JPS6339824Y2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a test device for checking the normal operation of a district circuit of a fire alarm system.

The fire alarm system includes a plurality of district circuits that detect the input of a fire detection signal from alarm wires wired to a plurality of fire warning districts and turn on corresponding district indicator lights. In order to check the operational function of the above-mentioned district circuit, a test circuit as shown in FIG. 1 is provided. That is, the district relays R ₁ to _{R o} are connected to the alarm lines L ₁ to _{L o} , respectively, and for example, when the alarm line L ₁ inputs a fire detection signal caused by earth air, etc., the district relay R ₁ operates,
It is self-held by a self-holding contact (make contact) _r1 , and the corresponding district light is turned on by another make contact (not shown). In order to check its functionality, multiple rotary contacts rs ₁ to rs _o of rotary switch RS are connected to the alarm line sides of district relays R ₁ to _{R o} , respectively, and the common contact side is connected to the test relay T, which is turned on during the test. Power supply E via the make contact _t1
connected to the negative side of Each district relay R ₁ ~ _{R o}
One ends of the self-holding contacts r ₁ to r _o are connected in common and connected to the negative side of the power source E via the break contact t ₂ of the test relay T. Therefore, when test relay T is operated by closing switch S ₁ during a test, its break contact t ₂ is opened and the self-holding function of each district relay is released, and by rotating rotary switch RS, the test relay T is activated. The normality of operation of each district circuit is checked by generating a fire signal and sequentially operating district relays R ₁ to _{R o} and turning on the corresponding district lights.

In the conventional test circuit described above, the normality of the operation of each district circuit is determined by turning on the district lights, so it is difficult to confirm when the district lights are located far from the tester. Furthermore, if an actual fire occurs during a test, it is difficult to distinguish between lighting for the test and lighting due to an actual fire, resulting in confusion. If the ringing of a bell or the like is stopped during the test, there is also the disadvantage that a fire alarm will not be issued. Furthermore, since the self-holding function of each district relay has been canceled, there is a risk that the fire alarm will not operate normally.

The purpose of the present invention is to solve the above-mentioned conventional drawbacks,
To provide a district circuit testing device for a fire alarm system, which allows easy confirmation of normal operation of each district circuit, and can immediately stop the test function and give priority to the fire when a fire actually occurs.

The test device of the present invention detects fire detection signals input from alarm wires wired in each of multiple fire warning districts, and sequentially transmits them to multiple district circuits that turn on the district lights in each applicable district to indicate a fire. In a district circuit test device for a fire alarm system comprising a rotary switch that provides a test pseudo signal, the rotary switch is configured to generate the test pseudo signal through an operating contact of a test relay that operates when the test switch is closed. a plurality of circuits configured to input the detection signal of each district circuit and the test pseudo signal or an interlocking signal, and output a high level to one of the first to third output terminals in response to a logical combination of both inputs; a decoder, a relay recovery means for updating the test relay with an OR output from the first output terminals of the plurality of decoders, and a flash signal that opens when the second output terminal of each of the decoders is at a high level. a plurality of gates that respectively supply the above-mentioned district lights to the corresponding district lights, a normal indicator light that is turned on by an OR output from the third output terminal of the plurality of decoders, and a flash signal input to the plurality of gates. It is characterized by comprising an intermittent oscillation circuit.

If the district circuit has a self-holding function, it is necessary to release the self-holding function using the break contact of the test relay. Further, if a delay circuit is provided to delay the OR output from the second output terminal of the decoder, and the output of the intermittent oscillation circuit is inputted to the plurality of gates by AND-coupling with the output of the delay circuit, It is possible to prevent the district light from flashing during the delay time from the test pseudo signal to the generation of the detection signal of the district circuit.

Next, the present invention will be explained in detail with reference to the drawings.

FIG. 2 is a circuit diagram showing an embodiment of the present invention. In _this embodiment as well _, as in _the conventional _example shown in FIG. The contact side is connected to the power supply negative side through the make contact t ₁ of the test relay T, and the break contact t ₂ of the test relay T is connected to the power supply negative side of the self-holding contact r ₁ to r _o of each district relay R ₁ to _{R o} . Commonly connected in series on both sides. The test relay T is connected between the positive side of the power supply and the emitter of the transistor _S2 , and the collector of the transistor _S2 is connected to the negative side of the power supply via the switch _S1 . The base of the transistor _S2 is connected to the negative side of the power supply through a resistor and is normally on, but the test relay T is not operating because the switch _S1 is open. When the switch _S1 is closed, the test relay T is activated, closing the make contact _t1 and opening the break contact _t2 . When rotary switch RS is rotated in this state, rotary contacts RS ₁ to RS _O are sequentially connected to the negative side of the power supply, a test pseudo signal is emitted, and district relay R ₁
~R _o operates sequentially. Since the self-holding circuits of the district relays R ₁ to _{R o} are opened by the break contact t ₂ , the self-holding function is released.

When the rotary switch RS is rotated to close the rotary contact rs ₁ , the associated contact rs ₁ ' is closed and a positive voltage is inputted to the B input of the decoder D ₁ . Further, due to the operation of the district relay R ₁ , a positive voltage is input to the A input of the decoder D ₁ through its make contact r ₁ '. Similarly, the A and B inputs of decoders D ₂ to D _o are connected to make contacts r ₂ ′ to r _{o ′} and rotary contacts rs ₂ ′ to corresponding district relays R ₂ to _R o, respectively.
rs _o ′ are connected respectively. rotary contacts
rs ₂ ′ to rs _o ′ are contacts that respectively operate in conjunction with the contacts rs ₁ to rs _o . The decoders D ₁ to _{D o} output the first to third output terminals corresponding to the logical combinations of the A input and the B input.
Outputs high level to any of Q ₁ to Q ₃ . now,
When the logic of the A input is "1" and the logic of the B input is "0", a high level is output to the first output terminal _Q1 ,
When the logic of the A input is "0" and the logic of the B input is "1", a high level is output to the second output terminal _Q2 ,
When the logic of both the A and B inputs is "1", a high level is output to the third output terminal _Q3 .

The first output terminals Q ₁ of the decoders D ₁ to D _o are each OR-connected via a diode 1, and the OR output thereof sets the base of the transistor S ₂ at a high level and turns off the transistor S ₂ . let This restores the test relay T and returns to the normal fire monitoring state.

The second output terminals Q ₂ are similarly OR-connected via diodes 2, and their OR outputs are
AND circuit delayed by delay circuit TS
input to one input of AND ₁ , AND circuit
The output of the intermittent oscillation circuit FS is input to the other input of AND ₁ . Therefore, the decoder
When the second output terminal of any one of D ₁ to _{D o} becomes high level, a flash signal is output from the AND circuit AND ₁ after a slight delay time. The flash signal is input to the base of the transistor _TR1 through the gate _G1 , which is opened by the high level of the second output terminal _Q2 of the decoder _D1 .
The emitter of the transistor TR ₁ is grounded, and the collector is connected to one end of the district light RL ₁ . district lights
The make contact r _{1 ″} of the district relay R ₁ is also connected to RL 1. That is, the district light RL ₁
When R ₁ is activated, it is grounded through contact r ₁ ″ and lights up continuously, and it blinks depending on the output of gate G ₁ .
Similarly, the gates G ₂ to _{G o} that are opened when the second output terminals Q ₂ of the decoders D ₂ to D _o become high level.
Accordingly, the flash signals output from the first AND circuit AND ₁ are connected to the respective transistors TR ₂
~ given to the base of TR _o , transistor TR ₂ ~
The district lights RL ₂ to RL _o blink due to the intermittent TR _o .

The third output terminals _Q3 of the decoders _D1 to _D0 are OR-connected by a diode 3, and the OR output thereof is input to the base of the transistor _S3 , and when the transistor _S3 is turned on, the normal indicator light P is turned on. Light.

Next, the operation of this embodiment will be explained. First, when switch _S1 is closed, test relay T is operated to close make contact _t1 and open break contact _t2 . Next, when contact rs ₁ of the rotary switch is closed,
The logic of the B input of the decoder _D1 becomes "1" due to the interlocking contact rs1 _' . If the district relay _R1 operates normally, its make contact r1 _' closes and the logic at the A input of the decoder _D1 also becomes "1". Therefore, the third output terminal Q ₃ of the decoder D ₁ becomes high level, and the transistor S ₃ passes through the diode 3.
is turned on, and the normal indicator light P lights up. Since the normality indicator light P is placed near the tester, the tester can easily confirm the normality of the district relay _R1 . Due to the operation of district relay R ₁ , its contact r ₁ ″ is closed and district light RL ₁ is also turned on, but
This is convenient because even if the district light RL ₁ is located at a distance from the tester, it can be confirmed by the above-mentioned normal indicator light P. However, the district relay
If R ₁ does not work properly, A of decoder D ₁
Since the input is “0” and the B input is “1”,
A high level is output to the second output terminal _Q2 .
The output signal is sent to the delay circuit TS via diode 2.
and the AND circuit after a slight delay time.
Input to one input of AND ₁ . Therefore, the intermittent signal (flash signal) output from the intermittent oscillation circuit FS is output from the AND circuit _AND1 . Meanwhile, since the gate _G1 is now open due to the high level of the second output terminal _Q2 of the decoder _D1 , the flash signal passes through the gate _G1 to turn on and off the transistor _TR1 . This causes district light RL ₁ to blink. Of course, the normal indicator light P does not light up. This is convenient because the tester can identify the faulty district circuit by the blinking of the district light RL ₁ . Note that the delay circuit TS prevents the district light RL ₁ from blinking within the operating time of the district relay R ₁ .

Similarly, district relays R ₂ -R _o are tested in sequence. Now, when a real fire occurs during the test, for example, district relay R _o will be activated. At this time, since the A input of the decoder D _o is "1" and the B input is "0", the first output terminal Q ₁ becomes high level. The output signal is given to the base of transistor _S2 via diode 1, and
_S2 is turned off. This allows the test relay T
is restored and the test is stopped. In this embodiment, the transistor _S2 constitutes relay recovery means. In other words, priority is given to fires. When the test relay T is restored, the make contact t ₁ opens and the supply of test pseudo signals to each district relay is stopped, and the break contact t ₂ closes to restore the self-holding function of each district relay and return to normal operation. Of course, a fire alarm operation is performed. Even if the bell ringing is stopped by opening a contact (not shown) while the test relay T is in operation, it will of course be canceled in the event of an actual fire.

In the above embodiment, the fire detection signal and the test pseudo signal input from the alarm line operate the district relays R ₁ to _{R o} , and the district lights RL ₁ to R o are activated, respectively.
Although this configuration is configured to light up the RL _o , it can be similarly applied even if the district circuit for detecting the fire detection signal and lighting the district light is configured by an electronic circuit instead of a relay. Moreover, it is of course unnecessary to cancel the self-holding function of the local circuit by the break contact _t2 when the local circuit does not have a self-holding function. Further, if the response of the district circuit is to be made in a short time, the delay circuit TS, diode 2, AND circuit AND ₁ , etc. are not necessary.

As described above, in the present invention, a test pseudo signal is supplied to each district circuit through the make contact of a test relay and a rotary switch, and the test pseudo signal or a signal linked thereto is supplied to each district circuit. Depending on the logic state of the first to third output terminals of the decoder that inputs the detection signal of the district circuit, a normal indicator light is turned on when the district circuit is normal, and a normal indicator light is turned on when the district circuit is malfunctioning. Since it is configured to blink the corresponding district lights, it has the effect of making test operations easier. In addition, if an actual fire occurs during a test, the test relay is configured to be restored by the output of the decoder, so there is a risk that the fire will be prioritized and the detection of a fire during the test may be missed. There is no. In other words, there is an effect that a reliable warning is guaranteed even during the test. And these can be achieved by providing one decoder per alarm line.

[Brief explanation of the drawing]

FIG. 1 is a circuit diagram showing an example of a conventional district circuit test device for a fire alarm system, and FIG. 2 is a circuit diagram including a partial block diagram showing an embodiment of the present invention. In the figure, 1 to 3... diodes, L ₁ to L _o
...Warning wire, R ₁ ~ R _o ... District relay, R ₁ ~ _{R o} ,
r ₁ ′～r _o ′, r ₁ ″～ _{r o} ″……Make contact of district relay,
RS……Rotary switch, rs ₁ ~ _{rs o} , rs ₁ ′ ~
rs _o ′...Contact of rotary switch, T...Test relay, _t1 , _t2 ...Contact of test relay, _S1 ...Switch, _S2 , _S3 ...Transistor, TR ₁ to TR _o ...
…Transistor, D ₁ ~D _o …Decoder, A, B
... Decoder input, Q ₁ , Q ₂ , Q ₃ ... Decoder first to third output terminals, TS ... Delay circuit, FS
...Intermittent oscillation circuit, AND ₁ ...AND circuit, G ₁ ...
G _o ...Gate, P...Normal indicator light, RL ₁ ~RL _o ...
…District light.

Claims (1)

[Scope of Utility Model Registration Request] (1) Multiple systems that detect fire detection signals input from alarm wires wired in each of multiple fire warning areas and turn on district lights in each of the areas to indicate a fire. In a district circuit testing device for a fire alarm system that is equipped with a rotary switch that sequentially supplies a test pseudo signal to a district circuit, the rotary switch transmits the test pseudo signal through an operating contact of a test relay that operates when the test switch is closed. The detection signal of each district circuit and the test pseudo signal or an interlocking signal are input, and a high level is output to one of the first to third output terminals corresponding to the logical combination of both inputs. a plurality of decoders that output , a relay restoration means that restores the test relay with the OR output from the first output terminals of the plurality of decoders, and a high level of the second output terminal of each of the decoders. a plurality of gates each supplying an opening flash signal to the corresponding district light;
A fire alarm device comprising: a normality indicator light that is lit by an OR output from the third output terminals of the plurality of decoders; and an intermittent oscillation circuit that inputs a flash signal to the plurality of gates. district circuit testing equipment. (2) Utility Model Registration Scope of Claim 1 In the district circuit testing device for a fire alarm system as set forth in claim 1, the test relay has a release contact for releasing the self-holding function of each district circuit. (3) A district circuit testing device for a fire alarm device according to claim 1 or 2 of the utility model registration claim, comprising a delay circuit for delaying the OR output from the second output terminals of the plurality of decoders. The output of the intermittent oscillation circuit is ANDed with the output of the delay circuit to generate a flash signal, which is input to the plurality of gates.