JPS6328255B2 - - Google Patents
Info
- Publication number
- JPS6328255B2 JPS6328255B2 JP56097305A JP9730581A JPS6328255B2 JP S6328255 B2 JPS6328255 B2 JP S6328255B2 JP 56097305 A JP56097305 A JP 56097305A JP 9730581 A JP9730581 A JP 9730581A JP S6328255 B2 JPS6328255 B2 JP S6328255B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- circuit
- pulse
- frequency
- wave
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000009529 body temperature measurement Methods 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims 2
- 239000013078 crystal Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
- 229910000859 α-Fe Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
- G01K1/024—Means for indicating or recording specially adapted for thermometers for remote indication
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/32—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using change of resonant frequency of a crystal
Description
【発明の詳細な説明】
本発明は離れて位置する被温度測定部の温度を
ワイヤレスにて測定する温度測定装置に関するも
のである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a temperature measurement device that wirelessly measures the temperature of a temperature measurement target located at a distance.
従来より感温共振回路にスイープパルスを送
り、反射波の周波数をカウントして被温度測定部
の温度を測定する温度測定装置が提案されている
が、階段的スイープや反射波形判定、周波数カウ
ント、処理装置等、大がかりな装置を有し、装置
が高価になる欠点があつた。 Conventionally, temperature measurement devices have been proposed that measure the temperature of the temperature-measured part by sending a sweep pulse to a temperature-sensitive resonant circuit and counting the frequency of the reflected wave. It has the disadvantage that it requires large-scale equipment such as processing equipment, making the equipment expensive.
本発明は上記のような欠点を除去した温度測定
装置に関するものである。 The present invention relates to a temperature measuring device that eliminates the above-mentioned drawbacks.
以下本発明の温度測定装置の一実施例を図面と
ともに説明する。 An embodiment of the temperature measuring device of the present invention will be described below with reference to the drawings.
第1図において、1はVCO(Voltage
Controlled Oscillator)回路2に印加される第2
図Aに示すような鋸歯状電圧を発生する鋸歯状電
圧発生回路であり、該鋸歯状電圧発生回路1の鋸
歯状波が印加されることにより上記VCO回路2
には第2図Bに示すような周波数fsから周波数fe
までのスイープ波が周期tで発生する。3は間欠
信号発信回路で、上記VCO回路2よりのスイー
プ波に第2図Cに示すような通過パルスを与え第
2図Dに示すような間欠パルスを被温度測定部に
設定される感温共振回路4に発信する。該感温共
振回路4では、感温水晶振動子の温度によつて定
まる共振周波数foまたはその至近周波数のパルス
が到来した時に共振して第2図Eに示すような反
射波を時間選択受信回路5に発信する。該時間選
択受信回路5は間欠信号発信回路3の通過パルス
に対して一定時間t′移相がずれた検知パルス(第
2図F)に基づいて通過パルスからt′遅れた点の
反射共振波のみを受信するものであり、今スイー
プスタートからn番目のパルスで受信されたとす
ると、次の計測回路6で第2図Gに示すようなパ
ルス信号foまでの時間tnを計測(計時)するか、
第2図Gに示すようなパルス信号foが入るまでの
パルス数nを計測(計時)するかして、次の処理
回路7で温度を表示するなりスイツチの動作をさ
せたりして被温度測定部の温度を測定するもので
ある。 In Figure 1, 1 is VCO (Voltage
Controlled Oscillator) The second voltage applied to circuit 2
This is a sawtooth voltage generation circuit that generates a sawtooth voltage as shown in FIG.
From the frequency fs to the frequency fe as shown in Figure 2B,
A sweep wave up to is generated with a period t. Reference numeral 3 designates an intermittent signal generating circuit which applies passing pulses as shown in FIG. 2C to the sweep wave from the VCO circuit 2, and transmits intermittent pulses as shown in FIG. The signal is transmitted to the resonant circuit 4. In the temperature-sensitive resonant circuit 4, when a pulse of the resonant frequency fo determined by the temperature of the temperature-sensitive crystal oscillator or a frequency close thereto arrives, it resonates and a reflected wave as shown in FIG. 2E is sent to a time-selective receiving circuit. Send a call to 5. The time selection receiving circuit 5 generates a reflected resonant wave at a point delayed by t' from the passing pulse based on the detection pulse (FIG. 2F) whose phase is shifted by a certain time t' with respect to the passing pulse of the intermittent signal transmitting circuit 3. If the nth pulse is received from the sweep start, the next measuring circuit 6 measures (times) the time tn until the pulse signal fo as shown in Fig. 2G. ,
The temperature of the object is measured by measuring (timekeeping) the number of pulses until the pulse signal fo is input as shown in Fig. 2G, or by displaying the temperature or operating a switch in the next processing circuit 7. This is to measure the temperature of the area.
尚、上記実施例の構成において、VCO回路2
から発生するスイープ波は段階的であつてもよ
く、また計測回路6で波形確認を行なつても良
く、そして感温共振回路4の感温素子も水晶に限
らずニオブ酸リチウムのような弾性表面波発振
子、フエライト、磁器コンデンサのようなもので
あつても良い。 In addition, in the configuration of the above embodiment, the VCO circuit 2
The sweep wave generated from the waveform may be stepwise, and the waveform may be checked by the measurement circuit 6.The temperature sensing element of the temperature sensing resonant circuit 4 is not limited to crystal, but may also be made of an elastic material such as lithium niobate. It may also be something like a surface wave oscillator, ferrite, or a magnetic capacitor.
本発明の温度測定装置は上記のような構成であ
スイープ波の周波数をカウントしたり、反射波形
を判定したりする必要がなく、装置が大幅に簡略
化することができ、安価な装置を提供することが
できる。 The temperature measurement device of the present invention has the above-described configuration, and there is no need to count the frequency of the sweep wave or judge the reflected waveform, and the device can be significantly simplified, providing an inexpensive device. can do.
第1図は本発明の温度測定装置の一実施例の構
成を示すブロツク図、第2図は第1図の各部の波
形図である。
図面中、3は間欠信号発信回路、4は感温共振
回路を示す。
FIG. 1 is a block diagram showing the configuration of one embodiment of the temperature measuring device of the present invention, and FIG. 2 is a waveform diagram of each part of FIG. 1. In the drawings, numeral 3 indicates an intermittent signal generating circuit, and numeral 4 indicates a temperature-sensitive resonant circuit.
Claims (1)
て間欠発信させる間欠信号発信回路と、被温度測
定部に設定して被温度測定部の温度によつて定ま
る共振周波数若しくはその至近周波数のパルスが
上記間欠信号発信回路から到来した時に共振する
感温共振回路と、 この感温共振回路の反射波を、上記通過パルス
に対して一定時間移相がずれた検出パルスによつ
て検出する手段と、この検出手段の出力に基づい
て共振を検知し、上記スイープ波のスタートから
この検知までの時間あるいは検出パルスの数によ
つて温度を測定する測定回路とを具備してなる温
度測定装置。[Scope of Claims] 1. An intermittent signal generation circuit that intermittently transmits a sweep wave based on passing pulses of a constant period, and a resonant frequency that is set in a temperature measurement section and determined by the temperature of the temperature measurement section, or a resonance frequency close to the resonance frequency. A temperature-sensitive resonant circuit that resonates when a frequency pulse arrives from the intermittent signal generation circuit, and a reflected wave of this temperature-sensitive resonant circuit is detected by a detection pulse whose phase is shifted by a certain period of time with respect to the passing pulse. and a measurement circuit that detects resonance based on the output of the detection means and measures the temperature based on the time from the start of the sweep wave to this detection or the number of detected pulses. Device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56097305A JPS57211024A (en) | 1981-06-22 | 1981-06-22 | Temperature measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56097305A JPS57211024A (en) | 1981-06-22 | 1981-06-22 | Temperature measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57211024A JPS57211024A (en) | 1982-12-24 |
JPS6328255B2 true JPS6328255B2 (en) | 1988-06-07 |
Family
ID=14188768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56097305A Granted JPS57211024A (en) | 1981-06-22 | 1981-06-22 | Temperature measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57211024A (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63200028A (en) * | 1987-02-17 | 1988-08-18 | Japan Atom Energy Res Inst | Method and apparatus for measuring weight by means of piezoelectric vibrator |
JPH0219713A (en) * | 1988-07-07 | 1990-01-23 | Nagano Keiki Seisakusho Ltd | Displacement measuring instrument |
JPH02138837A (en) * | 1988-11-19 | 1990-05-28 | Agency Of Ind Science & Technol | Wireless temperature measuring system and crystal temperature sensor |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5447593A (en) * | 1977-09-22 | 1979-04-14 | Tokyo Denpa Kk | Atricle identifying device |
-
1981
- 1981-06-22 JP JP56097305A patent/JPS57211024A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5447593A (en) * | 1977-09-22 | 1979-04-14 | Tokyo Denpa Kk | Atricle identifying device |
Also Published As
Publication number | Publication date |
---|---|
JPS57211024A (en) | 1982-12-24 |
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