JPS6383605U - - Google Patents
Info
- Publication number
- JPS6383605U JPS6383605U JP17844586U JP17844586U JPS6383605U JP S6383605 U JPS6383605 U JP S6383605U JP 17844586 U JP17844586 U JP 17844586U JP 17844586 U JP17844586 U JP 17844586U JP S6383605 U JPS6383605 U JP S6383605U
- Authority
- JP
- Japan
- Prior art keywords
- scriber
- pinion
- feed handle
- longitudinal direction
- height gauge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Length-Measuring Instruments Using Mechanical Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17844586U JPS6383605U (sv) | 1986-11-20 | 1986-11-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17844586U JPS6383605U (sv) | 1986-11-20 | 1986-11-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6383605U true JPS6383605U (sv) | 1988-06-01 |
Family
ID=31120582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17844586U Pending JPS6383605U (sv) | 1986-11-20 | 1986-11-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6383605U (sv) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010217182A (ja) * | 2009-03-18 | 2010-09-30 | Helmut Fischer Gmbh Inst Fuer Elektronik & Messtechnik | 測定スタンドおよびその電気制御方法 |
| US9337071B2 (en) | 1998-07-15 | 2016-05-10 | Rudolph Technologies, Inc. | Automated wafer defect inspection system and a process of performing such inspection |
| JP2019144049A (ja) * | 2018-02-19 | 2019-08-29 | 株式会社ミツトヨ | 送り機構およびそれを備えた測定器 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5751281U (sv) * | 1980-09-03 | 1982-03-24 |
-
1986
- 1986-11-20 JP JP17844586U patent/JPS6383605U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5751281U (sv) * | 1980-09-03 | 1982-03-24 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9337071B2 (en) | 1998-07-15 | 2016-05-10 | Rudolph Technologies, Inc. | Automated wafer defect inspection system and a process of performing such inspection |
| US9464992B2 (en) | 1998-07-15 | 2016-10-11 | Rudolph Technologies, Inc. | Automated wafer defect inspection system and a process of performing such inspection |
| JP2010217182A (ja) * | 2009-03-18 | 2010-09-30 | Helmut Fischer Gmbh Inst Fuer Elektronik & Messtechnik | 測定スタンドおよびその電気制御方法 |
| JP2019144049A (ja) * | 2018-02-19 | 2019-08-29 | 株式会社ミツトヨ | 送り機構およびそれを備えた測定器 |