JPS6325945A - Conveying apparatus of wafer and wafer carrier - Google Patents

Conveying apparatus of wafer and wafer carrier

Info

Publication number
JPS6325945A
JPS6325945A JP61168048A JP16804886A JPS6325945A JP S6325945 A JPS6325945 A JP S6325945A JP 61168048 A JP61168048 A JP 61168048A JP 16804886 A JP16804886 A JP 16804886A JP S6325945 A JPS6325945 A JP S6325945A
Authority
JP
Japan
Prior art keywords
wafer
wafer carrier
carriers
vertical direction
wafers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61168048A
Other languages
Japanese (ja)
Inventor
Katsuyuki Akagawa
赤川 勝幸
Akitsugu Yamada
晃嗣 山田
Kunio Uchiyama
内山 久仁男
Hiroshi Arai
浩 新井
Yoshibumi Anami
阿南 義文
Hiromasa Shibata
浩匡 柴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP61168048A priority Critical patent/JPS6325945A/en
Publication of JPS6325945A publication Critical patent/JPS6325945A/en
Pending legal-status Critical Current

Links

Landscapes

  • Intermediate Stations On Conveyors (AREA)
  • Specific Conveyance Elements (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Warehouses Or Storage Devices (AREA)

Abstract

PURPOSE:To obtain a conveying apparatus, which can reduce the area of a floor occupied by the conveying means of wafer carriers, as much as possible, by constituting the conveying means by supporting members for a plurality of wafer carriers, which are arranged in series so that the carriers can be moved in the vertical direction, and a driving means, which drives the supporting means in the vertical direction. CONSTITUTION:A plurality of wafers 82 are accommodated in each of at least two wafer carriers 80. The carriers are conveyed to a specified position by a wafer conveying means. The wafers 82, are taken out of the wafer carrier 80, which is conveyed to the specified position one by one and conveyed to a wafer processing device by a wafer conveying means. Said wafer conveying means in a conveying apparatus for the wafers and the wafer carriers include the following parts. A plurality of wafer carrier supporting parts 22 are arranged in series in the moving direction so that the members can be moved in the vertical direction between the upper position and the lower position. Driving means 10-20 drive the wafer carrier supporing members 22 in the vertical direction.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、半導体ウェハ及びウェハキャリヤの搬送手段
を含む搬送装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a transport device including transport means for semiconductor wafers and wafer carriers.

(従来技術及びその欠点) 半導体ウェハを検査装置等のウェハ処理装置に運搬する
ために、複数枚のウェハをウェハキャリヤに収容し、こ
のウェハキャリヤを搬送することが行なわれている。こ
の場合、ウェハキャリヤを所定位置まで搬送するための
手段と、所定位置に搬送されたウェハキャリヤをウェハ
処理装置(例えば検査位置)に搬送するための手段とが
必要となる。
(Prior Art and Its Disadvantages) In order to transport semiconductor wafers to a wafer processing device such as an inspection device, a plurality of wafers are accommodated in a wafer carrier and this wafer carrier is transported. In this case, means for transporting the wafer carrier to a predetermined position and means for transporting the wafer carrier transported to the predetermined position to a wafer processing apparatus (for example, an inspection position) are required.

従来においては、上記搬送装置は工場内の床面に水平に
設置されておシ、ウェハキャリヤはその搬送手段によっ
て水平方向に搬送されていた(ウェハ搬送手段について
は、ウェハキャリヤを所定位置からウェハ処理装置まで
水平方向に搬送するものも、垂直方向に搬送するものも
知られていた)。
Conventionally, the above-mentioned transport device was installed horizontally on the floor in the factory, and the wafer carrier was transported horizontally by the transport means (the wafer transport means was used to transport the wafer carrier from a predetermined position to the wafer carrier). (It was known that both horizontal and vertical transport methods were used to transport the material to the processing equipment.)

しかし、従来の搬送装置では、これを設置するために占
める床面積が犬きくなシ、その公地の装置を設置するた
めのスペースが少なくなる。また、最近ではウェハキャ
リヤの天井搬送によるインライン化の要求があるが、上
記搬送装置はこうした要求に応え得るものとは言えない
However, the conventional conveying device requires a considerable amount of floor space to install it, and the space available for installing the device on public land is reduced. Furthermore, although there has recently been a demand for in-line wafer carrier ceiling transport, the above-mentioned transport apparatus cannot be said to be able to meet such demands.

本発明は、こうした従来技術の欠点を解消すること、即
ちウェハキャリヤの搬送手段が占める床面積を極力小さ
くし得るウェハ及びウェハキャリヤの搬送装置を提供す
ることを目的としてなされたものである。
The present invention has been made to overcome these drawbacks of the prior art, namely to provide a wafer and a wafer carrier transport device that can minimize the floor space occupied by the wafer carrier transport means.

〔問題点を解決するための手作、作用〕上記目的を達成
するために、本発明においては、ウェハキャリヤの搬送
手段を全体として垂直方向に配置し、該搬送手段は上昇
位置と下降位置との間で垂直方向に移動する、複数の移
動方向に直列的に配置されたウェハキャリヤの支持部材
(トレイ)と、この支持部材を垂直方向に駆動する駆動
手段(モータ、チェーン等)とで構成したのである。ウ
ェハキャリヤは、例えば天井搬送装置によってウェハキ
ャリヤ、搬送手段の支持部材上に供給され(例えば上昇
位置にちるとき)、支持部材が駆動手段で駆動されるこ
とにより、ウェハ搬送手段との受渡し場所まで移動され
る。
[Manipulations and actions to solve the problem] In order to achieve the above object, in the present invention, the conveying means for the wafer carrier is arranged in a vertical direction as a whole, and the conveying means has a raised position and a lowered position. It consists of a support member (tray) for wafer carriers arranged in series in multiple movement directions, which moves vertically between That's what I did. The wafer carrier is supplied onto the wafer carrier and the supporting member of the transporting means by, for example, an overhead transporting device (for example, when it falls to the raised position), and the supporting member is driven by the driving means to the delivery place with the wafer transporting means. will be moved.

〔実施例〕〔Example〕

以下、本発明の実施例を図面をもとに説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明に係るウェハ及びウェハキャリヤの搬送
装置を示す平面図、第2図は第1図の■−■断面図、第
3図は上記装置と天井搬送装置との関係を示す説明図で
ある。
FIG. 1 is a plan view showing a wafer and wafer carrier transport device according to the present invention, FIG. 2 is a sectional view taken along the line ■-■ in FIG. 1, and FIG. 3 is an explanation showing the relationship between the above device and the ceiling transport device. It is a diagram.

第1図及び第2図から明らかなように、搬送装置は、断
面積が小さく高さの高い第1のカバー10におおわれて
いる。断面積が大きく高さの低い第2及び第3のカバー
30及び32は、測定系をおおうカバーである。
As is clear from FIGS. 1 and 2, the conveying device is covered with a first cover 10 having a small cross-sectional area and a high height. The second and third covers 30 and 32, which have a large cross-sectional area and a low height, are covers that cover the measurement system.

カバー10内には、第2図に示すように、ループ状のチ
ェーン12が三つのスプロケット14によシ張設され、
このチェーン12はモータ16によシ駆動されるように
なっている。またカバー10内にはガイドバー18が垂
直方向に配設され、その上に一対のスライダ20が上下
動可能に嵌合されておシ、両スライダ間にはウェハキャ
リヤ80を収容するためのトレイ22が三つ上下方向に
配設されている。各トレイ22はボックス形状を呈し、
複数の棚24を有するとともに、−側壁(第2図中左側
壁)及び天井壁は開放されている。
Inside the cover 10, as shown in FIG. 2, a loop-shaped chain 12 is stretched around three sprockets 14.
This chain 12 is adapted to be driven by a motor 16. A guide bar 18 is disposed vertically within the cover 10, on which a pair of sliders 20 are fitted so as to be movable up and down, and a tray for accommodating a wafer carrier 80 is provided between the sliders. 22 are arranged in the vertical direction. Each tray 22 has a box shape,
It has a plurality of shelves 24, and the negative side wall (left side wall in FIG. 2) and ceiling wall are open.

チェーン12の両端がトレイ22に結合されており、モ
ータ16でチェーン12を駆動することにより、トレイ
22が上下動するようになっている。モータ16、チェ
ーン12及びトレイ22等によシウエハキャリャ80の
搬送装置が構成されている。
Both ends of the chain 12 are connected to a tray 22, and by driving the chain 12 with a motor 16, the tray 22 is moved up and down. The motor 16, the chain 12, the tray 22, and the like constitute a conveying device for the wafer carrier 80.

上記カバー30及び32内の構造は全く同様であるので
、第2図をもとにその一方てついて説明する。カバー3
0内には、架台31上にXステージ34、Xステージ3
6及び2・θステージ38がとの頭序に載置されており
、その上方にはプローブガード4o及びプローブピン4
2が配置されている。両力バー30及び32間には、第
1図及び第2図から明らかなように、ガイドバー44及
びその−ヒを移動可能なスライダ46が配置され、スラ
イダ46にはウェハチャック48が固設されている。ス
ライダユニット18及び20はウェハキャリヤ22内の
ウェハ82を一枚づつ第2図中左方に運ぶものであシ、
ウェハ82は所定位置まで運ばれた後、図示しない旋回
ユニットによってプローブガード40と2・θステージ
38との間に運ばれる。スライダユニット18及び20
、不図示の旋回ユニット等によシ、ウェハキャリヤ80
のローディング装置が構成されている。
Since the structures inside the covers 30 and 32 are exactly the same, one of them will be explained based on FIG. 2. cover 3
0, an X stage 34 and an X stage 3 are mounted on a pedestal 31.
6 and 2.theta. stages 38 are placed in the head position, and above them are a probe guard 4o and a probe pin 4
2 is placed. As is clear from FIGS. 1 and 2, a slider 46 is disposed between the force bars 30 and 32 and is capable of moving a guide bar 44 and its parts, and a wafer chuck 48 is fixed to the slider 46. has been done. The slider units 18 and 20 carry the wafers 82 in the wafer carrier 22 one by one to the left in FIG.
After the wafer 82 is carried to a predetermined position, it is carried between the probe guard 40 and the 2.theta. stage 38 by a rotating unit (not shown). Slider units 18 and 20
, a wafer carrier 80 by a rotating unit (not shown), etc.
A loading device is configured.

なお、カバー10へのウェハキャリヤ80の供給及び排
除は、第3図に示すように、カバー10上端の開口11
を通して行なわれるようになっておシ、カバー開口11
への供給及びここからの排除は、天井に水平方向に張設
された駆動機構50から垂直方向に上下動可能に垂れ下
がったチャック52によって行なわれる。
The wafer carrier 80 is supplied to and removed from the cover 10 through the opening 11 at the upper end of the cover 10, as shown in FIG.
Through the cover opening 11
The supply and removal from there is performed by a chuck 52 that hangs vertically movably from a drive mechanism 50 that is horizontally extended from the ceiling.

次に本実施例の作用、効果てついて説明する。Next, the functions and effects of this embodiment will be explained.

天井搬送装置50.52によってウェハキャリヤ80が
カバー10の上方開口11からトレイ22内に供給され
ると、モータ16が駆動し、チェーン12を介してトレ
イ22を下降させる。トレイ22は、スライダユニット
1日及び20と同一高さとなるまで下降され、次にスラ
イダ46を前進させてウェハキャリヤ80内のウェハ8
2を一枚づつウェハチャック48上に載せ、ウェハキャ
リヤ80を僅かに降下させる。その後ウェハ82を支持
したウェハチャック48は所定位置まで後退し、この地
点でウェハ82は旋回ユニットに受は渡され、旋回ユニ
ット等によってプローブガード40とZ・θステージ3
8との間に設置される。ウェハ82は、Xステージ34
、Xステージ36及び2・θステージ38の何れかを駆
動することによって所定状態に位置決めされ、プローブ
ピン42をチップの端子に接触させて所定の検査が行な
われる。
When the wafer carrier 80 is fed into the tray 22 through the upper opening 11 of the cover 10 by the ceiling transport device 50, 52, the motor 16 is driven and the tray 22 is lowered via the chain 12. The tray 22 is lowered until it is flush with the slider units 1 and 20, and then the slider 46 is advanced to load the wafers 8 in the wafer carrier 80.
2 is placed on the wafer chuck 48 one by one, and the wafer carrier 80 is lowered slightly. Thereafter, the wafer chuck 48 that supported the wafer 82 retreats to a predetermined position, and at this point the wafer 82 is transferred to the rotating unit, which moves the probe guard 40 and the Z/θ stage 3.
It will be installed between 8 and 8. The wafer 82 is placed on the X stage 34
, the X stage 36, and the 2.theta. stage 38, the chip is positioned in a predetermined state, and a predetermined test is performed by bringing the probe pins 42 into contact with the terminals of the chip.

検査が終了すると、ウェハ82は上述したのとは反対の
過程を経てウェハキャリヤ80内の元の位置に戻され、
他のウェハ82についても同様の手順が繰シ返される。
Once the inspection is complete, the wafer 82 is returned to its original position within the wafer carrier 80 through a process reverse to that described above.
The same procedure is repeated for other wafers 82 as well.

こうしてすべてのウェハ82の検査が終了すると、ウェ
ハキャリヤ80は、前述したのとは逆の過程を経てカバ
ー10の上方開口11から排除されることとなる。
When all the wafers 82 have been inspected in this manner, the wafer carrier 80 is removed from the upper opening 11 of the cover 10 through a process reverse to that described above.

以上の通り、ウェハキャリヤ80の搬送を垂直方向に延
びる搬送手段で行なうようにしたので、当該搬送手段が
占める床面積が大幅に減少する(従来においては、第1
図中二点鎖線で示すように水平方向に延びる搬送手段9
0を使用しておシ、そのために搬送手段が大きな床面積
を占めていた)。また、ウェハキャリヤ用搬送手段を垂
直方向に配設してその上方開口11からウェハキャリヤ
80の供給及び排出を行なうようにしたので、天井搬送
されてまたウェハキャリヤ80を天井搬送装置と垂直方
向の搬送装置との間でスムーズに受は渡しできる。これ
に対して、例えウェハキャリヤの搬送手段を垂直方向に
配置しても、ウェハキャリヤをカバー10の側方から出
し入れするようにしたのでは、この搬送手段と天井搬送
装置との間でウェハキャリヤをスムーズに受は渡しでき
るとは言い難い。
As described above, since the wafer carrier 80 is transported by the transport means extending in the vertical direction, the floor space occupied by the transport means is significantly reduced (in the past, the wafer carrier 80 was
Conveying means 9 extending in the horizontal direction as shown by the two-dot chain line in the figure
0, the transport means therefore occupied a large amount of floor space). Further, since the wafer carrier transport means is vertically disposed and the wafer carriers 80 are supplied and discharged from the upper opening 11, the wafer carriers 80 are transported to the ceiling and the wafer carriers 80 are vertically connected to the ceiling transport device. It can be smoothly transferred to and from the conveyor. On the other hand, even if the wafer carrier transport means is arranged vertically, if the wafer carrier is taken in and taken out from the side of the cover 10, the wafer carrier cannot be moved between the transport means and the ceiling transport device. It is difficult to say that receiving and passing can be done smoothly.

さらに、ウェハの搬送手段の両側にウェハの検査装置を
配置したので、検査の効率が向上する。即ち、一方の検
査装置でウェハ82を検査している間に、搬送装置で他
方の検査装置に次のウェハを運び、他方の検査装置でウ
ェハを検査中に、上記一方の検査装置で検査の終了した
ウェハを搬送手段でウェハキャリヤ80内に戻せば良い
Furthermore, since the wafer inspection devices are arranged on both sides of the wafer transport means, inspection efficiency is improved. That is, while one inspection device is inspecting the wafer 82, the transfer device carries the next wafer to the other inspection device, and while the other inspection device is inspecting the wafer, the one inspection device is inspecting the next wafer. The completed wafer may be returned to the wafer carrier 80 using a transport means.

なお、上述したのは本発明の一実施例にすぎず、本発明
はこの他にもその趣旨を損ねない範囲内で適宜変更、改
良が可能であることは勿論でちる。例えば、ウェハキャ
リヤの搬送手段の細部構造については、必要に応じて変
形を加えることができる。
It should be noted that what has been described above is only one embodiment of the present invention, and it goes without saying that the present invention can be modified and improved in other ways without departing from the spirit thereof. For example, the detailed structure of the wafer carrier transport means can be modified as necessary.

〔発明の効果〕〔Effect of the invention〕

以上述べてきたように、本発明によれば、ウェハキャリ
ヤの搬送手段を全体として垂直方向に配置したので、こ
の搬送手段を配置するために要する床面積を小さくでき
る。これに伴ない、搬送手段へのウェハキャリヤの供給
及び排出をその上方から行なうようになり、天井搬送の
インライン化の要求に応えることができる効果が奏され
ることとなる。
As described above, according to the present invention, since the conveying means for the wafer carrier is arranged in the vertical direction as a whole, the floor area required for arranging the conveying means can be reduced. Along with this, wafer carriers are now supplied to and discharged from the transport means from above, and the effect of meeting the demand for in-line ceiling transport is achieved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係るウェハ及びウェハキャリヤの搬送
装置の実施例を示す平面図、第2図は第1図における■
−■断面図、第3図は搬送装置と天井搬送装置との関係
を示す説明図である。 〔主要部分の符号の説明〕 12.14.16・・・駆動手段、22・・・支筒材、
80・・・ウェハキャリヤ、    82・・・ウェハ
FIG. 1 is a plan view showing an embodiment of the wafer and wafer carrier transport device according to the present invention, and FIG.
-■ sectional view and FIG. 3 are explanatory diagrams showing the relationship between the conveyance device and the ceiling conveyance device. [Explanation of symbols of main parts] 12.14.16... Drive means, 22... Support material,
80...Wafer carrier, 82...Wafer.

Claims (1)

【特許請求の範囲】  各々に複数枚のウェハが収容された少なくとも二つの
ウェハキャリヤをウェハキャリヤ搬送手段によつて所定
位置まで搬送し、該所定位置まで搬送されたウェハキャ
リヤからウェハを一枚づつ取り出してウェハ処理装置ま
で搬送するウェハ搬送手段とを含むウェハ及びウェハキ
ャリヤの搬送装置において、 前記ウェハキャリヤ搬送手段は、上昇位置 と下降位置との間を垂直方向に移動可能で移動方向に直
列的に配置された複数のウェハキャリヤ支持部材と、該
ウェハキャリヤを垂直方向に駆動する駆動手段とを含む
ことを特徴とするウェハ及びウェハキャリヤの搬送装置
[Claims] At least two wafer carriers each containing a plurality of wafers are transported to a predetermined position by a wafer carrier transport means, and wafers are transferred one by one from the wafer carriers transported to the predetermined position. A wafer and wafer carrier transport device including a wafer transport means for taking out and transporting the wafer to a wafer processing device, wherein the wafer carrier transport means is vertically movable between a raised position and a lowered position and is arranged in series in the moving direction. 1. A wafer and wafer carrier conveying device comprising: a plurality of wafer carrier support members arranged in a vertical direction; and a driving means for driving the wafer carrier in a vertical direction.
JP61168048A 1986-07-18 1986-07-18 Conveying apparatus of wafer and wafer carrier Pending JPS6325945A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61168048A JPS6325945A (en) 1986-07-18 1986-07-18 Conveying apparatus of wafer and wafer carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61168048A JPS6325945A (en) 1986-07-18 1986-07-18 Conveying apparatus of wafer and wafer carrier

Publications (1)

Publication Number Publication Date
JPS6325945A true JPS6325945A (en) 1988-02-03

Family

ID=15860861

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61168048A Pending JPS6325945A (en) 1986-07-18 1986-07-18 Conveying apparatus of wafer and wafer carrier

Country Status (1)

Country Link
JP (1) JPS6325945A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003101285A (en) * 2001-09-25 2003-04-04 Yamagata Casio Co Ltd Tray parts supplying device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59117130A (en) * 1982-12-24 1984-07-06 Hitachi Ltd Loading unloading apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59117130A (en) * 1982-12-24 1984-07-06 Hitachi Ltd Loading unloading apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003101285A (en) * 2001-09-25 2003-04-04 Yamagata Casio Co Ltd Tray parts supplying device
JP4532038B2 (en) * 2001-09-25 2010-08-25 山形カシオ株式会社 Tray parts supply device

Similar Documents

Publication Publication Date Title
KR101716524B1 (en) Substrate container storage system
EP1159214B1 (en) In/out load port transfer mechanism
KR940001150B1 (en) Semiconductor wafer transfer system
KR101475662B1 (en) Overhead hoist transport vehicle with overhead hoist
US20020031421A1 (en) Substrate arranging apparatus and method
KR100215227B1 (en) Transfer apparatus
KR20020010640A (en) System for manufacturing semiconductor products
KR20190122147A (en) Transfer mechanism
JP4100585B2 (en) Pod supply device in semiconductor manufacturing equipment
JPS6325945A (en) Conveying apparatus of wafer and wafer carrier
JPH07263521A (en) Apparatus and method for transferring wafer, and method of fabricating semiconductor device
KR102700084B1 (en) Gripper device, return vehicle, and return method
JP2000353735A (en) Equipment for producing semiconductor product
US6688840B2 (en) Transport apparatus and method
JP3483842B2 (en) Wafer cleaning apparatus and wafer cleaning method
JP2002255315A (en) Tray accommodation device
JP3205525B2 (en) Substrate unloading device, loading device and unloading and loading device
KR100220817B1 (en) A cvd apparatus
JPS6331133A (en) Wafer carrier system
JPH0936196A (en) Product feeding mechanism in clean room
JPH02213633A (en) Clean room equipment
JP3313975B2 (en) Substrate inspection apparatus and inspection method, and substrate processing apparatus
JPH0810723B2 (en) Wafer or wafer carrier transfer device
JPS62277743A (en) Conveyor for wafer
JPS6386448A (en) Transfer apparatus of semiconductor wafer