JPS6319281U - - Google Patents
Info
- Publication number
- JPS6319281U JPS6319281U JP11227586U JP11227586U JPS6319281U JP S6319281 U JPS6319281 U JP S6319281U JP 11227586 U JP11227586 U JP 11227586U JP 11227586 U JP11227586 U JP 11227586U JP S6319281 U JPS6319281 U JP S6319281U
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- test object
- guard
- voltage supply
- supply source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 6
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
第1図はこの考案の一実施例を示す接続図、第
2図及び第3図はこの考案の他の実施例を説明す
るための接続図、第4図は従来の電圧印加電流測
定装置を説明するための接続図、第5図は従来の
装置における電圧帰還回路の部分の等価回路を示
す接続図、第6図及び第7図は従来のガード電圧
印加手段の接続構造を説明するための接続図、第
8図は従来の電圧印加電流測定装置の動作を説明
するための波形図である。
100:被験体、200:電圧供給源、300
:電流測定手段、304:レンジ切替手段、40
0:ケーブル、401:電圧供給源、402:電
圧検出線、403:シールド、Ra:リーク抵抗
、Ca:静電容量、500:電圧帰還回路、60
0:共通電位点、700:ガード電圧印加手段、
800:切替手段。
Fig. 1 is a connection diagram showing one embodiment of this invention, Figs. 2 and 3 are connection diagrams for explaining other embodiments of this invention, and Fig. 4 shows a conventional voltage applied current measuring device. FIG. 5 is a connection diagram for explaining the equivalent circuit of the voltage feedback circuit in a conventional device. FIGS. 6 and 7 are connection diagrams for explaining the connection structure of the conventional guard voltage applying means. The connection diagram and FIG. 8 are waveform diagrams for explaining the operation of the conventional voltage applied current measuring device. 100: Subject, 200: Voltage supply source, 300
: Current measuring means, 304: Range switching means, 40
0: cable, 401: voltage supply source, 402: voltage detection line, 403: shield, Ra: leak resistance, Ca: capacitance, 500: voltage feedback circuit, 60
0: common potential point, 700: guard voltage application means,
800: Switching means.
Claims (1)
加する電圧供給源と、 B 被験体の端子電圧を電圧検出線を通じて取り
出し、上記電圧供給源に帰還し、被験体の端子電
圧を所望の電圧に維持させるための電圧帰還回路
と、 C 上記電圧供給源を通じて被験体に流れる電流
を測定する電流測定手段と、 D 上記電流測定手段に設けられ、測定電流値を
切替えるレンジ切替手段と、 E 上記電圧供給線及び電圧検出線を保護するシ
ールドに上記電圧供給線に与える電圧と同じ電圧
を印加するガード電圧印加手段と、 F 上記レンジ切替手段が大電流測定レンジに切
替えられるのと連動して上記ガード電圧印加手段
に共通電位点の電圧を与える切替手段と、 から成る電圧印加電流測定装置。[Scope of Claim for Utility Model Registration] A. A voltage supply source that applies voltage to the terminals of the test object via a voltage supply line; B. The terminal voltage of the test object is extracted through a voltage detection line and returned to the voltage supply source, A voltage feedback circuit for maintaining the terminal voltage of the test object at a desired voltage, C. A current measuring means for measuring the current flowing through the test object through the voltage supply source, and D. E a guard voltage applying means that applies the same voltage as the voltage applied to the voltage supply line to a shield that protects the voltage supply line and the voltage detection line; A voltage applied current measuring device comprising: switching means for applying a voltage at a common potential point to the guard voltage applying means in conjunction with switching to the guard voltage applying means.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11227586U JPH0438303Y2 (en) | 1986-07-21 | 1986-07-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11227586U JPH0438303Y2 (en) | 1986-07-21 | 1986-07-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6319281U true JPS6319281U (en) | 1988-02-08 |
JPH0438303Y2 JPH0438303Y2 (en) | 1992-09-08 |
Family
ID=30992995
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11227586U Expired JPH0438303Y2 (en) | 1986-07-21 | 1986-07-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0438303Y2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003014825A (en) * | 2001-07-04 | 2003-01-15 | Advantest Corp | Electric source device and test device |
WO2015083618A1 (en) * | 2013-12-06 | 2015-06-11 | オムロン株式会社 | Contactless voltage measurement device and method |
-
1986
- 1986-07-21 JP JP11227586U patent/JPH0438303Y2/ja not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003014825A (en) * | 2001-07-04 | 2003-01-15 | Advantest Corp | Electric source device and test device |
WO2015083618A1 (en) * | 2013-12-06 | 2015-06-11 | オムロン株式会社 | Contactless voltage measurement device and method |
JP2015111087A (en) * | 2013-12-06 | 2015-06-18 | オムロン株式会社 | Non-contact voltage measurement device and non-contact voltage measurement method |
Also Published As
Publication number | Publication date |
---|---|
JPH0438303Y2 (en) | 1992-09-08 |
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