JPS6342404A - Measuring method for thickness of plating film - Google Patents
Measuring method for thickness of plating filmInfo
- Publication number
- JPS6342404A JPS6342404A JP18562786A JP18562786A JPS6342404A JP S6342404 A JPS6342404 A JP S6342404A JP 18562786 A JP18562786 A JP 18562786A JP 18562786 A JP18562786 A JP 18562786A JP S6342404 A JPS6342404 A JP S6342404A
- Authority
- JP
- Japan
- Prior art keywords
- plating film
- magnet
- sample
- thickness
- shaft
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007747 plating Methods 0.000 title claims abstract description 32
- 238000000034 method Methods 0.000 title claims description 6
- 239000000696 magnetic material Substances 0.000 claims description 10
- 239000000463 material Substances 0.000 abstract description 13
- 238000006073 displacement reaction Methods 0.000 abstract description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 12
- 229910052742 iron Inorganic materials 0.000 description 6
- 229910001096 P alloy Inorganic materials 0.000 description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 4
- 239000011574 phosphorus Substances 0.000 description 4
- 229910000640 Fe alloy Inorganic materials 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 206010010904 Convulsion Diseases 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000009954 braiding Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- DPTATFGPDCLUTF-UHFFFAOYSA-N phosphanylidyneiron Chemical compound [Fe]#P DPTATFGPDCLUTF-UHFFFAOYSA-N 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は、メッキ皮膜厚の測定方法に係り、特に非磁性
体に施された磁性体からなるメッキ皮膜厚の測定に最適
なメッキ皮膜厚の測定方法に関する。Detailed Description of the Invention (Field of Industrial Application) The present invention relates to a method for measuring the thickness of a plating film, and in particular to a method for measuring the thickness of a plating film made of a magnetic material applied to a non-magnetic material. Regarding the measurement method.
（従来の技術）
自動車等のエンジンにあっては、軽量化のためにシリン
ダーブロック及びピストンのそれぞれの材質としてＡＩ
（アルミニウム）合金を用いたものがあるが、これら
は同種材料であるため、相互の摺動によって焼き付きが
生じ易い。(Prior art) In automobile engines, AI is used as the material for cylinder blocks and pistons to reduce weight.
There are some that use (aluminum) alloy, but since these are the same type of material, they tend to seize due to mutual sliding.
このため、ピストンのスカート部に鉄系メッキを施すこ
とにより焼き付き等の発生を抑制している（Ｐｌａｉｔ
ｉｎｇ、 Ａｕｇ、 ’ ７４ Ｐ−７４１〜ｆ（参照
）。For this reason, the piston skirt is coated with iron-based plating to suppress the occurrence of seizures (Plait
ing, Aug, '74 P-741-f (reference).
上記ピストンのスカート部におけるメッキ皮膜厚を測定
することは、円滑な摺動をなすピストンを設計するため
の重要な要素のひとつである。Measuring the thickness of the plating film on the skirt portion of the piston is one of the important elements for designing a piston that slides smoothly.
メッキ皮膜厚の測定には、光、電子、イオン等を利用し
た応用機器を用いる方法と、現在広く行なわれているが
、試料を切断後、メッキ皮膜の断面厚を光学顕微鏡、あ
るいは電子顕微鏡で測定する方法がある。Currently, the plating film thickness is measured using applied equipment that uses light, electrons, ions, etc., but after cutting the sample, the cross-sectional thickness of the plating film is measured using an optical microscope or an electron microscope. There is a way to measure it.
（発明が解決しようとする問題点）
しかしながら、前者の場合はコンピュータ及び映像処理
等が必要とされることが多く、一般的に設備が大型化す
る傾向があるにもかかわらず得られる情報が少ない場合
が多いという欠点がある。(Problem to be solved by the invention) However, in the former case, computers and video processing are often required, and although there is a general tendency for equipment to become larger, little information can be obtained. The disadvantage is that there are many cases.
また、後者の場合は試料を切断しなければならないうえ
、切断及び研摩の際に試料が変化する傾向があり、測定
結果の信頼度低下を招くので、試料作製に熟練を要す（
日本金属学会会報第２５巻第３号Ｐ−１５５〜９参照）
。In addition, in the latter case, the sample must be cut, and the sample tends to change during cutting and polishing, which reduces the reliability of the measurement results, and requires skill in sample preparation.
(Refer to Bulletin of the Japan Institute of Metals, Vol. 25, No. 3, P-155-9)
.
（問題点を解決するための手段）
本発明は上記問題点を解決するために、非磁性体に磁性
体からなるメッキ皮膜を施した試料と磁石との間の引力
（磁力）によって前記メッキ皮膜厚の測定をするという
ものである。(Means for Solving the Problems) In order to solve the above-mentioned problems, the present invention aims to apply the attractive force (magnetic force) between a magnet and a sample in which a plating film made of a magnetic material is applied to a non-magnetic material. This is to measure the thickness.
（作用）
上記のようｌこ構成することによって、試料と磁石との
間の引力に起因する両者間の相対変位を、Ｔｉｌ＋定し
、ついでその測定データに基づいてメッキ皮膜の材質、
試料形状、等のデータ類と共に処理することで、試料を
切断することなく容易なメッキ皮膜厚の測定を可能にす
る。(Function) By configuring as described above, the relative displacement between the sample and the magnet due to the attractive force is determined, and then the material of the plating film is determined based on the measured data.
By processing data such as the sample shape, it becomes possible to easily measure the plating film thickness without cutting the sample.
（実施例）
以下、本発明に係るメッキ皮膜厚の測定方法の一実施例
を図面を参照しながら詳細に説明する。(Example) Hereinafter, an example of the method for measuring plating film thickness according to the present invention will be described in detail with reference to the drawings.
第１図において、１は荷重測定装置で磁石２と試料３と
の間の引力を測定するもので、スタンド５にはアナログ
ゲージ４が支持部材７を介して固定され、アナログゲー
ジ４には支持杆８を介して磁石２が垂下されている。ス
タンド５の基台６上であって磁石２の下方には試料３が
設置可能となっている。In FIG. 1, reference numeral 1 denotes a load measuring device that measures the attractive force between a magnet 2 and a sample 3. An analog gauge 4 is fixed to a stand 5 via a support member 7; A magnet 2 is suspended via a rod 8. A sample 3 can be placed on the base 6 of the stand 5 and below the magnet 2.
試料３としてはＡ文等の非磁性体からなる被メッキ材に
鉄等の磁性体からなるメッキ皮膜を施したものが使用さ
れ、試料３のメッキ皮膜と磁石２との間に引力が発生す
る。As sample 3, a plated material made of a non-magnetic material such as pattern A is coated with a plating film made of a magnetic material such as iron, and an attractive force is generated between the plating film of sample 3 and magnet 2. .
第２図に明示するようにアナログゲージ４はシャフト９
と筒状ばねｌＯと表示針１１とから構成され、これらは
ケース１２に保持されている。As clearly shown in Figure 2, the analog gauge 4 is connected to the shaft 9.
, a cylindrical spring lO, and an indicator hand 11, which are held in a case 12.
シャフト９の一端には頭部１３が形成され、この頭部１
３には、８３図に示すように支持杆８の一端に形成され
た屈曲部が嵌合される挿入孔１４が形成されており、ま
た他端には歯車１５がシャフト９の中心軸と同軸状に固
定されている。A head 13 is formed at one end of the shaft 9, and this head 1
3 has an insertion hole 14 into which a bent portion formed at one end of the support rod 8 is fitted, as shown in FIG. fixed in shape.
筒状ばね１０は細幅の金属材をら旋状に巻いて円筒状に
形成したもので、その一端はケース１２に形成されたポ
ス１６に嵌合されている。シャフト９は筒状ばね１０に
挿入され、その両端部は筒状ばね１０に取付けられたビ
ス１７と、ボス１Ｂに取付けられたビス１８とを介して
筒状ばね１０に固定されている。The cylindrical spring 10 is formed into a cylindrical shape by spirally winding a narrow metal material, and one end of the cylindrical spring 10 is fitted into a post 16 formed in the case 12. The shaft 9 is inserted into the cylindrical spring 10, and both ends thereof are fixed to the cylindrical spring 10 via screws 17 attached to the cylindrical spring 10 and screws 18 attached to the boss 1B.
表示針１１はシャフト９の回転度合を文字盤１８に表示
するもので、表示針１１はその回転軸２１を介してケー
ス１２に回転自在に取付けられ、またこの回転軸２１に
は歯車１５と噛合可能な小索車２０が取付けられている
。歯車１５の回転は試料３のメッキ皮膜と磁石２どの引
力に基づくものであるため極めて小さい。このため、歯
車１５の小歯車２０に対する直径比を大きくして表示針
１１の回転角度を拡大するようにしている。The display hand 11 displays the degree of rotation of the shaft 9 on the dial 18. The display hand 11 is rotatably attached to the case 12 via its rotating shaft 21, and a gear 15 meshes with the rotating shaft 21. A small pulley 20 is installed. The rotation of the gear 15 is extremely small because it is based on the attractive force between the plating film of the sample 3 and the magnet 2. For this reason, the diameter ratio of the gear 15 to the small gear 20 is increased to enlarge the rotation angle of the display hand 11.
つぎに以上の構成に係る装置を用いてメッキの皮膜厚を
測定する場合について説明する。Next, a case will be described in which the thickness of a plating film is measured using the apparatus having the above configuration.
基台６に試料３を設置すると、試料３にメッキされた磁
性体と磁石２どの間に引力が発生し、磁石２は基台６方
向に変位するためシャフト９は筒状ばね１０の付勢力に
抗してポス１８側から見て時計方向に回転し、そしてこ
の回転は引力と、筒状ばね１０の付勢力とのつりめいが
とれるまで継続し、この間歯車１５が回転し、従って小
歯車２０もこれと逆方向に回転するため表示針１１は文
字盤１９上を回転し、磁石２の変位を回転角度によって
表示する。When the sample 3 is placed on the base 6, an attractive force is generated between the magnetic material plated on the sample 3 and the magnet 2, and the magnet 2 is displaced in the direction of the base 6, so that the shaft 9 is moved by the biasing force of the cylindrical spring 10. This rotation continues until the balance between the attractive force and the biasing force of the cylindrical spring 10 is removed, and during this period the gear 15 rotates, and therefore the pinion rotates. 20 also rotates in the opposite direction, the display hand 11 rotates on the dial 19 and displays the displacement of the magnet 2 by the rotation angle.
第４図は以上の測定方法によって得られたメッキ皮膜厚
の実測値と文字盤１９に記載された数値（表示針１１の
角度）との関係を示すもので、横軸は実測値、縦軸は角
度をそれぞれ示す。Figure 4 shows the relationship between the actual value of the plating film thickness obtained by the above measurement method and the value written on the dial 19 (the angle of the display hand 11), where the horizontal axis is the actual value and the vertical axis is the actual value. indicates the angle, respectively.
同図において、２２は鉄メッキを施したＡ文バブルリフ
ター、２３は鉄と燐との合金メッキを施したＡｎバブル
リフター、２４は鉄メッキを施したＡＭピストン、２５
は鉄と燐との合金メッキを施したＡ文ピストン、２８は
鉄メッキを施した人文平板、２７は鉄と燐との合金メッ
キを施したＡ文モ板のＡ１１Ｉ定結果を示すグラフであ
る。同図から、メッキ皮膜を厚くすると磁力は大きくな
り、またメッキ材及び被メッキ材の材質を変更すると磁
力も変化することが理解できる。In the figure, 22 is an iron-plated A bubble lifter, 23 is an iron-phosphorus alloy plated An bubble lifter, 24 is an iron-plated AM piston, and 25 is an iron-plated A bubble lifter.
28 is a graph showing the A11I results of A-pattern piston plated with an alloy of iron and phosphorus, 28 is a humanities plate plated with iron plating, and 27 is a plate plate plated with A-pattern plate plated with an alloy of iron and phosphorus. . From the figure, it can be understood that the thicker the plating film, the greater the magnetic force, and that changing the materials of the plated material and the plated material also changes the magnetic force.
例えば、６０ｐ−Ｉ５のメッキ皮膜厚を有する各試料３
の測定値を比較すれば次のとおりである。For example, each sample 3 having a plating film thickness of 60p-I5
A comparison of the measured values is as follows.
すなわち、ＡＩピストンに鉄メッキを施した試料３と、
同被メッキ材に鉄と燐との合金メッキを施した試ネ４３
とでは、同図２４．２５から明らかなように前者は ＋
８５” 、後者は２０７′″をそれぞれ表示し、
Ａｉ平板に鉄メッキを施した試料３と、同被メッキ材に
鉄と燐との合金メッキを施した試料３とでは同図２８．
２７から明らかなように、前者は２２０’ 、後者は２
４３”をそれぞれ表示する。That is, sample 3 in which the AI piston was plated with iron,
Test Nee 43, which is made by applying alloy plating of iron and phosphorus to the same material to be plated.
As is clear from Figure 24.25, the former is +
85" and 207'" for Sample 3, in which an Ai flat plate was plated with iron, and Sample 3, in which the plated material was plated with an alloy of iron and phosphorus, were 28.
27, the former is 220' and the latter is 2
43" are displayed respectively.
この様に、メッキ材、非磁性体からなる被メッキ材、等
のデータ類を予め記憶媒体等に記憶させたうえで上記実
験データとあわせて処理することによりメッキ皮膜厚を
測定することができる。In this way, the plating film thickness can be measured by storing data on the plating material, the non-magnetic material to be plated, etc. in advance in a storage medium, etc., and processing it together with the above experimental data. .
（発明の効果）
本発明は以上から明らかなように、磁石と被測定品との
間の引力を利用してメー、キ皮膜厚を測定するので、被
測定品を破壊することなく。(Effects of the Invention) As is clear from the above, the present invention measures the coating thickness by utilizing the attractive force between the magnet and the object to be measured, without destroying the object to be measured.
メッキ皮膜Ｈを容易に測定することができる。The plating film H can be easily measured.
更に、測定のために必要なスペースも従来の光学応用機
器等を利用する場合に比べて大幅に節約できることにな
る。Furthermore, the space required for measurement can be significantly saved compared to the case of using conventional optical application equipment.
第１図は、本発明のメッキ皮膜厚の測定方法に使用され
る装置の正面図、
第２図は、第１図の断面図、
第３図は、第２図のシャフト頭部と支持杆との取付を示
す詳細図、
第４図は、本発明の一実施例による実験結果を示すグラ
フである。FIG. 1 is a front view of the device used in the method of measuring plating film thickness of the present invention, FIG. 2 is a sectional view of FIG. 1, and FIG. 3 is a shaft head and support rod of FIG. 2. FIG. 4 is a graph showing experimental results according to an embodiment of the present invention.
Claims (1)
料と磁石との間の引力によって前記 メッキ皮膜の厚さを測定することを特徴とするメッキ皮
膜厚の測定方法。(1) A method for measuring the thickness of a plating film, characterized in that the thickness of the plating film is measured by the attractive force between a magnet and a sample in which a plating film made of a magnetic material is applied to a non-magnetic material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18562786A JPS6342404A (en) | 1986-08-07 | 1986-08-07 | Measuring method for thickness of plating film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18562786A JPS6342404A (en) | 1986-08-07 | 1986-08-07 | Measuring method for thickness of plating film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6342404A true JPS6342404A (en) | 1988-02-23 |
Family
ID=16174092
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18562786A Pending JPS6342404A (en) | 1986-08-07 | 1986-08-07 | Measuring method for thickness of plating film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6342404A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2466869A (en) * | 2009-01-07 | 2010-07-14 | Bj Services Co | Gauge for measuring substrate thickness |
-
1986
- 1986-08-07 JP JP18562786A patent/JPS6342404A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2466869A (en) * | 2009-01-07 | 2010-07-14 | Bj Services Co | Gauge for measuring substrate thickness |
| GB2466869B (en) * | 2009-01-07 | 2011-09-14 | Bj Services Co | Method and device for measuring thickness of a substrate |
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