JPS6383757U - - Google Patents

Info

Publication number
JPS6383757U
JPS6383757U JP17821386U JP17821386U JPS6383757U JP S6383757 U JPS6383757 U JP S6383757U JP 17821386 U JP17821386 U JP 17821386U JP 17821386 U JP17821386 U JP 17821386U JP S6383757 U JPS6383757 U JP S6383757U
Authority
JP
Japan
Prior art keywords
image
sample
electron microscope
scanning electron
enlarged field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17821386U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP17821386U priority Critical patent/JPS6383757U/ja
Publication of JPS6383757U publication Critical patent/JPS6383757U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例のブロツク図である
。 1……試料微動装置、2……加熱電源、3……
X,Y偏向電源、4……電圧―電流変換回路、5
……積分回路、6……パルス発生回路。
FIG. 1 is a block diagram of one embodiment of the present invention. 1... Sample fine movement device, 2... Heating power supply, 3...
X, Y deflection power supply, 4...Voltage-current conversion circuit, 5
...Integrator circuit, 6...Pulse generation circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試料微動装置に試料加熱を備えた走査電子顕微
鏡において、試料を高温加熱した場合の拡大視野
像における定常的な像移動をなくすために、偏向
コイルまたは補正コイルに補正電源より定常的な
電流を供給し拡大視野像の像移動をなくしたこと
を特徴とする走査電子顕微鏡。
In a scanning electron microscope equipped with sample heating in the sample fine movement device, a steady current is supplied from the correction power supply to the deflection coil or correction coil in order to eliminate the steady image movement in the enlarged field of view image when the sample is heated at high temperature. A scanning electron microscope characterized in that image movement of an enlarged field image is eliminated.
JP17821386U 1986-11-21 1986-11-21 Pending JPS6383757U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17821386U JPS6383757U (en) 1986-11-21 1986-11-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17821386U JPS6383757U (en) 1986-11-21 1986-11-21

Publications (1)

Publication Number Publication Date
JPS6383757U true JPS6383757U (en) 1988-06-01

Family

ID=31120139

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17821386U Pending JPS6383757U (en) 1986-11-21 1986-11-21

Country Status (1)

Country Link
JP (1) JPS6383757U (en)

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