JPS63198249A - Sem stereo-display device - Google Patents

Sem stereo-display device

Info

Publication number
JPS63198249A
JPS63198249A JP2964987A JP2964987A JPS63198249A JP S63198249 A JPS63198249 A JP S63198249A JP 2964987 A JP2964987 A JP 2964987A JP 2964987 A JP2964987 A JP 2964987A JP S63198249 A JPS63198249 A JP S63198249A
Authority
JP
Japan
Prior art keywords
light
detectors
crt
sample
filter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2964987A
Other languages
Japanese (ja)
Inventor
Junichiro Nakajima
中島 順一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP2964987A priority Critical patent/JPS63198249A/en
Publication of JPS63198249A publication Critical patent/JPS63198249A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain the stereo-display effect by alternately displaying signals from two detectors on a screen and repeating the transmission and cutoff of the light of filters for the right and left eyes synchronously with it. CONSTITUTION:The reflected electron intensity from two detectors 81, 82 arranged at a fixed angle is intensity-modulated via a detecting/amplifying system 11 and alternately displayed on a CRT 10. A filter cutting off or transmitting the light by the application of voltage is used as the lens of spectacles 14. For one screen scan on the CRT 10, the light is transmitted only through the right-side filter, for example, end for the next screen scan, the light is transmitted only through the left-side filter. Thereby, only the light transmitted through the filter synchronously with respective screens of the detectors 81, 82 enters the eyes. The detector 81, 82 are arranged at the angular arrangement corresponding to positions of the right and left eyes. Accordingly, the displayed image can obtain the stereo-effect.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は走査型電子顕微鏡(scanr+rng El
ectronprobe MiCrOanalyZer
、以下SEMと略す〉の表示装置に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention is applied to a scanning electron microscope (scanr+rng El
ectronprobe MiCrOanalyZer
, hereinafter abbreviated as SEM).

[従来の技術] SEMとは電子レンズ等を用いて細く絞った電子線を試
料の表面に照射し、電子線と試料との相互作用によって
その部分から放射される二次電子、反射電子、もしくは
試料への吸収電子、透過電子を検出して、試料の表面お
よび内部構造を観察する装置である。第2図は従来のS
EMの一例を示す原理的構成図である。図の左側部分は
照射系で装置内部は電子線を扱うため下部に取付けられ
た真空ポンプ1によって1O−5Torr程度の真空に
保たれている。フィラメント2およびウェネルト3で構
成された電子銃で発生した電子は陽極4で数十KeVに
加速され、集束レンズ5および対物レンズ6で細く絞ら
れて試料9に照射されるが、この電子線を試料15の所
望の位置に照射させるため電子線の走査コイル7が装着
されている。以上のように構成されたSEMの照射装置
を用いて試料の電子線像を得るには、試料上の一定の領
域をテレビのラスターのように電子線を掃引し、これと
同期して掃引しているCRT上のラスターの輝度を検出
器8によって検出された電子の強度で変調してやれば、
試料の表面の形状に応じた電子線像が得られる。電子線
の走査系は、電子線を試料面に走査する走査コイル7と
その電子走査回路9、これと同期して掃引しているCR
TIOおよび試料面からの情報を検出してCRTの輝度
を変調する検出増幅系11で構成されている。その他の
主な構成要素としてフィラメント2とウェネルト3の間
に高圧を発生させる高圧発生回路12、集束レンズ5お
よび対物レンズ6に電流を供給するレンズ励磁電源回路
13等が備えられている。
[Prior art] SEM is a system in which a finely focused electron beam is irradiated onto the surface of a sample using an electron lens, etc., and secondary electrons, reflected electrons, or This device detects absorbed electrons and transmitted electrons in a sample to observe the surface and internal structure of the sample. Figure 2 shows the conventional S
FIG. 2 is a theoretical configuration diagram showing an example of EM. The left side of the figure is an irradiation system, and the inside of the apparatus is kept at a vacuum of about 10-5 Torr by a vacuum pump 1 installed at the bottom to handle electron beams. Electrons generated by an electron gun composed of a filament 2 and Wehnelt 3 are accelerated to several tens of KeV by an anode 4, narrowed down by a focusing lens 5 and an objective lens 6, and irradiated onto a sample 9. An electron beam scanning coil 7 is attached to irradiate a desired position on the sample 15. To obtain an electron beam image of a sample using the SEM irradiation device configured as described above, the electron beam is swept over a certain area on the sample like a raster on a television, and the sweep is synchronous with this. If we modulate the brightness of the raster on the CRT with the intensity of the electrons detected by the detector 8, we get
An electron beam image corresponding to the shape of the sample surface can be obtained. The electron beam scanning system consists of a scanning coil 7 that scans the electron beam onto the sample surface, its electronic scanning circuit 9, and a CR that sweeps in synchronization with the scanning coil 7.
It consists of a detection amplification system 11 that detects information from the TIO and the sample surface and modulates the brightness of the CRT. Other main components include a high voltage generation circuit 12 that generates high voltage between the filament 2 and Wehnelt 3, a lens excitation power supply circuit 13 that supplies current to the focusing lens 5 and the objective lens 6, and the like.

以上述べた構成により主として二次電子、反射電子か検
出される。二次電子の検出の場合は、試料と検出器の間
に、集束電極と呼ばれる試料に対して正電位に保たれた
電極が配置され、この電界によって試料面から放射され
た二次電子はその放射の方向にかかわらず、はとんど集
束電極の方に引き寄せられて検出される。その結果、二
次電子像はあらゆる方向から照明光が来て影の生じない
無影照明の像となる。反射電子の検出の場合は、その持
つエネルキーが大きいので二次電子検出の場合のような
集束電極を必要とせず、試料から検出器の方向に放射さ
れた反射電子のみが検出されるため、反射電子像は検出
器の方向から照射されているように見え、試料の凹凸に
よって鮮明なコントラストを生ずる。
With the configuration described above, mainly secondary electrons and reflected electrons are detected. In the case of secondary electron detection, an electrode called a focusing electrode that is kept at a positive potential with respect to the sample is placed between the sample and the detector, and the secondary electrons emitted from the sample surface by this electric field are Regardless of the direction of the radiation, it is mostly attracted towards the focusing electrode and detected. As a result, the secondary electron image becomes an image of shadowless illumination with illumination light coming from all directions and no shadows. In the case of detecting backscattered electrons, since they have a large energy key, there is no need for a focusing electrode like in the case of secondary electron detection, and only the backscattered electrons emitted from the sample in the direction of the detector are detected. The electron image appears to be irradiated from the direction of the detector, and the unevenness of the sample creates a sharp contrast.

[発明が解決しようとする問題点] 上述した従来のSEMでは、検出器が1つしか設置され
ていないため、特に反射電子像においては1つの方向か
ら単眼で観察するのと同様な平面的な像しか得ることが
出来なかった。
[Problems to be Solved by the Invention] In the conventional SEM described above, only one detector is installed, so especially for backscattered electron images, it is difficult to observe the image from a single direction in a flat manner similar to that observed with a monocular camera. All I could get was a statue.

[問題点を解決するための手段] 本発明は2個の電子検出器を試料に対して所定の角度に
配置し、電子線を試料表面に掃引することによって前記
各検出器で検出された反射電子強度を輝度変調してCR
T上に一画面ずつ交互にラスター表示する機構と、電圧
の印加によって光を透過もしくは遮断する機能を持つフ
ィルター2枚をメガネ構造に配置すると共に、この2枚
のフィルターの光の透過と遮断の周期をCRT上の交互
ラスター表示に同期して切り換える機構とを備えてなる
ことを特徴とするSEM立体表示装置である。
[Means for Solving the Problems] The present invention arranges two electron detectors at a predetermined angle with respect to the sample, and sweeps an electron beam over the sample surface to detect the reflections detected by each of the detectors. CR by brightness modulating electron intensity
A mechanism that alternately displays raster images one screen at a time on T, and two filters that have the function of transmitting or blocking light by applying a voltage are arranged in the glasses structure, and the two filters have a mechanism for transmitting and blocking light. This is a SEM stereoscopic display device characterized by comprising a mechanism for switching the cycle in synchronization with alternate raster display on a CRT.

[作 用] 本発明の要旨とするところは、一定の角度を保持して配
置された二個の検出器によって検出された反射電子強度
を輝度変調して交互にCRT上に表示し、この表示に同
期してメガネの構造に配置した、電場の印加により光の
透過と遮断が可能な機能を持つ光フィルターの周期を切
り換えることによって、1つの検出器によって得られた
像は例えば右眼のみから、また他の検出器によって得ら
れた像は左眼のみから見えるように構成し、かつ電子線
の試料上の一周期のラスタ一時間を目の残像時間よりも
短く取るようにスキャンすることで両方の眼で1つの試
料を見るのと同じ立体効果を得ることができる。
[Function] The gist of the present invention is to modulate the intensity of reflected electrons detected by two detectors arranged at a constant angle and alternately display them on a CRT. By switching the period of an optical filter that is placed in the structure of the glasses and has the function of transmitting and blocking light by applying an electric field in synchronization with the In addition, the image obtained by the other detector is configured so that it can be seen only from the left eye, and the electron beam is scanned so that one period of the raster on the sample is shorter than the afterimage time of the eye. The same stereoscopic effect as viewing one sample with both eyes can be obtained.

[実施例] 次に、本発明について第1図を参照して説明する。[Example] Next, the present invention will be explained with reference to FIG.

第1図は本発明の一実施例を示す原理的構成図である。FIG. 1 is a diagram showing the basic configuration of an embodiment of the present invention.

なお、従来例と同じ構成部分には第2図と同じ符号を付
してその説明を省略する。
Components that are the same as those in the conventional example are given the same reference numerals as in FIG. 2, and their explanations will be omitted.

第1図において検出器81.82は1800配置になっ
ているが実際の構成においては互いの間の角度は、いず
れの大きさであっても良く、またいずれの大きさにも変
えられるような機構を装置自体が有していてもよい。
In FIG. 1, the detectors 81 and 82 are arranged in an 1800 angle arrangement, but in an actual configuration the angles between them may be of any size and can be changed to any size. The device itself may have the mechanism.

各検出器81.82からの信号は検出増幅系11によっ
て増幅されるとともにその強度は輝度変調されてCRT
上に表示される。その際、電子線の試料15上の一掃引
における信号強度の変化は検出器81のみの信号が輝度
変調されてCRTIO上に表示され、次の電子線の試料
15上の一掃引における信号強度の変化は検出器82の
みの信号が輝度変調されてCRTIO上に表示されるよ
うに構成する。
The signals from each detector 81 and 82 are amplified by the detection amplification system 11, and their intensity is luminance-modulated and transmitted to the CRT.
displayed above. At that time, the change in signal intensity during the sweep of the electron beam on the sample 15 is determined by the signal of only the detector 81 being brightness-modulated and displayed on the CRTIO, and the change in signal intensity during the next sweep of the electron beam on the sample 15 is displayed on the CRTIO. The change is configured such that the signal of only the detector 82 is intensity-modulated and displayed on the CRTIO.

一方、電圧を印加することによって光を透過もしくは遮
断するフィルターは液晶等の材料のような電圧の印加に
よって結晶の配向性等の物性変化が生じて光の透過もし
くは遮断か可能であるような機能を持つものであれば良
いが、電圧の印加に対する物性変化に要する反応時間は
後述する眼の残像時間を考慮すると少なくとも1740
秒よりも短いものでなければならない。このフィルター
をメツラネのレンズとし、メガネフレームと一体化させ
てメガネ14を構成する。フィルターはCRT上への一
画面スキ(ノンに対しては例えば、右側のフィルターの
み光を透過するように動作させ、次のCRT上の一画面
スキャンに対しては、左側のフィルターのみ光を通すよ
うに動作させる。これにより各検出器81.82のそれ
ぞれの画面と同期してフィルターを透過した光のみが目
に入射する構成となる。また検出器の配置は左右両眼の
目の位置に対応した角度配置を持つように構成されてい
るから、得られた像は、立体効果を有することとなる。
On the other hand, a filter that transmits or blocks light by applying a voltage is a material such as liquid crystal that changes physical properties such as crystal orientation when a voltage is applied, and can transmit or block light. However, considering the afterimage time of the eye, which will be described later, the reaction time required for the physical properties to change in response to the application of voltage is at least 1740.
Must be shorter than seconds. Glasses 14 are constructed by using this filter as a mesh lens and integrating it with a glasses frame. The filter scans one screen on the CRT (for example, for non-screens, only the right filter is operated to transmit light, and for the next one screen scan on the CRT, only the left filter is transmitted). This allows only the light that has passed through the filter to enter the eye in synchronization with the respective screens of each detector 81 and 82.The detectors are also placed at the positions of the left and right eyes. Since they are configured with corresponding angular configurations, the resulting image will have a three-dimensional effect.

一画面スキャンは目の残像時間が約1720秒で必るこ
と、および各検出器からの両方の信号を表示する必要が
あることから、一画面のスキャンは約1740秒よりも
短い周期で行う必要がある。これに1従来のテレビスキ
ャン技術を用いれば可能である。またフィルターもこれ
に従って1740秒よりも短い時間周期で切り変わる画
面に対応してより短時間で光の透過、遮断を切り換える
機能を有するように構成する。
One screen scan requires an eye afterimage time of approximately 1720 seconds, and both signals from each detector must be displayed, so one screen scan must be performed at a cycle shorter than approximately 1740 seconds. There is. This can be done by using conventional television scanning technology. In accordance with this, the filter is also configured to have a function of switching between transmitting and blocking light in a shorter time in response to a screen that changes at a time period shorter than 1740 seconds.

[発明の効果] 以上説明したように本発明では2個の検出器からの信号
を交互に画面表示し、それに同期して左右の各眼用のフ
ィルターの光の透過、遮断をくり返すことによって像の
立体表示効果を得ることができる効果がおる。
[Effects of the Invention] As explained above, in the present invention, the signals from the two detectors are alternately displayed on the screen, and in synchronization with the signals, the filters for the left and right eyes repeat the transmission and blocking of light. There is an effect that a three-dimensional image display effect can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す原理的構成図、第2図
は従来例によるSEM立体表示装置の原理的構成図であ
る。 1・・・真空ポンプ     2・・・フィラメント3
・・・ウェネルト     4・・・陽極5・・・集束
レンズ     6・・・対物レンズ7・・・走査コイ
ル     8.81.82・・・検出器9・・・電子
走査回路    10・・・CRTll・・・検出増幅
系     12・・・高圧発生回路13・・・レンズ
励磁電源回路 14・・・メガネ15・・・試料
FIG. 1 is a diagram showing the basic configuration of an embodiment of the present invention, and FIG. 2 is a diagram showing the basic configuration of a conventional SEM stereoscopic display device. 1... Vacuum pump 2... Filament 3
...Wehnelt 4...Anode 5...Focusing lens 6...Objective lens 7...Scanning coil 8.81.82...Detector 9...Electronic scanning circuit 10...CRTll. ...Detection amplification system 12...High voltage generation circuit 13...Lens excitation power supply circuit 14...Glasses 15...Sample

Claims (1)

【特許請求の範囲】[Claims] (1)2個の電子検出器を試料に対して所定の角度に配
置し、電子線を試料表面に掃引することによって前記各
検出器で検出された反射電子強度を輝度変調してCRT
上に一画面ずつ交互にラスター表示する機構と、電圧の
印加によって光を透過もしくは遮断する機能を持つフィ
ルター2枚をメガネ構造に配置すると共に、この2枚の
フィルターの光の透過と遮断の周期をCRT上の交互ラ
スター表示に同期して切り換える機構とを備えてなるこ
とを特徴とするSEM立体表示装置。
(1) Two electron detectors are placed at a predetermined angle with respect to the sample, and by sweeping an electron beam over the sample surface, the intensity of the reflected electrons detected by each of the detectors is modulated in brightness, and the CRT
A mechanism that alternately displays raster images one screen at a time on the top, and two filters that have the function of transmitting or blocking light by applying voltage are arranged in the glasses structure, and the period of light transmission and blocking of these two filters A SEM stereoscopic display device characterized by comprising: a mechanism for switching in synchronization with alternating raster display on a CRT.
JP2964987A 1987-02-13 1987-02-13 Sem stereo-display device Pending JPS63198249A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2964987A JPS63198249A (en) 1987-02-13 1987-02-13 Sem stereo-display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2964987A JPS63198249A (en) 1987-02-13 1987-02-13 Sem stereo-display device

Publications (1)

Publication Number Publication Date
JPS63198249A true JPS63198249A (en) 1988-08-16

Family

ID=12281952

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2964987A Pending JPS63198249A (en) 1987-02-13 1987-02-13 Sem stereo-display device

Country Status (1)

Country Link
JP (1) JPS63198249A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH052365U (en) * 1991-02-27 1993-01-14 サンユー電子株式会社 Stereo display

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH052365U (en) * 1991-02-27 1993-01-14 サンユー電子株式会社 Stereo display

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