JPS6341412B2 - - Google Patents
Info
- Publication number
- JPS6341412B2 JPS6341412B2 JP55130277A JP13027780A JPS6341412B2 JP S6341412 B2 JPS6341412 B2 JP S6341412B2 JP 55130277 A JP55130277 A JP 55130277A JP 13027780 A JP13027780 A JP 13027780A JP S6341412 B2 JPS6341412 B2 JP S6341412B2
- Authority
- JP
- Japan
- Prior art keywords
- light source
- pinhole
- source device
- infrared analyzer
- analyzer according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010438 heat treatment Methods 0.000 claims description 8
- 239000002184 metal Substances 0.000 claims description 6
- 239000012212 insulator Substances 0.000 claims description 3
- 230000005855 radiation Effects 0.000 claims description 3
- 239000000919 ceramic Substances 0.000 claims description 2
- 230000005469 synchrotron radiation Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 5
- 229910001120 nichrome Inorganic materials 0.000 description 2
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
- G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
Description
【発明の詳細な説明】
本発明は赤外線分析計の光源装置に係り、特に
点光源とみなし得る光源を実現することができ、
該点光源としてのピンホールの穴の形状や大きさ
に犠牲を払うことなくフイラメントを空気と遮断
できる赤外線分析計の光源装置に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a light source device for an infrared analyzer, and in particular can realize a light source that can be regarded as a point light source.
The present invention relates to a light source device for an infrared analyzer that can isolate a filament from air without sacrificing the shape or size of a pinhole that serves as a point light source.
近年、赤外線ガス分析計の検出器として半導体
センサが使われることが多くなつた。 In recent years, semiconductor sensors have been increasingly used as detectors in infrared gas analyzers.
この種の装置の一例を第１図に示し説明すると
図において、１は半導体センサで、この半導体セ
ンサ１はその受光面積が１mm×１mm程の小さなも
のである。そして、従来赤外線光源としてのフイ
ラメント２は１mm×１mmよりはるかに大きな形状
をしており、その発光量のわずか１部のみが光源
反射鏡３ａ，３ｂで平行光線４ａ，４ｂになり、
検出器反射鏡５ａ，５ｂで半導体センサ１に集光
されるように構成されている。 An example of this type of device is shown in FIG. 1 and will be described. In the figure, 1 is a semiconductor sensor, and this semiconductor sensor 1 has a small light-receiving area of about 1 mm x 1 mm. The filament 2 used as a conventional infrared light source has a shape much larger than 1 mm x 1 mm, and only a portion of its emitted light becomes parallel light rays 4 a and 4 b at the light source reflectors 3 a and 3 b.
The light is condensed onto the semiconductor sensor 1 by detector reflecting mirrors 5a and 5b.
しかしながら、このような装置においては、フ
イラメント２から発光された光のうち、有効に利
用される光は検出器反射鏡で半導体センサに集光
された部分だけであつて、多くの発光エネルギー
は無駄になるという欠点があつた。 However, in such a device, of the light emitted from the filament 2, only the part that is focused on the semiconductor sensor by the detector reflector is effectively used, and much of the emitted energy is wasted. It had the disadvantage of becoming.
本願出願人はこの欠点を解決すべく、先に赤外
線分析計の光源装置として、第２図に示すような
装置を出願した。これについて説明する。 In order to solve this drawback, the applicant of the present application previously applied for a device as shown in FIG. 2 as a light source device for an infrared analyzer. This will be explained.
図において、６は光源ハウジングであり、この
光源ハウジング６には直径1.5mmほどのピンホー
ル（貫通孔）７があけられており、その内面（反
射面）８はよい反射面に仕上げられている。そし
て、光源ハウジング６の内部にはフイラメント９
があつて、その温度は600℃から700℃位である。 In the figure, 6 is a light source housing, and this light source housing 6 has a pinhole (through hole) 7 with a diameter of about 1.5 mm, and its inner surface (reflective surface) 8 is finished as a good reflective surface. . A filament 9 is disposed inside the light source housing 6.
The temperature is around 600℃ to 700℃.
そして、フイラメント９から発光された赤外線
は反射面８で何度も反射されて、光源ハウジング
６内の空間１０に満ちている。空間１０を満たし
た赤外線は貫通孔７から外部に放射される。すな
わち、貫通孔７は点光源となる。 The infrared rays emitted from the filament 9 are reflected many times by the reflecting surface 8 and fill the space 10 within the light source housing 6. The infrared rays filling the space 10 are radiated to the outside from the through hole 7. That is, the through hole 7 becomes a point light source.
１１は放物面鏡で、この放物面鏡１１はその焦
点が貫通孔７の出口に一致するように加工され、
取付けられている。そして、貫通孔７から放射さ
れた赤外線は放物面鏡１１によつてその大部分が
完全な平行光線となる。 11 is a parabolic mirror, and this parabolic mirror 11 is processed so that its focal point coincides with the exit of the through hole 7,
installed. The infrared rays emitted from the through hole 7 are mostly converted into perfectly parallel rays by the parabolic mirror 11.
１２は気密端子、１３はフイラメントベース
で、これらはそれぞれフイラメント９を保持する
ためのものである。 12 is an airtight terminal, and 13 is a filament base, each of which is for holding the filament 9.
このように、外部に通ずる小さな貫通孔７が設
けられた中空体であつて、その中空体の内部がフ
イラメント９によつて温められて貫通孔７から赤
外線が外部に放射される構造体と、この構造体の
貫通孔７の出口からの放射光を平行光線に整列さ
せる手段とから構成されている。 In this way, the structure is a hollow body provided with a small through hole 7 communicating with the outside, and the inside of the hollow body is heated by the filament 9 and infrared rays are emitted to the outside from the through hole 7. It consists of a means for aligning the emitted light from the exit of the through hole 7 of this structure into parallel light beams.
しかしながら、この第２図に示す装置は、フイ
ラメント９が空気にさらされているので700℃を
超える高温での使用に対しては劣化し易いという
欠点があつた。 However, the device shown in FIG. 2 has the disadvantage that since the filament 9 is exposed to air, it is susceptible to deterioration when used at high temperatures exceeding 700°C.
本発明は以上の問題点を解決すべくなされたも
ので、その目的は、点光源とみなし得る光源で、
かつ、高温での使用に適する赤外線分析計の光源
装置を提供することにある。 The present invention was made to solve the above problems, and its purpose is to provide a light source that can be regarded as a point light source,
Another object of the present invention is to provide a light source device for an infrared analyzer that is suitable for use at high temperatures.
本発明の特徴とするところは、中空体に設けた
ピンホールの大きさ・形状等、光の放射口として
の状態を変更することなく維持しながら、簡単な
構成によつて点光源とみなし得る光源を実現しつ
つ、光源装置の金属発熱体を、空気から遮断する
ために絶縁物で被覆するところにある。 The feature of the present invention is that the pinhole provided in the hollow body can be regarded as a point light source due to its simple configuration while maintaining its state as a light emission port without changing the size and shape of the pinhole. While realizing a light source, the metal heating element of the light source device is coated with an insulator to isolate it from the air.
以下、本発明を、その構成等を図示する実施例
を用いて詳細に説明する。 DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail below using examples illustrating its configuration and the like.
第３図は、本発明による赤外線分析計の光源装
置の一実施例を示す構成図で、図において第２図
と同一符号がふられたものは同じなので説明は省
略する。１６は本発明における金属発熱体の一実
施例を示す構造体でその詳細を第４図に示す。 FIG. 3 is a block diagram showing one embodiment of the light source device of an infrared analyzer according to the present invention. In the figure, the same reference numerals as in FIG. 2 are the same, so the explanation will be omitted. Reference numeral 16 denotes a structure representing one embodiment of the metal heating element according to the present invention, the details of which are shown in FIG.
第４図において１４は電熱線であつて、給電装
置（図示せず）から給電される。１６はセラミツ
クであつて、その内部には給電出力１４によつて
赤外線を発光するニクロム線などをサンドイツチ
状に挟み、フイラメントを空気に触れないように
した構造である。 In FIG. 4, reference numeral 14 denotes a heating wire, which is supplied with power from a power supply device (not shown). Reference numeral 16 is a ceramic material, inside which a nichrome wire or the like that emits infrared rays by the power supply output 14 is sandwiched in a sandwich-like manner to prevent the filament from coming into contact with the air.
なお、第３図に示す実施例における光源ハウジ
ング６として、断線材を用いるとより効率がよ
い。また、放物面鏡１１の代りに凸レンズを用い
ることもできる。そして、凸レンズを用いる場合
には、貫通孔７の出口を凸レンズの焦点位置に有
するように構成する。 Note that it is more efficient to use a broken wire as the light source housing 6 in the embodiment shown in FIG. Further, a convex lens can be used instead of the parabolic mirror 11. When a convex lens is used, the exit of the through hole 7 is configured to be located at the focal point of the convex lens.
従来のような裸のニクロム線等のフイラメント
では、長寿命を保つために、700℃以下の低温度
の光源として使用するのに適したが、本発明によ
る構造体を使用すれば、700℃以上の高温光源と
して使用するのに適し、フイラメント（金属発熱
体）を空気に触れないようにしたので長寿命とな
る。また、この構造体は放射率が単なる金属線よ
りも大きいという利点がある。 Conventional filaments such as bare nichrome wire are suitable for use as low-temperature light sources of 700°C or less in order to maintain long lifespans, but with the structure of the present invention, it can be used as low-temperature light sources of 700°C or higher. It is suitable for use as a high-temperature light source, and has a long life because the filament (metal heating element) is not exposed to air. This structure also has the advantage of having a higher emissivity than a simple metal wire.
以上本発明を外部へのむだな熱放射等を防止す
るため、中空体の内面に反射鏡を設け、または断
熱材で覆う場合を例にとつて説明したが、本発明
はこれに限定されるものではなく、このように構
成すれば、エネルギーの有効利用が一段と良化す
るということで、このように構成しなくても従来
のものに比して省エネルギーが図れることは明ら
かである。 Although the present invention has been described above using an example in which a reflective mirror is provided on the inner surface of a hollow body or the hollow body is covered with a heat insulating material in order to prevent wasteful heat radiation to the outside, the present invention is limited to this. It is clear that even if this configuration is not used, energy savings can be achieved compared to the conventional configuration, since the effective use of energy will be further improved if the configuration is configured in this way.
以上の説明から明らかなように、本発明によれ
ば点光源とみなし得るピンホールの大きさ、形
状、状態等に変更を与えることなく気密のフイラ
メントが実現でき、また、ピンホールは通気孔と
なるから、冷却効果がよい。 As is clear from the above description, according to the present invention, an airtight filament can be realized without changing the size, shape, state, etc. of the pinhole, which can be regarded as a point light source, and the pinhole can be used as a ventilation hole. Therefore, the cooling effect is good.
第１図は従来の赤外線分析計の光源装置の一例
を示す構成図、第２図は本出願人が先に出願した
発明における赤外線分析計の光源装置を示す構成
図、第３図は本発明による赤外線分析計の光源装
置の一実施例を示す構成図、第４図は第３図の実
施例における構造体に係わる部分の一実施例を示
す構成図である。
６……光源ハウジング、７……ピンホール、８
……反射面、９……フイラメント、１０……空
間、１１……放物面鏡、１４……電熱線、１６…
…セラミツク。
Fig. 1 is a block diagram showing an example of a light source device of a conventional infrared analyzer, Fig. 2 is a block diagram showing a light source device of an infrared analyzer according to an invention previously filed by the present applicant, and Fig. 3 is a block diagram showing an example of a light source device of an infrared analyzer according to the present invention. FIG. 4 is a block diagram showing an embodiment of a light source device for an infrared analyzer according to the present invention, and FIG. 4 is a block diagram showing an embodiment of a portion related to the structure in the embodiment of FIG. 6...Light source housing, 7...Pinhole, 8
... Reflective surface, 9 ... Filament, 10 ... Space, 11 ... Parabolic mirror, 14 ... Heating wire, 16 ...
...Ceramics.
Claims (1)
るピンホールが設けられた中空体と、前記ピンホ
ールから放散される放射光を平行光線に整列させ
る手段とを備え、前記金属発熱体を赤熱性絶縁物
で被覆することにより空気に触れないようにした
ことを特徴とする赤外線分析計の光光源装置。 ２ 前記中空体はその内面全体に赤外線の反射手
段を具備したことを特徴とする特許請求の範囲第
１項記載の赤外線分析計の光源装置。 ３ 前記赤熱性絶縁物としてセラミツクスを用
い、金属発熱体をサンドイツチ状に挟んだ構造か
らなるようにしたことを特徴とする特許請求の範
囲第１項記載の赤外線分析計の光源装置。 ４ 前記ピンホールから放散する放射光を平行光
線に整列させる手段は、間隔を置いて設けた凸レ
ンズで構成し、前記ピンホールは該凸レンズの焦
点位置に有するようにしたことを特徴とする特許
請求の範囲第１項または第２項もしくは第３項記
載の赤外線分析計の光源装置。 ５ 前記ピンホールから放散する放射光を平行光
線に整列させる手段は、前記ピンホールの周囲に
連続して設けた放物面鏡で構成し、前記ピンホー
ルは、その焦点位置に有するようにしたことを特
徴とする特許請求の範囲第１項または第２項もし
くは第３項記載の赤外線分析計の光源装置。[Scope of Claims] 1. A hollow body having a metal heating element inside and provided with a pinhole communicating with the outside, and means for aligning radiation light emitted from the pinhole into parallel rays, A light source device for an infrared analyzer, characterized in that a heating element is covered with a red-hot insulator to prevent it from coming into contact with air. 2. The light source device for an infrared analyzer according to claim 1, wherein the hollow body is provided with infrared reflecting means on its entire inner surface. 3. The light source device for an infrared analyzer according to claim 1, wherein ceramic is used as the red-hot insulator, and a metal heating element is sandwiched in a sandwich-like structure. 4. A patent claim characterized in that the means for aligning the radiation light emitted from the pinhole into parallel rays is constituted by convex lenses provided at intervals, and the pinhole is located at the focal point of the convex lens. A light source device for an infrared analyzer according to item 1, item 2, or item 3. 5. The means for aligning the synchrotron radiation emitted from the pinhole into parallel rays is constituted by a parabolic mirror continuously provided around the pinhole, and the pinhole is located at its focal point. A light source device for an infrared analyzer according to claim 1, 2, or 3, characterized in that:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13027780A JPS5754825A (en) | 1980-09-19 | 1980-09-19 | Light source apparatus for infrared ray analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13027780A JPS5754825A (en) | 1980-09-19 | 1980-09-19 | Light source apparatus for infrared ray analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5754825A JPS5754825A (en) | 1982-04-01 |
| JPS6341412B2 true JPS6341412B2 (en) | 1988-08-17 |
Family
ID=15030452
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13027780A Granted JPS5754825A (en) | 1980-09-19 | 1980-09-19 | Light source apparatus for infrared ray analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5754825A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4499382A (en) * | 1982-10-18 | 1985-02-12 | Hewlett-Packard Company | Infrared source element |
| US5291022A (en) * | 1992-07-01 | 1994-03-01 | Nicolet Instrument Corporation | High efficiency infrared source |
| KR100996711B1 (en) * | 2007-07-31 | 2010-11-25 | 주식회사 오토전자 | Non-dispersive Infra-Red Absorption NDIR Type Gas Sensor with Collimated Light Source |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5917375A (en) * | 1982-07-21 | 1984-01-28 | 有限会社タ−モ | Marker engaging tool |
-
1980
- 1980-09-19 JP JP13027780A patent/JPS5754825A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5917375A (en) * | 1982-07-21 | 1984-01-28 | 有限会社タ−モ | Marker engaging tool |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5754825A (en) | 1982-04-01 |
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