JPS63199055U - - Google Patents

Info

Publication number
JPS63199055U
JPS63199055U JP9083187U JP9083187U JPS63199055U JP S63199055 U JPS63199055 U JP S63199055U JP 9083187 U JP9083187 U JP 9083187U JP 9083187 U JP9083187 U JP 9083187U JP S63199055 U JPS63199055 U JP S63199055U
Authority
JP
Japan
Prior art keywords
light
particle
group
moving
particles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9083187U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9083187U priority Critical patent/JPS63199055U/ja
Publication of JPS63199055U publication Critical patent/JPS63199055U/ja
Pending legal-status Critical Current

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Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
JP9083187U 1987-06-15 1987-06-15 Pending JPS63199055U (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9083187U JPS63199055U (fr) 1987-06-15 1987-06-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9083187U JPS63199055U (fr) 1987-06-15 1987-06-15

Publications (1)

Publication Number Publication Date
JPS63199055U true JPS63199055U (fr) 1988-12-21

Family

ID=30951060

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9083187U Pending JPS63199055U (fr) 1987-06-15 1987-06-15

Country Status (1)

Country Link
JP (1) JPS63199055U (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220141405A (ko) * 2021-04-13 2022-10-20 서강대학교산학협력단 입자의 밀도 측정 장치 및 방법

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6114542A (ja) * 1984-06-30 1986-01-22 Toshiba Corp 粒径測定装置
JPS61134644A (ja) * 1984-12-06 1986-06-21 Toshiba Corp 蒸気タ−ビンの蒸気監視装置
JPS6255545A (ja) * 1985-09-05 1987-03-11 Toshiba Corp 粒径測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6114542A (ja) * 1984-06-30 1986-01-22 Toshiba Corp 粒径測定装置
JPS61134644A (ja) * 1984-12-06 1986-06-21 Toshiba Corp 蒸気タ−ビンの蒸気監視装置
JPS6255545A (ja) * 1985-09-05 1987-03-11 Toshiba Corp 粒径測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220141405A (ko) * 2021-04-13 2022-10-20 서강대학교산학협력단 입자의 밀도 측정 장치 및 방법

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