JPS63188085A - Method for detecting label of label printer - Google Patents

Method for detecting label of label printer

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Publication number
JPS63188085A
JPS63188085A JP1970887A JP1970887A JPS63188085A JP S63188085 A JPS63188085 A JP S63188085A JP 1970887 A JP1970887 A JP 1970887A JP 1970887 A JP1970887 A JP 1970887A JP S63188085 A JPS63188085 A JP S63188085A
Authority
JP
Japan
Prior art keywords
detected
optical sensor
output
wave form
output voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1970887A
Other languages
Japanese (ja)
Inventor
Masayuki Osawa
大沢 正幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba TEC Corp
Original Assignee
Tokyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electric Co Ltd filed Critical Tokyo Electric Co Ltd
Priority to JP1970887A priority Critical patent/JPS63188085A/en
Publication of JPS63188085A publication Critical patent/JPS63188085A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To prevent the erroneous operation of a circuit due to the effect of the temp. characteristic inherent to an optical sensor or disturbance, by converting the analogue output detected by the optical sensor to digital output subjected to time sharing and calculating the differential value of said data and detecting a part to be detected on the basis of the detected wave form of said differential value. CONSTITUTION:When an optical sensor 24 detects a part to be detected different in light transmissivity, the light receiving quantity of a light receiving element 23 changes and the voltage on the side of a collector 25 varies and output voltage Vout of the analogue wave form on the side of the collector 25 appears. The output voltage Vout of this analogue wave form is timewise divided at an equal interval >=t by an A/D converter 18 to be converted to digital wave form (S1...S15). Then, the digital value S1 is subtracted from the digital value S2 using RAM 19 and ROM 20 to calculate difference d1. Next, when the difference d1 is divided by the interval DELTAt subjected to time sharing, a differential value D1 is calculated. Hereinafter, in the same way, differential values (D2,...D14) are calculated. By calculating the differential values (D1..., D14) by this method, the change quantity and change direction (+/-) of the output voltage Vout can be investigated.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、連続用紙上の光透過率の異なったすきまや切
欠等の被検出部を検出するラベルプリンタのラベル検出
方法に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a label detection method for a label printer that detects detection areas such as gaps and notches with different light transmittances on continuous paper.

従来の技術 従来の被検出部としてのラベル間のすきまを検出するす
きま検出回路を第5図ないし第10図に基づいて説明す
る。
2. Description of the Related Art A conventional gap detection circuit for detecting a gap between labels as detected parts will be explained with reference to FIGS. 5 to 10.

従来のすきま検出回路1には、連続用紙2上の光透過率
の異なった被検出部すなわち第9図における台紙3に貼
付されたラベル4間のすきま5を検出する光センサ回路
部6と、波形整形を行うコンパレータ7と、■10ポー
ト8と、CPU9とが設けられている。前記光センサ回
路部6は、発光素子(LED)10と受光素子(フォト
トランジスタ)11とよりなる光センサ12を有する。
The conventional gap detection circuit 1 includes an optical sensor circuit section 6 that detects the gap 5 between the detected parts of the continuous paper 2 having different light transmittances, that is, the labels 4 affixed to the mount 3 in FIG. A comparator 7 for waveform shaping, a 10 port 8, and a CPU 9 are provided. The optical sensor circuit section 6 includes an optical sensor 12 including a light emitting element (LED) 10 and a light receiving element (phototransistor) 11.

前記発光素子10は、抵抗R8を介して電源Vccに接
続され、他方前記受光素子11のコレクタ13側は可変
抵抗VRを介して前記電源Vccに接続されている。ま
た、前記受光素子11のコレクタ13側は次段に位置す
る前記コンパレータ7の片方の入力側一端子に接続され
、このコンバレータフの他方の入力側+端子には基準電
圧Voが接続されている。このコンパレータ7の出力側
は次段に位置する前記I10ポート8に接続され、この
I10ボート8はバス14を通して前記CPU9に接続
されている。なお、第10図における前記被検出部に相
当するものは、台紙3の一側縁に等間隔に形成された切
欠15がこれに相当する。
The light emitting element 10 is connected to the power supply Vcc via a resistor R8, and the collector 13 side of the light receiving element 11 is connected to the power supply Vcc via a variable resistor VR. Further, the collector 13 side of the light receiving element 11 is connected to one input terminal of the comparator 7 located at the next stage, and the reference voltage Vo is connected to the other input terminal of the comparator 7. The output side of this comparator 7 is connected to the I10 port 8 located at the next stage, and this I10 port 8 is connected to the CPU 9 through a bus 14. Note that the notches 15 formed at equal intervals on one side edge of the mount 3 correspond to the detected portions in FIG.

このような構成において、光センサ12が光透過率の異
なった被検出部を検出すると、受光素子11の受光量が
変化してコレクタ13側の電圧が変動し、このコレクタ
13側にアナログ波形の出力電圧Voutが現れる。こ
の出力電圧Voutをそのまま検出電圧と見なしてコン
パレータ7の検出レベルa、bと比較すると、波形整形
されたパルス状の検出波形が得られる。この時、検出レ
ベルがa、bの2つに分かれているが、これはスレッシ
ュホールドレベルによって検出を行っているためで、下
向きの曲線では検出レベルaと交差すると検出され、逆
に上向きの曲線では検出レベルbと交差すると検出され
て、その結果検出波形のようなパルス状の波形が得られ
る。この検出波形はI10ポート8に送られ、さらにバ
ス14を通してCPU9に送られて被検出部の検出が行
われる。
In such a configuration, when the optical sensor 12 detects detected parts with different light transmittances, the amount of light received by the light receiving element 11 changes, the voltage on the collector 13 side fluctuates, and an analog waveform is applied to the collector 13 side. An output voltage Vout appears. When this output voltage Vout is regarded as a detection voltage and compared with the detection levels a and b of the comparator 7, a waveform-shaped pulse-shaped detection waveform is obtained. At this time, the detection level is divided into two, a and b, but this is because detection is performed based on the threshold level, and the downward curve is detected when it intersects detection level a, whereas the upward curve , it is detected when it intersects the detection level b, and as a result, a pulse-like waveform like the detection waveform is obtained. This detection waveform is sent to the I10 port 8, and further sent to the CPU 9 through the bus 14, where the detected portion is detected.

発明が解決しようとする問題点 上述のように、従来のすきま検出では、光センサ12の
出力電圧V outをそのまま検出電圧として利用して
いるので、このため前記光センサ12個々の出力特性の
バラツキ等による影響で前記出力電圧Voutが異なっ
た値V1.V2 を持つことがあり、これによって前記
検出電圧の出力レベルがバラツキ、その結果、このバラ
ツキを補正して出力レベルを一定にするために可変抵抗
VRを用いてあらかじめ調整しておく必要がある。また
回路動作中においても同様に、前記光センサ12固有の
温度特性や外乱による影響で前記出力電圧Voutがバ
ラツクとこれによって前記検出電圧がバラツキ、その結
果、すきま検出回路1が誤動作する恐れがある。
Problems to be Solved by the Invention As mentioned above, in conventional gap detection, the output voltage V out of the optical sensor 12 is directly used as the detection voltage. The output voltage Vout has a different value V1. V2, which causes variations in the output level of the detection voltage, and as a result, it is necessary to adjust the output level in advance using a variable resistor VR in order to correct this variation and make the output level constant. Similarly, during circuit operation, the output voltage Vout varies due to the temperature characteristics specific to the optical sensor 12 and the influence of disturbances, which causes the detection voltage to vary, and as a result, there is a risk that the gap detection circuit 1 may malfunction. .

問題点を解決するための手段 そこで、このような問題点を解決するために、光センサ
によって検出されたアナログ出力をA/Dコンバータを
用いて、時分割されたデジタル出力に変換し、この時分
割されたデジタル出力のデータの微分値を求め、この微
分値の検出波形により被検出部を検出する。
Means to Solve the Problems Therefore, in order to solve these problems, the analog output detected by the optical sensor is converted into a time-divided digital output using an A/D converter. The differential value of the divided digital output data is determined, and the detected portion is detected based on the detected waveform of this differential value.

作用 したがって、すきまや切欠等の被検出部の検出は、光セ
ンサのアナログ出力の微分値の検出波形によって行われ
るので、アナログ出力の変動分のみが信号として取り出
され、光センサ個々の出力特性のバラツキ等による影響
で出力レベルがたとえ異なっていたとしてもその出力レ
ベルの変動分 ′を考慮する必要がなく、このため可変
抵抗による調整は不要となり、また、回路動作中におい
ても同様に、光センサ固有の温度特性や外乱による影響
で回路が誤動作するようなこともなくなる。
Therefore, detection of the detected parts such as gaps and notches is performed by the detection waveform of the differential value of the analog output of the optical sensor, so only the variation of the analog output is extracted as a signal, and the output characteristics of each optical sensor are detected. Even if the output level differs due to variations, there is no need to take into account the variation in the output level, so adjustment using a variable resistor is no longer necessary. The circuit will no longer malfunction due to inherent temperature characteristics or disturbances.

実施例 本発明の一実施例を第1図ないし第4図および第9図な
いし第10図に基づいて説明する。
Embodiment An embodiment of the present invention will be described with reference to FIGS. 1 to 4 and 9 to 10.

すきま検出回路16には、連続用紙2上の光透過率の異
なった被検出部すなわち第9図における台紙3に貼付さ
れたラベル4間のすきま5を検出する光センサ回路部1
7と、アナログ波形をデジタル波形に変換するA/Dコ
ンバータ18と、ブータラ記憶するRAM19と、Ro
M20と、CPU21とが設けられている。前記光セン
サ回路部17は1発光素子(LED)22と受光素子(
フォトトランジスタ)23とよりなる光センサ24を有
する。前記発光素子22は、抵抗R2を介して電源Vc
cに接続され、他方前記受光素子23のコレクタ25側
では抵抗R3を介して前記電源Vccに接続されている
。また、前記受光素子23のコレクタ25側は次段に位
置する前記A/Dコンバータ18に接続され、前記A/
Dコンバータ18はバス26を通して前記CPU21に
接続されている。また、前記RAM19.前記ROM2
0は各々前記バス26を通して前記CPU21に接続さ
れている。なお、第10図における前記被検出部に相当
するものは1台紙3の一側縁に等間隔に形成された切欠
15がこれに相当する。
The gap detection circuit 16 includes an optical sensor circuit section 1 that detects the gap 5 between the detected parts of the continuous paper 2 having different light transmittances, that is, the labels 4 attached to the mount 3 in FIG.
7, an A/D converter 18 for converting an analog waveform into a digital waveform, a RAM 19 for storing booter, and a Ro
M20 and CPU21 are provided. The optical sensor circuit section 17 includes one light emitting element (LED) 22 and a light receiving element (
It has a photosensor 24 consisting of a phototransistor) 23. The light emitting element 22 is connected to a power source Vc via a resistor R2.
On the other hand, the collector 25 side of the light receiving element 23 is connected to the power supply Vcc via a resistor R3. Further, the collector 25 side of the light receiving element 23 is connected to the A/D converter 18 located at the next stage, and the A/D converter 18 is connected to the A/D converter 18 located at the next stage.
The D converter 18 is connected to the CPU 21 through a bus 26. In addition, the RAM 19. Said ROM2
0 are each connected to the CPU 21 through the bus 26. Note that the notches 15 formed at equal intervals on one side edge of the mount 3 correspond to the detected portions in FIG.

このような構成において、光センサ24が光透過率の異
なった被検出部を検出すると、受光素子23の受光量が
変化してコレクタ25側の電圧が変動し、このコレクタ
25側にアナログ波形の出力電圧Voutが現れる。こ
のアナログ波形の出力電圧■outは、A/Dコンバー
タ18により等間隔゛Δtに時分割されてデジタル波形
(S工、S2.・・・。
In such a configuration, when the optical sensor 24 detects a detected part having a different light transmittance, the amount of light received by the light receiving element 23 changes, the voltage on the collector 25 side changes, and an analog waveform is applied to the collector 25 side. An output voltage Vout appears. The output voltage (output) of this analog waveform is time-divided by the A/D converter 18 at equal intervals "Δt" to form digital waveforms (S, S2, . . . ).

S、、)に変換される。:、::i’、RAM19.R
OM20を用いて次のような処理が行われる。
S, , ). :, ::i', RAM19. R
The following processing is performed using the OM20.

52S1=dt  + di /Δt=D工・・・(1
)S、−52=d、  、d、/Δt=D、・・・(2
)Sl   Sl =da  、d3/Δt=D3・・
・(3)Ss   Sl =d4  m (L /at
=D4・・・(4)Ss   Ss ”ds  + d
s /at=D、・・・(5)s、ss ==d、  
−d、 /Δt=D、・・・(6)S、−57=d、 
、d、/Δt=D、・・・(7)S、   ss =d
、  、d、 /Δt=D、・・・(8)Sl。−S、
 ==d、  、d、 /Δ1=0.・・・(9)S2
、−Sl。=d工。、dl。/Δt=D1゜・・・(1
0)Si、−S工□=d1□、 d、、/Δt=D□、
・・・(11)Sl、−S、□=dzz 、dtz/Δ
t=D1□・・・(12)S14−813=d11.d
l、/Δt=D1.・・・(13)S 1s   S 
14 =dxs  、dz4/Δt=Di、・・・(1
4)上記のように、まず、S2からS□を引き、差分d
、を求める。次に、この差分d1を時分割した時間Δt
で割ると、(1)式の微分値D1が求まる。以下同様に
して、(2)式から(14)式までの微分値(D2゜D
!?・・・、D14)を求める。このようにして微分値
(Dl、D、、・・・、D14)を求めることによって
、出力電圧V outの変化量と変化方向(+/−)を
調べることができる。第4図は、この微分値の変化量と
変化方向(+/−)の状態を表したもので、これは第2
図の出力電圧Voutの変動分のみが現れたものである
。このようにして求められた微分値は、バス26を通し
てCPU21に送られて被検出部の検出が行われる。し
たがって、このすきま検出回路16から得られる検出信
号は、出力電圧Voutの出力レベルの変動による影響
を全く受けずに取り出すことができるのである。
52S1=dt+di/Δt=D...(1
)S, -52=d, ,d,/Δt=D,...(2
) Sl Sl = da , d3/Δt = D3...
・(3) Ss Sl = d4 m (L /at
=D4...(4) Ss Ss "ds + d
s/at=D,...(5) s, ss==d,
-d, /Δt=D,... (6) S, -57=d,
, d, /Δt=D, ... (7) S, ss = d
, , d, /Δt=D, (8) Sl. -S,
==d, ,d, /Δ1=0. ...(9) S2
, -Sl. = d engineering. , dl. /Δt=D1゜...(1
0) Si, -S work□=d1□, d,, /Δt=D□,
...(11) Sl, -S, □=dzz, dtz/Δ
t=D1□...(12) S14-813=d11. d
l, /Δt=D1. ...(13) S 1s S
14 =dxs, dz4/Δt=Di,...(1
4) As mentioned above, first subtract S□ from S2 and get the difference d
, find. Next, the time Δt obtained by time-dividing this difference d1
By dividing by, the differential value D1 of equation (1) can be found. Similarly, the differential value (D2゜D
! ? ..., D14) is calculated. By determining the differential values (Dl, D, . . . , D14) in this manner, the amount and direction (+/-) of change in the output voltage V out can be investigated. Figure 4 shows the amount of change in this differential value and the direction of change (+/-).
Only the variation of the output voltage Vout in the figure appears. The differential value thus obtained is sent to the CPU 21 via the bus 26, and the detected portion is detected. Therefore, the detection signal obtained from the gap detection circuit 16 can be extracted without being affected by fluctuations in the output level of the output voltage Vout.

発明の効果 本発明は、上述のように、光センサによって検出された
アナログ出力をA/Dコンバータを用いて時分割された
デジタル出力に変換し、この時分割されたデジタル出力
のデータの微分値を求め、この微分値の検出波形により
被検出部を検出するようにしたので、アナログ出力の変
動分のみを考えればよく、したがって光センサ個々の出
力特性のバラツキ等による影響で出力レベルがたとえ異
なっていたとしても可変抵抗による調整を行う必要がな
く、また回路動作中においても光センサ固有の温度特性
や外乱による影響で回路が誤動作す、るようなこともな
くなるのである。
Effects of the Invention As described above, the present invention converts an analog output detected by an optical sensor into a time-divided digital output using an A/D converter, and calculates the differential value of the data of this time-divided digital output. Since the detected part is detected using the detected waveform of this differential value, it is only necessary to consider the variation of the analog output. There is no need to perform adjustment using a variable resistor even if the optical sensor is in use, and there is no need for the circuit to malfunction due to temperature characteristics specific to the optical sensor or disturbances during circuit operation.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図ないし第4図は本発明の一実施例を示すもので、
第1図はすきま検出回路の回路図、第2図は出力電圧の
波形図、第3図はデジタルデータの波形図、第4図は微
分波形の変化量とその変化方向を示す波形図、第5図な
いし第8図は従来例を示すもので、第5図はすきま検出
回路の回路図、第6図は出力電圧の波形図、第7図は検
出波形の波形図、第8図は出力電圧が異なった場合の状
態を示す波形図、第9図は連続用紙上におけるラベルと
被検出部のすきまとの状態を示す平面図、第10図は連
続用紙上におけるラベルと被検出部の切欠との状態を示
す平面図である。 2・・・連続用紙、5・・・すきま(被検出部)、15
・・・切欠(被検出部)、16・・・すきま検出回路、
18・・・A/Dコンバータ、24・・・光センサ出 
願 人   東京電気株式会社 、¥)、1 図 7」 廁1式)− 、%、3  図 、%、u 図 、%6図(部(9)) 的1vl(支)〕− 、%  ’7 図(蝮り) J)   と)   ■コイ)(翅り)8?+間父c)
1 to 4 show an embodiment of the present invention,
Figure 1 is a circuit diagram of the gap detection circuit, Figure 2 is a waveform diagram of the output voltage, Figure 3 is a waveform diagram of digital data, Figure 4 is a waveform diagram showing the amount of change in the differential waveform and its direction of change, Figures 5 to 8 show conventional examples, where Figure 5 is a circuit diagram of the gap detection circuit, Figure 6 is a waveform diagram of the output voltage, Figure 7 is a waveform diagram of the detection waveform, and Figure 8 is the output. Waveform diagrams showing the conditions when the voltage is different; Figure 9 is a plan view showing the gap between the label and the detected part on continuous paper; Figure 10 is a cutout between the label and the detected part on continuous paper. FIG. 2...Continuous paper, 5...Gap (detected part), 15
... Notch (detected part), 16... Gap detection circuit,
18...A/D converter, 24...light sensor output
Applicant: Tokyo Electric Co., Ltd., ¥), 1 Figure 7'' Liao 1 type) - , %, 3 Figure, %, u Figure, % 6 Figure (Part (9)) 1vl (branch)] -, % '7 Figure (flying) J) and) ■Carp) (wings) 8? + c)

Claims (1)

【特許請求の範囲】[Claims] 連続用紙上の光透過率の異なつた被検出部を検出する光
センサを有するラベルプリンタにおいて、前記光センサ
によつて検出されたアナログ出力をA/Dコンバータを
用いて時分割されたデジタル出力に変換し、この時分割
されたデジタル出力のデータの微分値を求め、この微分
値の検出波形により前記被検出部を検出するようにした
ことを特徴とするラベルプリンタのラベル検出方法。
In a label printer having an optical sensor that detects detected portions with different light transmittances on continuous paper, the analog output detected by the optical sensor is converted into time-divided digital output using an A/D converter. A label detection method for a label printer, characterized in that the differential value of the time-divided digital output data is determined, and the detected portion is detected using a detection waveform of the differential value.
JP1970887A 1987-01-30 1987-01-30 Method for detecting label of label printer Pending JPS63188085A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1970887A JPS63188085A (en) 1987-01-30 1987-01-30 Method for detecting label of label printer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1970887A JPS63188085A (en) 1987-01-30 1987-01-30 Method for detecting label of label printer

Publications (1)

Publication Number Publication Date
JPS63188085A true JPS63188085A (en) 1988-08-03

Family

ID=12006785

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1970887A Pending JPS63188085A (en) 1987-01-30 1987-01-30 Method for detecting label of label printer

Country Status (1)

Country Link
JP (1) JPS63188085A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05193225A (en) * 1992-01-17 1993-08-03 Nec Corp Position detection device
WO2011064908A1 (en) * 2009-11-26 2011-06-03 株式会社サトー Device for detecting central portion of position detection area of printing paper in printer, method for detecting central portion of position detection area, device for detecting print start position of printing paper, method for detecting print start position, and printer
US11208230B2 (en) 2019-06-27 2021-12-28 Brother Kogyo Kabushiki Kaisha Printing apparatus including optical sensor located at conveying region through which label passes

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5698634A (en) * 1980-01-09 1981-08-08 Dainippon Printing Co Ltd Printed matter testing device
JPS61246891A (en) * 1985-04-24 1986-11-04 株式会社東芝 Printed matter discriminator

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5698634A (en) * 1980-01-09 1981-08-08 Dainippon Printing Co Ltd Printed matter testing device
JPS61246891A (en) * 1985-04-24 1986-11-04 株式会社東芝 Printed matter discriminator

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05193225A (en) * 1992-01-17 1993-08-03 Nec Corp Position detection device
WO2011064908A1 (en) * 2009-11-26 2011-06-03 株式会社サトー Device for detecting central portion of position detection area of printing paper in printer, method for detecting central portion of position detection area, device for detecting print start position of printing paper, method for detecting print start position, and printer
JP2011110778A (en) * 2009-11-26 2011-06-09 Sato Knowledge & Intellectual Property Institute Device and method for detecting center part of position detection area of printing paper for printer, device and method for detecting printing start position of printing paper, and printer
US11208230B2 (en) 2019-06-27 2021-12-28 Brother Kogyo Kabushiki Kaisha Printing apparatus including optical sensor located at conveying region through which label passes

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