JPS6367670B2 - - Google Patents

Info

Publication number
JPS6367670B2
JPS6367670B2 JP55115590A JP11559080A JPS6367670B2 JP S6367670 B2 JPS6367670 B2 JP S6367670B2 JP 55115590 A JP55115590 A JP 55115590A JP 11559080 A JP11559080 A JP 11559080A JP S6367670 B2 JPS6367670 B2 JP S6367670B2
Authority
JP
Japan
Prior art keywords
circuit
voltage
amplitude
current
phase shift
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55115590A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5740659A (en
Inventor
Hideo Kitagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Electric Meters Inspection Corp JEMIC
Original Assignee
Japan Electric Meters Inspection Corp JEMIC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Electric Meters Inspection Corp JEMIC filed Critical Japan Electric Meters Inspection Corp JEMIC
Priority to JP55115590A priority Critical patent/JPS5740659A/ja
Publication of JPS5740659A publication Critical patent/JPS5740659A/ja
Publication of JPS6367670B2 publication Critical patent/JPS6367670B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/62—Testing of transformers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP55115590A 1980-08-22 1980-08-22 Testing burden setting device for current transformer Granted JPS5740659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55115590A JPS5740659A (en) 1980-08-22 1980-08-22 Testing burden setting device for current transformer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55115590A JPS5740659A (en) 1980-08-22 1980-08-22 Testing burden setting device for current transformer

Publications (2)

Publication Number Publication Date
JPS5740659A JPS5740659A (en) 1982-03-06
JPS6367670B2 true JPS6367670B2 (cs) 1988-12-27

Family

ID=14666363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55115590A Granted JPS5740659A (en) 1980-08-22 1980-08-22 Testing burden setting device for current transformer

Country Status (1)

Country Link
JP (1) JPS5740659A (cs)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3611261A1 (de) * 1986-04-04 1987-10-15 Tettex Ag Elektronische buerde
CN103743994B (zh) * 2014-01-27 2017-02-01 广州供电局有限公司 低压带负荷测试方法及装置

Also Published As

Publication number Publication date
JPS5740659A (en) 1982-03-06

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