JPS6344282A - Inspecting instrument for appearances of packaged parts - Google Patents

Inspecting instrument for appearances of packaged parts

Info

Publication number
JPS6344282A
JPS6344282A JP61188275A JP18827586A JPS6344282A JP S6344282 A JPS6344282 A JP S6344282A JP 61188275 A JP61188275 A JP 61188275A JP 18827586 A JP18827586 A JP 18827586A JP S6344282 A JPS6344282 A JP S6344282A
Authority
JP
Japan
Prior art keywords
parts
component
distance
pictures
feature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61188275A
Other languages
Japanese (ja)
Other versions
JPH07104937B2 (en
Inventor
Kazunari Yoshimura
一成 吉村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP61188275A priority Critical patent/JPH07104937B2/en
Publication of JPS6344282A publication Critical patent/JPS6344282A/en
Publication of JPH07104937B2 publication Critical patent/JPH07104937B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To highly accurately inspect packaged parts by detecting the distance pictures of parts packaged on a printed circuit board and binarizing the detected distance pictures at a threshold level where only the parts can be extracted. CONSTITUTION:A distance picture detector 1 detects the distance pictures of the parts packaged on the printed circuit board. The distance pictures that the detector 1 detects are inputted to a binarization processing part 2, which binarizes said pictures at the threshold level where only the parts can be extracted. A separation and recognition part 3 separates and recognizes the parts from the binarized pictures that the binarization processing part 2 obtains, and a part feature amount calculation part 4 calculates the feature amounts of the separated and recognized parts. A comparison and decision part 6 compares said feature amounts with those of acceptances from an acceptance feature amount storage part 5, and decides whether the parts are accepted or rejected.

Description

【発明の詳細な説明】 (技術分野) 本発明は、印刷配線基板上に実装された部品の外観を検
査するための実装部品外観検査装置に関するものであり
、例えば、チップ部品が実装された印刷配線基板におけ
る部品の実装状態や半田はけ状態等を自動的に検査する
ために用いられるものである。
Detailed Description of the Invention (Technical Field) The present invention relates to a mounted component appearance inspection device for inspecting the appearance of components mounted on a printed wiring board, and for example, a printed wiring board on which chip components are mounted. It is used to automatically inspect the mounting state of components, soldering state, etc. on a wiring board.

(背景技術) 従来、印刷配線基板上に実装された部品の外観な検査す
るためには、第6図(、)に示すように、印刷配線基板
(7)上の部品(8)に半田1寸は部分(9)を光らせ
るような照明を行い、テレビカメラ等により部品実装面
を撮像して得た画像信号を二値化し、第6113(b)
に示すように、半田(寸は部分等の画像く9°)を検出
し、第6図(c)に示すように、縦ずれ検査領域(10
)や横ずれ検査領域(11)を設定し、各領域(10)
、(11)内での測定を行うことによって部品(8)の
ずれを測定し、また、欠品検査領域(12)を設定し、
該領域(12)内での色の測定を行い、部品(8)と基
板(7)との色の差により欠品の有無を検査していた。
(Background Art) Conventionally, in order to inspect the appearance of components mounted on a printed wiring board, as shown in FIG. 6113(b).
As shown in FIG.
) and lateral slip inspection area (11), and each area (10)
, (11) to measure the deviation of the part (8), and also set a missing part inspection area (12),
The color within the area (12) was measured, and the presence or absence of a missing item was inspected based on the difference in color between the component (8) and the board (7).

しかしながら、半田付けの状態は多種多様であり、例え
ば、第7図(a)に示すように半田不足部分(9A)と
半田過剰部分(9B)とがある場合には、同図(b)に
示すように、半田付は部分の画1 (9A’ ) 、 
(9B’)を正確に二値化することができず、部品(8
)のずれ測定に誤差を生じるという問題があった。また
、第8図(a)に示すように、実装部品(8)に文字(
13)やトリミング(14)がある場合には、同図(b
)に示すような画像が得られ、半田1すけ部分の画像(
9゛)と半田付は部分以外の画像(13’)、(14°
)とが紛られしく、測定困難な場6が生じる。さらに、
基板(ア)に白色のシルクが印刷してあったり、セラミ
ック基板のように白の基板色が露出している場合や、実
装部品(8〉の色が基板(7)の色と類似している場合
にら測定が困難であった。
However, there are many different soldering conditions, and for example, when there is an insufficient solder area (9A) and an excessive solder area (9B) as shown in FIG. 7(a), the situation shown in FIG. As shown, the soldering is part picture 1 (9A'),
(9B') cannot be binarized accurately, and the part (8B') cannot be binarized accurately.
) There was a problem in that an error occurred in the measurement of the deviation. In addition, as shown in FIG. 8(a), the mounting component (8) has letters (
13) or trimming (14), the same figure (b)
The image shown in ) is obtained, and the image of one solder area (
9゛) and soldering are images other than the parts (13') and (14°
) is confusing and difficult to measure. moreover,
If the board (A) has white silk printed on it, the white board color is exposed like a ceramic board, or the color of the mounted component (8>) is similar to the color of the board (7). It was difficult to measure when there were

(発明の目的) 本発明は上述のような点に鑑みてなされたものであり、
その目的とするところは、部品実装状態を喬精度で且つ
簡単に検査することのできる実装部品外観検査装置を提
供するにある。
(Object of the invention) The present invention has been made in view of the above points, and
The object thereof is to provide a mounted component appearance inspection apparatus that can easily and accurately inspect the component mounting state.

(発明の開示) 本発明に係る実装部品外観検査装置にあっては、第1図
及び第2図に示すように、印刷配線基板(7)上に実装
された部品(8)の距離画像を検出するための距雛画(
象検出器(1)と、該検出器(1)によって検出された
距離画像を部品(8)のみが抽出されるような閾値レベ
ルで二値化する二値(ヒ処理部(2)と、二値化処理部
(2)にて得られた二値(ヒ画像から部品(8)の分能
認識を行う分雛認識部(3)と、分離認識された部品(
8)の特徴量と算出する部品特徴量算出部(4)と、予
め良品について算出した特徴量を保持する良品特徴量記
憶部(5)と、部品特徴量算出部(4〉と良品特rB、
量記憶部〈5)との各特徴量を比較して良苫判定を行う
比較判定部(6)とを有して成るものである。
(Disclosure of the Invention) As shown in FIGS. 1 and 2, the mounted component visual inspection apparatus according to the present invention provides a distance image of a component (8) mounted on a printed wiring board (7). The distance image for detection (
an image detector (1), a binary processing unit (2) that binarizes the distance image detected by the detector (1) at a threshold level such that only the component (8) is extracted; The divided chick recognition unit (3) performs the separation recognition of the part (8) from the binary image obtained by the binarization processing unit (2), and the part (8) that has been separated and recognized.
8), a component feature calculation unit (4) that calculates the feature values, a non-defective product feature storage unit (5) that stores the feature values calculated in advance for non-defective products, a component feature calculation unit (4) and the non-defective product characteristics rB. ,
It comprises a comparison/judgment section (6) that compares each characteristic quantity with a quantity storage section (5) to determine whether it is good or bad.

第2図は距離検出器(1)による四重画像検出の様子を
示している。第2図においては、三角測量による光学式
の距離検出器り1)を用いて、第3図(a)に示すよう
な部品(8)の実装された基板(7)における各点の高
さを測定している。そして、基板(7)又は距離検出器
(1)をX−Yステージ等を用いてX方向及びY方向に
走査し、部品実装された基板(7)の距離画像を構成す
る。この距離画像から部品(8)の形状のみが白く(又
は黒く)出るように画像信号を二値(ヒして、第3図(
b)に示すような二値化画像を得る。この二値化画像を
用いて、各部品画像(8°)の分離認識を行い、ラベリ
ングする。
FIG. 2 shows how quadruple images are detected by the distance detector (1). In Figure 2, an optical distance detector 1) based on triangulation is used to determine the height of each point on the board (7) on which the component (8) is mounted as shown in Figure 3 (a). are being measured. Then, the substrate (7) or the distance detector (1) is scanned in the X and Y directions using an X-Y stage or the like to construct a distance image of the substrate (7) on which the components are mounted. From this distance image, the image signal is binarized so that only the shape of part (8) appears white (or black), as shown in Figure 3 (
A binarized image as shown in b) is obtained. Using this binarized image, each component image (8°) is recognized separately and labeled.

第3図(c)にラベリングされた状想の一例を示す。An example of the labeled state is shown in FIG. 3(c).

そして、ラベル1すけされた各ランド(連結性を持つ白
又は黒の固まり)毎に、第4図に示すように、重心、面
苛、外接四角形、慣性主軸方向等の特徴量を演算する。
Then, for each labeled land (white or black mass with connectivity), as shown in FIG. 4, feature quantities such as the center of gravity, surface area, circumscribed rectangle, direction of the principal axis of inertia, etc. are calculated.

そして、予め算出しておいた良品基板の特徴量と比較を
行う。
Then, a comparison is made with the feature amount of the non-defective board calculated in advance.

具体的な検査−の流れを第5図(、)〜(c)のフロー
チャートに沿って説明する。まず、第5図(a)に示す
ように、部品を実装された基板の距離画像を入力し、入
力された画像信号を二値化して、二値(ヒ画像における
各ランドをラベリングして分離認識し、面積フィルタリ
ングを行った後、各ランドの特徴量演算を行う、特徴量
演算が終了すると、ラベリングしたランドの重心と良品
の重心との距離を全て求める。検査ランド(n)と良品
ランド(翔)との重心距fiRnmは次式で求められる
The specific flow of the inspection will be explained with reference to the flowcharts in FIGS. 5(,) to (c). First, as shown in Figure 5(a), a distance image of a board on which components are mounted is input, the input image signal is binarized, and each land in the binary image is labeled and separated. After recognition and area filtering, the feature value calculation for each land is performed. Once the feature value calculation is completed, all distances between the center of gravity of the labeled land and the center of gravity of the non-defective land are calculated. Inspection land (n) and non-defective land The center-of-gravity distance fiRnm with (Sho) is determined by the following formula.

Rn+a= y’ (Xng−Xmg)2±(Yng 
  Y 偵g) まただし、(Xng、Yng)は検査
ランド(n)の重心座標、(X Iag 、 Y Ia
g )は良品ランド(m)の重心座標である。
Rn+a=y' (Xng-Xmg)2±(Yng
(Xng, Yng) are the coordinates of the center of gravity of the inspection land (n), (X Iag, Y Ia
g) is the coordinate of the center of gravity of the non-defective land (m).

次に、第5図(b)に示すように、重心距馳Rnmが所
定の規格内に入っていれば、良品に対応する候補として
記憶し、候補が1つも存在しなければ欠品と判定する。
Next, as shown in FIG. 5(b), if the center of gravity distance Rnm is within a predetermined standard, it is stored as a candidate corresponding to a good product, and if there is no candidate, it is determined that the product is missing. do.

良品ランド(、、)に対応する検査ランド(n)が1つ
であれば、良品とのラベル対応づけを行い、複数個存在
する場合には、次式の評価関数α11111を計算する
If there is one inspection land (n) corresponding to a non-defective land (,,), a label is associated with the non-defective land, and if there are multiple inspection lands, an evaluation function α11111 of the following equation is calculated.

a nm=J  (Rnm −Rn+can)2+ (
Am −An)2/ 、Amまただし、Anは検査ラン
ド(n>の面積であり、A…は良品ランド(m>の面茫
である。また、Rmcanは次式で表される。
a nm=J (Rnm −Rn+can)2+ (
Am - An) 2/ , Am where An is the area of the inspection land (n>), A... is the area of the non-defective land (m>), and Rmcan is expressed by the following formula.

Rn+ean −Σ (win   Rnm’  )/
  K上式において、Rnm’は規格内の距離であり、
Σ(+ain Rnm’)はその最小値の総和である。
Rn+ean -Σ (win Rnm')/
In the above formula, Rnm' is the distance within the standard,
Σ(+ain Rnm') is the sum of the minimum values.

また、Kは距離で1:1に対応づけされた良品の個数で
ある。
Further, K is the number of non-defective products that are correlated 1:1 in terms of distance.

αnunが規格内であるものに対して、良品とのラベル
対応づけを行い、池のものは異物混載と判定する9この
方法を用いると、検査時の基板の位置決め精度が荒くて
も判定を行うことが可能となり、複雑な処理も不要とな
る。評価関数のより簡単な式として、次式を用いて計算
しても良い。
For items whose αnun is within the standard, labels are associated with non-defective items, and those in the pond are determined to be contaminated with foreign matter.9 Using this method, even if the positioning accuracy of the board at the time of inspection is rough, the judgment can be made. This makes it possible to eliminate the need for complicated processing. As a simpler expression of the evaluation function, the following expression may be used for calculation.

a nm’ = (Rnm −Rmean)+ An/
 Am次に、対応づけされたランドに関しては、第5(
2I(c)に示すように、面積比較を行い、An>Am
の場合には゛部品間違い”又は゛ブリッジ°゛と判定し
、A n CA +nの場合には゛部品立ち°“又はパ
部品欠け″と判定し、はぼ等しい場きには、外接四角形
を調べる。外接四角形が予め設定された範囲内になけれ
ば、“部品ずれ°′と判定する。次に、慣性主軸方向ご
見て、°゛部品き°゛の有無を判定する0面積、外接四
角形、慣性主軸方向等の各条件が良品と一致するものに
ついては、良品であると判定する。
a nm' = (Rnm - Rmean) + An/
Am Next, regarding the associated lands, the fifth (
As shown in 2I(c), the area is compared and An>Am
In the case of A n CA +n, it is determined to be "wrong part" or "bridge", and in the case of A n CA +n, it is determined to be "part standing" or part missing. If they are approximately equal, the circumscribing rectangle is examined. If the circumscribed rectangle is not within a preset range, it is determined that there is a "component misalignment °'." Next, looking at the direction of the principal axis of inertia, if the conditions such as 0 area, circumscribed rectangle, direction of principal axis of inertia, etc. for determining the presence or absence of parts are consistent with a non-defective product, it is determined to be a non-defective product.

(発明の効果) 以上のように本発明にあっては、印刷配線基板上に実装
された部品の距離画像を検出し、検出された距離画像を
部品のみが抽出されるような閾値レベルで二値化するよ
うにしたから、正確な部品形状を取ることができ、部品
の色や形状、あるいは基板の状態等に影響されることな
く、精度良く検査を行うことができるという効果があり
、また、部品の特52Nを用いて良品との比較判定を行
っているので、検査時における基板の位置決めが荒くて
も、部品ずれ等の検出に影響を受けることがなく、高精
度で検出することができるという効果がある。
(Effects of the Invention) As described above, in the present invention, a distance image of a component mounted on a printed wiring board is detected, and the detected distance image is divided at a threshold level such that only the component is extracted. Because it is converted into a value, the accurate part shape can be taken, and inspection can be performed with high precision without being affected by the color or shape of the part or the condition of the board. Since the parts are compared with non-defective parts using 52N, even if the board is roughly positioned during inspection, it will not be affected by the detection of parts displacement, etc., and it can be detected with high accuracy. There is an effect that it can be done.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の基本構成を示すブロック図、第2図は
同上に用いる距離画像検出器を示す斜視図、第3図(a
)乃至(c)は同上の動作説明図、第4図は同上に用い
る実装部品の特vi玉を説明するための説明図、第5図
(、)乃至(c)は同上の一実施例の動作を示すフロー
チャート、第6図(a)乃至(C)、第7図(a)(b
)及び第8図(a)(b)は従来の検査方法を説明する
ための説明図である。 (1)は距な画像検出器、(2)は二値化処理部、(3
)は分離認識部、(4)は部品特徴量算出部、(5)は
良品特徴量記憶部、り6)は比較判定部、(7)は基板
、(8)は部品である・
FIG. 1 is a block diagram showing the basic configuration of the present invention, FIG. 2 is a perspective view showing a distance image detector used in the above, and FIG.
) to (c) are explanatory diagrams of the same operation as above, FIG. 4 is an explanatory diagram to explain the features of the mounted components used in the same, and FIG. Flowcharts showing operations, FIGS. 6(a) to (C), FIGS. 7(a)(b)
) and FIGS. 8(a) and 8(b) are explanatory diagrams for explaining the conventional inspection method. (1) is a distance image detector, (2) is a binarization processing unit, (3
) is the separation recognition unit, (4) is the component feature value calculation unit, (5) is the non-defective feature value storage unit, 6) is the comparison determination unit, (7) is the board, and (8) is the component.

Claims (1)

【特許請求の範囲】[Claims] (1)印刷配線基板上に実装された部品の距離画像を検
出するための距離画像検出器と、該検出器によつて検出
された距離画像を部品のみが抽出されるような閾値レベ
ルで二値化する二値化処理部と、二値化処理部にて得ら
れた二値化画像から部品の分離認識を行う分離認識部と
、分離認識された部品の特徴量を算出する部品特徴量算
出部と、予め良品について算出した特徴量を保持する良
品特徴量記憶部と、部品特徴量算出部と良品特徴量記憶
部との各特徴量を比較して良否判定を行う比較判定部と
を有して成ることを特徴とする実装部品外観検査装置。
(1) A distance image detector for detecting a distance image of a component mounted on a printed wiring board, and a distance image detected by the detector that is divided at a threshold level such that only the component is extracted. A binarization processing unit that converts into values, a separation recognition unit that separates and recognizes parts from the binarized image obtained by the binarization processing unit, and component features that calculate features of separated and recognized parts. A calculation unit, a non-defective feature storage unit that holds feature quantities calculated in advance for non-defective products, and a comparison judgment unit that compares the feature quantities of the component feature calculation unit and the non-defective feature storage unit to determine quality. A mounted component appearance inspection device comprising:
JP61188275A 1986-08-11 1986-08-11 Visual inspection method for mounted parts Expired - Lifetime JPH07104937B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61188275A JPH07104937B2 (en) 1986-08-11 1986-08-11 Visual inspection method for mounted parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61188275A JPH07104937B2 (en) 1986-08-11 1986-08-11 Visual inspection method for mounted parts

Publications (2)

Publication Number Publication Date
JPS6344282A true JPS6344282A (en) 1988-02-25
JPH07104937B2 JPH07104937B2 (en) 1995-11-13

Family

ID=16220807

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61188275A Expired - Lifetime JPH07104937B2 (en) 1986-08-11 1986-08-11 Visual inspection method for mounted parts

Country Status (1)

Country Link
JP (1) JPH07104937B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0743124A (en) * 1993-08-03 1995-02-10 Nec Corp Inspection device for packaged substrate

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139278A (en) * 1982-02-10 1983-08-18 Fuji Electric Co Ltd Testing device for plural patterns
JPS6015780A (en) * 1983-07-08 1985-01-26 Hitachi Ltd Robot

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139278A (en) * 1982-02-10 1983-08-18 Fuji Electric Co Ltd Testing device for plural patterns
JPS6015780A (en) * 1983-07-08 1985-01-26 Hitachi Ltd Robot

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0743124A (en) * 1993-08-03 1995-02-10 Nec Corp Inspection device for packaged substrate

Also Published As

Publication number Publication date
JPH07104937B2 (en) 1995-11-13

Similar Documents

Publication Publication Date Title
US4876457A (en) Method and apparatus for differentiating a planar textured surface from a surrounding background
JP3051279B2 (en) Bump appearance inspection method and bump appearance inspection device
US7961933B2 (en) Method of setting reference data for inspection of fillets and inspection device using same
KR100283834B1 (en) Bonding method of semiconductor chip and its device
CN106651857B (en) A kind of printed circuit board patch defect inspection method
CN107945184A (en) A kind of mount components detection method positioned based on color images and gradient projection
JP2004340832A (en) Method and system for visual inspection of circuit board
JPH09231362A (en) Appearance inspecting device and its method
JP5045591B2 (en) Method for creating area setting data for inspection area and board appearance inspection apparatus
JP2010091361A (en) Method and device for inspecting image
US6741734B2 (en) Appearance inspection method and appearance inspection apparatus having high inspection processing speed
JPH04315907A (en) Solder wetting form examining method
JPS6344282A (en) Inspecting instrument for appearances of packaged parts
JPH0380258B2 (en)
CN106996911B (en) The localization method of two-dimensional detection paste solder printing
JPH07104132B2 (en) Mounted component appearance inspection method
JP3119743B2 (en) Mounting inspection device
JPS59150433A (en) Wire inspection apparatus
JPH0739997B2 (en) Appearance inspection method for soldered parts
JPS62233746A (en) Checker for chip mounted board
JPH0372204A (en) Checking method of outer appearance of soldering part
JPH02165004A (en) Object testing apparatus
JP3715489B2 (en) Printed circuit board inspection equipment
JP2006250610A (en) Visual inspection method of circuit board
JP2836580B2 (en) Projection inspection device for semiconductor integrated circuit device