JPS63269446A - 電子ビーム装置 - Google Patents
電子ビーム装置Info
- Publication number
- JPS63269446A JPS63269446A JP10303287A JP10303287A JPS63269446A JP S63269446 A JPS63269446 A JP S63269446A JP 10303287 A JP10303287 A JP 10303287A JP 10303287 A JP10303287 A JP 10303287A JP S63269446 A JPS63269446 A JP S63269446A
- Authority
- JP
- Japan
- Prior art keywords
- charged beam
- sources
- charged
- source
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Electron Beam Exposure (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10303287A JPS63269446A (ja) | 1987-04-28 | 1987-04-28 | 電子ビーム装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10303287A JPS63269446A (ja) | 1987-04-28 | 1987-04-28 | 電子ビーム装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63269446A true JPS63269446A (ja) | 1988-11-07 |
JPH0574181B2 JPH0574181B2 (enrdf_load_stackoverflow) | 1993-10-15 |
Family
ID=14343317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10303287A Granted JPS63269446A (ja) | 1987-04-28 | 1987-04-28 | 電子ビーム装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63269446A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5430292A (en) * | 1991-06-10 | 1995-07-04 | Fujitsu Limited | Pattern inspection apparatus and electron beam apparatus |
US5557105A (en) * | 1991-06-10 | 1996-09-17 | Fujitsu Limited | Pattern inspection apparatus and electron beam apparatus |
-
1987
- 1987-04-28 JP JP10303287A patent/JPS63269446A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5430292A (en) * | 1991-06-10 | 1995-07-04 | Fujitsu Limited | Pattern inspection apparatus and electron beam apparatus |
US5557105A (en) * | 1991-06-10 | 1996-09-17 | Fujitsu Limited | Pattern inspection apparatus and electron beam apparatus |
Also Published As
Publication number | Publication date |
---|---|
JPH0574181B2 (enrdf_load_stackoverflow) | 1993-10-15 |
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