JPS6384572U - - Google Patents

Info

Publication number
JPS6384572U
JPS6384572U JP17991286U JP17991286U JPS6384572U JP S6384572 U JPS6384572 U JP S6384572U JP 17991286 U JP17991286 U JP 17991286U JP 17991286 U JP17991286 U JP 17991286U JP S6384572 U JPS6384572 U JP S6384572U
Authority
JP
Japan
Prior art keywords
probe
tip
electrode pad
brought
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17991286U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP17991286U priority Critical patent/JPS6384572U/ja
Publication of JPS6384572U publication Critical patent/JPS6384572U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP17991286U 1986-11-21 1986-11-21 Pending JPS6384572U (US06649357-20031118-C00005.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17991286U JPS6384572U (US06649357-20031118-C00005.png) 1986-11-21 1986-11-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17991286U JPS6384572U (US06649357-20031118-C00005.png) 1986-11-21 1986-11-21

Publications (1)

Publication Number Publication Date
JPS6384572U true JPS6384572U (US06649357-20031118-C00005.png) 1988-06-02

Family

ID=31123394

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17991286U Pending JPS6384572U (US06649357-20031118-C00005.png) 1986-11-21 1986-11-21

Country Status (1)

Country Link
JP (1) JPS6384572U (US06649357-20031118-C00005.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994009374A1 (en) * 1992-10-12 1994-04-28 Kabushiki Kaisha Kobe Seiko Sho Probe unit and method of manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994009374A1 (en) * 1992-10-12 1994-04-28 Kabushiki Kaisha Kobe Seiko Sho Probe unit and method of manufacturing the same

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