JPS6363785U - - Google Patents
Info
- Publication number
- JPS6363785U JPS6363785U JP15817886U JP15817886U JPS6363785U JP S6363785 U JPS6363785 U JP S6363785U JP 15817886 U JP15817886 U JP 15817886U JP 15817886 U JP15817886 U JP 15817886U JP S6363785 U JPS6363785 U JP S6363785U
- Authority
- JP
- Japan
- Prior art keywords
- measurement chamber
- measured
- monitor
- article
- rotation device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 2
- 230000005855 radiation Effects 0.000 claims 2
- 238000011109 contamination Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15817886U JPS6363785U (enExample) | 1986-10-17 | 1986-10-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15817886U JPS6363785U (enExample) | 1986-10-17 | 1986-10-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6363785U true JPS6363785U (enExample) | 1988-04-27 |
Family
ID=31081424
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15817886U Pending JPS6363785U (enExample) | 1986-10-17 | 1986-10-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6363785U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000056026A (ja) * | 1998-06-05 | 2000-02-25 | Toshiba Corp | 成形品放射能汚染モニタ装置 |
-
1986
- 1986-10-17 JP JP15817886U patent/JPS6363785U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000056026A (ja) * | 1998-06-05 | 2000-02-25 | Toshiba Corp | 成形品放射能汚染モニタ装置 |