JPS63303886A - Silicon oxide discharge device in single crystal pulling-up device - Google Patents
Silicon oxide discharge device in single crystal pulling-up deviceInfo
- Publication number
- JPS63303886A JPS63303886A JP13841087A JP13841087A JPS63303886A JP S63303886 A JPS63303886 A JP S63303886A JP 13841087 A JP13841087 A JP 13841087A JP 13841087 A JP13841087 A JP 13841087A JP S63303886 A JPS63303886 A JP S63303886A
- Authority
- JP
- Japan
- Prior art keywords
- silicon oxide
- discharge device
- crucible
- single crystal
- ring member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 31
- 229910052814 silicon oxide Inorganic materials 0.000 title claims abstract description 29
- 239000013078 crystal Substances 0.000 title claims description 18
- 230000002093 peripheral effect Effects 0.000 abstract description 5
- 239000007788 liquid Substances 0.000 abstract description 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 239000011261 inert gas Substances 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、チョクラルスキー法(CZ法)を用いたシ
リコンの単結晶引上げ装置における酸化シリコン排出装
置に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a silicon oxide discharge device in a silicon single crystal pulling device using the Czochralski method (CZ method).
単結晶引上げ装置は、第3図に示すように引上炉A内に
設置されたルツボ2内の溶融シリコン3に、ワイヤ4(
もしくは引上軸)下端の種結晶ホルダー7に取付けた種
結晶(図示せず)を浸漬物させ、自然凝固により単結晶
を形成し、前記ワイヤ4を回転させながら引上げて単結
晶5を成長させるものである。ルツボ2内のシリコンは
、ルツボ周囲に設けられたヒーター1の熱により溶融さ
れる。ルツボ2を支持するルツボ軸6はモータ等で回転
され、ルツボ2内の溶融シリコン3に温度不均一が生じ
ないようになっている。As shown in FIG. 3, the single crystal pulling device inserts a wire 4 (
(or pulling shaft) A seed crystal (not shown) attached to the seed crystal holder 7 at the lower end is immersed, a single crystal is formed by natural solidification, and the wire 4 is pulled up while rotating to grow the single crystal 5. It is something. The silicon in the crucible 2 is melted by the heat of the heater 1 provided around the crucible. A crucible shaft 6 supporting the crucible 2 is rotated by a motor or the like to prevent temperature non-uniformity in the molten silicon 3 within the crucible 2.
ところで単結晶引上げ装置に使用されるルツボは一般に
石英ガラス(SiO□)製である。このため溶融シリコ
ン3と下記の化学反応を生じ、溶融液面から結晶成長に
有害な酸化シリコン(SiOx)ガスが蒸発する。
□
S i Oz + S i 4 S i Ox +
O!そこでこのような有害ガスを引上炉A外に排出する
ため、第4図に示すように炉上部からアルゴンガス等の
不活性ガス8を導入している。Incidentally, crucibles used in single crystal pulling apparatuses are generally made of quartz glass (SiO□). Therefore, the following chemical reaction occurs with the molten silicon 3, and silicon oxide (SiOx) gas harmful to crystal growth evaporates from the molten liquid surface.
□ S i Oz + S i 4 S i Ox +
O! Therefore, in order to discharge such harmful gases to the outside of the pulling furnace A, an inert gas 8 such as argon gas is introduced from the upper part of the furnace as shown in FIG.
第5図〜第8図は不活性ガスを導入した際の酸化シリコ
ンガスの流れを示すもので、第5図は不活性ガス導入0
.2秒後、第6図は0.4秒後、第7図は0.6秒後、
第8図は1.0秒後の状態を示す。Figures 5 to 8 show the flow of silicon oxide gas when inert gas is introduced, and Figure 5 shows the flow of silicon oxide gas when inert gas is introduced.
.. After 2 seconds, Figure 6 after 0.4 seconds, Figure 7 after 0.6 seconds,
FIG. 8 shows the state after 1.0 seconds.
図示したように不活性ガスを導入しても、ルツボ2内壁
周囲の溶融液面近傍の酸化シリコンガス9は下方に流れ
ず、停滞してしまう(第4図参照)。停滞した酸化シリ
コンガス9は高濃度のもの(50%)であるため、シリ
コン単結晶の有転位化が結晶引上げ作業中に起きてしま
うという問題がある。Even if the inert gas is introduced as shown, the silicon oxide gas 9 near the molten liquid surface around the inner wall of the crucible 2 does not flow downward and stagnates (see FIG. 4). Since the stagnant silicon oxide gas 9 has a high concentration (50%), there is a problem that dislocations occur in the silicon single crystal during the crystal pulling operation.
このため、特開昭61−44792号公報に示すように
、ルツボ側壁の溶融液面より上部に複数の間隙を形成す
ることも考えられるが、ルツボすなわち石英ガラスに孔
等を形成することは極めて困難である。For this reason, as shown in JP-A-61-44792, it is conceivable to form a plurality of gaps above the melt surface on the side wall of the crucible, but it is extremely difficult to form holes in the crucible, that is, in the quartz glass. Have difficulty.
この発明は以上の問題点を解決するために創案されたも
ので、酸化シリコンガスの停滞を生じさせず、ルツボに
切削加工等を施す必要のない単結晶引上げ装置における
酸化シリコン排出装置を提供することを目的とする。This invention was created to solve the above problems, and provides a silicon oxide discharge device in a single crystal pulling device that does not cause stagnation of silicon oxide gas and does not require cutting or the like on the crucible. The purpose is to
〔問題点を解決するための手段〕
この発明の単結晶引上げ装置における酸化シリコン排出
装置は、ルツボ内壁の上端周囲に取付けられるものであ
って、円環状のリング部材の周囲に複数のヒレを形成し
てなることを特徴とする。[Means for solving the problem] The silicon oxide discharge device in the single crystal pulling device of the present invention is attached around the upper end of the inner wall of the crucible, and has a plurality of fins formed around an annular ring member. It is characterized by:
以下、この発明を図面に示す実施例に基づいて説明する
。The present invention will be described below based on embodiments shown in the drawings.
第1図はこの発明の酸化シリコン排出装置10の実施例
を示すものである。FIG. 1 shows an embodiment of a silicon oxide discharge device 10 of the present invention.
酸化シリコン排出装置10は、円環状のリング部材11
の内周面に複数のヒレ12を形成してなり、リング部材
11の上端部には同じく円環状のキャップ部材13が側
方に突出するように設けである。酸化シリコン排出装置
10を形成するリング部材11、ヒレ12、キャップ部
材13は充分な耐熱性を有しており、一体成型されてい
る。リング部材11の外径はルツボ2上部内径に対し、
ややしまりばめとなるように形成する。The silicon oxide discharge device 10 includes an annular ring member 11
A plurality of fins 12 are formed on the inner peripheral surface of the ring member 11, and a ring-shaped cap member 13 is provided at the upper end of the ring member 11 so as to protrude laterally. The ring member 11, fin 12, and cap member 13 forming the silicon oxide discharge device 10 have sufficient heat resistance and are integrally molded. The outer diameter of the ring member 11 is relative to the inner diameter of the upper part of the crucible 2.
Form it so that it has a slight tight fit.
また図示した実施例のほか、リング部材の外周面に複数
のヒレを形成してもよい、この場合リング部材には複数
の孔を穿設し、キャップ部材は設けないようにし、設け
た場合にはリング部材と同様複数の孔を穿設する。In addition to the illustrated embodiment, a plurality of fins may be formed on the outer peripheral surface of the ring member. In this case, the ring member is provided with a plurality of holes, and a cap member is not provided. A plurality of holes are bored in the same way as in the ring member.
以上のように形成した酸化シリコン排出装置10を第2
図に示すようにルツボ2の上部内壁に嵌着する。The silicon oxide discharge device 10 formed as described above is
As shown in the figure, it is fitted onto the upper inner wall of the crucible 2.
ルツボ2は従来技術で述べたように回転するので、ルツ
ボ2内壁周囲の溶融液面近傍に位置する高濃度の酸化シ
リコンガスは、酸化シリコン排出装置10のヒレ12に
沿ってルツボ2上方へ流れ、停滞することはない。Since the crucible 2 rotates as described in the prior art, the highly concentrated silicon oxide gas located near the molten liquid surface around the inner wall of the crucible 2 flows upward to the crucible 2 along the fins 12 of the silicon oxide discharge device 10. , never stagnate.
■ ルツボ内壁周囲に高濃度の酸化シリコンが停滞せず
、単結晶引上げ作業を良好に行うことができる。■ Highly concentrated silicon oxide does not stagnate around the inner wall of the crucible, making it possible to pull single crystals smoothly.
■ ルツボに切削加工等を施す必要がな(、製作も容易
でコストも安い。■ There is no need to perform cutting on the crucible (it is easy to manufacture and inexpensive.
■ 既製のルツボにも簡単に取付けることができる。■ Can be easily attached to ready-made crucibles.
第1図はこの発明の酸化シリコン排出装置の実施例を示
す斜視図、第2図は使用例を示す断面図、第3図は従来
の単結晶引上げ装置の引上炉を示す断面図、第4図は不
活性ガスの流れを示す第3図の要部拡大図、第5図〜第
8図は酸化シリコンガスの流れを示す要部拡大図である
。
A・・・・・・引上炉、1・・・・・・ヒーター、2・
・・・・・ルツボ、3・・・・・・溶融シリコン、4・
・・・・・ワイヤ、5・・・・・・単結晶、6・・・・
・・ルツボ軸、7・・・・・・種結晶ホルダー、8・・
・・・・不活性ガス、9・・・・・・酸化シリコンガス
、10・・・・・・酸化シリコン排出装置、11・・・
リング部材、12・・・・・・ヒレ、13・・・・・・
キャップ部材
第 3 ご
第 4 図
(つ
第5図 第6図FIG. 1 is a perspective view showing an embodiment of the silicon oxide discharge device of the present invention, FIG. 2 is a sectional view showing an example of use, FIG. 3 is a sectional view showing a pulling furnace of a conventional single crystal pulling device, and FIG. FIG. 4 is an enlarged view of the main part of FIG. 3 showing the flow of inert gas, and FIGS. 5 to 8 are enlarged views of the main part showing the flow of silicon oxide gas. A... Drawing furnace, 1... Heater, 2.
...crucible, 3...molten silicon, 4.
...Wire, 5...Single crystal, 6...
... Crucible axis, 7 ... Seed crystal holder, 8 ...
...Inert gas, 9...Silicon oxide gas, 10...Silicon oxide discharge device, 11...
Ring member, 12...fin, 13...
Cap member Fig. 3 Fig. 4 (Fig. 5 Fig. 6)
Claims (1)
環状のリング部材の周囲に複数のヒレを形成してなるこ
とを特徴とする単結晶引上げ装置における酸化シリコン
排出装置。1. A silicon oxide discharge device in a single crystal pulling device, which is attached around the upper end of an inner wall of a crucible, and is characterized by having a plurality of fins formed around an annular ring member.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13841087A JPS63303886A (en) | 1987-06-02 | 1987-06-02 | Silicon oxide discharge device in single crystal pulling-up device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13841087A JPS63303886A (en) | 1987-06-02 | 1987-06-02 | Silicon oxide discharge device in single crystal pulling-up device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63303886A true JPS63303886A (en) | 1988-12-12 |
Family
ID=15221308
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13841087A Pending JPS63303886A (en) | 1987-06-02 | 1987-06-02 | Silicon oxide discharge device in single crystal pulling-up device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63303886A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6476992A (en) * | 1987-06-08 | 1989-03-23 | Mitsubishi Metal Corp | Apparatus for growing single crystal |
US6287528B1 (en) * | 1998-11-24 | 2001-09-11 | WACKER SILTRONIC GESELLSCHAFT FüR HALBLEITERMATERIALIEN AG | Method for removing dust |
-
1987
- 1987-06-02 JP JP13841087A patent/JPS63303886A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6476992A (en) * | 1987-06-08 | 1989-03-23 | Mitsubishi Metal Corp | Apparatus for growing single crystal |
US6287528B1 (en) * | 1998-11-24 | 2001-09-11 | WACKER SILTRONIC GESELLSCHAFT FüR HALBLEITERMATERIALIEN AG | Method for removing dust |
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