JPS6375041U - - Google Patents

Info

Publication number
JPS6375041U
JPS6375041U JP16973086U JP16973086U JPS6375041U JP S6375041 U JPS6375041 U JP S6375041U JP 16973086 U JP16973086 U JP 16973086U JP 16973086 U JP16973086 U JP 16973086U JP S6375041 U JPS6375041 U JP S6375041U
Authority
JP
Japan
Prior art keywords
wafer
probe card
wafer stage
probe
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16973086U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16973086U priority Critical patent/JPS6375041U/ja
Publication of JPS6375041U publication Critical patent/JPS6375041U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP16973086U 1986-11-04 1986-11-04 Pending JPS6375041U (US20090163788A1-20090625-C00002.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16973086U JPS6375041U (US20090163788A1-20090625-C00002.png) 1986-11-04 1986-11-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16973086U JPS6375041U (US20090163788A1-20090625-C00002.png) 1986-11-04 1986-11-04

Publications (1)

Publication Number Publication Date
JPS6375041U true JPS6375041U (US20090163788A1-20090625-C00002.png) 1988-05-19

Family

ID=31103806

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16973086U Pending JPS6375041U (US20090163788A1-20090625-C00002.png) 1986-11-04 1986-11-04

Country Status (1)

Country Link
JP (1) JPS6375041U (US20090163788A1-20090625-C00002.png)

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