JPS6388765U - - Google Patents
Info
- Publication number
- JPS6388765U JPS6388765U JP18449486U JP18449486U JPS6388765U JP S6388765 U JPS6388765 U JP S6388765U JP 18449486 U JP18449486 U JP 18449486U JP 18449486 U JP18449486 U JP 18449486U JP S6388765 U JPS6388765 U JP S6388765U
- Authority
- JP
- Japan
- Prior art keywords
- grid plate
- inspection machine
- grid
- probe head
- pin insertion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 14
- 239000000523 sample Substances 0.000 claims description 5
- 230000037431 insertion Effects 0.000 claims description 4
- 238000003780 insertion Methods 0.000 claims description 4
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986184494U JPH0637336Y2 (ja) | 1986-11-29 | 1986-11-29 | 布線検査機用アダプタ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986184494U JPH0637336Y2 (ja) | 1986-11-29 | 1986-11-29 | 布線検査機用アダプタ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6388765U true JPS6388765U (de) | 1988-06-09 |
| JPH0637336Y2 JPH0637336Y2 (ja) | 1994-09-28 |
Family
ID=31132223
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986184494U Expired - Lifetime JPH0637336Y2 (ja) | 1986-11-29 | 1986-11-29 | 布線検査機用アダプタ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0637336Y2 (de) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55163468A (en) * | 1979-06-06 | 1980-12-19 | Toshiba Corp | Inspecting method and device for circuit substrate |
| JPS5629475U (de) * | 1979-08-15 | 1981-03-20 | ||
| JPS5662577U (de) * | 1979-10-19 | 1981-05-27 | ||
| JPS61190867U (de) * | 1985-05-20 | 1986-11-27 |
-
1986
- 1986-11-29 JP JP1986184494U patent/JPH0637336Y2/ja not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55163468A (en) * | 1979-06-06 | 1980-12-19 | Toshiba Corp | Inspecting method and device for circuit substrate |
| JPS5629475U (de) * | 1979-08-15 | 1981-03-20 | ||
| JPS5662577U (de) * | 1979-10-19 | 1981-05-27 | ||
| JPS61190867U (de) * | 1985-05-20 | 1986-11-27 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0637336Y2 (ja) | 1994-09-28 |