JPS63298107A - Slant incident interferometer device - Google Patents

Slant incident interferometer device

Info

Publication number
JPS63298107A
JPS63298107A JP62135868A JP13586887A JPS63298107A JP S63298107 A JPS63298107 A JP S63298107A JP 62135868 A JP62135868 A JP 62135868A JP 13586887 A JP13586887 A JP 13586887A JP S63298107 A JPS63298107 A JP S63298107A
Authority
JP
Japan
Prior art keywords
light
diffraction grating
checked
light beam
interference fringes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62135868A
Other languages
Japanese (ja)
Other versions
JPH06103173B2 (en
Inventor
Masane Suzuki
鈴木 正根
Takayuki Saito
隆行 斉藤
Kenji Yasuda
賢司 安田
Akio Tsukada
塚田 明夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujinon Corp
Original Assignee
Fuji Photo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Optical Co Ltd filed Critical Fuji Photo Optical Co Ltd
Priority to JP62135868A priority Critical patent/JPH06103173B2/en
Publication of JPS63298107A publication Critical patent/JPS63298107A/en
Publication of JPH06103173B2 publication Critical patent/JPH06103173B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To measure the irregularities of a surface to be checked accurately with interference fringes, by providing image forming lenses on a light path between a second diffraction grating and a hologram screen, and providing the image forming relation of a equal multiplication. CONSTITUTION:Laser light from a laser oscillator 1 is inputted into a first diffraction grating 4 through a diverging lens 2 and collimator lenses 3. A body under test is mounted on a mounting stage 5 and the flatness of the surface to be checked is checked. The light, which is inputted on the surface to be checked of the body under test and reflected, is made to interfere in a second diffraction grating 6. The luminous flux through the second diffraction grating 6 undergoes equimultiple image forming action through a lens system comprising image forming lenses 20 and 22. The diffracted light from the peripheral part of the surface to be checked is condensed at a point corresponding to a hologram screen 7. Therefore, the roundness at the peripheral part of the interference fringes is eliminated. Mutually parallel interference fringes are formed. Even if diffraction occurs at the peripheral part of the surface to be checked, the effect is not received, and the flatness of the surface is accurately checked.

Description

【発明の詳細な説明】 (産業上の利用分野) この発明は、光の干渉作用によって形成される干渉縞を
利用して被検体の平面度を検査することのできる斜入射
干渉計装置の改良に関するものである。
Detailed Description of the Invention (Industrial Application Field) The present invention is an improvement of a grazing incidence interferometer device capable of inspecting the flatness of an object by using interference fringes formed by interference of light. It is related to.

(従来の技術) 近年、被検体表面の凹凸差が大きくてもその表面を精度
良く測定することができる干渉計装置として、斜入射干
渉計装置が開発されている。第3図ta’l及び(b)
は本件特許出願人が昭和61年1月31日付で特許出願
し提案した射入斜干渉計装置を示すものである。
(Prior Art) In recent years, a grazing incidence interferometer device has been developed as an interferometer device that can accurately measure the surface of an object to be examined even if the surface has a large unevenness difference. Figure 3 ta'l and (b)
1 shows an incident oblique interferometer device proposed by the applicant for the patent on January 31, 1986.

この斜入射干渉計装置において、He−Neレーザ発振
器1から射出された波長632.8nmのレーザ光は、
プリズム発射鏡9で光路を折り曲げられて発散レンズ2
に入射する。このレーザ光は発散レンズ2で光束を拡げ
られ、ミラー11で折り曲げられてコリメーターレンズ
3に入射する。コリメーターレンズ3により平行光束と
されたレーザ光は、第1回折格子4により+1次方向に
回折する平行光の+1次光αと、回折されずに直進透過
する平行光のO次光βとに分割される。この+1次光α
は、載置台5上に載置される被検体Tの被検面に入射し
、反射されて第2回折格子6に入射する。第2回折格子
6は、第5図に示す如く前記0次光βを、回折せずに直
進透過する0次光Aと=1次光方向に回折される一1次
M光β′とに分割するとともに、被検体Tの被検面で反
射された光αを透過させて透過光α′とする。この透過
光渉縞を作る。この干渉縞は、ホログラムスクリーン7
により視点Eで正面視できるようになっている。
In this grazing incidence interferometer device, the laser beam with a wavelength of 632.8 nm emitted from the He-Ne laser oscillator 1 is
The optical path is bent by the prism emitting mirror 9 and the diverging lens 2
incident on . This laser beam is expanded by a diverging lens 2, bent by a mirror 11, and then enters a collimator lens 3. The laser beam that has been made into a parallel beam by the collimator lens 3 is divided into +1st-order parallel light α, which is diffracted in the +1st-order direction by the first diffraction grating 4, and O-order parallel light β, which is transmitted straight without being diffracted. divided into This +1st order light α
is incident on the test surface of the subject T placed on the mounting table 5 , is reflected, and enters the second diffraction grating 6 . As shown in FIG. 5, the second diffraction grating 6 converts the 0th-order light β into 0th-order light A, which is transmitted straight without being diffracted, and 11th-order M light β′, which is diffracted in the direction of the 1st-order light. At the same time, the light α reflected by the test surface of the subject T is transmitted to become transmitted light α′. This transmitted light creates interference fringes. This interference fringe is the hologram screen 7
This allows for a frontal view from viewpoint E.

なお、調整用ホログラム8は、被検面で反射して第2回
折格子6で回折する回折光りをスクリーン12に集光さ
せるものである。観察者は、前記干渉縞が観察できるよ
うにするために、載置台5を調節して被検面の高さや傾
き調整を行ない、スクリーン12上の基準面の集光点と
被検面の集光点を一致させることができるようになって
いる。
Note that the adjustment hologram 8 focuses diffracted light that is reflected by the surface to be inspected and diffracted by the second diffraction grating 6 onto the screen 12 . In order to be able to observe the interference fringes, the observer adjusts the height and inclination of the surface to be measured by adjusting the mounting table 5, and aligns the focal point of the reference surface on the screen 12 with that of the surface to be measured. This makes it possible to match the light points.

(発明が解決しようとする問題点) ところで、前記干渉計装置にあっては、第1回折格子4
で回折された平行光の+1次回折光αが被検体Tの被検
面以上に拡がって入射すると、被検面の形状に関係なく
その周縁部T1で回折現象が生ずる。この回折現象が起
こると、被検面の周縁部から反射された光の波面は完全
な平面波形状でなくなり周辺部に丸みを帯びた波面形状
となる。
(Problems to be Solved by the Invention) By the way, in the interferometer device, the first diffraction grating 4
When the +1st-order diffracted light α of the parallel light diffracted by the +1st-order diffracted light spreads beyond the surface to be examined of the object T and enters the same, a diffraction phenomenon occurs at the peripheral edge T1 regardless of the shape of the surface to be examined. When this diffraction phenomenon occurs, the wavefront of the light reflected from the periphery of the test surface no longer has a perfect plane wave shape, but instead has a wavefront shape with rounded edges.

−例として、被検体Tが円形形状で傾きを有している場
合、被検面で反射して第2回折格子6で回折せずに透過
する透過光α′と第2回折格子6で回折した一1次耕4
ffl光β′とによる干渉縞は、第6図(alに示すよ
うな互いに平行な干渉縞とならず被検面の周縁部T、に
おける回折光の影響により、第6図(blに示すように
周縁部に丸みを帯びた干渉縞となる。このため、被検面
の周縁部TIにあたかも面ダレが存在しているように誤
認される恐れがあった。
- For example, when the object T is circular and has an inclination, the transmitted light α' that is reflected from the object surface and transmitted without being diffracted by the second diffraction grating 6 is diffracted by the second diffraction grating 6. First plowing 4
The interference fringes caused by the ffl light β' do not become mutually parallel interference fringes as shown in Fig. 6 (al), but due to the influence of the diffracted light at the peripheral edge T of the test surface, as shown in Fig. 6 (bl). This results in rounded interference fringes at the periphery.Therefore, there is a risk that the periphery TI of the surface to be inspected may be mistakenly recognized as if surface sagging exists.

そこで、この発明は上記事情に鑑みて、被検面の周縁部
で回折現象が生じていても干渉縞に回折効果が付加され
ないで正しく被検面を検査することができる斜入射干渉
計装置を提供することを目的とするものである。
Therefore, in view of the above circumstances, the present invention provides a grazing incidence interferometer device that can correctly inspect a surface to be measured without adding a diffraction effect to the interference fringes even if a diffraction phenomenon occurs at the periphery of the surface to be measured. The purpose is to provide

(問題点を解決するための手段) 本発明の斜入射干渉計装置は、可干渉性の光を射出する
射出手段と、この射出手段から射出された光線を発散さ
せる光学手段と、この光学手段透過後の光束を平行光束
に形成する平行光束形成手段と、この平行光束形成手段
透過後の光束を特定方向に回折する回折光線αと直進透
過する透過光線βとに分割する第1回折格子と、検査す
る被検体を載置して変位・移動させる載置手段と、前記
第1回折格子によって回折され、且つ前記被検体の被検
面で反射された光線αを透過光線α′となし、前記透過
光線βを特定方向に回折させて回折光線β′となして前
記両光線α′とβ′とを干渉させる第2回折格子と、前
記第2回折格子からの光線を屈折透過し且つ前記被検体
を等倍率で結像する結像レンズ系と、前記結像レンズ系
を透過した干渉縞が投影され且つ前記結像レンズ系によ
る被検体の像が結像されるホログラムスクリーンとを備
えたものである。
(Means for Solving the Problems) The grazing incidence interferometer device of the present invention includes an emitting means for emitting coherent light, an optical means for diverging the light beam emitted from the emitting means, and an optical means for emitting coherent light. a first diffraction grating that divides the light beam after passing through the parallel light beam forming means into a diffracted light ray α that diffracts in a specific direction and a transmitted light ray β that passes straight through; , a mounting means for placing and displacing and moving an object to be inspected, and a light ray α diffracted by the first diffraction grating and reflected by the test surface of the object as a transmitted light ray α'; a second diffraction grating that diffracts the transmitted light beam β in a specific direction to form a diffracted light beam β′ and interferes with both the light beams α′ and β′; An imaging lens system that images a subject at the same magnification, and a hologram screen on which interference fringes transmitted through the imaging lens system are projected and an image of the subject is formed by the imaging lens system. It is something.

(作用) この発明の斜入射干渉計装置では、被検体の被検面が、
第2回折格子とホログラムスクリーンとの間の光路中に
設けられた結像レンズ系によって、ホログラムスクリー
ンに等倍で結像される。従い、被検面の周縁部で生ずる
回折光はホログラムスクリーン上の対応する結像点に集
光され、ホログラムスクリーン上の干渉縞には回折光の
影響が生じなくなる。
(Function) In the grazing incidence interferometer device of the present invention, the test surface of the test object is
An image at the same magnification is formed on the hologram screen by an imaging lens system provided in the optical path between the second diffraction grating and the hologram screen. Therefore, the diffracted light generated at the peripheral edge of the surface to be inspected is focused on the corresponding imaging point on the hologram screen, and the interference fringes on the hologram screen are no longer affected by the diffracted light.

(実施例) 以下、この発明の一実施例について添付図面を参照しな
がら説明する。第1図(al及び(blは、この発明に
係る斜入射干渉計装置の平面図及び側面図を示す第1図
(a)及び(illにおいて1はレーザ光などの可干渉
性光を射出するレーザ発振器、2は発散レンズ、3はコ
リメーターレンズ、4は第1回折格子、5は載置台、6
は第2回折格子、20.22は結像レンズ、7はホログ
ラムスクリーン(ホログラムレンズとも言う)、9は反
射プリズム、lOはピンホール、11は反射ミラー、3
0は撮像レンズ、40はテレビカメラを示す。
(Example) Hereinafter, an example of the present invention will be described with reference to the accompanying drawings. In FIGS. 1(a) and (ill), 1 emits coherent light such as a laser beam. Laser oscillator, 2 is a diverging lens, 3 is a collimator lens, 4 is a first diffraction grating, 5 is a mounting table, 6
is a second diffraction grating, 20.22 is an imaging lens, 7 is a hologram screen (also called a hologram lens), 9 is a reflection prism, IO is a pinhole, 11 is a reflection mirror, 3
0 indicates an imaging lens, and 40 indicates a television camera.

レーザ発振器1は、波長632.8nmの赤色の可干渉
光線である出力15mWのヘリウムネオン(He−Ne
)レーザ光を射出する。このレーザ光は直線偏光となっ
ている。発散レンズ2は、レーザ発振器1から射出され
たレーザ光を発散させるレンズであり、複数枚のレンズ
で構成される場合もある。
The laser oscillator 1 uses helium neon (He-Ne) with an output of 15 mW, which is a red coherent light beam with a wavelength of 632.8 nm.
) emits laser light. This laser light is linearly polarized light. The diverging lens 2 is a lens that diverges the laser beam emitted from the laser oscillator 1, and may be composed of a plurality of lenses.

コリメーターレンズ3は、有害光を除去するピンホール
10を通過し反射ミラー11で反射した発散レーザ光を
平行光束とするものであり、複数枚のレンズから構成さ
れている。
The collimator lens 3 converts a diverging laser beam that passes through a pinhole 10 for removing harmful light and is reflected by a reflection mirror 11 into a parallel light beam, and is composed of a plurality of lenses.

第1回折格子4は、コリメーターレンズ3により平行光
束となったレーザ光を+1次光方向に回折する第1次光
αと、回折せずに直進透過するO次光βとに分割するも
のである。この第1回折格子4は、平面を機械的に刻設
して多数の微細な溝を形成したものから構成されている
が、例えば乳剤あるいは感光性樹脂に干渉縞を記録して
格子を形成したホログラフィック格子を用いてもよい。
The first diffraction grating 4 splits the laser beam, which has been made into a parallel beam by the collimator lens 3, into the first-order light α, which is diffracted in the +1st-order light direction, and the O-order light β, which is transmitted straight without being diffracted. It is. This first diffraction grating 4 is constructed by mechanically carving a plane to form a large number of fine grooves, but for example, the grating can be formed by recording interference fringes on an emulsion or a photosensitive resin. Holographic gratings may also be used.

載置台5は、被検体を載置する台である。この載置台5
は、第4図に示すように、ジヤツキ機構5aと、ジヤツ
キ機構5a上に取付けられジヤツキ機構により垂直方向
(Z方向)に移動する基台5bと、3個のねじ5cによ
って基台5bに支持され、それらのねじ5cを操作して
Z方向に垂直な平面(XY面)の傾きを調整する円形テ
ーブル5dとから構成されている。この円形テーブル5
d上に被検体Tを載置してその被検体Tの被検面の平面
度を検査するようになっている。
The mounting table 5 is a table on which the subject is placed. This mounting table 5
As shown in FIG. 4, there is a jack mechanism 5a, a base 5b that is mounted on the jack mechanism 5a and moves in the vertical direction (Z direction) by the jack mechanism, and is supported on the base 5b by three screws 5c. and a circular table 5d for adjusting the inclination of a plane perpendicular to the Z direction (XY plane) by operating these screws 5c. This circular table 5
A subject T is placed on the test surface d, and the flatness of the surface of the subject T is inspected.

第2回折格子6は、第1回折格子4と同様に形成されて
いる。この第2回折格子6は、第5図に示すように、第
1回折格子4によって+1次方向に回折して被検体Tの
被検面に入射した後反射された+1次光αを回折せずに
直進透過した一1次光α′と、第1回折格子4で回折せ
ずに直進透過した0次光βを一1次方向に回折した一1
次光β′とを重ね合せて干渉させるものである。
The second diffraction grating 6 is formed similarly to the first diffraction grating 4. As shown in FIG. 5, this second diffraction grating 6 diffracts the +1st order light α which is diffracted by the first diffraction grating 4 in the +1st order direction and reflected after being incident on the test surface of the subject T. The 11th-order light α' that passed straight through without being diffracted by the first diffraction grating 4, and the 11-order light that diffracted the 0th-order light β that passed straight through the first diffraction grating 4 in the 11th-order direction.
This is to superimpose and interfere with the secondary light β'.

結像レンズ20は、正の焦点距離fを有するレンズであ
る。この結像レンズ20は、被検体5の被検面の中心点
Oから距離fの位置に設けられており、第2回折格子6
から射出される前記干渉状態にある平行光束をp点に集
光させるものである。
The imaging lens 20 is a lens having a positive focal length f. This imaging lens 20 is provided at a distance f from the center point O of the surface to be examined of the object 5, and the second diffraction grating 6
This is to condense the collimated light beam in the interference state emitted from the point to point p.

結像レンズ22は、結像レンズ20と同様に正の焦点距
離fを有するレンズである。この結像レンズ22は、集
光点pから距離fの位置に設けられており、結像レンズ
20により集光された光束を再び平行光束に戻すもので
ある。従い、この結像レンズ20と22は、集光点pを
中心として対象的に配置されており、両レンズは同一の
レンズ結像レンズ22から距離fの位置O′に被検体T
の被検面に対応して斜めに設けられており、結像レンズ
20と22とから成るレンズ系によって被検面と等倍(
−1倍)の結像関係となっている。
The imaging lens 22, like the imaging lens 20, is a lens having a positive focal length f. The imaging lens 22 is provided at a distance f from the focal point p, and returns the light beam focused by the imaging lens 20 into a parallel light beam. Therefore, the imaging lenses 20 and 22 are arranged symmetrically with the focal point p as the center, and both lenses have the same lens.
It is installed diagonally corresponding to the surface to be inspected, and a lens system consisting of imaging lenses 20 and 22 allows it to be viewed at the same magnification as the surface to be inspected.
-1 times).

一方、ホログラムスクリーン7ゝ上には、被検面の凹凸
に起因する干渉縞が投影される。ここで、−例として円
形形状の被検体がそのXY平面に傾斜している場合の干
渉縞の形状について説明する。
On the other hand, interference fringes due to the unevenness of the surface to be inspected are projected onto the hologram screen 7 . Here, as an example, the shape of interference fringes when a circular object is tilted to its XY plane will be described.

第2回折格子6を経た光束は、平行光束であるので、結
像レンズ20の方向から見るとその波面は平面波のよう
に見える。ところが実際には、光帯びた擬平面波となる
。この擬平面波と前記平面波の一次元β′とが干渉する
と、その干渉縞の形等倍率の結像作用をするため、被検
面の周縁部T。
Since the light beam passing through the second diffraction grating 6 is a parallel light beam, its wavefront looks like a plane wave when viewed from the direction of the imaging lens 20. However, in reality, it becomes a light-tinged quasi-plane wave. When this pseudo-plane wave interferes with the one-dimensional plane wave β', an image is formed at the same magnification in the form of interference fringes, so that the peripheral edge T of the surface to be inspected.

からの回折光りはホログラムスクリーン7の対応する点
T 1’に集光されるので、前記干渉縞の周縁部の丸み
は無くなり、互いに平行な干渉縞となることができるも
のである。
Since the diffracted light from the hologram screen 7 is focused on the corresponding point T1' of the hologram screen 7, the roundness of the peripheral edge of the interference fringes disappears and the interference fringes become parallel to each other.

撮影レンズ30は、ホログラムスクリーン7上の干渉縞
をテレビカメラ40に内蔵されている撮像管の撮像面に
結像させるものである。前記干渉縞は、この撮影レンズ
30の位置に観察者の眼を置くことによっても観察する
ことができる。
The photographing lens 30 forms an image of the interference fringes on the hologram screen 7 on the imaging surface of an imaging tube built into the television camera 40. The interference fringes can also be observed by placing the observer's eyes at the position of the photographing lens 30.

次に、この発明に係る斜入射干渉計装置の他の実施例に
ついて説明する。
Next, another embodiment of the grazing incidence interferometer device according to the present invention will be described.

第2図は、この発明に係る他の実施例の斜入射干渉計装
置の第1回折格子4からテレビカメラ40に至る要部側
面図を示し、レーザー発振器1からコリメーターレンズ
3に至る構成は第1図(a)及び(blと同一である。
FIG. 2 shows a side view of the main parts of a grazing incidence interferometer device according to another embodiment of the present invention, from the first diffraction grating 4 to the television camera 40, and shows the configuration from the laser oscillator 1 to the collimator lens 3. It is the same as FIG. 1(a) and (bl).

第2図において、第1図(a)及び(b)と同符号、同
番号は同一機能を有する。
In FIG. 2, the same symbols and numbers have the same functions as those in FIGS. 1(a) and (b).

24は偏光ビームスプリッタ、26は1/4波長板、2
8は裏面鏡を示す。第2図において、レーザ発振器1か
らコリメーターレンズ3に至る図示していない構成及び
第1回折格子4から第2回折格子6に至る構成は前記と
重複するため説明を省略する。
24 is a polarizing beam splitter, 26 is a quarter wavelength plate, 2
8 indicates a rear mirror. In FIG. 2, the not-illustrated structure from the laser oscillator 1 to the collimator lens 3 and the structure from the first diffraction grating 4 to the second diffraction grating 6 are the same as those described above, and therefore their explanations will be omitted.

偏光ビームスプリッタ24は、第2回折格子6から射出
された一1次光α′に対し45°傾斜して設けられ、第
2回折格子6からの直線偏光光束を透過させる。
The polarizing beam splitter 24 is provided at an angle of 45 degrees with respect to the 1st-order light α' emitted from the second diffraction grating 6, and transmits the linearly polarized light beam from the second diffraction grating 6.

結像レンズ20は、焦点距離fを有し、被検体の被検面
の中心0から距離fの位置に設けられ、偏光ビームスプ
リッタ24からの平行光束を距離f離れた点pに集光す
る。
The imaging lens 20 has a focal length f, is provided at a distance f from the center 0 of the surface to be examined of the object, and focuses the parallel light beam from the polarizing beam splitter 24 on a point p separated by a distance f. .

1/4波長板26は、結像レンズ20の集光光束中に設
けられ、結像レンズ20からの光束を円偏光させる。
The 1/4 wavelength plate 26 is provided in the condensed light beam of the imaging lens 20, and circularly polarizes the light beam from the imaging lens 20.

裏面鏡28は、反射面28bを有し、その反射面28b
が集光点pに一致するように設けられている。この裏面
鏡28は、1/4波長板26により円偏光された光束を
反射面28bで反射して元の光路へ戻すものである。裏
面鏡28で反射され1ま た光束は、1/4波長板26で前記光束と直交する直線
偏光に偏光され、結像レンズ20から再び平行光束とな
る。結像レンズ20から射出された平行光束は、偏光ビ
ームスプリンタ24で反射され光路を折り曲げられてホ
ログラムスクリーン7に達する。ホログラムスクリーン
7の中心0゛は、結像レンズ20から距離fの位置にあ
り、被検面に対応して光束に対して角度θ傾斜して設け
られている。すなわち、被検面とホログラムスクリーン
7は、等倍(−1倍)の結像関係になっている。
The back mirror 28 has a reflective surface 28b, and the reflective surface 28b
is provided so as to coincide with the focal point p. This back mirror 28 reflects the light beam circularly polarized by the quarter-wave plate 26 on a reflecting surface 28b and returns it to the original optical path. The light beam reflected by the back mirror 28 is polarized into linearly polarized light orthogonal to the light beam by the quarter-wave plate 26, and then becomes a parallel light beam from the imaging lens 20 again. The parallel light beam emitted from the imaging lens 20 is reflected by the polarizing beam splinter 24 and reaches the hologram screen 7 with its optical path bent. The center 0' of the hologram screen 7 is located at a distance f from the imaging lens 20, and is inclined at an angle θ with respect to the light beam in correspondence with the surface to be inspected. In other words, the surface to be inspected and the hologram screen 7 have an image formation relationship of equal magnification (-1 times).

このホログラムスクリーン7上には、被検面の像と被検
面の凹凸に基づく干渉縞が形成されている。
On this hologram screen 7, interference fringes are formed based on the image of the surface to be inspected and the irregularities of the surface to be inspected.

ホログラムスクリーン7は、光束を折り曲げるので、撮
影レンズ30によりテレビカメラ40の撮像面に結像さ
せる。この実施例では偏光ビームスプリッタ24、裏面
反射鏡28を用いたので結像レンズ20を1つ設ければ
よく、安価′となり、全長を短くすることができる。
Since the hologram screen 7 bends the light beam, the photographing lens 30 forms an image on the imaging surface of the television camera 40 . In this embodiment, since the polarizing beam splitter 24 and the back reflecting mirror 28 are used, it is sufficient to provide only one imaging lens 20, which is inexpensive and allows the overall length to be shortened.

(効果) 以上説明したように、この発明に係る斜入射子渉計装置
は、第2回折格子とホログラムスクリーンとの間の光路
中に結像レンズを設けて等倍の結像関係を持たせたから
、ホログラムスクリーン上にできる干渉縞は、回折の影
響を受けずに被検面の凹凸状態を正確に測定することが
できる。
(Effects) As explained above, the grazing-incidence interferometer device according to the present invention provides an imaging lens in the optical path between the second diffraction grating and the hologram screen to provide a same-magnification imaging relationship. Therefore, the interference fringes formed on the hologram screen can accurately measure the uneven state of the test surface without being affected by diffraction.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)及び山)は、それぞれ本発明に係る斜入射
干渉計装置の一実施例を示す平面図と側面図である。第
2図は、本発明に係る斜入射干渉計装置の他の実施例の
要部側面図である。第3図fal及び(blは、それぞ
れ従来の斜入射干渉計装置の平面図と側面図である。第
4図は、本発明に係る斜入射干渉計装置の載置台を示す
図である。第5図は本発明に係る斜入射干渉計装置の第
2回折格子の作用を説明する図である。第6図fal及
び(b)は、それぞれ本発明に係る斜入射干渉計装置に
基づく干渉縞と従来の斜入射干渉計装置に基づく干渉縞
を示す図である。 1−−−−−−レーザ発振器、3−・−・−コリメータ
ーレンズ、4−−−−−−−一第1回折格子、5−〜−
−−−−載置台、6−−−−−−−−第2回折格子、 7−−−−−・−ホログラムスクリーン、20.22・
−−−−m−結像レンズ。
FIGS. 1(a) and 1(a) are a plan view and a side view, respectively, showing an embodiment of a grazing incidence interferometer device according to the present invention. FIG. 2 is a side view of main parts of another embodiment of the grazing incidence interferometer device according to the present invention. FIGS. 3 fal and (bl are a plan view and a side view, respectively, of a conventional grazing incidence interferometer device. FIG. 4 is a diagram showing a mounting table of the grazing incidence interferometer device according to the present invention. Fig. 5 is a diagram explaining the action of the second diffraction grating of the grazing incidence interferometer device according to the present invention. Fig. 6 fal and (b) respectively show interference fringes based on the grazing incidence interferometer device according to the present invention. 1 is a diagram showing interference fringes based on a conventional oblique incidence interferometer device. 1--Laser oscillator, 3--Collimator lens, 4--First diffraction Lattice, 5---
-----Placement table, 6------Second diffraction grating, 7-------Hologram screen, 20.22.
----m-imaging lens.

Claims (1)

【特許請求の範囲】[Claims] 1、可干渉性の光を射出する射出手段と、この射出手段
から射出された光線を発散させる光学手段と、この光学
手段透過後の光束を平行光束に形成する平行光束形成手
段と、この平行光束形成手段透過後の光束を特定方向に
回折する回折光線αと直進透過する透過光線βとに分割
する第1回折格子と、検査する被検体を載置して変位・
移動させる載置手段と、前記第1回折格子によって回折
され、且つ前記被検体の被検面で反射された光線αを透
過光線α′となし、前記透過光線βを特定方向に回折さ
せて回折光線β′となして前記両光線α′とβ′とを干
渉させる第2回折格子と、前記第2回折格子からの光線
を屈折透過し且つ前記被検体を等倍率で結像する結像レ
ンズ系と、前記結像レンズ系を透過した干渉縞が投影さ
れ且つ前記結像レンズ系による被検体の像が結像される
ホログラムスクリーンとを備えたことを特徴とする斜入
射干渉計装置。
1. An emitting means for emitting coherent light, an optical means for diverging the light emitted from the emitting means, a parallel light beam forming means for forming a light beam after passing through the optical means into a parallel light beam, and a parallel light beam forming means for forming a parallel light beam after passing through the optical means. A first diffraction grating that divides the light flux after passing through the light flux forming means into a diffracted light ray α that diffracts in a specific direction and a transmitted light ray β that passes straight through;
The light ray α diffracted by the moving mounting means and the first diffraction grating and reflected by the test surface of the object is defined as a transmitted light ray α′, and the transmitted light ray β is diffracted in a specific direction to perform diffraction. a second diffraction grating that causes the two light beams α' and β' to interfere with each other as a light beam β'; and an imaging lens that refracts and transmits the light beam from the second diffraction grating and forms an image of the subject at the same magnification. A grazing incidence interferometer apparatus comprising: a hologram screen on which interference fringes transmitted through the imaging lens system are projected and on which an image of a subject is formed by the imaging lens system.
JP62135868A 1987-05-29 1987-05-29 Oblique incidence interferometer device Expired - Fee Related JPH06103173B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62135868A JPH06103173B2 (en) 1987-05-29 1987-05-29 Oblique incidence interferometer device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62135868A JPH06103173B2 (en) 1987-05-29 1987-05-29 Oblique incidence interferometer device

Publications (2)

Publication Number Publication Date
JPS63298107A true JPS63298107A (en) 1988-12-05
JPH06103173B2 JPH06103173B2 (en) 1994-12-14

Family

ID=15161646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62135868A Expired - Fee Related JPH06103173B2 (en) 1987-05-29 1987-05-29 Oblique incidence interferometer device

Country Status (1)

Country Link
JP (1) JPH06103173B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0650709A (en) * 1992-06-15 1994-02-25 Hughes Aircraft Co Full-aperture interferometer for oblique- incident type optical system
JP2009517871A (en) * 2005-11-29 2009-04-30 カール・ツァイス・エスエムティー・アーゲー Projection irradiation system
JP5725681B1 (en) * 2014-01-22 2015-05-27 レーザーテック株式会社 Interferometer and phase shift amount measuring apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0650709A (en) * 1992-06-15 1994-02-25 Hughes Aircraft Co Full-aperture interferometer for oblique- incident type optical system
JP2009517871A (en) * 2005-11-29 2009-04-30 カール・ツァイス・エスエムティー・アーゲー Projection irradiation system
US8228485B2 (en) 2005-11-29 2012-07-24 Carl Zeiss Smt Gmbh Projection illumination system
JP5725681B1 (en) * 2014-01-22 2015-05-27 レーザーテック株式会社 Interferometer and phase shift amount measuring apparatus
US9719859B2 (en) 2014-01-22 2017-08-01 Lasertec Corporation Interferometer and phase shift amount measuring apparatus with diffraction gratings to produce two diffraction beams

Also Published As

Publication number Publication date
JPH06103173B2 (en) 1994-12-14

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