JPS6321850B2 - - Google Patents

Info

Publication number
JPS6321850B2
JPS6321850B2 JP12887780A JP12887780A JPS6321850B2 JP S6321850 B2 JPS6321850 B2 JP S6321850B2 JP 12887780 A JP12887780 A JP 12887780A JP 12887780 A JP12887780 A JP 12887780A JP S6321850 B2 JPS6321850 B2 JP S6321850B2
Authority
JP
Japan
Prior art keywords
light
interference filter
light source
interference
predetermined
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP12887780A
Other languages
Japanese (ja)
Other versions
JPS5753644A (en
Inventor
Masahiko Sakurada
Takayuki Aihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP12887780A priority Critical patent/JPS5753644A/en
Publication of JPS5753644A publication Critical patent/JPS5753644A/en
Publication of JPS6321850B2 publication Critical patent/JPS6321850B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255Details, e.g. use of specially adapted sources, lighting or optical systems

Description

【発明の詳細な説明】 本発明はおもに自動分析装置に用いる種々の測
定項目に応じた被検液に種々の波長の光を選択的
に照射し、被検液の吸光度を測定することにより
被検液の反応状態を測定する複数波長を用いる測
光装置に関するものである。
Detailed Description of the Invention The present invention mainly involves selectively irradiating light of various wavelengths to test liquids according to various measurement items used in automatic analyzers, and measuring the absorbance of the test liquids. The present invention relates to a photometric device that uses multiple wavelengths to measure the reaction state of a test liquid.

このような測光装置としては従来種々の装置が
提案されているが、一例として第1図に示すよう
な装置が知られている。この装置はランプハウス
1内に光源2を収容し、この光源2からの光を平
行光束にするためのレンズ3をランプハウス1に
設け、レンズ3からの平行光束を所定の波長の光
束に選定するため、この平行光束の光路上に干渉
フイルタ4を設置してある。干渉フイルタ4を保
持する干渉フイルタ保持部材5には種々の波長の
光束を通過させるための複数種の干渉フイルタ4
を設ける。この干渉フイルタ保持部材5は回動軸
6を駆動装置7に連結し、この駆動装置7の作動
により干渉フイルタ保持部材5を回動させ、所定
の干渉フイルタ4をレンズ3からの光束の光路上
に配置することができる。この所定の干渉フイル
タ4を配置する位置の下方に反射鏡を取付けた反
射器8を設ける。反射器8は駆動装置9に回動駆
動し得るように取付けてあるため、干渉フイルタ
4を通過した光束を所定方向に導くことができ
る。駆動装置9の回動軸を中心とする円の円周上
を移動する図示してないターンテーブル上に配置
した反応管10内には被検液11を収容し、ター
ンテーブル上に複数個設定した測光位置に、反射
器8により反射された光束を反応管10に照射す
るためのレンズ12と反応管10内に照射された
光の吸光度を測定するための受光素子13とをそ
れぞれ設置する。この装置はこの構成により、光
源2から発した光をレンズ3、干渉フイルタ4、
反射器8、レンズ12を介して反応管10内に収
容した被検液11に照射し、受光素子13にこの
光を受光することにより被検液11の吸光度を測
定し、被検液の反応状態を調べるものである。
Various types of photometric devices have been proposed in the past, and one known example is the device shown in FIG. 1. This device houses a light source 2 in a lamp house 1, and a lens 3 for converting the light from the light source 2 into a parallel beam is provided in the lamp house 1, and the parallel beam from the lens 3 is selected as a beam of a predetermined wavelength. Therefore, an interference filter 4 is installed on the optical path of this parallel light beam. The interference filter holding member 5 that holds the interference filter 4 includes a plurality of types of interference filters 4 for passing light beams of various wavelengths.
will be established. This interference filter holding member 5 has a rotating shaft 6 connected to a driving device 7, and the operation of this driving device 7 rotates the interference filter holding member 5, so that a predetermined interference filter 4 is placed on the optical path of the light beam from the lens 3. can be placed in A reflector 8 with a reflecting mirror attached thereto is provided below the position where this predetermined interference filter 4 is arranged. Since the reflector 8 is rotatably attached to the drive device 9, it can guide the light beam that has passed through the interference filter 4 in a predetermined direction. A test liquid 11 is contained in a reaction tube 10 placed on a turntable (not shown) that moves on the circumference of a circle centered on the rotation axis of the drive device 9, and a plurality of test liquids 11 are set on the turntable. A lens 12 for irradiating the reaction tube 10 with the light beam reflected by the reflector 8 and a light receiving element 13 for measuring the absorbance of the light irradiated into the reaction tube 10 are installed at the photometry positions. With this configuration, this device passes the light emitted from the light source 2 through the lens 3, interference filter 4,
The test liquid 11 contained in the reaction tube 10 is irradiated through the reflector 8 and the lens 12, and the light is received by the light receiving element 13 to measure the absorbance of the test liquid 11 and detect the reaction of the test liquid. This is to check the condition.

ところで光の波長を設定する干渉フイルタはそ
の通過させる波長によつては測光開始初期時に特
性が変化し、受光素子の出力が変化する場合があ
る。第2図はその一例を示す図である。この例は
光の波長340nmの干渉フイルタを用いた場合であ
り、図示から明らかなように測光開始から1分経
過する間の受光素子の出力電圧はかなり変化して
おり、その後はほぼ一定の電圧に保たれている。
この測光開始初期の出力電圧の変化の原因はいく
つか考えられるが、その一つには温度の影響が考
えられる。第3図は測光を開始してからの受光素
子の出力の変化と干渉フイルタの温度の変化とを
比較して示したものである。図示のように干渉フ
イルタの温度が上昇し一定の温度に安定するまで
の間に、受光素子の出力は大きく変化し、干渉フ
イルタの温度が一定の温度で安定すると受光素子
の出力もほぼ一定の出力で安定する。
By the way, the characteristics of an interference filter that sets the wavelength of light may change at the initial stage of photometry depending on the wavelength to be passed, and the output of the light receiving element may change. FIG. 2 is a diagram showing an example thereof. This example uses an interference filter with a light wavelength of 340 nm, and as is clear from the diagram, the output voltage of the photodetector changes considerably during the first minute from the start of photometry, and after that, the voltage remains almost constant. is maintained.
There are several possible causes for this change in output voltage at the beginning of photometry, one of which is considered to be the influence of temperature. FIG. 3 shows a comparison of changes in the output of the light receiving element and changes in the temperature of the interference filter after the start of photometry. As shown in the figure, while the temperature of the interference filter rises and stabilizes at a constant temperature, the output of the light receiving element changes greatly. When the temperature of the interference filter stabilizes at a constant temperature, the output of the light receiving element also remains almost constant. Stable at output.

前述した第1図の装置の場合にも種々の波長の
干渉フイルタを取換えて測光を行ない、被検液の
多項目の分析を行なうので、それまで用いていな
かつた干渉フイルタに測光する光束を通す際に、
測光開始初期の出力の変化が大きく、特に干渉フ
イルタを短時間で切換えて種々の測定項目にわた
るデータを取る場合にはこの出力変化により測定
結果に大きな影響を受け、正確な測定結果を得る
ことはできなかつた。
In the case of the device shown in Fig. 1 mentioned above, photometry is performed by replacing the interference filters of various wavelengths, and multi-item analysis of the test liquid is performed. When passing,
There is a large change in the output at the beginning of photometry, and especially when changing the interference filter in a short period of time to collect data for various measurement items, this output change has a large effect on the measurement results, making it difficult to obtain accurate measurement results. I couldn't do it.

本発明の目的はこの欠点を解決し、干渉フイル
タの特性変化の少ない複数波長を用いる測光装置
を得ることである。
An object of the present invention is to solve this drawback and provide a photometric device that uses a plurality of wavelengths with little change in the characteristics of an interference filter.

この目的を達成するため本発明の複数波長を用
いる測光装置は光源と、この光源からの光を選択
的に通過させる複数個の干渉フイルタと、この干
渉フイルタに光源からの光を導くための第1の光
学部材と、前記複数個の干渉フイルタの中の所定
の干渉フイルタを通過した光を所定の試料に導く
ための第2の光学部材と、前記第1の光学部材と
前記第2の光学部材とにより形成される光学通路
に前記所定の干渉フイルタを配置するための手段
とを有する光度計において前記第1の光学部材が
前記複数個の干渉フイルタのすべてに常時前記光
源からの光を導くようにしたことを特徴とするも
のである。
To achieve this purpose, the photometric device using multiple wavelengths of the present invention includes a light source, a plurality of interference filters that selectively pass the light from the light source, and a plurality of interference filters that guide the light from the light source to the interference filters. 1 optical member, a second optical member for guiding light that has passed through a predetermined interference filter among the plurality of interference filters to a predetermined sample, and the first optical member and the second optical member. and means for arranging the predetermined interference filter in an optical path formed by the first optical member, wherein the first optical member constantly guides light from the light source to all of the plurality of interference filters. It is characterized by the following.

以下に第4,5,6図を参照して本発明の実施
例を詳述する。第4図は本発明の実施の一例を示
す図である。第4図において20はランプハウス
であり、内部に光源21を収容し、光源21を中
心とするランプハウスの周壁に光学フアイバによ
るライトガイド22の一端を取付け、ライトガイ
ド22の他端を干渉フイルタ保持部材23に環状
に複数個設けた干渉フイルタ24の上方に配設す
る。ライトガイド22の数は干渉フイルタ24の
数と同数設け、各干渉フイルタ24にそれぞれ一
個ずつのライトガイド22を配置する。これによ
り干渉フイルタ24の全部に常時光源21の光が
導かれることになる。干渉フイルタ保持部材23
は静置して固定し、干渉フイルタ保持部材の下部
に設けた回動軸に回転部材25を回動自在に枢着
する。この回転部材25の円周に歯車溝を形成
し、モータ26の回動軸に取付けた歯車27を回
転部材25の円周の歯車溝に掛合させ、モータ2
6により回転部材25を駆動し得るようにする。
回転部材25に設けたクランクフアイバーから成
る一個のライトガイド28は一端を干渉フイルタ
24を通過した光を受光する位置に配置し、他端
を回転部材25の回転中心の位置で回転部材25
の下面から突出させる。この突出端の下方にプリ
ズム29を取付けたプリズム台30を設け、この
プリズム台をモータ31の回転軸に枢着し、モー
タ31により回転駆動し得るようにする。ライト
ガイド28を通り、プリズム29により方向変換
された光束の光路にレンズ32,33を設置し、
これらのレンズを通過した光束の光路に被検液3
4を収容した反応管35を配置し、この反応管3
5を通過した光を受光するため反応容器35の後
方に受光素子36を設け、この受光素子36によ
り受光した光を光電変換し、電気信号として処理
する。なお反応管35は図示してないターンテー
ブル上に配置したものであり、このターンテーブ
ルはプリズム29の回動軸を中心とする円の円周
上にある。ターンテーブル上には複数個測光位置
を設定し、これらの測光位置に対してそれぞれレ
ンズ32,33および受光素子36を設け、モー
タ31を介してプリズムを回転させこれらの測光
位置の内の所定の測光位置へ光束を導く、このモ
ータ31の回転制御は図示してない制御装置によ
り行なう。またモータ26により回転部材25を
回転させライトガイド28の入射端を所定の干渉
フイルタ24の下方に停止させるためのモータ2
6の駆動制御も図示してない制御装置により行な
う。
Embodiments of the present invention will be described in detail below with reference to FIGS. 4, 5, and 6. FIG. 4 is a diagram showing an example of implementation of the present invention. In FIG. 4, reference numeral 20 denotes a lamp house, which houses a light source 21 therein. One end of a light guide 22 made of an optical fiber is attached to the peripheral wall of the lamp house with the light source 21 in the center, and the other end of the light guide 22 is connected to an interference filter. It is arranged above a plurality of interference filters 24 provided annularly on the holding member 23. The number of light guides 22 is the same as the number of interference filters 24, and one light guide 22 is arranged for each interference filter 24. As a result, the light from the light source 21 is constantly guided to the entire interference filter 24. Interference filter holding member 23
is fixed in a stationary state, and the rotating member 25 is rotatably pivoted to a rotating shaft provided at the lower part of the interference filter holding member. A gear groove is formed on the circumference of the rotating member 25, and a gear 27 attached to the rotating shaft of the motor 26 is engaged with the gear groove on the circumference of the rotating member 25.
6 so that the rotating member 25 can be driven.
One light guide 28 made of a crank fiber provided on the rotating member 25 has one end placed at a position to receive the light that has passed through the interference filter 24 , and the other end located at the center of rotation of the rotating member 25 .
protrude from the bottom of the A prism stand 30 to which the prism 29 is attached is provided below this projecting end, and this prism stand is pivotally connected to the rotating shaft of a motor 31 so that it can be rotationally driven by the motor 31. Lenses 32 and 33 are installed in the optical path of the light beam that passes through the light guide 28 and whose direction is changed by the prism 29,
The test liquid 3 is placed in the optical path of the light beam that has passed through these lenses.
A reaction tube 35 containing 4 is arranged, and this reaction tube 3
A light receiving element 36 is provided behind the reaction vessel 35 in order to receive the light that has passed through the reaction vessel 35, and the light received by the light receiving element 36 is photoelectrically converted and processed as an electrical signal. The reaction tube 35 is placed on a turntable (not shown), and this turntable is located on the circumference of a circle centered on the rotation axis of the prism 29. A plurality of photometric positions are set on the turntable, lenses 32 and 33 and a light receiving element 36 are provided for each of these photometric positions, and a prism is rotated via a motor 31 to select a predetermined one of these photometric positions. The rotation of the motor 31, which guides the light beam to the photometry position, is controlled by a control device (not shown). Also, a motor 26 is used to rotate the rotating member 25 and stop the incident end of the light guide 28 below a predetermined interference filter 24.
6 is also controlled by a control device (not shown).

この装置はこのような構成により光源21の光
をライトガイド22を介して各干渉フイルタ24
に照射し、所定の干渉フイルタ24を通過した光
をライトガイド28によりプリズム29に導き、
このプリズム29から所定の測光位置の方向に光
束を方向変換し、レンズ32,33を介して被検
液34を収容した反応管35に光束を照射し、こ
の反応管35を通過した光を受光素子36により
受光して光電変換して処理し、被検液の吸光度を
測定し、被検液の反応状態を調べることのできる
ものである。
With this configuration, this device passes the light from the light source 21 through the light guide 22 to each interference filter 24.
The light that has passed through a predetermined interference filter 24 is guided to a prism 29 by a light guide 28,
The direction of the light flux is changed from this prism 29 in the direction of a predetermined photometry position, and the light flux is irradiated via lenses 32 and 33 to a reaction tube 35 containing a test liquid 34, and the light that has passed through this reaction tube 35 is received. The element 36 receives light, photoelectrically converts it, processes it, measures the absorbance of the test liquid, and can investigate the reaction state of the test liquid.

この装置は光源21の光をライトガイド22を
介して干渉フイルタ24のすべてに常時光を照射
するので、測光に使用する干渉フイルタの特性変
化を起すことなく安定したデータを得ることがで
きる。
Since this device constantly irradiates all of the interference filters 24 with light from a light source 21 via a light guide 22, stable data can be obtained without changing the characteristics of the interference filters used for photometry.

第5図は第4図の実施例のライトガイド22の
変わりにレンズ38およびプリズム39を設け、
ライトガイド22の変わりにプリズム40,41
を設けたものであり、他の構成は第4図の実施例
と同様に構成した。この測光装置でも第4図の実
施例と同様の効果が得られる。
In FIG. 5, a lens 38 and a prism 39 are provided in place of the light guide 22 in the embodiment shown in FIG.
Prisms 40 and 41 instead of light guide 22
The rest of the structure was the same as that of the embodiment shown in FIG. With this photometric device, the same effects as in the embodiment shown in FIG. 4 can be obtained.

第6図は本発明の測光装置のさらに他の実施例
を示す図であり、この装置は光源21の光をレン
ズ43および反射鏡44を介して干渉フイルタ2
4に導き、所定の干渉フイルタ24の下方に直接
プリズム29を設け、干渉フイルタ保持部材23
をモータ26の軸に取付け、図示してない制御装
置によるモータ26の駆動により所定の干渉フイ
ルタ24をプリズム29の上方の所定位置まで回
動させ、停止させることができるようにしたもの
である。なおランプハウス20および反射鏡44
も干渉フイルタ保持部材23に一体に取付け、干
渉フイルタ保持部材23とともに回動移動し得る
ように構成することによりフイルタ24に常時光
源21の光を照射することができる。
FIG. 6 is a diagram showing still another embodiment of the photometric device of the present invention, in which light from a light source 21 is passed through a lens 43 and a reflecting mirror 44 to an interference filter 2.
4, a prism 29 is provided directly below a predetermined interference filter 24, and the interference filter holding member 23
is attached to the shaft of a motor 26, and a predetermined interference filter 24 can be rotated to a predetermined position above the prism 29 and stopped by driving the motor 26 by a control device (not shown). In addition, the lamp house 20 and the reflecting mirror 44
The filter 24 can be constantly irradiated with light from the light source 21 by being integrally attached to the interference filter holding member 23 and configured to be able to rotate together with the interference filter holding member 23.

このように構成した本発明の複数波長を用いる
測光装置は干渉フイルタに常時光を照射している
ため干渉フイルタを切り換えて種々の項目の測定
を行なう時にも干渉フイルタが測光開始時におけ
る特性変化を起さないので安定した正確なデータ
を得ることができる測光装置である。
In the photometry device of the present invention configured in this way, which uses multiple wavelengths, the interference filter is constantly irradiated with light, so even when changing the interference filter to measure various items, the interference filter does not detect the change in characteristics at the start of photometry. This is a photometric device that can obtain stable and accurate data because it does not cause any noise.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の測光装置の構成を略図的に示し
た線図、第2図は測光開始時における受光素子の
出力の変化を示す特性線図、第3図は測光開始時
における受光素子の出力の変化と干渉フイルタの
温度変化とを比較して示した特性線図、第4図は
本発明の測光装置の実施例の構成を示す線図、第
5図は本発明の測光装置の他の実施例の構成を示
す線図、第6図は本発明の測光装置のされに他の
実施例の構成を示す線図である。 1……ランプハウス、2……光源、3……レン
ズ、4……干渉フイルタ、5……干渉フイルタ保
持部材、6……回動軸、7……駆動装置、8……
反射器、9……駆動装置、10……反応管、11
……被検液、12……レンズ、13……受光素
子、20……ランプハウス、21……光源、22
……ライトガイド、23……干渉フイルタ保持部
材、24……干渉フイルタ、25……回転部材、
26……モータ、27……歯車、28……ライト
ガイド、29……プリズム、30……プリズム
台、31……モータ、32,33……レンズ、3
4……被検液、35……反応管、36……受光素
子、38……レンズ、39,40,41……プリ
ズム、43……レンズ、44……反射鏡。
Fig. 1 is a diagram schematically showing the configuration of a conventional photometry device, Fig. 2 is a characteristic diagram showing changes in the output of the photodetector at the start of photometry, and Fig. 3 is a diagram showing the changes in the output of the photodetector at the start of photometry. A characteristic diagram showing a comparison between changes in output and changes in temperature of the interference filter, FIG. 4 is a diagram showing the configuration of an embodiment of the photometric device of the present invention, and FIG. 5 is a diagram showing the configuration of an embodiment of the photometric device of the present invention. FIG. 6 is a diagram showing the configuration of another embodiment of the photometric device of the present invention. DESCRIPTION OF SYMBOLS 1... Lamp house, 2... Light source, 3... Lens, 4... Interference filter, 5... Interference filter holding member, 6... Rotation shaft, 7... Drive device, 8...
Reflector, 9... Drive device, 10... Reaction tube, 11
... Test liquid, 12 ... Lens, 13 ... Light receiving element, 20 ... Lamp house, 21 ... Light source, 22
... Light guide, 23 ... Interference filter holding member, 24 ... Interference filter, 25 ... Rotating member,
26... Motor, 27... Gear, 28... Light guide, 29... Prism, 30... Prism stand, 31... Motor, 32, 33... Lens, 3
4... Test liquid, 35... Reaction tube, 36... Light receiving element, 38... Lens, 39, 40, 41... Prism, 43... Lens, 44... Reflecting mirror.

Claims (1)

【特許請求の範囲】[Claims] 1 光源と、この光源からの光を選択的に通過さ
せる複数個の干渉フイルタとこの干渉フイルタに
光源からの光を導くための第1の光学部材と、前
記複数個の干渉フイルタの中の所定の干渉フイル
タを通過した光を所定の試料に導くための第2の
光学部材と、前記第1の光学部材と前記第2の光
学部材とにより形成される光学通路に前記所定の
干渉フイルタを配置するための手段とを有する光
度計において前記第1の光学部材が前記複数個の
干渉フイルタのすべてに常時前記光源からの光を
導くようにしたことを特徴とする複数波長を用い
る測光装置。
1. A light source, a plurality of interference filters that selectively pass the light from the light source, a first optical member for guiding the light from the light source to the interference filters, and a predetermined member among the plurality of interference filters. a second optical member for guiding the light that has passed through the interference filter to a predetermined sample, and the predetermined interference filter is arranged in an optical path formed by the first optical member and the second optical member. A photometer using a plurality of wavelengths, characterized in that the first optical member always guides light from the light source to all of the plurality of interference filters.
JP12887780A 1980-09-17 1980-09-17 Photometric device using more than one wavelength Granted JPS5753644A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12887780A JPS5753644A (en) 1980-09-17 1980-09-17 Photometric device using more than one wavelength

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12887780A JPS5753644A (en) 1980-09-17 1980-09-17 Photometric device using more than one wavelength

Publications (2)

Publication Number Publication Date
JPS5753644A JPS5753644A (en) 1982-03-30
JPS6321850B2 true JPS6321850B2 (en) 1988-05-09

Family

ID=14995558

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12887780A Granted JPS5753644A (en) 1980-09-17 1980-09-17 Photometric device using more than one wavelength

Country Status (1)

Country Link
JP (1) JPS5753644A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5961760A (en) * 1982-09-30 1984-04-09 Shimadzu Corp Luminous intensity meter
DE3923831A1 (en) * 1989-07-19 1991-01-31 Hartmann & Braun Ag INTERFEROMETRIC DEVICE
DE3925692C1 (en) * 1989-08-03 1990-08-23 Hartmann & Braun Ag, 6000 Frankfurt, De

Also Published As

Publication number Publication date
JPS5753644A (en) 1982-03-30

Similar Documents

Publication Publication Date Title
SU961570A3 (en) High-speed spectroanalyzer
EP0146781B1 (en) Photometric apparatus with multi-wavelength excitation
US5204922A (en) Optical signal channel selector
US4685801A (en) Apparatus for absorptiometric analysis
US4082464A (en) Optical analysis system having rotating filters
US3966322A (en) Device for use in producing a scanning beam of radiation and apparatus for use in investigating specimens
JP4791625B2 (en) Spectrophotometric / turbidimetric detection unit
US4264205A (en) Rapid scan spectral analysis system utilizing higher order spectral reflections of holographic diffraction gratings
JPH0810189B2 (en) Detector assembly
EP0274403A2 (en) Light absorption analyser
JP2004354397A (en) Fluorophotometer
EP0164680A2 (en) Integrated photometric microscope system
JPH04503864A (en) Multichannel optical monitor system
JPH03202754A (en) Atomic absorption spectrophotometer for simultaneous analysis of many elements and simultaneous analysis method of many elements
US4950077A (en) Photoelectric measuring apparatus for use in automatic analyzer
JPS605895B2 (en) Sample inspection device
JPH052931B2 (en)
JPS6147373B2 (en)
JPS6321850B2 (en)
JPS59184844A (en) Photometer for fluorescent light and scattered light
CN104316629A (en) Liquid phase multi-channel detector device
JPS6135506B2 (en)
US3982838A (en) Compact fast analyzer of rotary cuvette type
JP2000304694A (en) Method and apparatus for grading of tea leaf
GB2046901A (en) Measurement of blood bilirubin concentration