JPS6351842A - X-ray ct apparatus - Google Patents

X-ray ct apparatus

Info

Publication number
JPS6351842A
JPS6351842A JP61196262A JP19626286A JPS6351842A JP S6351842 A JPS6351842 A JP S6351842A JP 61196262 A JP61196262 A JP 61196262A JP 19626286 A JP19626286 A JP 19626286A JP S6351842 A JPS6351842 A JP S6351842A
Authority
JP
Japan
Prior art keywords
ray
detector
main
scattered radiation
scattered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61196262A
Other languages
Japanese (ja)
Inventor
俊裕 利府
恭二郎 南部
シルバース・アールヴェイダ・アン
ナップ・ケニス・エドワード
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP61196262A priority Critical patent/JPS6351842A/en
Publication of JPS6351842A publication Critical patent/JPS6351842A/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明はX線CT装置に関する。[Detailed description of the invention] [Purpose of the invention] (Industrial application field) The present invention relates to an X-ray CT apparatus.

(従来の技術) 一般にX線CT装置においては、X線源から曝射され被
写体を透過したスキャン面内のX線を検出する検出器(
この検出器を主検出器という)を備えており、この主検
出器からのX線情報に基づいて画像を再構成するように
なっている。
(Prior Art) Generally, in an X-ray CT apparatus, a detector (
This detector is referred to as a main detector), and images are reconstructed based on X-ray information from this main detector.

(発明か解決しようとする問題点) ところが、主検出器に入るX線には本来測定しようとし
ているX線以外に例えば被検体から発生する散乱線が含
まれているため、従来の装置では必ずしも正確なX線情
報を得ることかでさないという問題かあった。
(Problem to be solved by the invention) However, in addition to the X-rays that are originally intended to be measured, the X-rays entering the main detector include scattered rays generated from the object, for example, so conventional devices cannot always There was a problem of obtaining accurate X-ray information.

本発明の目的は上記問題点を解決し、より正確なX線情
報を1qることにある。
An object of the present invention is to solve the above problems and provide more accurate X-ray information.

[発明の構成] (問題点を解決するための手段) 上記目的を達成するため、本発明はスキャン面外であっ
て主検出器群の少なくとも一つと対応する位置に散乱線
検出器を設けた構成とした。
[Structure of the Invention] (Means for Solving the Problems) In order to achieve the above object, the present invention provides a scattered radiation detector provided at a position outside the scanning plane and corresponding to at least one of the main detector groups. The structure is as follows.

(作 用) 本発明は上記の構成としたので、次のように作用する。(for production) Since the present invention has the above configuration, it operates as follows.

即ち、スーVヤン面外にあって主検出器と対応する位置
に配置された散乱線検出器は、主検出器に入る散乱線と
ほぼ同量の散乱線を検出する。従ってこの散乱線検出器
からのデータに基づき散乱線成分を検出してこれを主検
出器からのスキャンデータから除去することによってよ
り正確なX線情報を得ることができる。
That is, a scattered radiation detector placed outside the Su-V-Yen plane at a position corresponding to the main detector detects approximately the same amount of scattered radiation as the scattered radiation entering the main detector. Therefore, more accurate X-ray information can be obtained by detecting the scattered radiation component based on the data from the scattered radiation detector and removing it from the scan data from the main detector.

(実施例) 以下図示の実施例について説明する。(Example) The illustrated embodiment will be described below.

く第1実施例〉 第1図は本発明をいわゆる第3世代のX線CT装置に適
用した実施例の要部を示す斜視図であり、第2図はその
側面図である。
First Embodiment FIG. 1 is a perspective view showing the main parts of an embodiment in which the present invention is applied to a so-called third generation X-ray CT apparatus, and FIG. 2 is a side view thereof.

1はX線源であり、被検体PにX線を曝射する。1 is an X-ray source, which irradiates the subject P with X-rays.

2は主検出器を多数円弧状に配置した主検出器群であり
、X線源1から曝射され被検体1)を透過したスキャン
面A内のX線を検出する。
Reference numeral 2 denotes a main detector group in which a large number of main detectors are arranged in an arc shape, and detects the X-rays within the scan plane A that are emitted from the X-ray source 1 and transmitted through the subject 1).

3は散乱線検出器であり、スキャン面A外であって前記
主検出器群2の少なくとも一つと対応力る位置に配置さ
れている。図示のものは8個だCプ装置してあり、散乱
線検出器3の数を主検出器2の数より少なくすることに
よってコストダウンを図っている。又、散乱線検出器3
としては、主検出器2と同じ種類のものを用い、X線に
対す−るエネルギー特性か同じになるようにしである。
Reference numeral 3 denotes a scattered radiation detector, which is placed outside the scan plane A at a position corresponding to at least one of the main detector group 2. The illustrated device has eight C-type detectors, and by making the number of scattered radiation detectors 3 smaller than the number of main detectors 2, cost reduction is achieved. In addition, the scattered radiation detector 3
The same type of detector as the main detector 2 is used so that the energy characteristics for X-rays are the same.

本実施例は、X線源1、主検出器BY2及び散乱線検出
器3かスキャン中心O−Oの回りに一体的に回転するよ
うになっており、前記散乱線検出器3はスキャン中心を
向くように配置されている。
In this embodiment, the X-ray source 1, main detector BY2, and scattered ray detector 3 rotate integrally around the scan center O-O, and the scattered ray detector 3 rotates around the scan center. It is placed to face.

従って本実施例でスキャンを行なうと、X線源1、主検
出器群2及び散乱線検出器3かスキャン中心O−Oの回
りに一体的に回転しつつ、X線源1からX線が曝射され
、被検体Pを透過したスキャン面Δ内の散乱線を含むX
線が1丁検出器2に入るとともに、散乱線検出器3には
、これかスキX・ン面A外にあることから散乱線のみが
入る。そこでこの散乱線検出器3からのデータに基づき
散乱線成分を検出してこれを主検出器からのスキャンデ
ータから除去することによってより正確なX線情報を得
ることができる。
Therefore, when scanning is performed in this embodiment, the X-ray source 1, main detector group 2, and scattered radiation detector 3 rotate integrally around the scan center O-O, and the X-rays are emitted from the X-ray source 1. X containing scattered rays within the scan plane Δ that was irradiated and transmitted through the subject P
When the ray enters the single detector 2, only the scattered rays enter the scattered ray detector 3 since this is outside the skin plane A. Therefore, more accurate X-ray information can be obtained by detecting the scattered radiation component based on the data from the scattered radiation detector 3 and removing it from the scan data from the main detector.

尚、本実施例の場合、散乱線検出器3の数は主検出器2
の数より少ないため、全部の主検出器2の各データに対
する散乱線のデータが得られる訳ではなく、従って散乱
線検出器3から得られたデータを補間して主検出器2か
受けた散乱線量を推定覆−る必要があるが、この点につ
いては後述する。
In the case of this embodiment, the number of scattered radiation detectors 3 is greater than the main detector 2.
, it is not possible to obtain scattered radiation data for each data of all the main detectors 2. Therefore, the data obtained from the scattered radiation detectors 3 is interpolated to calculate the scattering received by the main detector 2. It is necessary to overestimate the dose, but this point will be discussed later.

〈実施例2〉 第3図は本発明をいわゆる第4世代のX線CT装置に適
用した実施例の要部を示す斜視図である。
<Embodiment 2> FIG. 3 is a perspective view showing a main part of an embodiment in which the present invention is applied to a so-called fourth generation X-ray CT apparatus.

この実施例か第1実施例と異なるのは、主検出器2が円
環状に配置されていて、かつ固定されている点である。
This embodiment differs from the first embodiment in that the main detector 2 is arranged in an annular shape and is fixed.

従ってこの実施例の場合、X線源1と散乱線検出器3の
みが回転することとなり、主検出器2と散乱線検出器3
との位置関係は順次移り変わって行くことになるが、各
瞬間についてみれば主検出器2と散乱線検出器3との対
応関係は第1実施例の場合と同様であり、散乱線検出器
3からのデータに基づき散乱線成分を検出してこれを主
検出器からのスキャンデータから除去することによって
より正確なX線情報を得ることかできる点については変
りはない。
Therefore, in this embodiment, only the X-ray source 1 and the scattered radiation detector 3 rotate, and the main detector 2 and the scattered radiation detector 3 rotate.
The positional relationship between the main detector 2 and the scattered radiation detector 3 will change sequentially, but at each moment, the correspondence between the main detector 2 and the scattered radiation detector 3 is the same as in the first embodiment, and the scattered radiation detector 3 There is no difference in the fact that more accurate X-ray information can be obtained by detecting scattered radiation components based on data from the main detector and removing them from the scan data from the main detector.

更に、図示はしないが、散乱線検出器3も円環状に配置
した場合には、X線源1のみを回転させればよいことと
なる。
Furthermore, although not shown, if the scattered radiation detectors 3 are also arranged in an annular shape, only the X-ray source 1 needs to be rotated.

〈第3実施例〉 第4図に上述の実施例を用いたX線C下装置全体のブロ
ック図を示す。
<Third Embodiment> FIG. 4 shows a block diagram of the entire X-ray C apparatus using the above-described embodiment.

前述のように散乱線検出器3の数を主検出器2の数より
少なくした場合、全部の主検出器2の各データに対する
散乱線のデータか得られる訳ではないので、散乱線検出
器3から17られたデータを補間して主検出器2が受け
た散乱線量をJft定する必要がある。更に、より正確
なX線源情報を得るためには、散乱線検出器3と主検出
器2のX線に対する感度の違いの補正、散乱線検出器3
と主検出器20位首の違いによる散乱線量の違いの補正
をL行イ【うことが望ましいか、本実施例はこれらの補
正をも行なうように構成されている。
As mentioned above, if the number of scattered ray detectors 3 is smaller than the number of main detectors 2, it is not possible to obtain scattered ray data for each data of all the main detectors 2. It is necessary to interpolate the data obtained from 17 to determine the scattered radiation dose received by the main detector 2, Jft. Furthermore, in order to obtain more accurate X-ray source information, it is necessary to correct the difference in sensitivity to X-rays between the scattered ray detector 3 and the main detector 2, and to
It is desirable to correct the difference in scattered radiation dose due to the difference in the position of the main detector and the main detector 20, but the present embodiment is configured to perform these corrections as well.

第4図に於て、10は土jホのスキャJ−111は該ス
キャナ10の主検出器群からのデータを収集づるf゛−
夕収集部(DAS)である。
In FIG. 4, 10 is a scanner F-111 which collects data from the main detector group of the scanner 10.
This is the Evening Collection Department (DAS).

12は演算部であり、DASll及び散乱線検出器3か
らのデータに基づき、散乱線検出器3と主検出器2のX
線に対する感度及び位置の近いによる散乱線量の比を算
出して、その算出結果を出力するようになっている。
12 is a calculation unit, which calculates the
The ratio of the scattered radiation dose due to the sensitivity to the radiation and the proximity of the position is calculated, and the calculation result is output.

上記比を求める手段としてはR1法又は鉛ピン法を採用
する。RI法を採用する場合は、スキャン中心又はスキ
ャン領域の任意の位置にRadiOISOtopeを置
いて、主検出器2と散乱線検出器3のデータとを同時に
収集し各々の比を求める。鎗ピン法を採用する場合は、
スキャン領域に散乱線を発する被検体を置いて被検体と
主検出器2どの間に鉛ピンを首く。この場合、焦点と鉛
ピンとを結ぶ線上にある主検出器には主線が当らないの
で゛鎗ピンの見込角を除いたところからの散乱線を測定
できる。そこで同時に散乱線を散乱線検出器で測定し、
主検出器の出力との比を求める。ここで鎗ピンは、X線
の焦点外X線を」−分にカバーするという条件の下で、
十分に幅を狭くする。
The R1 method or the lead pin method is employed as a means for determining the above ratio. When employing the RI method, a RadioOISOtope is placed at the center of the scan or at an arbitrary position in the scan area, data from the main detector 2 and the scattered radiation detector 3 are collected simultaneously, and the ratio of each is determined. When using the spear pin method,
A subject that emits scattered radiation is placed in the scan area, and a lead pin is hung between the subject and the main detector 2. In this case, since the main line does not hit the main detector located on the line connecting the focal point and the lead pin, it is possible to measure scattered radiation from areas other than the line of sight of the lead pin. At the same time, the scattered radiation was measured using a scattered radiation detector.
Find the ratio to the output of the main detector. Here, the spear pin is under the condition that it covers the out-of-focus X-rays by ''-minutes.
Make the width sufficiently narrow.

13は演算部12からの算出結果を記憶するメモリであ
る。
Reference numeral 13 denotes a memory that stores calculation results from the calculation unit 12.

14は補正部であり、メモリ13に記憶されている散乱
線検出器3と主検出器2のX線に対重る感度及び位置の
違いによる散乱線量の比に基づいて散乱線検出器3のデ
ータを補正し、更にその補正データを補間して主検出器
に入ったと推定される散乱線成分を検出し、これを主検
出器からのスキャンデータから減算除去することによっ
て、より正確なX線情報を生成するようになっている。
Reference numeral 14 denotes a correction unit, which adjusts the amount of scattered radiation of the scattered radiation detector 3 based on the ratio of the scattered radiation amount due to the difference in sensitivity and position of the scattered radiation detector 3 and the main detector 2 relative to X-rays, which is stored in the memory 13. By correcting the data, interpolating the corrected data, detecting the scattered radiation component estimated to have entered the main detector, and subtracting and removing it from the scan data from the main detector, more accurate X-rays can be obtained. It is designed to generate information.

補間手段として1よ、直線補間又はスプライン補間を採
用する。又、散乱線検出器からのデータについてはレフ
ァレンス補正を施すようになっている。
1, linear interpolation or spline interpolation is employed as the interpolation means. Further, reference correction is applied to data from the scattered radiation detector.

15は補正部14からのデータに基づき画像を再構成す
る再構成部、16は該再構成部15により再構成された
画像を表示する表示部、17は前記スキャナ10及び演
算部12の制御を司るシステム」ントローラである。
15 is a reconstruction unit that reconstructs an image based on the data from the correction unit 14; 16 is a display unit that displays the image reconstructed by the reconstruction unit 15; and 17 is a control unit for controlling the scanner 10 and the calculation unit 12. The controller is the system that controls the system.

以上のような装置は、実際の被検体をスキャンJ−る前
に、予め前記RI法又は釦ピン払にてスキA・ンを行な
い、演算部12により上述の比を冑でこれをメモリ13
に記憶しておく。その後通當どうり被検体のスキャンを
行なうと、補正部14によって前記メモリ内の比及び補
間によって補正された正確なX線情報が得られ、これが
再構成部15で再構成され、従来よりも分解能の高い画
像が表示部16に表示されることとなる。尚、前記比を
得る作業は被検体のスキャンを行なう毎に行なう必要t
まなく、所定回数毎に行なえば足りる。
In the above-mentioned apparatus, before scanning an actual subject, a scan is performed in advance using the RI method or button pin removal, and the above-mentioned ratio is calculated by the calculation unit 12 and stored in the memory 13.
Remember it. After that, when the object is scanned in the same way, accurate X-ray information corrected by the ratio and interpolation in the memory is obtained by the correction unit 14, and this is reconstructed by the reconstruction unit 15. An image with high resolution will be displayed on the display unit 16. Note that the task of obtaining the above ratio needs to be performed every time the subject is scanned.
It is sufficient to do it every predetermined number of times.

以上本発明の実施例について説明したが、本発明は一ト
記実施例に限定されるものではなく、本発明の要旨の範
囲内において適宜変形実施可能であることは言うまでも
ない。
Although the embodiments of the present invention have been described above, it goes without saying that the present invention is not limited to the above embodiments, and can be modified as appropriate within the scope of the gist of the present invention.

例えば、散乱線検出器の数は主検出器と同数としてもよ
い。この場合上述のような補間は不要となる。
For example, the number of scattered radiation detectors may be the same as the number of main detectors. In this case, interpolation as described above becomes unnecessary.

又、散乱線検出器として特願昭57−86269Q明細
書に見られるようなGd202 Sシンチレータ士フォ
トダイオードを用いれば温度係数が小さく、キャリブレ
ーションを煩繁にする必要かなくなる。
Furthermore, if a Gd202S scintillator photodiode, as disclosed in Japanese Patent Application No. 57-86269Q, is used as the scattered radiation detector, the temperature coefficient will be small and there will be no need for complicated calibration.

[発明の効果] 以上詳述したように本発明によれば、スキャン中心にあ
って主検出器と対応する位置に配置された散乱線検出器
が主検出器に入る散乱線とほぼ同量の散乱線を検出する
ので、この散乱線検出器からのデータに基づき散乱線成
分を検出してこれを主検出器からのスキX・ンデータか
ら除去覆−ることによってより正確なX線情報を得るこ
とかでさる3゜
[Effects of the Invention] As detailed above, according to the present invention, the scattered ray detector located at the center of the scan and at the position corresponding to the main detector receives approximately the same amount of scattered rays as the scattered rays entering the main detector. Since scattered radiation is detected, more accurate X-ray information can be obtained by detecting the scattered radiation component based on the data from this scattered radiation detector and removing it from the skin X-ray data from the main detector. Monkey 3゜

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係るX線CT装置の第1実施例の要部
を示す斜視図、第2図は同上側面図、第3図は同士第2
実施例の斜視図、第4図は本発明を用いたX線CT装買
全体のブロック図である。 1・・・X線源、 2・・・主検出器、3・・・散乱線
検出器、 A・・・スキャン面。
FIG. 1 is a perspective view showing the main parts of the first embodiment of the X-ray CT apparatus according to the present invention, FIG. 2 is a top side view of the same, and FIG.
FIG. 4, which is a perspective view of the embodiment, is a block diagram of the entire X-ray CT equipment using the present invention. 1... X-ray source, 2... Main detector, 3... Scattered radiation detector, A... Scanning surface.

Claims (4)

【特許請求の範囲】[Claims] (1)被検体にX線を曝射するX線源と、該X線源から
曝射され被検体を透過したスキャン面内のX線を検出す
る主検出器群とを備えたX線CT装置に於て、前記スキ
ャン面外であって前記主検出器群の少なくとも一つと対
応する位置に散乱線検出器を設けたことを特徴とするX
線CT装置。
(1) X-ray CT equipped with an X-ray source that irradiates the subject with X-rays and a main detector group that detects the X-rays within the scan plane that are emitted from the X-ray source and transmitted through the subject. The apparatus is characterized in that a scattered radiation detector is provided at a position outside the scanning plane and corresponding to at least one of the main detector groups.
Ray CT device.
(2)前記散乱線検出器は主検出器の数より少ない数と
した特許請求の範囲第1項記載のX線CT装置。
(2) The X-ray CT apparatus according to claim 1, wherein the number of the scattered ray detectors is smaller than the number of main detectors.
(3)前記散乱線検出器は、スキャン中心の回りにX線
源と一体的に回転するものとした特許請求の範囲第1項
又は第2項記載のX線CT装置。
(3) The X-ray CT apparatus according to claim 1 or 2, wherein the scattered ray detector rotates integrally with the X-ray source around the scan center.
(4)前記散乱線検出器は、X線源と一体的に回転させ
ずに固定した特許請求の範囲第1項又は第2項記載のX
線CT装置。
(4) The X-ray detector according to claim 1 or 2, wherein the scattered ray detector is fixed without rotating integrally with the X-ray source.
Ray CT device.
JP61196262A 1986-08-21 1986-08-21 X-ray ct apparatus Pending JPS6351842A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61196262A JPS6351842A (en) 1986-08-21 1986-08-21 X-ray ct apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61196262A JPS6351842A (en) 1986-08-21 1986-08-21 X-ray ct apparatus

Publications (1)

Publication Number Publication Date
JPS6351842A true JPS6351842A (en) 1988-03-04

Family

ID=16354880

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61196262A Pending JPS6351842A (en) 1986-08-21 1986-08-21 X-ray ct apparatus

Country Status (1)

Country Link
JP (1) JPS6351842A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009512851A (en) * 2005-10-20 2009-03-26 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Improved CSCT detector geometry

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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