JPS6342498U - - Google Patents
Info
- Publication number
- JPS6342498U JPS6342498U JP1986135452U JP13545286U JPS6342498U JP S6342498 U JPS6342498 U JP S6342498U JP 1986135452 U JP1986135452 U JP 1986135452U JP 13545286 U JP13545286 U JP 13545286U JP S6342498 U JPS6342498 U JP S6342498U
- Authority
- JP
- Japan
- Prior art keywords
- fixed
- ring
- sealing device
- stern tube
- shaft sealing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007789 sealing Methods 0.000 claims description 4
- 239000013013 elastic material Substances 0.000 claims 1
- 230000013011 mating Effects 0.000 description 1
Landscapes
- Sealing Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986135452U JPS6342498U (un) | 1986-09-05 | 1986-09-05 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986135452U JPS6342498U (un) | 1986-09-05 | 1986-09-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6342498U true JPS6342498U (un) | 1988-03-19 |
Family
ID=31037650
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1986135452U Pending JPS6342498U (un) | 1986-09-05 | 1986-09-05 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6342498U (un) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5630661B2 (un) * | 1976-08-23 | 1981-07-16 | ||
JPS5921169B2 (ja) * | 1977-01-24 | 1984-05-18 | 三菱電機株式会社 | 半導体素子の不良解析法 |
-
1986
- 1986-09-05 JP JP1986135452U patent/JPS6342498U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5630661B2 (un) * | 1976-08-23 | 1981-07-16 | ||
JPS5921169B2 (ja) * | 1977-01-24 | 1984-05-18 | 三菱電機株式会社 | 半導体素子の不良解析法 |