JPS63191655U - - Google Patents

Info

Publication number
JPS63191655U
JPS63191655U JP6796188U JP6796188U JPS63191655U JP S63191655 U JPS63191655 U JP S63191655U JP 6796188 U JP6796188 U JP 6796188U JP 6796188 U JP6796188 U JP 6796188U JP S63191655 U JPS63191655 U JP S63191655U
Authority
JP
Japan
Prior art keywords
conductivity type
type region
region
field effect
effect transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6796188U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6796188U priority Critical patent/JPS63191655U/ja
Publication of JPS63191655U publication Critical patent/JPS63191655U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Junction Field-Effect Transistors (AREA)
JP6796188U 1988-05-25 1988-05-25 Pending JPS63191655U (es)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6796188U JPS63191655U (es) 1988-05-25 1988-05-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6796188U JPS63191655U (es) 1988-05-25 1988-05-25

Publications (1)

Publication Number Publication Date
JPS63191655U true JPS63191655U (es) 1988-12-09

Family

ID=30907345

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6796188U Pending JPS63191655U (es) 1988-05-25 1988-05-25

Country Status (1)

Country Link
JP (1) JPS63191655U (es)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5221874A (en) * 1975-08-11 1977-02-18 Hewlett Packard Yokogawa Group delay measuring device
JPS5450277A (en) * 1977-09-27 1979-04-20 Nec Corp Semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5221874A (en) * 1975-08-11 1977-02-18 Hewlett Packard Yokogawa Group delay measuring device
JPS5450277A (en) * 1977-09-27 1979-04-20 Nec Corp Semiconductor device

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