JPS63193101A - Antireflection film - Google Patents
Antireflection filmInfo
- Publication number
- JPS63193101A JPS63193101A JP62024522A JP2452287A JPS63193101A JP S63193101 A JPS63193101 A JP S63193101A JP 62024522 A JP62024522 A JP 62024522A JP 2452287 A JP2452287 A JP 2452287A JP S63193101 A JPS63193101 A JP S63193101A
- Authority
- JP
- Japan
- Prior art keywords
- film
- fine
- coating
- glass body
- sio2
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011521 glass Substances 0.000 claims abstract description 23
- 239000010419 fine particle Substances 0.000 claims abstract description 16
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 4
- 239000010409 thin film Substances 0.000 claims description 6
- 230000001476 alcoholic effect Effects 0.000 claims description 2
- 239000006117 anti-reflective coating Substances 0.000 claims 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 abstract description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 9
- 238000000576 coating method Methods 0.000 abstract description 8
- 239000011248 coating agent Substances 0.000 abstract description 7
- 230000000694 effects Effects 0.000 abstract description 7
- 239000002245 particle Substances 0.000 abstract description 5
- 239000000377 silicon dioxide Substances 0.000 abstract description 5
- 238000000354 decomposition reaction Methods 0.000 abstract description 2
- 239000004973 liquid crystal related substance Substances 0.000 abstract description 2
- 229910052681 coesite Inorganic materials 0.000 abstract 4
- 229910052906 cristobalite Inorganic materials 0.000 abstract 4
- 235000012239 silicon dioxide Nutrition 0.000 abstract 4
- 229910052682 stishovite Inorganic materials 0.000 abstract 4
- 229910052905 tridymite Inorganic materials 0.000 abstract 4
- 238000001354 calcination Methods 0.000 abstract 2
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 abstract 1
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 abstract 1
- 239000007888 film coating Substances 0.000 abstract 1
- 238000009501 film coating Methods 0.000 abstract 1
- 239000010408 film Substances 0.000 description 18
- 239000000243 solution Substances 0.000 description 10
- 239000000758 substrate Substances 0.000 description 6
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 238000010304 firing Methods 0.000 description 2
- 230000007062 hydrolysis Effects 0.000 description 2
- 238000006460 hydrolysis reaction Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 241000282320 Panthera leo Species 0.000 description 1
- 241000209140 Triticum Species 0.000 description 1
- 235000021307 Triticum Nutrition 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000008280 blood Substances 0.000 description 1
- 210000004369 blood Anatomy 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- -1 ethyl silica Chemical compound 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 230000003301 hydrolyzing effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 239000012798 spherical particle Substances 0.000 description 1
- 238000009987 spinning Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Landscapes
- Surface Treatment Of Optical Elements (AREA)
- Vessels, Lead-In Wires, Accessory Apparatuses For Cathode-Ray Tubes (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、陰極線管、液晶表示装置その他のディスプレ
イ装置等に用いられるガラス表面の反射防止膜に関する
。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an antireflection coating on a glass surface used in cathode ray tubes, liquid crystal display devices, and other display devices.
従来この稲の反射防止膜としては、ガラスを例えばケイ
フッ化水素酸Hz S i Fsなどでエツチングし、
表面に深さ50〜30000 A 、ピッチ100〜2
000Aの凹凸をつけて無反射性能を付与したもの(米
国特許第2490662号)、あるいはs l (OR
)。Conventionally, this anti-reflection coating for rice has been made by etching glass with hydrofluorosilicic acid Hz S i Fs, etc.
Depth 50-30000A on the surface, pitch 100-2
000A with unevenness to give non-reflection performance (US Patent No. 2,490,662), or s l (OR
).
(Rはアルキル基)のアルコール溶液を吹付けた後焼成
し、5lot膜からなる凹凸を形成したもの(特開昭6
1−118932号公報)がある。(R is an alkyl group) was sprayed with an alcohol solution and then baked to form unevenness consisting of 5 lots of film (Japanese Patent Laid-Open No. 6
1-118932).
前者の従来例では、エツチングによる堆積物が表面に残
シ、エツチングされた凹部も化学的にダメージを受けて
いるため耐磨耗強度が弱く、表面をこすると簡単に凹凸
がくずれて無反射性能が低下する。また、後者では、吹
付けられた5t(oR)。In the former conventional example, deposits from etching remain on the surface, and the etched recesses are also chemically damaged, so the wear resistance is weak, and when the surface is rubbed, the unevenness easily collapses, resulting in non-reflective performance. decreases. Also, in the latter case, sprayed 5t (oR).
のアルコール溶液の液粒がガラス表面で薄く広がシ、周
縁部のみが高く盛り上がる。その結果、均一な凹凸がで
きにくい。The droplets of the alcohol solution spread thinly on the glass surface, and only the periphery rises high. As a result, uniform unevenness is difficult to form.
との発明は、細かく均一な凹凸を有し、かつ機械的な強
度の高いガラスの反射防止膜を提供することを目的とす
る。The object of the invention is to provide a glass antireflection film that has fine and uniform irregularities and has high mechanical strength.
上記問題点は、ガラス体の表面上に、5i(hの・微粒
子を添加したSi(OR)4 (Rはアルキル基)のア
ルコール溶液を塗布後焼成することによシ解決される。The above problem can be solved by applying an alcoholic solution of Si(OR)4 (R is an alkyl group) to which fine particles of 5i(h) have been added onto the surface of the glass body and then firing the solution.
81(OR)、が加水分解してできたS L (hの薄
膜が、均一に分散したS i OHの微粒子を被覆しこ
れをガラス体表面に固定する。A thin film of S L (h) formed by hydrolysis of 81 (OR) coats uniformly dispersed S i OH fine particles and fixes them to the surface of the glass body.
反射防止膜を形成するガラス基板の表面を50℃程度に
予熱する。一方、エチルシリケー)(81(OCIHs
)4 )をエタノールに溶解し、さらに加水分解のため
のH,0と触媒としてのHNOsとを添加した溶液を作
る。この溶液に、2000X±1001に整粒された5
101の微粒子(粒形はほぼ球形)を重量%で10%添
加する。このとき、充分に分散するようKJI液のPR
を調整する。 ゛この混合溶液をガラス基板の表
面上に息下させ、さらにスピンナーで均一に塗布する。The surface of the glass substrate on which the antireflection film is to be formed is preheated to about 50°C. On the other hand, ethyl silica) (81 (OCIHs)
) 4) is dissolved in ethanol, and a solution is prepared by adding H,0 for hydrolysis and HNOs as a catalyst. In this solution, 5
101 fine particles (approximately spherical particle shape) are added in an amount of 10% by weight. At this time, PR of KJI liquid to ensure sufficient dispersion.
Adjust. ``This mixed solution is breathed onto the surface of the glass substrate, and further coated uniformly with a spinner.
その後、150℃で約30分間空気中で焼成し、5i(
O1’l)a (RはCコHs)を分解する。溶液に添
加したSin!の微粒子は分解してでき九S I Ox
の連続した均一の薄膜によシ強固に固着され、ガラス基
板の表面に凹凸が形成される。予め整粒した微粒子を使
い、かつ溶液中に均一に分散させるようにしたことによ
シ、電子顕微鏡で観察したところ、第1図に示すように
、最外表面に深さ1000λ±200に、 ピッチ約
5ooXの均一な凹凸を有する反射防止膜が形成された
。第1図において11は810m微粒子、2は81(O
R)、が分解してできた8 i (h O薄膜である。After that, it was baked in air at 150°C for about 30 minutes, and 5i (
O1'l)a (R is C-Hs) is decomposed. Sin! added to the solution! The fine particles are decomposed and formed into S I Ox
The glass substrate is firmly fixed by a continuous, uniform thin film, and irregularities are formed on the surface of the glass substrate. By using pre-sized fine particles and uniformly dispersing them in the solution, when observed with an electron microscope, as shown in Figure 1, there were particles on the outermost surface at a depth of 1000λ±200. An antireflection film having uniform irregularities with a pitch of about 5ooX was formed. In Fig. 1, 11 is 810m fine particle, 2 is 81(O
8 i (h 2 O thin film) formed by the decomposition of R).
この反射防止膜を形成したガラス表面に5°の入射角で
光を入射させ、その反射率を測定した結果、第2図に曲
線Iで示すように、波長450〜650nmの範囲で1
チ以下の反射率であった。この値は、VDT(ビジュア
ル・ディスプレイ・ターミナル)としての条件を充分に
満足する値である。Light was incident on the glass surface on which this antireflection film was formed at an incident angle of 5°, and the reflectance was measured.
The reflectance was less than . This value is a value that fully satisfies the conditions for a VDT (visual display terminal).
次に、この反射防止膜を形成したガラス基板の表面を消
ゴム(ライオン5o−so)で強く50回こすったとこ
ろ、反射率は、第2図中に曲線用で示すように、0.1
%li度短波長側にシフトしただけで、その品質上は全
く問題がなかった。比較のため、エツチングによシ凹凸
を形成したガラス表面について同様の試験を行なったと
ころ、消ゴム1回のとすシで反射率は2係増加し、5回
のとすルによ)、第2図中に曲線Iで示した無処理のガ
ラス表面と全く同じ反、耐重となった。Next, when the surface of the glass substrate on which the antireflection film was formed was rubbed vigorously 50 times with an eraser (Lion 5o-so), the reflectance was 0.1 as shown in the curved line in Figure 2.
There was no problem at all in terms of quality, with only a shift of %li degrees to the shorter wavelength side. For comparison, a similar test was conducted on a glass surface with unevenness formed by etching, and it was found that the reflectance increased by two factors after one eraser eraser, and after five erasers). The weight resistance was exactly the same as that of the untreated glass surface shown by curve I in Figure 2.
また、本実施例の反射防止膜表面に指紋を付着させても
、その汚れは普通紙で簡単に拭きとることができた。Further, even if fingerprints were attached to the surface of the antireflection film of this example, the stains could be easily wiped off with plain paper.
上述したような反射防止膜を形成したガラス基板におい
て、反射率を低下させることができる理由を次に説明す
る。The reason why the reflectance can be reduced in the glass substrate on which the above-mentioned antireflection film is formed will be explained below.
第3図において、Aに示す位置における屈折率は空気の
屈折率n6で、その値紘約1である。一方、Bに示す位
置ではS t O,が詰まった状態で、その屈折率はほ
ぼガラス(stow)の屈折率ng;1.48に等しい
。このA、Bに挾まれた凹凸部分において、屈折率は、
5iQ1の体積分率、っiシA、B平面に平行な平面で
切った微小な厚みの板を仮想したとき、その板の体積全
体に占める8101部分の体積の割合に応じて連続的に
変化する。Aよ)わずかに内側に入っ九0位置での屈折
率をn!、Bよシわずかに外側に出たD位置での屈折率
をJとしたとき、この反射防止膜を形成したガラス表面
での反射率Rが最小となる条件は、
g−7
凰
の条件を満足するときに、無反射性能が得られる。In FIG. 3, the refractive index at the position indicated by A is the refractive index n6 of air, which is approximately 1. On the other hand, at the position shown in B, S t O, is packed, and its refractive index is approximately equal to the refractive index of glass (stow), ng: 1.48. In the uneven part between A and B, the refractive index is
The volume fraction of 5iQ1, when imagining a plate with a minute thickness cut on a plane parallel to planes A and B, changes continuously according to the proportion of the volume of the 8101 part in the entire volume of the plate. do. A) Slightly inside, the refractive index at the 90 position is n! , when the refractive index at position D, which is slightly outward from B, is J, the conditions for the minimum reflectance R on the glass surface on which this anti-reflection film is formed are the conditions of g-7 凰. When satisfied, non-reflective performance can be obtained.
ここで、n!/n1の値は、凹凸の形状によって決まる
が、前述しよようにSiO□微粒子を添加した5S(O
R)iのアルコール溶液を血布後焼成するととKよ〕、
上式を近似的に満足するよう麦凹凸が形成でき、lts
以下というような低い反射率が得られたものと考えられ
る。Here, n! The value of /n1 is determined by the shape of the unevenness, but as described above, 5S(O
R) When the alcohol solution of i is baked after blood cloth,
The wheat irregularities can be formed to approximately satisfy the above formula, and lts
It is thought that the following low reflectance was obtained.
次くい高い機械的強度が得られる理由は、5l(OR)
4が次のように加水分解してできたS 10g膜が存在
し、と杆が保ll[膜キなっているためと考えられる。The reason why the second highest mechanical strength is obtained is 5l (OR)
This is thought to be due to the existence of a 10 g S film formed by hydrolyzing 4 as follows, and the rod is retained [the film is thin].
S l(OCgHs )4 + 4HxO−4S i
(OH)(+ 4 (4HIIOH→3101 + 2
HxO
また、整粒されたS i 02微粒子による細かい凹凸
が均一にできることから、全面にわたシ良好な反射防止
効果が得られるとともに、必要以上の凹凸によって解像
度が低下することもない。S l(OCgHs )4 + 4HxO−4S i
(OH) (+ 4 (4HIIOH→3101 + 2
HxO Furthermore, since fine irregularities are made uniform by the well-sized S i 02 fine particles, a good anti-reflection effect can be obtained over the entire surface, and the resolution will not be degraded due to unnecessarily irregularities.
さらに、このような反射防止膜を形成するプロセスとし
ては、既存の5l(OR)4アルコール溶液に市販のS
t O,微粒子を添加して塗布し焼成するだけでよく
、フッ酸などの有害な薬品の使用は一切なく、安全にし
かも低コストで製造することができる。Furthermore, as a process for forming such an anti-reflection film, commercially available S
It is only necessary to add tO, fine particles, apply, and bake, and there is no use of harmful chemicals such as hydrofluoric acid, and it can be produced safely and at low cost.
5tos微粒子は、球形に限らず、第4図に示すように
不定形であってよい。第4図において、IAが5101
微粒子、2人がs t O=薄膜である。また、その粒
径は500〜1ooooX程度が好ましい。この粒径が
小さすぎると、形成される膜の最外表面が平滑になシす
ぎて充分な反射防止効果が得られない。逆に大きすぎる
と、拡散効果が大きすぎ、解像度が低下するとともに、
膜強度も低下する。The 5tos fine particles are not limited to a spherical shape, but may have an amorphous shape as shown in FIG. In Figure 4, IA is 5101
Fine particles, two people s t O = thin film. Moreover, the particle size is preferably about 500 to 10ooX. If the particle size is too small, the outermost surface of the formed film will be too smooth, making it impossible to obtain a sufficient antireflection effect. On the other hand, if it is too large, the diffusion effect will be too large and the resolution will decrease.
The film strength also decreases.
StO,微粒子を添加した81(OR)4のアルコール
溶液の塗布方法は、スピニング法に限定されず、ディッ
ピング法やコーティング法などでもよい。The method of applying the alcohol solution of 81(OR)4 containing StO and fine particles is not limited to the spinning method, but may be a dipping method, a coating method, or the like.
また、塗布後の焼成温度は50〜200℃程度が適当で
ある。Further, the firing temperature after coating is suitably about 50 to 200°C.
本発明によれば、反射防止効果にすぐれ、かつ機械的に
も強い反射防止膜が得られる。しかも本発明による反射
防止膜は、フッ酸などの有害な処理薬品を使用せず、簡
単で安全なプロセスで製造でき、また耐汚染性にもすぐ
れている。According to the present invention, an antireflection film that has excellent antireflection effects and is mechanically strong can be obtained. Moreover, the antireflection film according to the present invention can be manufactured by a simple and safe process without using harmful processing chemicals such as hydrofluoric acid, and has excellent stain resistance.
第1図は本発明の一実施例を模式的に示した反射防止膜
の最外表面部断面図、第2図はその反射率の測定結果を
示す図、第3図は反射防止の原理を説明するための図、
第4図は本発明の他の実施例を模式的に示した反射防止
膜の最外表面部断面図である。
1.1A・・・・SIO!微粒子、2,2A ・・・
・S%oz薄膜。Figure 1 is a sectional view of the outermost surface of an antireflection film schematically showing an embodiment of the present invention, Figure 2 is a diagram showing the measurement results of its reflectance, and Figure 3 is a diagram illustrating the principle of antireflection. Diagram for explanation,
FIG. 4 is a sectional view of the outermost surface of an antireflection film schematically showing another embodiment of the present invention. 1.1A...SIO! Fine particles, 2,2A...
・S%oz thin film.
Claims (1)
Si(OR)_4(Rはアルキル基)のアルコール溶液
を塗布後焼成し、ガラス体表面上にSiO_2微粒子お
よびこれを被覆するSiO_2薄膜を付着させてなる反
射防止膜。1. After applying an alcoholic solution of Si(OR)_4 (R is an alkyl group) to which SiO_2 fine particles have been added onto the surface of the glass body, it is fired to attach the SiO_2 fine particles and the SiO_2 thin film covering them onto the glass body surface. Anti-reflective coating made by
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62024522A JPS63193101A (en) | 1987-02-06 | 1987-02-06 | Antireflection film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62024522A JPS63193101A (en) | 1987-02-06 | 1987-02-06 | Antireflection film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63193101A true JPS63193101A (en) | 1988-08-10 |
Family
ID=12140494
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62024522A Pending JPS63193101A (en) | 1987-02-06 | 1987-02-06 | Antireflection film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63193101A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01224792A (en) * | 1988-03-04 | 1989-09-07 | Toshiba Corp | Display device and its production |
JPH02245702A (en) * | 1989-03-20 | 1990-10-01 | Hitachi Ltd | Antireflection file and production thereof |
JPH02256001A (en) * | 1988-10-31 | 1990-10-16 | Sumitomo Cement Co Ltd | Glass or plastic product having antireflection coating, its production and coating composition |
WO2001042156A1 (en) * | 1999-12-13 | 2001-06-14 | Nippon Sheet Glass Co., Ltd. | Low-reflection film and solar cell panel |
JP2013501248A (en) * | 2009-07-31 | 2013-01-10 | ライプニッツ−インスティトゥート フィア ノイエ マテリアーリエン ゲマインニュッツィゲ ゲゼルシャフト ミット ベシュレンクタ ハフトゥンク | Method for making an anti-reflective coating |
JP2013122949A (en) * | 2011-12-09 | 2013-06-20 | Asahi Glass Co Ltd | Article with low-reflection film, and solar battery module |
CN103524048A (en) * | 2013-09-29 | 2014-01-22 | 南通汉瑞实业有限公司 | Preparation method of multi-layer SiO2 inorganic anti-reflection film |
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JPS58126502A (en) * | 1982-01-25 | 1983-07-28 | Nippon Sheet Glass Co Ltd | Antireflection plastic optical parts |
JPS6088901A (en) * | 1983-10-20 | 1985-05-18 | Seiko Epson Corp | Plastic lens |
JPS6151101A (en) * | 1984-08-21 | 1986-03-13 | Toray Ind Inc | Coated transparent conductive panel |
JPS61162001A (en) * | 1985-01-11 | 1986-07-22 | Toray Ind Inc | Optical lens having antireflection film |
JPS61254901A (en) * | 1985-05-08 | 1986-11-12 | Toray Ind Inc | Production of transparent antireflection material |
JPS6217044A (en) * | 1985-07-12 | 1987-01-26 | Hoya Corp | Formation of antireflection film resistant to laser damage and having high wear resistance on optical element surface |
-
1987
- 1987-02-06 JP JP62024522A patent/JPS63193101A/en active Pending
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US2601123A (en) * | 1947-04-05 | 1952-06-17 | American Optical Corp | Composition for reducing the reflection of light |
JPS58126502A (en) * | 1982-01-25 | 1983-07-28 | Nippon Sheet Glass Co Ltd | Antireflection plastic optical parts |
JPS6088901A (en) * | 1983-10-20 | 1985-05-18 | Seiko Epson Corp | Plastic lens |
JPS6151101A (en) * | 1984-08-21 | 1986-03-13 | Toray Ind Inc | Coated transparent conductive panel |
JPS61162001A (en) * | 1985-01-11 | 1986-07-22 | Toray Ind Inc | Optical lens having antireflection film |
JPS61254901A (en) * | 1985-05-08 | 1986-11-12 | Toray Ind Inc | Production of transparent antireflection material |
JPS6217044A (en) * | 1985-07-12 | 1987-01-26 | Hoya Corp | Formation of antireflection film resistant to laser damage and having high wear resistance on optical element surface |
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JPH01224792A (en) * | 1988-03-04 | 1989-09-07 | Toshiba Corp | Display device and its production |
JPH02256001A (en) * | 1988-10-31 | 1990-10-16 | Sumitomo Cement Co Ltd | Glass or plastic product having antireflection coating, its production and coating composition |
JPH02245702A (en) * | 1989-03-20 | 1990-10-01 | Hitachi Ltd | Antireflection file and production thereof |
WO2001042156A1 (en) * | 1999-12-13 | 2001-06-14 | Nippon Sheet Glass Co., Ltd. | Low-reflection film and solar cell panel |
US6921578B2 (en) | 1999-12-13 | 2005-07-26 | Nippon Sheet Glass Co., Ltd. | Low-reflection glass article |
EP1167313A4 (en) * | 1999-12-13 | 2007-09-12 | Nippon Sheet Glass Co Ltd | Low-reflection glass article |
JP4841782B2 (en) * | 1999-12-13 | 2011-12-21 | 日本板硝子株式会社 | Low reflective film and solar panel |
JP2013501248A (en) * | 2009-07-31 | 2013-01-10 | ライプニッツ−インスティトゥート フィア ノイエ マテリアーリエン ゲマインニュッツィゲ ゲゼルシャフト ミット ベシュレンクタ ハフトゥンク | Method for making an anti-reflective coating |
JP2013122949A (en) * | 2011-12-09 | 2013-06-20 | Asahi Glass Co Ltd | Article with low-reflection film, and solar battery module |
CN103524048A (en) * | 2013-09-29 | 2014-01-22 | 南通汉瑞实业有限公司 | Preparation method of multi-layer SiO2 inorganic anti-reflection film |
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