JPS636375U - - Google Patents
Info
- Publication number
- JPS636375U JPS636375U JP9679086U JP9679086U JPS636375U JP S636375 U JPS636375 U JP S636375U JP 9679086 U JP9679086 U JP 9679086U JP 9679086 U JP9679086 U JP 9679086U JP S636375 U JPS636375 U JP S636375U
- Authority
- JP
- Japan
- Prior art keywords
- filter paper
- concentrically
- shaft
- attached
- paper holder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000006835 compression Effects 0.000 claims description 2
- 238000007906 compression Methods 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 4
- 238000001125 extrusion Methods 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9679086U JPS636375U (sl) | 1986-06-26 | 1986-06-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9679086U JPS636375U (sl) | 1986-06-26 | 1986-06-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS636375U true JPS636375U (sl) | 1988-01-16 |
Family
ID=30962956
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9679086U Pending JPS636375U (sl) | 1986-06-26 | 1986-06-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS636375U (sl) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002131196A (ja) * | 2000-09-26 | 2002-05-09 | General Electric Co <Ge> | 表面の微粒子汚染物質を測定する装置 |
-
1986
- 1986-06-26 JP JP9679086U patent/JPS636375U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002131196A (ja) * | 2000-09-26 | 2002-05-09 | General Electric Co <Ge> | 表面の微粒子汚染物質を測定する装置 |