JPS63187078U - - Google Patents
Info
- Publication number
- JPS63187078U JPS63187078U JP7898487U JP7898487U JPS63187078U JP S63187078 U JPS63187078 U JP S63187078U JP 7898487 U JP7898487 U JP 7898487U JP 7898487 U JP7898487 U JP 7898487U JP S63187078 U JPS63187078 U JP S63187078U
- Authority
- JP
- Japan
- Prior art keywords
- constant temperature
- temperature chamber
- loading
- loading rail
- storage rails
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7898487U JPH065650Y2 (ja) | 1987-05-25 | 1987-05-25 | Ｉｃ試験用恒温槽 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7898487U JPH065650Y2 (ja) | 1987-05-25 | 1987-05-25 | Ｉｃ試験用恒温槽 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63187078U true JPS63187078U (enExample) | 1988-11-30 |
| JPH065650Y2 JPH065650Y2 (ja) | 1994-02-09 |
Family
ID=30928428
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7898487U Expired - Lifetime JPH065650Y2 (ja) | 1987-05-25 | 1987-05-25 | Ｉｃ試験用恒温槽 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH065650Y2 (enExample) |
-
1987
- 1987-05-25 JP JP7898487U patent/JPH065650Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH065650Y2 (ja) | 1994-02-09 |