JPS6319281U - - Google Patents

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Publication number
JPS6319281U
JPS6319281U JP11227586U JP11227586U JPS6319281U JP S6319281 U JPS6319281 U JP S6319281U JP 11227586 U JP11227586 U JP 11227586U JP 11227586 U JP11227586 U JP 11227586U JP S6319281 U JPS6319281 U JP S6319281U
Authority
JP
Japan
Prior art keywords
voltage
test object
guard
voltage supply
supply source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11227586U
Other languages
Japanese (ja)
Other versions
JPH0438303Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11227586U priority Critical patent/JPH0438303Y2/ja
Publication of JPS6319281U publication Critical patent/JPS6319281U/ja
Application granted granted Critical
Publication of JPH0438303Y2 publication Critical patent/JPH0438303Y2/ja
Expired legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を示す接続図、第
2図及び第3図はこの考案の他の実施例を説明す
るための接続図、第4図は従来の電圧印加電流測
定装置を説明するための接続図、第5図は従来の
装置における電圧帰還回路の部分の等価回路を示
す接続図、第6図及び第7図は従来のガード電圧
印加手段の接続構造を説明するための接続図、第
8図は従来の電圧印加電流測定装置の動作を説明
するための波形図である。 100:被験体、200:電圧供給源、300
:電流測定手段、304:レンジ切替手段、40
0:ケーブル、401:電圧供給源、402:電
圧検出線、403:シールド、Ra:リーク抵抗
、Ca:静電容量、500:電圧帰還回路、60
0:共通電位点、700:ガード電圧印加手段、
800:切替手段。
Fig. 1 is a connection diagram showing one embodiment of this invention, Figs. 2 and 3 are connection diagrams for explaining other embodiments of this invention, and Fig. 4 shows a conventional voltage applied current measuring device. FIG. 5 is a connection diagram for explaining the equivalent circuit of the voltage feedback circuit in a conventional device. FIGS. 6 and 7 are connection diagrams for explaining the connection structure of the conventional guard voltage applying means. The connection diagram and FIG. 8 are waveform diagrams for explaining the operation of the conventional voltage applied current measuring device. 100: Subject, 200: Voltage supply source, 300
: Current measuring means, 304: Range switching means, 40
0: cable, 401: voltage supply source, 402: voltage detection line, 403: shield, Ra: leak resistance, Ca: capacitance, 500: voltage feedback circuit, 60
0: common potential point, 700: guard voltage application means,
800: Switching means.

Claims (1)

【実用新案登録請求の範囲】 A 被験体の端子に電圧供給線を介して電圧を印
加する電圧供給源と、 B 被験体の端子電圧を電圧検出線を通じて取り
出し、上記電圧供給源に帰還し、被験体の端子電
圧を所望の電圧に維持させるための電圧帰還回路
と、 C 上記電圧供給源を通じて被験体に流れる電流
を測定する電流測定手段と、 D 上記電流測定手段に設けられ、測定電流値を
切替えるレンジ切替手段と、 E 上記電圧供給線及び電圧検出線を保護するシ
ールドに上記電圧供給線に与える電圧と同じ電圧
を印加するガード電圧印加手段と、 F 上記レンジ切替手段が大電流測定レンジに切
替えられるのと連動して上記ガード電圧印加手段
に共通電位点の電圧を与える切替手段と、 から成る電圧印加電流測定装置。
[Scope of Claim for Utility Model Registration] A. A voltage supply source that applies voltage to the terminals of the test object via a voltage supply line; B. The terminal voltage of the test object is extracted through a voltage detection line and returned to the voltage supply source, A voltage feedback circuit for maintaining the terminal voltage of the test object at a desired voltage, C. A current measuring means for measuring the current flowing through the test object through the voltage supply source, and D. E a guard voltage applying means that applies the same voltage as the voltage applied to the voltage supply line to a shield that protects the voltage supply line and the voltage detection line; A voltage applied current measuring device comprising: switching means for applying a voltage at a common potential point to the guard voltage applying means in conjunction with switching to the guard voltage applying means.
JP11227586U 1986-07-21 1986-07-21 Expired JPH0438303Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11227586U JPH0438303Y2 (en) 1986-07-21 1986-07-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11227586U JPH0438303Y2 (en) 1986-07-21 1986-07-21

Publications (2)

Publication Number Publication Date
JPS6319281U true JPS6319281U (en) 1988-02-08
JPH0438303Y2 JPH0438303Y2 (en) 1992-09-08

Family

ID=30992995

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11227586U Expired JPH0438303Y2 (en) 1986-07-21 1986-07-21

Country Status (1)

Country Link
JP (1) JPH0438303Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003014825A (en) * 2001-07-04 2003-01-15 Advantest Corp Electric source device and test device
WO2015083618A1 (en) * 2013-12-06 2015-06-11 オムロン株式会社 Contactless voltage measurement device and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003014825A (en) * 2001-07-04 2003-01-15 Advantest Corp Electric source device and test device
WO2015083618A1 (en) * 2013-12-06 2015-06-11 オムロン株式会社 Contactless voltage measurement device and method
JP2015111087A (en) * 2013-12-06 2015-06-18 オムロン株式会社 Non-contact voltage measurement device and non-contact voltage measurement method

Also Published As

Publication number Publication date
JPH0438303Y2 (en) 1992-09-08

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