き出す。又化成液9の大部分はカツプ8
に入つた後吐出口7とカツプ8のすき間より出て
内槽2にまわる。
The chemical conversion equipment has a structure as shown in Figure 2. There is a pump 4 that circulates the chemical liquid 9, and a discharge port 7 is attached to the lower part of the inner tank 2. A cup 8 is attached above the discharge port 7 with a distance of about 10 mm. The cup 8 has a shape as shown in FIG. 3, and is large enough to cover the discharge port 7 and has a taper at the top to cause air bubbles to float above the cup. Those bubbles are pushed out by the chemical liquid 9 discharged from below, and at the same time due to their own buoyancy,
It erupts from 0. Also, most of the chemical liquid 9 is cup 8.
After entering the tank, it comes out through the gap between the discharge port 7 and the cup 8 and flows into the inner tank 2.

この吐出口7とカツプ8の間隔は化成液9の量
と内槽2の大きさにより決定される。それ故、ウ
エハ12が接触する、噴水ヘツド3から出る化成
液9には気泡は含まずウエハにも気泡が付着する
必配はない。
The distance between the discharge port 7 and the cup 8 is determined by the amount of chemical liquid 9 and the size of the inner tank 2. Therefore, the chemical liquid 9 discharged from the fountain head 3 with which the wafer 12 comes into contact does not contain air bubbles, and there is no need for air bubbles to adhere to the wafer.

本考案は化成装置のみならず、メツキ装置、エ
ツチング装置等第1図のごとく機構を持つ装置に
はすべて有効である。
The present invention is effective not only for chemical forming equipment, but also for all equipment such as plating equipment, etching equipment, etc., which have a mechanism as shown in Fig. 1.

特に、ごく小さな気泡もウエハに付着すると悪
影響を及ぼすような微細加工処理には効果があ
る。
It is particularly effective in microfabrication processing where even the smallest bubbles would have an adverse effect if attached to the wafer.

尚、カツプ8と内槽2の上板とはカツプ8の抜
き孔10がオスネジになつており、ナツト11で
固定する様になつている。又ポンプ4からの吐出
口7を第3図のごとくカツプ8内に立ち上がると
気泡が内槽内部に逃げ難く一層効果がある。
Incidentally, the cup 8 and the upper plate of the inner tank 2 have a hole 10 in the cup 8 which is a male screw, and is fixed with a nut 11. Moreover, if the discharge port 7 from the pump 4 is raised up into the cup 8 as shown in FIG. 3, air bubbles will be less likely to escape into the inner tank, making it even more effective.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は噴水機能を持つた機構を示す図であ
り、第2図は本考案の実施例のウエハ処理装置を
示す図であり、第3図は本考案の実施例のカツプ
を示す図である。 なお図において、1……外槽、2……内槽、3
……噴水ヘツド、4……ポンプ、5……留めタン
ク、6……循環液、7……吐出口、8……カツ
プ、9……化成液、10……噴き出し孔、11…
…ナツト、12……ウエハである。
FIG. 1 is a diagram showing a mechanism with a fountain function, FIG. 2 is a diagram showing a wafer processing apparatus according to an embodiment of the present invention, and FIG. 3 is a diagram showing a cup according to an embodiment of the present invention. be. In the figure, 1...outer tank, 2...inner tank, 3
... Fountain head, 4 ... Pump, 5 ... Holding tank, 6 ... Circulating fluid, 7 ... Discharge port, 8 ... Cup, 9 ... Chemical liquid, 10 ... Spout hole, 11 ...
... Nut, 12... It's a wafer.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体集積回路製造工程において、ウエハの表
面を逆さにし下方よりメツキ液、化成液等を噴出
させ、ウエハ表面を処理するウエハ処理装置にお
いて、装置内部に取りつけられている内槽内のポ
ンプの吐出口の上に、漏斗の形状をしたカツプを
逆さに取り付け、該カツプの最上部を内槽の上板
から取り出してそこに空気抜き孔を設け、該空気
抜き孔から空気抜きを行ない、循環液中に入り込
んだ気泡又は空気を噴水する箇所から取り除く気
泡除去機能を有するウエハ処理装置。
In the semiconductor integrated circuit manufacturing process, the wafer processing equipment processes the wafer surface by turning the wafer upside down and spouting plating liquid, chemical liquid, etc. from below, and the discharge port of the pump in the inner tank installed inside the equipment. A funnel-shaped cup was attached upside down on top of the cup, the top of the cup was taken out from the top plate of the inner tank, an air vent hole was provided there, and air was vented through the air vent hole, allowing the air to enter the circulating fluid. Wafer processing equipment that has a bubble removal function that removes bubbles or air from the point where it is sprayed.
JP10879081U 1981-07-22 1981-07-22 Wafer processing equipment Granted JPS5815347U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10879081U JPS5815347U (en) 1981-07-22 1981-07-22 Wafer processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10879081U JPS5815347U (en) 1981-07-22 1981-07-22 Wafer processing equipment

Publications (2)

Publication Number Publication Date
JPS5815347U JPS5815347U (en) 1983-01-31
JPS642438Y2 true JPS642438Y2 (en) 1989-01-20

Family

ID=29903181

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10879081U Granted JPS5815347U (en) 1981-07-22 1981-07-22 Wafer processing equipment

Country Status (1)

Country Link
JP (1) JPS5815347U (en)

Also Published As

Publication number Publication date
JPS5815347U (en) 1983-01-31

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